Showing recent results 1 - 15 of 209 products found.
-
TRd, TRs, TRds equipment family - LEMSYS
The equipment is designed to test IGBTs, MOSFETs and free wheeling Diodes from single chip to complex power modules and IPMs.
-
Newport Corporation
ILX Lightwave offers laser diode test systems for lifetime reliability tests and production burn-in. The systems incorporate ILX Lightwave's proven technology for laser diode control, temperature control, and optical measurement to provide the precision and reliability required for manufacturing, engineering evaluation, and R&D applications. Each system is custom designed to fit your laser package's requirements. Please view our Laser Diode Test System Overview for more information.
-
Yelo Ltd.
Life-tests consist of the highly accelerated ageing, under controlled conditions, of a group of lasers taken as a representative sample. Optical degradation of the laser diodes is observed and recorded by precisely measuring changes in the laser's operating characteristics during the test. Life-tests are used for vendor qualification of the laser diodes during product development and can be conducted throughout the production life of the laser.
-
FTI 3000 - Focused Test, Inc.
CURRENT CONTROL boards to provide the precise amount of Ir to each diode string during the burn-in periods. MEASURE boards to monitor the diode Vf during the measure periods. External Power Sources to power the diode strings.
-
King Design Industrial Co., Ltd.
* Power: the heating board control panel uses 220V single-phase power.* Power consumption: 1.0KVA, 1000W(Max)* Volt: 220VAC* Current: 4.5A* Heating board: one controller per board* Power rate: room temperature raise to 75°C± 5°C within one minute.* Heating board dimension: 500mm x 1,000mm* 6-sheet electrical heating boards test: used to test the 2,200mm x 2,600mm module. It can be customer-designed.* The length of board power cable and thermal sensor cable shall exceed 3,000mm.* To get uniform heating effect, the electrical board is sandwiched by 2mm aluminum sheets at both sides of board.
-
36XX - FETservice, Inc
Two test stations on the 3600E and 3601E systems. Performs DC, AC, and pulsed tests. Excels at evaluating difficult to measure parameters on zeners, current limiters, varactor tuning diodes and darlingtons. 24 bin opto-isolated handler/prober interface. Parallel first-in first out computer to tester interface for maximum throughput. Parallel testing with a 3602E or 3603E allows shared test execution for extremely high throughput applications when interfaced to high speed handlers with multiple test sites.
-
Thermal Engineering Associates, Inc.
Thermal test system combines the test and measurement capability of dedicated instruments with the ease of operation and data collecting capability offered by graphical-user-interface-driven software operating on an integrated computer.Diodes (PN, Schottky, LED, varactor, PIN), Stacked Diodes (Hi-V Rectifiers & LEDs), Laser Diodes, Transistors (Bipolar, MOSFET, IGBT) & Diodes, Integrated Circuits (Application & Thermal Test Die).
-
Yelo Ltd.
Laser reliability testing consists of a series of tests that laser diodes can be put under in order to ensure their reliability for post-production use. There are different types of tests that can be carried out and there are multiple measurements that can be taken in order to evaluate the reliability of the device. One of these tests is laser diode burn-in.
-
QT-4000 Series - PowerTECH Co,Ltd.
Discrete device test system is developed for Transistor Diode Zener diode MOS-FET J-FET Current Sence FET IGBT LDO(78XX 79XX Tl431 TL432 regular test) and 4 pin Photoelectric Coupler Wafer etc.
-
QT-3000 Series - PowerTECH Co,Ltd.
Developed for thermal resistance test of Transistor MOSFET IGBT DIODE.
-
METRAHIT Series - GMC-I Messtechnik GmbH
All multimeters measurevoltage, resistance, frequency, continuity and diode test.
-
FT4310 - HIOKI E.E. Corp
Hioki is pleased to announce the launch of the Bypass Diode Tester FT4310 for Photovoltaic Systems. The FT4310, which is designed to test bypass diodes in strings of crystalline photovoltaic cells, can be used to detect open and short-circuit faults in bypass diodes by string either in daylight or at night. The instrument is the first portable device capable of detecting bypass diode open faults in operating panels (without requiring the panels to be shielded from sunlight).
-
WeiMin Industrial Co., Ltd.
LASER DIODE TESTER LD-607 Basic Functions LIV curve test. LD horizontal and vertical test. LD Spectrum test
-
JT-820 - Rinch Industrial Co.,Limited
3 1/2 digital Automotive meter. Maximum Display:1999. Continuity test. Diode test. Weight: 180g(with battery)
-
Yelo Ltd.
A light-current-voltage (LIV) test is one of the essential tests that a laser diode must go through to ensure its reliability for post production use. This test will help to verify the operating characteristics of your laser device. The test works by driving current to your laser diode and measuring the resulting voltage and light output. The results are then plotted into a graph, which is known as an “LIV curve”.
