Showing results: 31 - 45 of 238 items found.
-
Ultima Investigator™ -
Bruker Nano Surfaces
As the most streamlined model of Bruker''s Ultima family of multiphoton microscopes, Ultima Investigator™ features a base system specifically optimized for in vivo studies and is designed for add-on flexibility with a host of specialized options. Ultima Investigator''s high-resolution, high-speed, high-sensitivity deep imaging provides the ultimate value for smaller labs and additional imaging bandwidth in larger labs.
-
ioLight Ltd.
*Very compact fluorescence microscope*Detects organisms expressing GFP or other fluorophores*Perfect for sample triage, education and outreach
-
Beacon -
Del Mar Photonics, Inc.
Beacon up-conversion spectrometer has been specially designed for measuring fluorescence lifetimes in the 400 - 1500 nm spectral range.
-
FACTORY LAB MXF-2400 -
Shimadzu Corp.
Wavelength Dispersive X-Ray Fluorescence Spectrometer The Shimadzu MXF-2400 is an improved version of the Shimadzu Multi-Channel X-ray fluorescence spectrometer, which has been rated highly in the overseas market as well as in the Japanese market. The latest hardware designed to fully utilize the principle of X-ray fluorescence spectrometry and the data processing unit that uses various software programs to permit automatic management of analysis data combine to provide high analytical productivity both in R&D and production control. Up to 36 elements can be simultaneously determined by the fixed monochrometer and up to 48 elements can be determined sequentially by the optional scanning monochrometer. High analytical precision is provided even in high sensitivity analysis of a few ppm quantity level.
-
FOG100 -
CDP Systems Corp.
Femtosecond optical gating (FOG) methods give best temporal resolution in light induced fluorescence lifetime measurements. Since 1997 we manufacture model FOG100-DX for operation with femtosecond oscillators and we offer now FOG100-DA for operation with femtosecond amplified pulses.
-
Model T100 -
Teledyne Advanced Pollution Instrumentation
The Model T100 uses the proven UV fluorescence principle, coupled with a state of the art user interface to provide easy, accurate, and dependable measurements of low level SO2.Exceptional stability is achieved with the use of an optical shutter to compensate for PMT drift and a reference detector to correct for changes in UV lamp intensity. A hydrocarbon 'kicker' and advanced optical design combine to prevent inaccuracies due to interferents.
-
Model T102 -
Teledyne Advanced Pollution Instrumentation
The Model T102 TRS analyzer uses the proven UV fluorescence principle to measure Total Reduced Sulfur at levels commonly required for ambient air monitoring.The Model T102 uses a high temperature external converter set at 850°C to allow conversion of H2S, methyl mercaptan, dimethyldisulfide, and methyl-disulfide to SO2 at this temperature with efficiency greater than 98%. A switching option alternately measures TRS and SO2 while showing both readings concurrently on the front display.
-
Model N100 -
Teledyne Advanced Pollution Instrumentation
The Model N100 instrument uses the proven UV-fluorescence principle, combined with a state-of-the-art modular architecture, and intuitive operating software to provide accurate and dependable measurements of low-level Sulfur Dioxide (SO2) gas.
-
FISCHERSCOPE X-RAY/XULM -
Helmut Fischer AG
Flexible instrument for measuring coating thickness with multiple usesBoth thin and thick coatings (e.g. 50 nm Au or 100 m Sn) can be measured equally well through selectable high voltage filter combinationsThe micro-focus tube enables small measurement spot sizes at short measurement distances of just 100 mHigh count rates of a few kcps through proportional counter tubeMeasuring direction from bottom to top, this allows for quick and easy sample positioningLarge measurement chamber with a cutout (C-slot)
-
FISCHERSCOPE X-RAY/XDAL -
Helmut Fischer AG
With semiconductor detector, this expands the possibilities in element analyses and for measuring thin coatings due to better signal/noise ratiosMicro-focus tube allows also for smaller measurement spots, but because lower in intensity, less well suited for smaller structures.Large and spacious measurement chamber with a cutout(C-slot)Fast, programmable XY-stage with pop-out function
-
FISCHERSCOPE XAN 220 -
Helmut Fischer AG
Optimized for non-destructive analysis of jewelry, coins and precious metalsFixed aperture and fixed filter; thus particularly suited for precious metal analysisWith high-resolution silicon drift detector (SDD) also applicable for more complex analyses with many elementsMeasuring direction from bottom to top, this allows for quick and easy sample positioning
-
FISCHERSCOPE X-RAY/XAN 250 -
Helmut Fischer AG
Universal premium instrument with comprehensive measurement capabilitiesAperture (collimator) 4x electrically changeable, Primary filter 6x electrically changeableWith high-resolution silicon drift detector (SDD) also applicable for more complex analyses with many elementsMeasuring direction from bottom to top, this allows for quick and easy sample positioning
-
FISCHERSCOPE XDL -
Helmut Fischer AG
Robust instrument suited for coating thickness measurements, even at large measuring distances (DCM, stroke 0-80 mm)Features a fixed aperture and a fixed filterSuitable for structure sizes starting at about 1 mmLarge and spacious measurement chamber with a cutout(C-slot)A programmable stage for automated measurements is availableStandard X-ray tube, proportional counter tube
-
FISCHERSCOPE X-RAY/XDLM -
Helmut Fischer AG
Very universal because equipped with a micro-focus tube, 4-x aperture changer and 3 primary filtersSuitable for smaller structures such as connector contacts or printed circuit boardsLarger measuring distances are possible as well (DCM, stroke 0-80 mm)Large and spacious measurement chamber with a cutout(C-slot)A programmable stage for automated measurements is available
-
FISCHERSCOPE X-RAY/XUL -
Helmut Fischer AG
For coating thickness measurements in the electroplating industryFixed aperture and fixed primary filterX-ray tube with a slightly larger primary spot, well suited for applications with measurement spot sizes starting at about 1 mmLow-energy beam components are excited with lower effectiveness, however for standard applications measuring the thickness of typical electroplated coatings such as Cr, Ni, Cu, this poses little to no problemMeasuring direction from bottom to top, this allows for quick and easy sample positioningLarge measurement chamber with a cutout (C-slot) Standard X-ray tube, proportional counter tube