Showing results: 481 - 495 of 570 items found.
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Precision Development Consulting Inc
Hand control module for teleprompter, Analog data acquisition and filtering, High-Power Arc Lamp Power Supply Controller and RTP gas flow and Vacuum System controller, Disk drive company test racks, Disk Drive Spindle Motor Tester, Disk Drive Head Stack Tester, Wafer photoresist coating and development system control PC boards, Nuclear Plant secondary water temperature monitor
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HDS-26S -
Hangzhou Huatai Optic Tech. Co., Ltd.
Huatai HDS-26S (original model: HDBS-3000TX) series satellite L-Band optical transmitter, adopts high linearity DFB laser and direct modulated way. It can transmit 950~2600MHz L-Band analog or digital satellite signal (SAT-IF) receiving by satellite aerial radio high frequency head, to realize total transparency, high quality, long distance transmission through optical fiber. It also can sue satellite L-Band up/down link.
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LPCE-2(LMS-8000) -
Lisun Electronics Inc.
LPCE-2(LMS-8000) is an Integrating Sphere Spectroradiometer LED Testing System for identifying the performance of single LEDs and LED lamps. LED’s quality should be tested by checking its photometric, colorimetric and electrical parameters. According to CIE 127-1997 and IES LM 79-08 standards, it recommends using an array spectroradiometer with integrating sphere and photometer head to test SSL products. LISUN GROUP developed LPCE-2 test system for LED products.
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PIMACS CO., LTD.
The simpler way to measure the total luminous flux of lamps and luminaires is to use an integrating sphere photometer system. It is a device to perform spatial integration of flux optically, thus the total luminous flux can be measured with one fixed photometer head and measurement can be instant. An integrating sphere photometer is calibrated with a total luminous flux standard lamp. A test light source is measured by comparison to a standard lamp calibrated for total luminous flux.
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FISCHERSCOPE X-RAY 4000 -
Helmut Fischer AG
For continuous measurement of coatings on foils, strips and punched strips in ongoing productionMeasuring head may be positioned at right angles to the transport direction of the specimenEasy handling and quick start-upProportional counter tube, peltier-cooled silicon PIN diode or silicon drift detector as X-ray detectorPositioning device for measurements on several measuring positionsCustomer-specific designAutomated calibrationFast conversion from one production line to anotherEasy integration into quality management systems and process controls
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SIFT -
FA Instruments
SIFT allows for the analysis of numerous stimuli to identify speed, fault, and parametric differences in silicon. The heart of the SIFT technique revolves around intentionally disturbing devices with external stimuli and comparing the test criteria to reference parts or timing/voltage sensitivities. Synchronous interfacing is possible to any tester without any wiring or program changes. The system can be based on either a motorized probe station or portable microscope stand for test head applications.
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ED-205 -
Standard Electric Works Co., Ltd
● Dimension：91(L) × 103(W) × 100(D)mm● Deflection Angle : 90°● Scale Length：Approx. 65mm ● Terminal： 4mm socket captive head, suitable for wire or pin-type test lead.● Material And Color： Acrylic resin meter cover, white scale plate, plastic stand in black.● Safety Standard： IEC/EN 61010-1 CAT Ⅱ 300V EN 61326-1 EN 61000-4-2 EN 61000-4-3
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SphereOptics GmbH
Goniometer has the capability not to only fit into almost every optical laboratory, but also to provide measurement data on concise level. The type C set up of this instrument enables the developer of single LEDs, LED modules or chips to study angular performance in many development stages; fast and most important: reliable. The detector head of the goniometer is a high-quality, visible-range spectrometer, equipped with diffuser optics to collect all important measurement quantities over the customer required angular range. With a maximum allowable source sample size of 300mmx100mm and 25kg, the new benchtop goniometer covers a wide range of LED measurement requirements. The footprint of the instrument itself with 1.65mx0.60mx1.73m allows the usage also in small dark rooms and optical laboratories.
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SphereOptics GmbH
This small goniometer has the capability not to only fit into almost every optical laboratory, but also to provide measurement data on concise level. The type C set up of this instrument enables the developer of single LEDs, LED modules or chips to study angular performance in many development stages; fast and most important: reliable. The detector head of the goniometer is a high-quality, visible-range spectrometer, equipped with diffuser optics to collect all important measurement quantities over the customer required angular range. With a maximum allowable source sample size of 300mmx100mm and 25kg, the new benchtop goniometer covers a wide range of LED measurement requirements. The footprint of the instrument itself with 1.65mx0.60mx1.73m allows the usage also in small dark rooms and optical laboratories.
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Micro-Epsilon Group
Laser scanners from Micro-Epsilon are among the highest performing profile sensors in the world with respect to accuracy and measuring rate. They detect, measure and evaluate profiles on different object surfaces without contact. The available models are suitable for numerous industrial applications. The integrated intelligence in their sensor head (scanCONTROL SMART) solves versatile measurement tasks. Models for the customer’s own programming are available for integrators. The scanCONTROL profile scanners do not require any external controller.
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Amida Technology, Inc.
The AMIDA-3KS test system provides a lower cost, cost-optimized test solution for all consumer power management ICs and portable product components. The AMIDA-3KS tester provides 6 board slots in the test head for the required number of analog board channels, thus reducing the overall system procurement cost, making the cost-effectiveness of each board channel 2 times higher and more flexible. The customer's product testing time is greatly shortened.
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GATS-3200 -
W.M. Hague Company
* Test individual packages or * Test Multi-image panels with Step&Repeat Function * single flying probe top using very high speed voice coil motor (VCM) technology * 50 - 100 tests per second ... high throughput * Dual Flying Probe Top for testing bump-to-bump nets * flying probe head allows testing of all nets including each power and ground point * 4-wire test capability
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AEP Technology
AEP Technology offers unique nanomechanical testers with a variety of interchangeable test heads that allow nanoindentation, scratch testing, microindentation testing and abrasion testing to be performed on the same platform. The rugged platform with built-in high-resolution imaging systems (atomic force microscope, 3D profiler, etc.) makes the UNT-30 a powerful tool for R&D and production. In order to ensure the high reliability of the data, the tester is also equipped with a shockproof platform and a soundproof cover.
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NanoScan -
mks Ophir
Measure your beam as never before with the NanoScan™ beam profiler. The advantage of scanning slit beam profiling is sub-micron precision for measuring beam position and size. Scan head configurations include Silicon, Germanium, and Pyroelectric versions for a wide range of wavelengths and laser power levels. The NanoScan software is available in two versions: Standard and Professional, and includes an extensive set of ISO quantitative measurements, an M2 Wizard, and the ability to measure laser power.
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Fieldpiece Instruments, Inc
The In-Duct Hot-Wire Anemometer & Psychrometer accessory head, AAT3 allows HVACR professionals to measure air velocity, temperature, and %RH all in one tool. The engineered 38" telescoping probe with laser etching and quick-response sensor provides quick and easy airflow measurements from the correct location--near the evaporator. When using with the Fieldpiece HVAC Guide System Analyzers, the AAT3 can automatically calculate target super heat and target evaporator exit temperature.
