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C Series Serial Interface Module
The C Series Serial Interface Module adds RS232 or RS485/RS422 serial ports to CompactRIO systems. The serial ports are accessed directly from the field-programmable gate array (FPGA) to offer you flexibility in communicating with serial devices. The module has individual buffers on every port that save FPGA space and simplify programming. The C Series Serial Interface Module supports standard start bit, stop bit, and handshaking settings. It uses an external power to provide maximum compatibility and reliability under all serial port conditions. You can choose from both enclosed and non-enclosed modules.
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Flaw Detector & Thickness Gauge
DFX-8+
Measurement Gates: Two independent gates (Flaw), and three gates (thickness). Start & width adjustable over full range. Amplitude 5-95%, 1% steps. Positive or negative triggering for each gate with audible and visual alarms.
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Isolation and Power Solutions
Silicon Labs' innovative digital isolation and power product portfolio includes CMOS digital isolators, isolated gate drivers, isolated current sensors, isolated system products and Power over Ethernet (PoE) families. These mixed-signal IC solutions leverage Silicon Labs' superior isolation and high voltage expertise to enhance power system performance, flexibility and reliability while reducing system size and cost. The entire isolation portfolio supports isolation voltages up to 5 kV.
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24 TTL Channels, Programmable I/O
TL1
Function module TL1 provides 24 channels of TTL/CMOS transceiver functionality as either inputs or outputs. The transistor-transistor logic (TTL) employs transmitters with multiple emitters in gates having more than one input. TTL offers high switching speed and relative immunity to noisy systems. CMOS sensors provide image sensing technology by converting light waves into signals that are small bursts of current. These waves can be light or other electromagnetic radiation.
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Rad Hard GaN Drivers
The space market has been driving towards more efficient power management solutions. Part of the drive includes the use of Gallium Nitride Field Effect Transistors (GaN FETs) for power conversion. GaN FETs have higher power conversion efficiency and have more natural immunity to radiation, due to them being wide-bandgap semiconductors. Equally important is the use of the correct driver that will allow reliable operation and maximize the benefits of the GaN FETs. Some of the key driver requirements are: a well-regulated gate drive voltage; high source/sink current capability and a split driver output stage.
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Bench-top Test Jigs
Robust, easily customised, standalone kits for testing a variety of PCB's. Basic hinged-top or cam operated pusher plate, advanced cam-operated gate with fully adjustable pusher-fingers.
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24 TTL Channels, Enhanced, Programmable I/O
TL2
Function module TL2 provides 24 channels of TTL/CMOS transceiver functionality as either inputs or outputs. The transistor-transistor logic (TTL) employs transmitters with multiple emitters in gates having more than one input. TTL offers high switching speed and relative immunity to noisy systems. CMOS sensors provide image sensing technology by converting light waves into signals that are small bursts of current. These waves can be light or other electromagnetic radiation.
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CAMAC Multifunctional Logic Unit
CMDGG8
The CMDGG-8 is a multi functional FPGA based delay, logic and timing module which provide often needed functions such as gate, delay & pulse generator, logic fan in / fan out, coincidence register and scaler / pre-scaler.
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Duty Cycle Meter
Displays ON or OFF period as a percentage of total period over a programmed gate time from 10 ms to 199.99 s. A resolution of 1%, 0.1% or 0.01% is user-selectable. Applications include monitoring modulated proportional control systems and pulse-modulated systems, such as radar, lasers or packet radio.
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Firmware for High-speed HDLC/SPI Communications (NEW Version)
OP-FW12G
This expansion firmware increases the baud rates of bit synchronous communications (e.g., HDLC/SDLC/X.25, and CC-Link communications). The firmware processes main measurement items completely with a field programmable gate array (FPGA), thus precisely capturing communications data along with time stamps in 1-µs units.
