Showing product results. 646 - 660 of 2222 products found.
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MDPPTSTUSB - Matco Tools
*Provides the user with a simple way to test a USB socket on a vehicle*Mini probe will light up when 4.4V - 5.25V is detected
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L336i-E - Ponovo Power Co., Ltd.
PONOVO’s L336i-E protection relay test equipment, is the three-phase relay test kit with small size and light weight, only 8.6kg.
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TW Systems - ATSEVA llc
Solid-state ultrafast titanium-sapphire terawatt laser system with peak power up to 15 TW is designed for reaching ultra-high light intensity.
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Lumere-ZeM - Evolusys Technologies Sdn. Bhd.
• CIE matched color filters and neutral density filters• Wide range of working distances and aperture settings• Color and light measurements
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TY-9610 - Wuxi Tianmu Instrument Technology Co., Ltd.
1, Optical SystemStructure: Pa type - RungeRaster: Radius of curvature: 750mmIncident slit width: 20 μ mExit slit: high-precision photolithography of the entire slit, according to different elements set up 30u-75u slit width.Detector: Photomultiplier tube ( PMT ) detector2, all digital excitation light source1. Fully digital intelligent composite light source DDD technology, which can automatically adjust the excitation parameters of light source according to the excitation characteristics of different materials, and truly realize full digital control. 2. Using the all-digital control mode, high-energy pre-combustion technology ( HEPS ), ultra-stable energy release stimulates the sample in an argon atmosphere. 3. The application of all-digital light source improves the measurement accuracy and similarity of the sample, improves the sample excitation speed, improves the spark stability, and makes the sample have better reproducibility. The maximum discharge current reaches 400A .
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SEEPOS - SiTek Electro Optics AB
For most position measurement applications the SiTek SEEPOS system offers a complete and easy-to-use solution. High speed PSD electronics combined with digital signal processing and high speed USB data transfer gives a powerful measurement system. With its large dynamic range it can handle light powers from nW to mW from DC light sources as well as modulated light sources. All parameters, such as PSD bias voltage, amplifier gain, the use of analog and digital filters etc., are easily controlled from the included software and light spot position is continuously displayed both in XY and X-t, Y-t graphs. Optimized plot algorithms ensure that all data is visually seen on the screen even in full speed measurements. Included tools for data analysis and visualization simplify rapid scan through large data sets in order to find specific parts of interest.
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Ophir Photonics
Photodiode sensors have a high degree of linearity over a large range of light power levels: from fractions of a nanowatt to about 2 mW. Above that light level, corresponding to a current of about 1 mA, the sensor saturates and reads erroneously low. Therefore, most Ophir PD sensors have a built-in and removable attenuator allows measurement of up to 3 W without saturation.
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pE-100 - CoolLED Ltd.
The pE-100 series is a mercury-free family of compact and simple to use LED illumination systems which can be configured to deliver light directly to a microscope, or via a liquid light guide or multimode fiber. Systems can be specified at any one of 20 different LED wavelengths. Operation is by a remote manual control pod with instant on/off and intensity control from 0-100%. Remote control is available via a TTL trigger.
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MIM - Applied Scientific Instrumentation
ASI Modular Microscope components consist of tube lenses along with adapters and accessories that either are primarily used in the collimated light space or adapters that are to be used on the image side. Collimated light adapters use the 38mm diameter C60-RING system to connect components. Focus-side adapters attached to lens tubes with either a 30mm diameter coupling to the I.D. of the C60-TUBE, or with a 50mm coupling on the O.D. of the lens tube.
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Materials Analysis Technology Inc.
Optical microscopy is used to display the surface morphology of samples by 2D intensity contrast due to deflection and reflection of visible light shined on areas of interest. Its resolution is about half of the incident wavelength, which is ~0.2 μm for visible light (wavelength of 400-700 nm). Such resolution limits the maximum magnification to X1000, and thus optical microscopy provides preliminary inspection of sample surface structure.
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Shimadzu Corp.
MALDI is the abbreviation for "Matrix Assisted Laser Desorption/Ionization." The sample for MALDI is uniformly mixed in a large quantity of matrix. The matrix absorbs the ultraviolet light (nitrogen laser light, wavelength 337 nm) and converts it to heat energy. A small part of the matrix (down to 100 nm from the top outer surface of the Analyte in the diagram) heats rapidly (in several nano seconds) and is vaporized, together with the sample.
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Apogee Instruments, Inc.
Apogee offers two types of quantum sensors. The Full-spectrum Quantum Sensors feature an improved detector that provides accurate measurements under all light sources, including LEDs, right out of the box. The Original Quantum Sensor is less expensive and great for measuring all light sources except certain LED colors, where post-measurement correction factors need to be applied to achieve accurate readings.
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AccuMAX™ Series - Spectronics Corp
Single detector with dual sensors measures both ultraviolet and visible light. Complies with ASTM specifications for MPI and FPI. Specially engineered for NDT applications. The AccuMAX XRP-3000 radiometer/photometer kit uses a dualwavelength UV-A/VIS sensor detector to measure both ultraviolet and visible light. Featuring automatic zeroing, integration and signal hold, the unit provides accurate readouts for UV, visible irradiance or radiance.
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McPherson, Inc.
Reflective condensing system and focusing accessory for coupling light sources to monochromators. It uses two mirrors to focus to the entrance slit. The reflective system eliminates chromatic aberration, provides maximum spectral range, and does not require refocusing. Accessories like light choppers and filter wheels can also fit inside next to the slit. Versions with rotatable mirror available for up to four source direction.
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OnTheFly® - Werth Inc.
High Speed Measurement for Time Critical ApplicationsMeasurement of features during continuous movement of the measuring axesWorks with all three illumination options (back light, dark field and bright field light)Significant reduction of measuring time through the omission of Start – Stop cyclesAnalysis of recorded objects simultaneously with the movement to the next measuring locationIntelligent macro programming of repetitive tasks with identical lighting and magnification settings
