Showing results 1 - 15 of 197 products found.
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Yelo Ltd.
Life-tests consist of the highly accelerated ageing, under controlled conditions, of a group of lasers taken as a representative sample. Optical degradation of the laser diodes is observed and recorded by precisely measuring changes in the laser's operating characteristics during the test. Life-tests are used for vendor qualification of the laser diodes during product development and can be conducted throughout the production life of the laser.
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FTI 3000 - Focused Test, Inc.
CURRENT CONTROL boards to provide the precise amount of Ir to each diode string during the burn-in periods. MEASURE boards to monitor the diode Vf during the measure periods. External Power Sources to power the diode strings.
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King Design Industrial Co., Ltd.
1. Power: the heating board control panel uses 220V single-phase power.2. Power consumption: 1.0KVA, 1000W(Max)3. Volt: 220VAC4. Current: 4.5A5. Heating board: one controller per board6. Power rate: room temperature raise to 75°C± 5°C within one minute.7. Heating board dimension: 500mm x 1,000mm8. 6-sheet electrical heating boards test: used to test the 2,200mm x 2,600mm module. It can be customer-designed.9. The length of board power cable and thermal sensor cable shall exceed 3,000mm.10. To get uniform heating effect, the electrical board is sandwiched by 2mm aluminum sheets at both sides of board.
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LRS-9550 - Newport Corporation
OverviewLiterature & DownloadsReduce your cost of test with the LRS-9550 high power laser diode life test and burn in system. With up to eight independent temperature controlled shelves supporting up to 512 high power devices per system, you will be able to run multiple independent tests, increase throughput, and lower your cost of test.
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QT-4000 Series - PowerTECH Co,Ltd.
Discrete device test system is developed for Transistor Diode Zener diode MOS-FET J-FET Current Sence FET IGBT LDO(78XX 79XX Tl431 TL432 regular test) and 4 pin Photoelectric Coupler Wafer etc.
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KM 6060 - KUSAM-MECO
Diode Test, hFE Test, Continuity Test, Data Hold, Backlight Display & Duty Cycle.* Overload Protection in all Ranges.
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WeiMin Industrial Co., Ltd.
LASER DIODE TESTER LD-607 Basic Functions LIV curve test. LD horizontal and vertical test. LD Spectrum test
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METRAHIT Series - GMC-I Messtechnik GmbH
All multimeters measurevoltage, resistance, frequency, continuity and diode test.
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QT-3000 Series - PowerTECH Co,Ltd.
Developed for thermal resistance test of Transistor MOSFET IGBT DIODE.
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F705/707 - Fine Instruments Corp.
For measuring voltage, resistance, capacitance, temperature & diode test in electronics & electric.
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Yelo Ltd.
Laser reliability testing consists of a series of tests that laser diodes can be put under in order to ensure their reliability for post-production use. There are different types of tests that can be carried out and there are multiple measurements that can be taken in order to evaluate the reliability of the device. One of these tests is laser diode burn-in.
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JT-820 - Rinch Industrial Co.,Limited
3 1/2 digital Automotive meter. Maximum Display:1999. Continuity test. Diode test. Weight: 180g(with battery)
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Skyworks Solutions, Inc.
Skyworks diode product offering includes PIN, limiter, Schottky, and varactor diodes for a wide variety of microwave applications including WLAN, infrastructure, handset, Satcom, automotive, military, aerospace and defense, test & measurement, metering, medical and RDID.
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Thermal Engineering Associates, Inc.
Thermal test system combines the test and measurement capability of dedicated instruments with the ease of operation and data collecting capability offered by graphical-user-interface-driven software operating on an integrated computer.Diodes (PN, Schottky, LED, varactor, PIN), Stacked Diodes (Hi-V Rectifiers & LEDs), Laser Diodes, Transistors (Bipolar, MOSFET, IGBT) & Diodes, Integrated Circuits (Application & Thermal Test Die).
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FT4310 - HIOKI E.E. Corp
Hioki is pleased to announce the launch of the Bypass Diode Tester FT4310 for Photovoltaic Systems. The FT4310, which is designed to test bypass diodes in strings of crystalline photovoltaic cells, can be used to detect open and short-circuit faults in bypass diodes by string either in daylight or at night. The instrument is the first portable device capable of detecting bypass diode open faults in operating panels (without requiring the panels to be shielded from sunlight).
