Software

Current-Voltage Measurement Option - Materials Development Corporation (MDC)

CSM/Win Systems with an I-V option can measure both MOS and diode structures. For junctions, both forward
and reverse bias curves can be analyzed. Junction ideality factor, series resistance, and reverse saturation current are found. Solar cells can be checked for efficiency. Gate Oxide Integrity of MOS devices can be measured as well.

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Topics

Software
IV Curve
Solar Cell Efficiency
Bias Current
Solar Cell
Junction
Bias
Current
Integrity
IV