Showing results: 61 - 75 of 212 items found.
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76562 -
Hickok Inc.
It eliminates the need for back-probing coil wires and disassembly to test at the coil connector or spark plugVariable sensitivity (VS) for greater diagnostic accuracy and expanded application coverageBacked by a Limited Lifetime Warranty
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Bearingless encoders -
Baumer Holdings AG
Baumer bearingless encoders offer contactless, magnetic and wear-free operation. Their reliable function is not affected by dust, dirt or moisture. They are extremely resistant to shocks and vibrations and have a virtually unlimited lifetime
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Boonton Electronics
WTG's calibration package is more than just verification of performance specs. It is a complete package of services including inspection and maintenance. Our services uphold the value of the instrument and extend its lifetime.
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Greenlee Tools
*AC current measuring capability up to 400 amps*Compact size, fits easily into tool pouch*Data hold and Max hold to capture important readings*Lifetime Limited Warranty
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Anti-Vibration Kit -
Axiomtek Co., Ltd.
*Multi-directional dampers*Withstands extreme temperatures*Extending product lifetimes*Maintains HDD stability*Available for tBOX and UST series*Easy installation with a wall mount bracket*Customizable for different application needs
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ams AG
ams’ portfolio of digital temperature sensors are the best combination of size, accuracy and current consumption for your design. They meet the highest quality standards to provide you with exceptional reliability over the lifetime of your product.
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HWS Series -
TDK-Lambda Corp.
*Limited Lifetime Warranty*UL 508 approved*SEMI F47 Compliant (high line AC)*Universal Input (85 - 265VAC)*High Efficiency*Class 1 Div 2 option (/RY suffix)
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HWS/HD Series -
TDK-Lambda Corp.
*Limited Lifetime Warranty*-10 to +71°C Operation (-40°C start up)*Universal input (85 - 265VAC)*Conformal coated PCBs*Class 1 Div 2 option (/RYHD suffix)
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ZWS-B Series -
TDK-Lambda Corp.
*Operating temp -10°C to +70°C*Low off-load power draw (<0.5W)*10 Year e-cap Lifetime*Universal Input (85 - 265VAC)*Suitable for 'Green' products*Five year warranty
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LIGHTsPEED -
Unity Semiconductor SAS
High throughput• Nanometer scale sensitivity• Autofocus• Full haze characterization• Multisize capability• Pits / Particle distinction• High lifetime / low CoO solid state laser• Advanced Automatic Defect Classification
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MWR-SIM -
HenergySolar
MWR-SIM Lifetime determination is based on measuring photoconductivity decay after pulselight photo-exciting with usage of reflected microwave as probe.It enables repetition and contactless of measurement and does not require specialsurface treatment before measurement or wafer cutting.
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IC-INT-VMEc -
ELMA Electronic, Inc.
The IC-INT-VMEc is a general-purpose Single Board Computer, aimed at lengthening the lifetime of legacy VMEbus systems. Based on an Intel® Xeon® processor D-15xx, it is designed to provide rugged, high-performance and highly secure solutions.
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PSE Instruments GmbH
The connection between the laminate and all other components of a PV module are essential for a high durability and long lifetime of PV modules. Only when the laminate protects the electrical components from humidity and water is a good insulation guaranteed.
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Nanowave Technologies Inc.
SSPAs based on the latest Galium Nitride (GaN) technology offer the best combination of high peak powers, high reliability, high efficiency, and soft degradation. High efficiency and high power are hallmarks of GaN technology, enabling SSPAs to challenge traditional tube-based amplifiers across the design spectrum. In addition the long lifetime from these devices, combined with the gradual degradation should individual devices fail, provide unparalleled service lifetime. Techniques such as bias modulation and linearization provide even better prime-power efficiency while still meeting the demanding requirements of pulsed or CW applications.
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MWR-2S-3 -
HenergySolar
The device is designed for express non-destructive contactless local measurement of non-equilibrium charge carrier effective lifetime in silicon substrates, epi-wafers and solar cells at different stages of manufacturing cycle. It can be used for incoming and outcoming inspection of silicon ingots and wafers, tuning and periodic inspection of semiconductor and solar cell technology quality. Lifetime determination is based on measuring photoconductivity decay after pulselight photo-exciting with usage of reflected microwave as a probe.