Dust Test Chambers
simulate windy dusty environments testing UUT performance therein.
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Sand Dust Test Chamber
Guangdong Test EQ Equipment co., Ltd.
Multi-Scenario Simulation: Replicates desert storms, industrial dust ingress, and abrasive wear with programmable wind/sand profiles. Precision Particle Control: Cyclonic dispersion system ensures uniform particle distribution (ISO 12103-2025 certified). Durability: Hard-coated aluminum interior, wear-resistant seals, and self-cleaning filter traps. Smart Monitoring: Real-time particle counter, temperature/humidity logging, and AI-driven failure prediction. Energy Efficiency: Recirculating airflow design reduces energy use by 35% (ENERGY STAR® 2025 compliant).
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Sand and Dust Environmental Test Chamber
Guangdong Bell Experiment Equipment Co.,Ltd
DGBell's Sand and dust test chamber is suitable for all kinds of automotive parts dust-proof, dust resistance test. Test components including automotive lights, instrumentation, electrical cover, switch system, door lock, etc., and test its sealing performance. Besides, it also has view window with illumination.
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Climatic Test Chambers
Dongguan Amade Instruments Technology Co., Ltd
Climatic test chambers are also referred as environmental test chambers, which is the general name of various test chambers that simulate the natural climate environment of raining, high temperature, low temperature, constant temperature, illumination, dewing etc, products including constant temperature chamber, constant humidity chamber, ozone aging test chamber, UV accelerated weathering tester, vacuum hot air oven, salt spray chamber, steam aging tester, rain test chamber, dust proof test chamber, ventilation aging chamber, xenon lamp weathering test chamber and so on.
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Climate Test Chambers
Infinity Machine International Inc.
Climate Test Chambers by Infinity Machine International Inc. - for applications such as dust proof climate test chamber for lighting, dust climate chamber for lab, and more.
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Dust Test Chamber
Sanwood Environmental Chambers Co ., Ltd.
Sand Dust chamber provide an environment to test the exposure of automotive and electronic components to concentrated levels of dust in order to validate product seal integrity.
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Dust Test Chamber
CX-S56B
Shenzhen Chuangxin Instruments Co., Ltd.
Sand and Dust Test Chamber Sand and dust test chamber is designed and manufactured in accordance with the standard requirement of IEC60529.
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Dust Chamber Manufacturer
Wewon Environmental Chambers Co, Ltd.
Wewon Environmental Chambers Co., Ltd. is a good dust chamber manufacturer and made a 3380 liters blowing sand and dust test chamber for a Vietnam customer last week. The controller system of this 3380 liters dust test chamber can be connected to the computer.
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Dust Test Chamber
CX-SC56B
Shenzhen Chuangxin Instruments Co., Ltd.
Sand and dust test chamber is designed and manufactured in accordance with the standard requirement of IEC60529.
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IEC60529 Dust Test Chamber
CX-SC56A
Shenzhen Chuangxin Instruments Co., Ltd.
The test box for low-voltage electrical appliances, motors, instruments, meters, lamps, household appliances and other products, in the storage, transportation and use of the process are often affected by dust and dust environment.
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Sand Test Chambers
Labodam sand and dust test chambers are corrosion resistant equipment that tests the stability, quality, reactivity, and characterists of products against the sand and dust exposed environmental conditions. These test chambers are carefully designed as per the CE and ISO standards and provide rpotection against current leakage, overload, over-current, short circuit, over temperature, motor overheating, and over pressure for safe and precise results.
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Design for Testability (DFT Test)
Corelis can provide you with design consultation and an analysis of your design for boundary-scan testability. We will review your design and make specific recommendations that if implemented will improve the testability. We can also suggest improvements that will increase test coverage and allow boundary-scan to be implemented in a more cost-effective manner.This service also includes a DFT test coverage analysis that we recommend to do after schematic capture and before PCB layout. At this stage of product development, Corelis provides you with a comprehensive test coverage reports that identifies all of the boundary-scan nets and pins and classifies them as completely tested, partially tested, or not tested. The report also recommends where to add test points (pads) for physical “nails” access if additional test coverage is required.
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NI Real-Time Test Cell Reference System
780590-35
VeriStand Full Development License with NI Standard Service , Include 1 Year SSP
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NI Real-Time Test Cell Reference System
778820-35
DIAdem Advanced with DAC Bundle, Perpetual License, Include 1 Year SSP
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6TL23 Off-Line Seat Operation Base Test Platform
H71002300
The 6TL23 is a bare rack for creating Off-Line, modular, flexible and reliable Base test platforms. The overall rack capacity is 18U (580mm depth). The rack is ideal for sit-down operation, since there’s space for the operator’s legs under the fixture receiver.
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Audio and Acoustic Functional Test Solution
With the growing popularity of Internet of Things devices worldwide, many electrical products are adopting voice commands as their user interface. This means that acoustic and audio test challenges are likely to impact more products than ever before. Test teams must meet extended test coverage requirements to ensure product quality while maintaining throughput and operational efficiency. For a solution to meet these sorts of demands, it must:
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Lens Module Test Platform
The Lens Module Test Platform is a flexible solution to deliver the quality that is expected from your brand for all types of lenses and cameras. The system can be configured to measure objective, eyepiece or camera lenses. As the platform can efficiently measure lenses as small as 2 mm3, it is perfect for the critically precise applications of life sciences, consumer electronics, automotive and other industries. With 25+ years of quality experience, the Lens Module Test Platform ensures that all products shipped to market work as intended.
