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Showing results: 1 - 10 of 10 items found.

  • Astronics PXIe-6943, 1-Slot, 50 MHz, 32-Channel PXI Digital Pattern Instrument

    785855-01 - NI

    1-Slot, 50 MHz, 32-Channel PXI Digital Pattern Instrument - The Astronics PXIe-6943 works as a core component of digital test systems that may include switching, analog instrumentation, and an RF subsystem. This instrument features an advanced thermal design, temperate monitoring, … and a high-speed data sequencer for control of stimulus and response patterns. Additionally, the Astronics PXIe-6943 operates at data rates up to 50 MHz with 1 ns edge placement, variable slew rates, and a <3 ns channel-to-channel skew. It also supports synchronized digital test systems from 32 to 224 channels.

  • PXIe-6571, 1-Slot, 100 MVector/s PXI Digital Pattern Instrument

    786320-01 - NI

    1-Slot, 100 MVector/s PXI Digital Pattern Instrument - The PXIe‑6571 is designed for semiconductor characterization and production test. It includes the Digital Pattern Editor for configuring pin maps, specifications, levels, timing, and patterns. It also includes debugging tools … like Shmoo, digital scope, and viewers for history RAM, pin states, and system status. The PXIe-6571 requires a chassis with 82 W slot cooling capacity, such as the PXIe-1095.

  • PXIe-6570, 100 MVector/s, PXI Digital Pattern Instrument

    785283-01 - NI

    100 MVector/s, PXI Digital Pattern Instrument—The PXIe‑6570 is designed for semiconductor characterization and production test. It includes the Digital Pattern Editor for configuring pin maps, specifications, levels, timing, and patterns. The PXIe‑6570 also includes debugging tools like Shmoo, digital scope, and viewers for history RAM, pin states, and system status.

  • Oscilloscopes

    Anritsu Corporation

    Anritsu sampling oscilloscope is an ideal solution for Eye pattern analyses and Eye Mask tests. In addition, The excellent performance and high sampling speed reduce measurement times and help hold-down equipment costs.

  • Rasterizers

    LV7300 - Leader Electronics Corp.

    LV7300 is a 1U half rack size rasterizer. It is compact but supports eye pattern measurement up to 12G-SDI.

  • 12 Channels 1.0 ~ 17.0 Gb/s (200Gbps) Pulse Pattern Generator and Error Detector

    CA9806-12 - UC Instruments, Corp.

    The UC INSTRUEMNTS CA9806-12 is a highp erformance, flexible 12 channels Pulse Pattern Generator and Error Detector that can operate from 1.0 to 17.0 Gb/s (200 G). It is combined with three sets CA9806 4 CH 1.0 to 17.0 Gbps Pulse Pattern Generator and Error Detector that incorporates an external one by 4 rate clock synthesizer. Its small size allows it to be placed close to the device under test, it can also be placed further away using the TX driver pre and post emphasis controls features to compensate for cable and interconnect losses. It also has a non destructive, integrated eye outline capture feature along with a quick eye height and width measurement capability. Build-in 8.5 ~ 15 Gb/s eye diagram testing function.

  • 4 Channel 1.0 ~ 17.0 Gb/s Pulse Pattern Generator and Error Detector

    CA9806 - UC Instruments, Corp.

    The UC INSTRUEMNTS CA9806 is a high performance, flexible four channel Pulse Pattern Generator and Error Detector that can operate from 1.0 to 17.0 Gb/s (consult factory for higher or lower operation speeds). It is also a standalone Bit Error Rate test solution that incorporates an internal full rate clock synthesizer. Its small size allows it to be placed close to the device under test, it can also be placed further away using the TX driver pre and post emphasis controls features to compensate for cable and interconnect losses. It also has a non destructive, integrated eye outline capture feature along with a quick eye height and width measurement capability. Build‐in 8.5 ~ 15 Gb/s eye diagram testing function.

  • Communication Test Set

    Eye-BERT 100G - Spectronix

    The Eye-BERT 100G is a low cost, full-featured, stand-alone communication test set with an integrated post equalizer eye opening monitor / scanner. Ultimate flexibility is provided with three different physical interfaces, 13 different configurations, and configurable transmit and receive clocks. The tester supports PRBS patterns up to 263-1 and select data rates from 1.25 to 29Gbps on up to 4 simultaneous channels. Front panel controls are also provided for stand-alone operation. Unlike competing products, fast post equalizer eye monitoring and scanning is included and can be performed on any input channel above 5Gbps.

  • ACCUplace BullsEye /Recognition Grid

    AP-B Series - Applied Image, Inc.

    A unique concept in imaging calibration technology, The ACCUplace Bulls Eye / Recognition Grid allows the end user to calibrate magnification at multiple power levels, as well as test the system’s ability to recognize and locate distinctive shapes within shapes by focusing on the concentric circles.Each Bulls Eye / Recognition Grid target has individual patterns consisting of 5 concentric circles with 0.50mm line width and 0.50mm spacing between circles (10mm Pitch) with a 0.100mm center dot. In addition, each row and column is labeled with X & Y coordinates. The AP-B series is offered on four standard substrates; Chrome on Glass (CG) Opal (OP) Photopaper (RM) and Film (TM).

  • Test Solution

    Eye-BERT MicroX - Spectronix

    The Eye-BERT MicroX is a compact, easy to use test solution offering high performance bit error rate testing at a fraction of the cost of competing solutions.  The unit is offered in two speed grades including the X10 which operates up to 14.5Gbps, and the X30 which extends the data rate to 29Gbps.  Its broad data rate capabilities and long test patterns make this unit suitable for testing nearly all optical SFP, SFP+, and SFP28 transceivers in production with just one unit. The real-time eye opening monitor and eye scanning capability can aid in troubleshooting by providing the operator with additional link quality information.  Other features include Autonomous pattern detection, SFP diagnostic tools, and wavelength tuning (per transceiver capability).  With a click of a button the Eye-BERT MicroX will automatically test an SFP module based on its advertised capabilities and generate a detailed test report complete with manufacturer, part number, serial number, date code, fiber type, link length, speed, and test results.  The Unit is supplied with anti-skid bumpers and is small enough to be integrated into larger systems for dedicated link verification.

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