Showing results: 4801 - 4815 of 4983 items found.
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ImageLab -
Menlo Systems Gmbh
ImageLab is a one-of-a-kind image processing tool developed by our partner EPINA for the analysis of data from various spectroscopic imaging techniques such as THz, optical, UV/VIS, IR, Raman, or mass spectrometry. Based on multivariate statistical methods it enables the user to analyze and classify acquired hyperspectral images, to merge them with maps of physical properties and to overlay them with conventional high-resolution color photos. Visualization of the image data and highlighting of analytical information round up the software package to an indispensable instrument for in-depth analysis of spectroscopic image data. ImageLab is now part of Menlo Systems’ imaging extension TERA Image. Ask us for possibilities to upgrade your THz imaging system with our unique software tool!
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TF164B -
TESTEX Testing Equipment Systems Ltd.
Our Air Permeability Tester determines the resistance of fabrics (woven, knitted and non-woven textile materials) to the passage of air (air flow) under constant pre-set air pressure while firmly clamped in the test rig of selected test head/area.The specimen is loaded to the test area of the instrument easily by means of a pneumatic holder. By pressing down the holder to start the test. The air permeability tester is equipped with a vacuum pump to draw air through an automatic interchangeable test head with a circular opening. The pre-selected test pressure is automatically maintained, and after a few seconds the air permeability of the test specimen is digitally displayed in the pre-selected unit of measure on the touch panel after test the holder is released and the vacuum pump is shut off.
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785769-01 -
NI
PXIe, 350 MHz, 3 GS/s, 8-Bit PXI Oscilloscope—The PXIe-5111 oscilloscope has two channels that sample up to 3 GS/s with flexible and programmable settings for coupling, input impedance, voltage range, and filtering. PXI Oscilloscopes also feature a number of triggering modes, deep onboard memory, and an instrument driver that facilitates high-speed data throughput and includes analysis functions. This device is ideal for automated and partially automated applications that require flexible measurement configurations and up to 350 MHz of analog bandwidth. The PXIe-5111 also features advanced PXI synchronization and data throughput capabilities. Some options also support CableSense™ technology, which can detect and locate signal path faults, changes, or discontinuities.
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785767-01 -
NI
PXIe, 100 MHz, 1 GS/s, 8-Bit PXI Oscilloscope—The PXIe-5110 oscilloscope has two channels that sample up to 1 GS/s with flexible and programmable settings for coupling, input impedance, voltage range, and filtering. PXI Oscilloscopes also feature a number of triggering modes, deep onboard memory, and an instrument driver that facilitates high-speed data throughput and includes analysis functions. This device is ideal for automated and partially automated applications that require flexible measurement configurations and up to 100 MHz of analog bandwidth. The PXIe-5110 also features advanced PXI synchronization and data throughput capabilities. Some options also support CableSense™ technology, which can detect and locate signal path faults, changes, or discontinuities.
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785768-11 -
NI
PXIe, 100 MHz, 1 GS/s, 8-Bit PXI Oscilloscope—The PXIe-5110 oscilloscope has two channels that sample up to 1 GS/s with flexible and programmable settings for coupling, input impedance, voltage range, and filtering. PXI Oscilloscopes also feature a number of triggering modes, deep onboard memory, and an instrument driver that facilitates high-speed data throughput and includes analysis functions. This device is ideal for automated and partially automated applications that require flexible measurement configurations and up to 100 MHz of analog bandwidth. The PXIe-5110 also features advanced PXI synchronization and data throughput capabilities. Some options also support CableSense™ technology, which can detect and locate signal path faults, changes, or discontinuities.
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785768-01 -
NI
PXIe, 100 MHz, 1 GS/s, 8-Bit PXI Oscilloscope—The PXIe-5110 oscilloscope has two channels that sample up to 1 GS/s with flexible and programmable settings for coupling, input impedance, voltage range, and filtering. PXI Oscilloscopes also feature a number of triggering modes, deep onboard memory, and an instrument driver that facilitates high-speed data throughput and includes analysis functions. This device is ideal for automated and partially automated applications that require flexible measurement configurations and up to 100 MHz of analog bandwidth. The PXIe-5110 also features advanced PXI synchronization and data throughput capabilities. Some options also support CableSense™ technology, which can detect and locate signal path faults, changes, or discontinuities.