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Bottom Electrode SMD Test Fixture
16197A
The 16197A is designed for impedance evaluations of bottom electrode SMDs. It achieves stable frequency characteristics up to 3 GHz and provides highly repeatable measurements. The Keysight 16197A supports various SMD sizes, as small as 1005 (mm)/0402 (inch) and as large as 3225 (mm)/1210 (inch). Accommodation of the 0603 (mm)/0201 (inch) size is available with option 001.
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TestStand
TestStand is industry-standard test management software that helps test and validation engineers build and deploy automated test systems faster. TestStand includes a ready-to-run test sequence engine that supports multiple test code languages, flexible result reporting, and parallel/multithreaded test.
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Automated Compliance and Device Characterization Tests
N5990A
The Keysight N5990A test automation software platform is the most powerful tool for serial and multi-lane gigabit testing. It is the unique universal platform for testing a wide range of digital buses such as PCI Express, USB, HDMI or MIPI. The same graphical user interface and operating principles are used for all applications. This boosts productivity, especially when testing devices which support multiple digital buses. The N5990A can be tailored to your individual test needs with the flexible test sequenzer and controls all instruments needed for your tests. The configurable database interface of the N5990A test automation platform enables the convenient storage of all test results. A web interface allows an effective and easy operation. Custom calibration and test procedures can be implemented easily with User Programming.
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CDMA2k Analysis Using NI PXI RF Test Instruments
NI-RFmx CDMA2k
NI-RFmx CDMA2k is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development effort.
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In-Circuit Test System
TestStation LX
TestStation LX is a cost-effective in-circuit test solution providing high-volume electronics manufacturers with reliable, high-quality test for the latest printed circuit board assembly technologies.
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Sand And Dust Test Chambers
Dongguan Amade Instruments Technology Co., Ltd
Sand and dust test chamber is also referred as dust-proof chamber, which is able to simulate the sand storm by putting the test piece in the chamber to judge the damage of sand-and-dust weather to products. Equipment is mainly applicable to determination of sealing performance of product shells based on the IPX5 and IPX6 degrees. Testing machine features a flow of air carrying dust in a vertical circulation, resulting in cycle use of sand during the test. Sand and dust testing has great significance to master the specimen’s performance to defend the penetration of dust particles, to withstand the abrasion of sands.
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Modular Functional Test Platform
LX-OTP2
The OTP² system platform has recently been available in both the PXI and LXI versions. The OTP2 system platform enables the cost-effective and fast implementation of function test systems based on defined modules and function blocks. Thanks to the open system interfaces, customer-specific adjustments can be made at any time without any problems. When considering options for your next generation functional test system, it is important to assess the entire life cycle of the system and the associated costs and efforts. Use OTP² to accelerate development cycles and reduce the development effort for new functional test systems.
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Imperial Test Executive
ITE
The Imperial Test Executive (iTE) is a UI shell that sits on top of National Instruments TestStand. It provides a simple but elegant interface to execute your NI TestStand sequences. The iTE software was designed to allow general operators to execute ATE testing software without requiring any knowledge of NI TestStand. Training an operator to use this system typically takes less then 5-minutes.
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Test System for Detecting Exact PCB Short Circuit Locations
QT25
Qmax Test Technologies Pvt. Ltd.
QT25 employs a unique method to detect exact PCB shorts circuit locations and pin down the shorted components and tracks. It is designed in such a manner that it precisely detects exact short circuit locations across VCC - GND or a shorted component connected across a Bus or hair-line shorts between PCB tracks, Which is highly impossible to detect using conventional tools especially when they are connected parallel in circuit. It can also be used in measuring the contact resistance of switches and relays in its milli-ohm mode as a value add.
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ARINC 818 Tester
iWave 3U VPX High-Speed Video/Data Processing Card is a rugged standalone module in the 3U VPX form factor, aimed for the high-speed data, video processing, and display applications is ideal for military, defense, and aerospace applications requiring an optimal balance of performance and power efficiency. iWave 3U VPX High-Speed Video/Data Processing Card is implemented using Xilinx Kintex-7 device architecture and has I/O interfaces including High speed 16 channels of transceiver interfaces capable of operating up to 6 Gbps data rate, Gigabit Ethernet, RS232, RS422, PCIe interface, Built-in health monitoring circuits, HDMI input, and output interfaces
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H(3)TRB & HTGB Test Systems
SET offers two H(3)TRB and HTGB product lines which differ in the number of test object channels and the range of technical possibilities. The innovative systems are scalable, modular and standardized.
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VLSI Test System
3380D
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (256 I/O pins to test 256 ICs in parallel) that can meet the upcoming higher IC testing demands.
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Regenerative Battery Pack Test System
17020E
Charge/discharge modes (CC, CV, CP)Power Range: 10kW / 20kW per channelVoltage Range: 60V/ 100VCurrent Range: 100A/200A/300A/400A/ 500A/600A/700A/800A per channelRegenerative battery energy discharge, efficiency 85%Channels paralleled for higher currentsDriving cycle simulationFast current conversion without current interruptHigh precision measurementSmooth current without over shootTest data analysis functionData recovery protection (after power failure)Independent protection of multi-channel
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High Temperature Component Test Fixture
16194A
Measure both axial/radial leaded devices and SMD within the temperature range from -55 to +200°C.