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Rad Hard GaN FETs
Wide band gap semiconductor technologies such as Gallim Nitride Field Effect Transistors (GaN FETs) have been gaining interest for power management and conversion in space applications. These devices feature higher breakdown voltage, lower RDS(ON) and very low gate charge enabling power management systems to operate at higher switching frequencies while still achieving higher efficiency and a smaller solution footprint. There is an additional benefit from GaN devices that make them attractive to the space market. These devices are inherently immune to total ionizing dose radiation.
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Analog Oscilloscope
CS-406
*OSCILLOSCOPE: 40 MHz Dual Trace,Dual Trigger. 1mV Sensitivity. 10ns Resolution. *COUNTER: 5 Digits 0.36" Red LED Display. 0.1Hz~50MHz Auto Range. 0.001Hz Resolution. Auto Gate Time. Auto Detect,Auto Reset. 1mV Sensitivity.
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12-Bit, 2.5 GSPS Digitizer Optimized for Pulse Detection
ADQ32-PDRX
ADQ32-PDRX acquires the input signal via a single connector and uses an onboard splitter to separate the signal into two paths with different gain settings. The high gain path is used to accurately capture low-amplitude portions of the input signal whereas the low gain path ensures the acquisition of high-amplitude peaks without causing saturation. The two signal paths are then combined in real-time inside the onboard field-programmable gate array (FPGA) to create a digitized output with improve...show more -
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0.1Hz-3.7GHz Frequency Counter
FC-3000
Features:*Frequency measuring range: 0.1Hz to 100MHz in A input, 80 MHz to 3.0GHz in C input.*Period,Total and RPM measurement for input A*9 Digit display with 0.01mHz resolution in 1 Sec (By Ext.Reference signal).*RS-232C serial interface function for communication with computer.*High sensitivity Extemal reference input function(>=1.5Vrms).*Peciprocal technique for high resolution at low counting frequencies .*Self check function executed to perform a automatic self diagnosis of various coun...show more -
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Quick Start Kit
Curtiss-Wright Defense Solutions
The OpenVPX CHAMP-WB/CHAMP-WB-DRFM/A25G/D25G 6U Quick Start Kit (QSK) from Curtiss-Wright Defense Solutions enables the system developer to rapidly prototype a core system for software and fieldprogrammable gate array (FPGA) development using the CHAMP-WB. Other components can be added to this basic configuration or alternative options can be explored.
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Atlas DCA Pro Advanced Semiconductor Analyser
DCA75
The DCA75 is a great instrument for identifying and testing a wide variety of semiconductor components. Just connect any way round! The DCA75 will perform the following:*Display component type (such as N-CH MOSFET, darlington transistor etc).*Display component pinout (such as drain, source, gate etc).*Display detailed parameter measurement.*Plot characteristics curves on your PC.
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Field-Programmable Gate Arrays (FPGAs) And Other Programmable Logic Devices (PLDs)
Are both programmable logic devices
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CAM/GATE Test Kits
Series 45
The CG Series 45 CAM/GATE linear over clamp kits utilize the same patented “Z” axis motion as our CAM/TRAC® Series products offering precise Z axis linear motion when testing higher point count and finer pitch test centers. By using the Z axis motion, side load of the test probes is minimized thus increasing probe life and performance. The latch assembly engages and disengages when actuating the clamping assembly. The CAM/GATE utilizes a cam roller system for precision guiding and smooth operati...show more -
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360 EC-RTL
During a typical development process, there are many occasions where a change needs to be made to a block, which must then be retested to ensure functional equivalence. For example, once a block has been proven to operate correctly, a designer may wish to optimize some section, maybe to improve the coding style, reduce the gate count or streamline operation. Today, an engineer must execute an entire simulation regression run to verify each change. This often requires a lot of time and may also need additional stimulus, with no guarantee that an exhaustive functional check will be performed.
