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Desktop Tunable Laser Source
UC8110
The UC8110 desktop tunable lasers offer superior performance for the test of DWDM components, AWG & PLC components, optical amplifiers, DWDM system and other general purpose of fiber optical test and measurement applications. It is a wavelength high accuracy, high power output, small dimension, fast startup, affordable tunable laser source system. UC INSTRUMENTS provides C band, L band, or C+L band tunable laser sources options.
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Plugbord
3797-2
VECTOR Electronics and Technology, Inc.
30 Gold plated edge contacts (15 each side) on 0.156"(3.96mm) centers. 3-Hole solder pads for interconnecting multiple component leads. All pad and bus surfaces solder coated for user convenience. No pattern on reverse side, edge contacts only.Convenient easy-to-read hole marking legend on wiring side.
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C/C++ Embedded Software Test Solution
VectorCAST/C++
An integrated software test solution that significantly reduces the time, effort, and cost associated with testing C/C++ software components necessary for validating safety- and mission-critical embedded systems.
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Electronic Components Test
Parameters to be measured (absolute value): Measure hypo-class U, Iout, Hz, Hc, Br, Bm, Hm, Br /Bm, m, magnetic core loss, B-H curve, U curve and I curve Output capacity of the high frequency power: Uout: 1~300V, Iout: 0.05~5A, Pout: 300VA, frequency: 10~300kHz Accuracy: 2% With 12-bit high-speed A/D, sampling rate up to 40MHz, ensuring data precise and stable test result Supermaximal database, suitable for almost all kinds of magnetic material in market, such as: circle, E ,U , ETD-EER, JAR, RM , EP , PM , EL , ER, PQ, EFD, plane E, etc Perfect software interface enables observation of curve in detail Meet international test requirements for magnetic particle ASTM E1444, ASTM E709-08.
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PFC Controllers
Renesas' power factor correction (PFC) controller family uses boost topology and are suitable for AC/DC power systems, up to 2kW and over the universal line input. These PFC controller IC's operate in continuous conduction mode (CCM), and the small external components result in a low cost design without sacrificing performance.
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Capacitance Tester
LCR55A
The ultimate electronic component verifier measures inductance, capacitance, resistance, transistors, diodes and microwave diodes.
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Compact & Robust Tunable Laser
WSL-110
Designed for use in fiber optic transmission testing, our WSL-110 can also be used for DWDM component evaluation and coherent communications testing. The WSL-110 features grid tuning and gridless tuning options, allowing any wavelength to be accessed.
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50MHz Arbitrary Waveform/ Function Generator
Model 645
Berkeley Nucleonics Corporation
The BNC Model 645 50MHz Function/Arbitrary Waveform Generator delivers many advanced features and user modes than our previous models, with a price that is designed to meet tough economic constraints. New DDS+ technology embraces advancements in the semiconductor industry and leverages state-of-the-art components for both standard and complex functions. The resulting design is a box for every bench, far more capable than the ARBs and Function Generators of the past. We have even incorporated IP support, so a web browser can control the instrument over LAN.
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IEEE-488 GPIB Device Interface IC (Chip) for the PCI-Bus
GPIB-72120
The i72120 GPIB-Chip is the ideal solution to implement a IEEE488.2 GPIB interface for next generation PCI based instruments. The GPIB-ASIC is designed to meet all of the functional requirements for talker and listener (TL) devices as specified by the IEEE Standards 488.1-1987 and 488.2-1987. Connected between the PCI bus and the GPIB, this GPIB-IC provides high-level management of the GPIB to unburden the processor and to simplify both hardware and software design. The i72120 is fully compatible with the PCI specification and requires only the addition of bus driver/receiver components to implement a talker/listener GPIB interface.
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Component Test Fixture For N1413 With B2980 Series
N1428A
The N1428A is designed to operate specifically with the B2985B / 87B electrometer / high resistance meter. It is provided with two component modules, which are used to hold SMD, lead, and various types of devices. Electrical noise effects are reduced by the employment of a shielded case. A built-in interlock circuit enables safe high-voltage measurements. The N1413A high resistance meter fixture adapter is also required to connect the N1428A to the B2985B / 87B.