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785767-11 -
NI
PXIe, 100 MHz, 1 GS/s, 8-Bit PXI Oscilloscope—The PXIe-5110 oscilloscope has two channels that sample up to 1 GS/s with flexible and programmable settings for coupling, input impedance, voltage range, and filtering. PXI Oscilloscopes also feature a number of triggering modes, deep onboard memory, and an instrument driver that facilitates high-speed data throughput and includes analysis functions. This device is ideal for automated and partially automated applications that require flexible measurement configurations and up to 100 MHz of analog bandwidth. The PXIe-5110 also features advanced PXI synchronization and data throughput capabilities. Some options also support CableSense™ technology, which can detect and locate signal path faults, changes, or discontinuities.
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782435-01 -
NI
PXIe, 4-Channel, ±6 V, 500 mA Precision PXI Source Measure Unit - The PXIe-4145 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation, and each channel has integrated remote (4 wire) sensing for accurate measurements. The fast sample rate of the PXIe-4145 can reduce measurement times, capture transient device characteristics, and allow quick I V characterization of devices under test (DUTs). With a high-speed sequencing engine, you can synchronize all these SMUs with each other or with other instruments such as switches or high-speed digital test modules. Additionally, you can tune the PXIe-4145 response to any load to achieve optimum responses with maximum stability and minimum transients using SourceAdapt technology.
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781743-01 -
NI
PXIe, 4-Channel, ±10 V, 100 mA, Precision PXI Source Measure Unit - The PXIe-4141 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation, and each channel has integrated remote (4 wire) sensing for accurate measurements. The fast sample rate of the PXIe-4141 can reduce measurement times, capture transient device characteristics, and allow quick I V characterization of devices under test (DUTs). With a high-speed sequencing engine, you can synchronize all these SMUs with each other or with other instruments such as switches or high-speed digital test modules. Additionally, you can tune the PXIe-4141 response to any load to achieve optimum responses with maximum stability and minimum transients using SourceAdapt technology.
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782431-01 -
NI
PXIe, 4-Channel, ±24 V, 150 mA Precision PXI Source Measure Unit - The PXIe-4143 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation and each channel has integrated remote (4-wire) sensing for accurate measurements. The fast sample rate of the PXIe-4143 can reduce measurement times, capture transient device characteristics, and allow quick I V characterization of devices under test (DUTs). With a high-speed sequencing engine, you can synchronize all these SMUs with each other or with other instruments such as switches or high-speed digital test modules. Additionally, you can tune the PXIe-4143 response to any load to achieve optimum responses with maximum stability and minimum transients using SourceAdapt technology.
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EL30000 Series -
Keysight Technologies
The Keysight EL30000 Series Bench electronic load with a built-in data logger provides new levels of test insights for your devices like power supplies, batteries, DC to DC converters, and more. View voltage and current trends to make real-time decisions, rather than waiting hours for a test to complete. At the heart of the EL30000 is a highly accurate measurement system that provides real-time updates to the large display. Keysight’s PathWave BenchVue software allows you to operate the electronic load remotely, execute test sequences, log data, and integrate with other test instruments. Single and dual-channel models are available with up to 600 W for measurements that require more power. Start your test with confidence and finish with results you trust.
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B&W Tek, Inc.
We offer a full suite of software for spectroscopic data collection and analysis designed for users at all levels, and varying applications. Our standard BWSpec® spectral data acquisition software allows for easy collection of data from our Raman systems and modular spectrometers. It includes tools for instrument control for data collection and spectral manipulation. The raw data and corrected data are stored and can be easily viewed. Data manipulation tools include smoothing, baseline correction and derivatives. Data can be saved in different formats for use in additional application software. For spectral identification against Raman spectral libraries with a simple interface for immediate identification for verification with a pass/fail result, our BWID® software provides qualitative analysis. Users of BWID software can create their own Raman spectral libraries, or select from our numerous ready to use libraries. For identification with portable Raman in regulated environments, the US FDA 21 CFR part 11- complaint version of BWID can be used. B&W Tek’s unique see-through identification using the STRam® can also be done using the BWID software operating on the embedded tablet computer of the STRam system. For quantitative analysis, data collected with BWSpec or other packages can be imported into the BWIQ® multivariate data analysis software, offering a full suite of data preprocessing, regression and classification analysis algorithms. PLS regression models from the BWIQ software an be used in rel-time in our BWAnalyst software, for use with the QTRam , as well as in Metrohm’s Vision® software. The i-Raman series portable Raman instruments can also be operated for single acquisition, or for real-time analysis in the Routine Analysis mode of the Vision software.
