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Bit Error Rate Tester - MATRIQ
The BERT is 2 or 4-channel PPG and Error Detector for the design, characterization and production of optical transceivers and opto-electrical components at data rates up to 30 Gb/s.With scalability and exceptional signal fidelity, it is a cost effective test solution for 400 Gb/s communication eco-systems.
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Chassis Dynanometer for Motorcycle
•Adopted FAMS-R5 system for motorcycle chassis dynamometer•Gas emission test, durability test, performance test, and environmental test are applicable to various vehicles (motorcycle, tricycle,ATV).•Newly designed measurement unit in a test room makes measurement easier.•Reduction of initial cost, space saving, and less maintenance items by lineup of electric inertia type chassis dynamometer that can be used for small to large vehicles.•Components necessary for emission test are included, such a...show more -
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HVAC/R Environmental Meter
FLIR EM54
The FLIR EM54 is ideal for inspecting and troubleshooting HVAC/R ducting systems within residential, commercial, and industrial facilities. This meter can help you verify that duct inlets and outlets have the specified volumetric flow – a prerequisite to an efficient functional system. Featuring humidity, wet bulb, and dew point functions, the EM54 can measure deviations from proper relative humidity levels. Plus, the included Type-K contact temperature probe is useful to check electric motors and thermal equipment components for proper operating temperatures.
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Sand and Dust Environmental Test Chamber
Guangdong Bell Experiment Equipment Co.,Ltd
DGBell's Sand and dust test chamber is suitable for all kinds of automotive parts dust-proof, dust resistance test. Test components including automotive lights, instrumentation, electrical cover, switch system, door lock, etc., and test its sealing performance. Besides, it also has view window with illumination.
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Control Center
COSYMA
COSYMA is the control centre for APCOS®4000, consisting of a comprehensive and versatile application software that includes the following components:*Communications Network Control (CNC)*Radio & Device Control (RDC)*Secure Automatic Military Message Handling System (SAMMS)
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Nano Spotter For MALDI-TOF MS
AccuSpot
Bringing LC to MALDI Technology LC/MS/MS is often regarded as the technique of choice in identifying components from complex mixtures; however, it is not without its limitations. An alternative approach is to consider LC/MALDI.
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BMS Transformers
In large battery pack applications with daisy chain connections, the number of cells connected in series is very high, and the large voltage differences demand component-to-component isolation. The serial communication links between boards need to be isolated by transformer coupling circuits instead of capacitor coupling.
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Verification IP's
SmartDV Technologies India Private Limited
We develop Verification Components, leveraging our rich experience in ASIC / SoC design verification and capabilities on high-level verification languages (HVLs). Our verification components are configurable, reusable plug-and-play verification solutions for standard interfaces based on HVL. We currently support SystemVerilog, Vera, SystemC, Specman E and Verilog. All our VIP''s are supported natively in SystemVerilog VMM, RVM, AVM, OVM, UVM, Verilog, SystemC, VERA, Specman E and non-standard verification env.
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Photonic Application Suite
N7700A
The N7700A Photonic Application Suite is a collection of advanced and basic software tools for making optical measurements, controlling fiber optic instruments, and analyzing measurement results. Many components are free and some can be licensed.
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Optical Profiler
DRK8090
Shandong Drick Instruments Co., Ltd.
This instrument uses noncontact, optical phase shift interferometry method does not damage the surface when measuring graphics can be quickly measured by a variety of three dimensional surface morphology, and analyzed to calculate the measurement results. Suitable for measuring a variety of blocks, the surface roughness of optical components; scale, dial the groove depth; magnetic (optical) disk, the head surface texture measurements; structural morphology of coating thickness and coating trough structure at the boundary of the grating; silicon surface roughness measurement and the graph structure and so on.
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EXG X-Series RF Analog Signal Generator, 9 kHz to 6 GHz
N5171B
Achieve faster throughput and greater uptime with the cost-effective performance optimized for manufacturing testPerform basic parametric testing of components and functional verification of receivers with industry-leading output powerThoroughly verify receiver performance by simulating complex analog modulation scenarios with multi-function generator capabilityMinimize downtime and expenses with self-maintenance solutions and low-cost repairs
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Broadband Amplifiers
Pasternack broadband amplifier is rated at 1 Watt (30 dBm) Psat and 1.67:1 input VSWR maximum. Our broad band radio frequency amp is part of over 40,000 RF, microwave and millimeter wave components available from Pasternack. This coaxial broadband amplifier can ship worldwide the same day of the purchase as with our other available RF parts.
