Showing results: 466 - 480 of 559 items found.
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MI 3102 BT EurotestXE -
Metrel d.d.
MI 3102 BT EurotestXE is a multifunctional measuring instrument which performs a complete set of installation safety tests according to IEC/EN 61557. It supports AUTO SEQUENCE® testing of the TN, TT and IT earthing systems. ISFL measurements and the IMD tests can be performed. Besides, the MI 3102 BT EurotestXE enables on-line voltage monitoring, phase sequence testing, earth resistance measurement, illuminance measurement and TRMS current measurement. EurotestXE is equipped with integrated characteristics of fuses and RCDs for PASS / FAIL evaluation of test results.
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MI 3121 -
Metrel d.d.
The MI 3121 SMARTEC Insulation / Continuity is a tester for dead testing of electrical installations. With both an analogue and digital representation of the results, the instrument ensures accurate measurements up to 2000 Ω on continuity and up to 30 GΩ on insulation function. Configurable limits enable a PASS / FAIL evaluation of test results, which is accompanied with the bright red and green indicator lights for comfortable use even in the dark conditions. The MI 3121 is equipped with a built-in charger and has a magnetic holder in order to free up hands for testing.
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PEM009 -
Pasternack Enterprises, Inc.
The Pasternack / Vubiq 60 GHz development system provides rapid evaluation of Pasternack’s 60 GHz waveguide modules for quick prototyping for millimeter wave wireless system development. This high speed wireless 60 GHz developer kit is created from a partnership between Pasternack and Vubiq (pronounced “View-bik”), an industry expert in designing 60 GHz RF systems. Our 60 GHz wireless development systems make it easy to design new products and applications in the emerging unlicensed millimeter wave ISM V band.
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FLEX BMS -
Bloomy Controls, Inc.
The FLEX BMS™ Validation System is a quick-connecting, highly flexible test system for rapid evaluation of centralized, single-board and distributed battery management systems. Utilizing Bloomy’s industry-leading battery cell simulators, COTS instrumentation, industry-standard connectors, and models that run in real-time, the FLEX BMS™ Validation System can easily be reconfigured to test a wide variety of BMSs. The FLEX BMS™ Validation System is used by national and regional safety and standards labs for certifying the BMS for a wide array of e-mobility products and applications.
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Chroma 11200 -
Chroma Systems Solutions, Inc.
The 11200 Capacitor Leakage Current / IR Meter is mainly used for electrolytic capacitor leakage current testing and aluminum-foil withstand voltage testing (EIAJ RC-2364A). The 11200 can also be used for active voltage checking or leakage current testing of absorber, Zener diode, and Neon lamp etc. With the standard RS232 interface, optional GPIB & Handler interfaces, high speed and stable measurement capabilities, the Chroma 11200 can be used for both component evaluation on the production line and for fundamental leakage current or IR testing for bench top applications.
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CDX-Ⅲ -
Mitech Co., LTD.
magnetic particle flaw detector is the self-designed magnetic participle flaw detector of MITECH CO.,LTD. With small size, light weight, easy operation, multifunction in one unit. The detector can equip A, D, E O four types of probes to realize the functions of magnetic clamp detection, electromagnetic yoke detection, cross magnetic yoke detection, ring detection. It is the necessary detector to do quality control, safety check, life evaluation in the fields of petrol, chemicals, metallurgy, shipbuilding, aviation, railway etc
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DUH-210/DUH-210S -
Shimadzu Corp.
A new evaluation system for measuring the material strength of micro regions, such as semiconductors, LSI, ceramics, hard disks, vapor deposited films, and thin coating layers, not addressed by previous hardness testers. It can also be used to evaluate the hardness of plastics and rubbers. This instrument uniquely measures dynamic indentation depth, not the indentation after the test. This in turn permits measurement of very thin films and surface (treatment) layers that are impossible to measure with conventional methods. Additionally, this same method supplies the data needed to calculate elastic modulus on the test specimens.
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ADSE 715 RS -
ATEQ Aviation
The ADSE 715 is a complete high performance single pressure Ps stand-alone test bench specially designed to be used in the workshop or in the laboratory to test and calibrate all air data equipment such as altimeters, vertical speed indicators, air data computers ) and sensors. The high precision embedded sensors enable the ADSE 715 to be used as a pressure standard. The user interface running on a PC connected through USB link is programmed underWindows and Labview, with a data base managed in a spreadsheet for easy evaluation, management, statistics and presentation.
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DX-201' -
Dexing Magnet Tech. Co., Ltd
This instrument is suitable for measuring non-magnetic stainless steel pipe inner layer accumulation rust. It can use a rechargeable battery, without power supply when test, which is suitable for outdoor environment operation. It can be used 4 hours once charge saturation. This product has been used by Hunan Xiangtan Power Generation Company Limited, Wuhan University, Nanyang Henan Yahekou Power Generation Co., Ltd., Anhui Huainan Pingwei power plants and Changsha thermal power plant, received good evaluations.
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Hanwa Electronic Ind. Co.,Ltd.
◆Automatic operationPerforms automatic destructive evaluation of Lazer-power after zap.After the measurement, the destruction judgment condition can be changed, and it judge again for the acquired data.◆Optical characteristic measurementThe output level of the laser diode (power) is measured by the Photodiode.After zap, it display Optical data displayed(IL), Performs the process of destruction.Settings: slope efficiency, differentiation resistance, and threshold current, etc◆Two kind LDAutomatic settings of two kinds wavelength.◆For variegated deviceThe socket (Jig) is separates. Perform to any device.The P.D. can be changed.Its height can be changed.
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16196D -
Keysight Technologies
The 16196D surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results – reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement – now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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16196C -
Keysight Technologies
The 16196C surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results - reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement - now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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16196B -
Keysight Technologies
The 16196B surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results, reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement. Now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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16196A -
Keysight Technologies
The 16196A surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results - reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement - now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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SEM -
Materials Evaluation and Engineering
JEOL JSM-6610 LV LaboratoryScanning electron microscopy (SEM) uses electrons for imaging to obtain higher magnifications and greater depth of field than light microscopes. The instruments at MEE are capable of variable-pressure, or low vacuum, SEM (VPSEM), as well as traditional high-vacuum conditions for sample observation. VPSEM is a specialized method using a variable-pressure sample chamber that allows direct evaluation of samples that are not readily examined with a traditional high-vacuum SEM. Nonconductive or vacuum sensitive samples that would typically require additional sample preparation can be directly analyzed in VPSEM without the need for additional sample preparation, such as carbon or metallic conductive coatings. This reduces both sample preparation time and distractions in microanalysis. Our laboratory also has a field emission SEM (FESEM) for critical high-magnification work and low-voltage (LVSEM) applications. Each instrument has a spacious sample chamber that can accommodate large and irregularly-shaped specimens and accessories for feature dimensional analysis and chemical microanalysis.