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3-Axis Ultrasonic Anemometer
HD2003
HD2003 is a 3-axis static anemometer for measuring wind speed and direction, U-V-W cartesian components of speed, wind gust, sound speed, sonic temperature, air temperature, relative humidity and barometric pressure.
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Ultra-thin Mass Flow Controller
DZ-100
The DZ-100 inherits the same CRITERION™ technology—a differential pressure detection system for laminar viscous flow ranges—used on HORIBA STEC’s MFC, the D500. This innovative technology controls the mass flow of various gases with high precision. As with the D500, the user-configurable DZ-100 supports multi-range and multi-gas applications. The compact design of the MFC reduces the internal volume of the internal gas flow path, and the optimized control algorithm improves response characterist...show more -
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Cable Electric Resistance Tester
MR 270 C-A
The MR270C-A is specially designed for electric resistance measurements in cable industry applications and inductive loads (transformers, motors). It is perfectly fit both for measuring the meter resistance in connection with a corresponding resistance measurement holding device or for final acceptance control of power cable reels. In the case of cable reels, which often have a cable length of several kilometers, both the compensation of the inductive component and the ability to perform measurements in the presence of high noise levels are important. This also applies to the winding resistance of transformers and motors.
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PXI Vector Component Analyzer, 100 kHz to 44 GHz
M9817AS
The PXI vector component analyzer enables complex multiport device characterization with continuous wave and modulated signal measurements.
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Ultra High Speed Pick & Place
MC889
The MC889 is specially designed for the fast and highly precise loading of large batch sizes. This pick and place machine is equipped with an optical centering, "Vision on the Fly" system that guarantees the best possible measurement of SMD components (such as 0201, SOIC, PLCC, BGA, µBGA, CSP & QFP, as well as odd-shaped components) while completing placement at rates of 20,000 CPH.
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FAult Detector and OScilloscope 7 Functions in 1 Device
FADOS7F1
Prot-Ar-Ge Industrial Project Design R&D Ltd. Co.
Usage of FADOS7F1: Determining faults of all types of electronic cards such as electronic cards of medical devices, textile and any other machines; automobile electronics; computer, monitor, TV, etc. Electronic Components Test: IC, transistor, FET, IGBT, resistor, capacitor, indicator, ect. This device is used to determine the faults at all these electronic components.
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CT-ALPHA Nanotube
One main component of the system is Excillum’s high performance X‑ray source NanoTube N2, a up to 110 kV X‑ray tube with latest tungsten-diamond transmission target technology, automatic e‑beam focusing and astigmatism correction, ensuring that the smallest possible, truly round X‑ray spot is achieved.
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ThermalAir Series Temperature Forcing System
ThermalAir TA-1000B Rack Mount Test System
The ThermalAir TA-1000B high capacity thermal air stream system is used for temperature testing, fast thermal cycling, and device temperature characterization of components, hybrids, modules, PCBs, and other electronic and non-electronic assemblies at precise temperature from -25°C to +200°C.
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Adjustable Test Stab Set
The ETI adjustable test stab set may be used with your high-current circuit breaker testers to maximize efficiency and convenience for testing multiple breakers. Our stab system allows your technicians to test breakers in-place and avoid jacking breakers up or down for testing. By combining mobility and flexibility into one simple system, this stab set is a proven improvement over conventional designs. The components in the adjustable stab set are made of 120 pounds of 110 copper.
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PXIe-5451, 145 MHz, 16-Bit, 512 MB, PXI Waveform Generator
781204-02
PXIe, 145 MHz, 16-Bit, 512 MB, PXI Waveform Generator—The PXIe‑5451 is a 145 MHz, dual‐channel arbitrary waveform generator capable of generating user-definied waveforms, standard functions, and I/Q communications signals. It is an ideal instrument for including in systems for testing devices with I/Q inputs, or as the baseband component of an RF vector signal generator as wells as time-domain signals like envelope tracking. The PXIe‑5451 also features onboard signal processing (OSP) functions t...show more -
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Multi Output Regulated DC Power Supply
LQ6324T
- Low cost general purpose laboratory bench unit.- Fully protected against overload and short circuit.- Three independent outputs electrically isolated from each other.- 5V/5A with over voltage crowbar protection for digital ICs.- Electrically floating outputs up to 500V DC w.r.t. ground.- Compact modular construction.- Precise regulation, low ripple and noise for both constant voltage and constant current operation.- Quality components and conservating ratings for high reliability and long life.