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Analyze RTL
ASICs and FPGA routinely have millions of gates with memories, transceivers, third party IP and processor cores. Problems can be time consuming and complex to debug in the lab and through simulations. Designers need verification tools that can identify problems quickly to reduce their verification and debug time before simulation, before synthesis, and definitely before burning chips in the lab.
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RF Amplifiers Bias Controllers
RF amplifier bias controllers generate a regulated drain voltage and actively adjusts the gate voltage of an external amplifier to achieve constant bias current. It can be used to bias any enhancement and depletion type amplifier operating in Class-A regime with drain voltages (VDRAIN) as specified. These devices achieve excellent bias stability over supply, temperature and process variations, and eliminates the required calibration procedures used to prevent RF performance degradation due to such variations.
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MOSFET Drivers
The bridge driver products handle voltages up to 100V, with industry-leading gate rise and fall times and exceptional input-to-output propagation delay performance. Select parts are available in 4mm x 4mm and 3mm x 3mm DFN packages which meet IPC-2221 creepage and clearance specifications for high-voltage systems.
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Semiconductor Tester
5000E
Current Ranges:Standard: 2.0nA – 50AUp to 100A with Mainframe ExtensionVoltage Ranges:Standard (anode): 10mV – 1000V2000V with 2kV Anode OptionStandard (gate): 10mv – 20V80V with 80V Gate Option
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Dual Gate LCU
Abaco Systems’ Dual Gate local control unit (LCU) provides an ideal user interface for the ADEPT line of automatic video trackers and can be used in a prototyping, development or production project phase.
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Inductive Sensors
Inductive sensor designed to detect shaft speed, shaft position, gate position, or object presenceTotally sealed constructionMulti-voltage 24 - 240 VAC/VDCDetects ferrous targets up to 5/16" (8 mm)IP 65 Protection
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Transistor Testing
Radiant is introducing an I2C digital-to-analog converter product that can be attached to the Precision Premier II and is controlled from Vision. The addition of this extra voltage source makes it possible for the Premier II to measure the performance of thin-ferroelectric-film gate transistors (TFFTs and MFSFETs). This document explains the theory for such testing and gives examples of such tests using Radiant's SFRAM transistors as examples.
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Photometer II
Spectra Film Gate
The Spectra Film Gate Photometer II offered by Spectra Cine is a significant advance in the field of photometry. It is extremely sensitive and solid state throughout. Reads directly in printer steps of 0.025 log exposure units. The large, uncrowded scale has an 80 printer point range and affords ease and accuracy in reading. A variety of probes are available for use in Acme optical printers, Bell & Howell Model "C", "J", and "A" contact printers, ARRI printers and Oxberry printers.
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PCI-7811, 1M Gate Virtex-II FPGA, Digital Reconfigurable I/O Device
779363-01
The PCI‑7811 is a reconfigurable I/O (RIO) device that features a user-programmable FPGA for onboard processing and flexible I/O operation. With LabVIEW FPGA, you can individually configure the digital lines as inputs, outputs, counter/timers, PWM, encoder inputs, or specialized communication protocols. You can also program custom onboard decision making that executes with hardware-timed speed and reliability. The PCI‑7811 is well-suited for a wide variety of applications, such as high-speed waveform generation, sensor simulation, hardware‑in‑the‑loop (HIL) test, custom communications protocols, bit error rate test, and other applications that require precise timing and control.
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Software
Current-Voltage Measurement Option
Materials Development Corporation
CSM/Win Systems with an I-V option can measure both MOS and diode structures. For junctions, both forwardand reverse bias curves can be analyzed. Junction ideality factor, series resistance, and reverse saturation current are found. Solar cells can be checked for efficiency. Gate Oxide Integrity of MOS devices can be measured as well.
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Photo Gate Logger Sensor
NUL-209
This sensor can be used to study various kinds of motion. With six modes of operation, time, velocity or acceleration can be measured with one or two photo gates and associated timing cards, as well as showing pictorially the status (digital 1 or 0) of the voltage output of the photo gate as timing cards pass through it.