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BLU-T Series -
IBEKO Power AB
Battery load bank BLU-T is a powerful and lightweight solution designed for condition assessment of telecommunication and radio equipment backup supply. This instrument can perform the battery capacity test on battery strings such as Pb, Li-ion, Ni-Cd, and others. It tests battery strings with voltages in the range of 0,9 – 70,5 V DC. As a special feature, the BLU110T model enables capacity testing of single PB, Ni-based as well as Li cells (with current up to 100 A).The capacity test is conducted in an accurate, user-friendly way. Also, it is in accordance with battery testing standards: IEEE 450-2010, IEEE 1188-2005, IEEE 1106-2015, IEC 60896-11/22, and other relevant standards.BLU-T battery load bank enables setting the discharge current up to 350 A, with 0,1 A resolution. If higher currents are required, the BLU-T units can be connected in parallel, or BXL-T additional load units can be linked.The instrument offers a high power-to-weight ratio. BLU-T series has models starting from 12,8 kg / 28.2 lbs and up to 19,2 kW of power.A user can select one of three discharge modes: Constant current, Constant power, Constant resistance. Additionally, different battery duty cycles can be simulated using user-selectable discharge profiles.Discharge parameters can be monitored in real-time during the capacity test. A 4,3-inch touch screen shows overall battery voltage, discharge current, discharge test time and capacity during the entire test. Also, the capacity tester is compatible with DV-B Win software. A user can view a detailed numerical and graphical presentation of key parameters, and create reports in various formats.Testing can be carried out without disconnecting the battery from the service.
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GGT Series -
IBEKO Power AB
The GGT500 ground grid integrity tester is designed for inspection of the substation ground grid. It can also be used as a portable micro-ohmmeter with Both Sides Grounded and Remote Control functionalities. It is intended to inspection the conditions of a grounding system beneath substations, testing of medium- and high-voltage circuit breakers, disconnecting switches, high-current bus bar joints, cable splices, and different high-current links.In the United States when inspecting the quality of the grounding systems beneath a substation, the proper procedure is to inject 300 A DC during a time period of 60 s. This is what the GGT500 will do, and in that time period, the current path and voltage drop are checked. Also acting as a micro-ohmmeter, the GGT500 can test low resistance values by producing high test currents of up to 500 A.The instrument is placed in an unbreakable, plastic case with IP67 protective rating (with closed lid). Although very portable and lightweight, micro-ohmmeters have very high output power capabilities. High output voltage enables a wider measurement range at higher test currents, as well as the use of thinner/longer test cables. GGT500 ground grid integrity tester generates a true DC ripple-free (less than 1 % ripple) current with automatically regulated test ramps. This significantly decreases magnetic transients and ensures great accuracy.When used for testing in Both Sides Grounded conditions, a special current clamp powered from the ground grid integrity tester is used for measuring a current through groundings. If even a higher safety level is required, the remote control feature enables the operator to perform measurements from a distant location, away from the instrument and test object.
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ST2822 -
Saluki Technology Inc.
ST2822 series handheld LCR meter is a portable handheld measuring instrument used to measure the parameters of inductance, capacitance, resistance and other components. Small in size, powered by 8.4V rechargeable battery (ST2822A is 9V non-rechargeable battery) or external power adapter, it can be used not only in desktop applications, but also in mobile measurement and handheld measurement.ST2822 series apply the ultra-low power consumption design and high density SMD assembly techniques and can simultaneously display primary and secondary parameters on a LCD display with backlight. The dual-color shell is gorgeously once shaped; and functions are easy to operate. The test frequency is up to 100 kHz, the readings of primary parameter 40,000 counts and the resolution of dissipation factor 0.0001. Accurate and convenient measurements of passive-components can be achieved in different occasions for a long time.