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PRECISION COMPONENT ANALYZER
6400 SERIES
The 6430B and 6440B Precision Component Analyzers provide thorough and accurate testing of any passive component to high resolution. In particular, for capacitor manufacturers, the instruments provide capabilities for both fast automatic production testing and complete design characterisation. Users include designers of passive components, manufacturing test, designing and testing materials as well as circuit designers who are evaluating component characteristics.
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Test Software
ATI
The ATI Test System Software and its utilities are built on a core of mature, object-oriented software components that have been thoroughly field tested and refined over many years. All of ATI's systems share a common core functionality and an easy to use program interface. Our highly skilled software and engineering experts are able to integrate nearly any OEM test or embedded systems equipment into the test system's design whether it's standard or proprietary.
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Power Supplies
CT-450
The CT series has a dual smart fan system that provides the fastest cooling system while maintaining a low noise level. The fans are installed in the front and rear of the power supply for maximum cooling efficiency. The CT series have all the necessary connectors to power all your devices and components. And it is PCI-E ready.
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Power Metering Precision Shunt Resistore
PMS
These components have E-Beam welded manganese-copper alloy elements giving high strength, stability and reliability. Low thermal EMF and TCR. Small size and minimal power loss. Minimal heat generation and surface temperature due to small total resistance. Proprietary processing technique allows very low resistance values. Ideally suited for KWh meters and sampling sensor shunts. These units are also suitable for custom design.
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Power Sensors
RTP5518
Providing the highest video bandwidth and fastest rise times, the 50 MHz to 18 GHz Power Sensor by Boonton is the ideal instrument for fast, accurate and reliable RF power measurements. This module is ideal for many different applications including Crest Factor and Peak to Average Power Ratio (PAPR) measurements for Power Amplifiers and RF components; Telecommunication & Satellite signals: W-CDMA, QAM, OFDM, LTE-FDD and LTE-TDD; WiFi signals: 802.11ac and legacy 802.11 a/g/n/b; RF and Microw...show more -
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SMD Array Type LCR Test Fixture
16034H
The 16034H is designed for impedance evaluations of array-type SMD.The minimum SMD size that this fixture is adapted to evaluate is 1.6(L)x0.8(W)[mm]. Since the tip of the measurement electrodes are very thin and the device holder is extremely flat, the device can be shifted and the measurement electrodes can contact each of the elements of the array-type component.
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Capacitor Leakage Current/IR Meter
Chroma 11200
Chroma Systems Solutions, Inc.
The 11200 Capacitor Leakage Current / IR Meter is mainly used for electrolytic capacitor leakage current testing and aluminum-foil withstand voltage testing (EIAJ RC-2364A). The 11200 can also be used for active voltage checking or leakage current testing of absorber, Zener diode, and Neon lamp etc. With the standard RS232 interface, optional GPIB & Handler interfaces, high speed and stable measurement capabilities, the Chroma 11200 can be used for both component evaluation on the production line and for fundamental leakage current or IR testing for bench top applications.
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Gas Generators
HPLC is an analytical method used to separate the components in a mixture, to identify each component, and to quantify each component. It relies on pumps to pass a pressurized liquid solvent containing the sample mixture through a column filled with a solid adsorbent material. Each component in the sample interacts slightly differently with the adsorbent material, causing different flow rates for the different components and leading to the separation of the components as they flow out the column.
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8 Series Optical Clock Recovery
The 8 Series Optical Clock Recovery is a fast, flexible and reliable instrument for assisting in the validation of current and future optical designs. With all the applicable standard rates in the 26 and 53 GBd data rate ranges – no options required – the TCR801 Optical Clock Recovery is a crucial component for any bench or rack aimed at verifying the latest high-speed optical standards. Featuring quick lock capabilities and a sensitive front end for low power signals, this instrument simplifies the challenges associated with today’s optical testing.