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Production Spin Testing & Balancing Services
Test Devices provides production spin testing and balancing services of production parts for customers with a repetitive need and who demand schedule predictability along with a quick turn-around time. Whether proof testing critical rotating components before shipment, pre-spinning to achieve required rotational growth prior to finish machining or simplifying the supply chain by consolidating pre-spin with rough machining and/or NDT inspection, Test Devices offers a full range of spin testing solutions.
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Walk-In Temperature & Humidity Test Chamber
Weiber walk in humidity test chambers are conceptualized and designed to create test chambers to study and contemplate the effects of different environmental parameters such as humidity, temperature applications tests involving micro-organisms, plants, tissues, electronic components etc. apart from various customized industrial and research applications. Our humidity test chambers have a variety of usage in R and D laboratories, research studies and product testing facilities across the globe. A...show more -
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Brake Test Systems
Giant 8000 Series
Customer perception of vehicle quality is closely related to the NVH behaviour of the vehicle. With the HORIBA ATS Brake testing system, NVH relevant design features are analyzed and various metrics stored in the database of the automation system. For friction borne vehicle NVH problems coming from the brake and its components the GIANT 8000 Series is the ideal tool to resolve it. The GIANT 8000 Series is superior NVH test system providing you with the best testing conditions for all types of ve...show more -
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Logarithmic Amplifiers
Pasternack Logarithmic amplifier category includes a wide range of log amp components. Log amplifier products in this logarithmic amp category are built to precise RF and microwave industry specifications. Logarithmic amplifiers, like the other over 40,000 RF, microwave and millimeter wave components at Pasternack are in-stock. Not only are these logarithmic amp components in stock, they also ship the same day.
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UV Test Chamber
Wewon Environmental Chambers Co, Ltd.
* UV test chamber simulates damaging effects of long term outdoor exposure of materials and coatings by exposing test samples to varying conditions of the most aggressive components of weathering – ultraviolet radiation, moisture and heat. * UV test chamber use fluorescent lamps to provide a radiation spectrum centered in the ultraviolet wavelengths. Moisture is provided by forced condensation, and temperature is controlled by heaters. Based on your testing sample’s size, We has two options uv test chambers for choice.
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Digital In-Circuit tester
MTS180/300
Analog in-circuit inspection and function inspection are realized on this inspection equipment. IC pin float function is standard equipment. The MTS180 is a press type jig, and the MTS300 is a vacuum type jig. In the board mounting process at the production site, electrical inspection is performed on the mounted board after component mounting, and non-defective or defective products are automatically judged. The main inspection contents are short / open inspection, analog inspection of resistors, capacitors, coils, diodes, etc., lead floating voltage measurement of QFP and BGA, Digital IC inspection, frequency measurement.
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Basic 3U VPX-to-PCI Express (PCIe/PCI-e) Adapter
8462
The Technobox, Inc. P/N 8462 is a 3U VPX-to-PCI Express (PCIe) adapter that provides a convenient and cost-effective means for developing 3U VPX boards in a personal computer environment. It can also be used for production testing of 3U VPX boards. The adapter is a half-length PCIe card with the VPX card under test mounted close to the PCIe edge fingers to minimize signal lengths. When seated in a PC motherboard, the VPX card primary side faces upward to allow convenient access to components.
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MSX® Thermal Camera
FLIR TG165-X
The FLIR TG165-X helps you visualize the hot and cold spots that can indicate electrical faults, mechanical break-downs, or air and water leaks. This all-in-one, non-contact measurement and imaging tool displays temperature anomalies on screen, allowing you to inspect efficiently and pinpoint the source of problems faster than with a single-spot IR thermometer. See components clearly and even read labels thanks to FLIR patented MSX image enhancement, which adds visual details to full thermal ima...show more -
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Fully-automated Test Systems
Special mechanical systems/solutions
Foerster Instruments, Incorporated
Alongside individual test instruments, we collaborate closely with our customers to develop and produce customized test systems for their application. Following a consultation with our product and sales specialists, we develop a concept to suit you. For the production process that follows, we enter into product-specific collaborations with professional mechanical system manufacturers to achieve the best possible solution. We are also happy to work with mechanical system suppliers proposed by our...show more -
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LCR Meter
Hantek1832C/Hantek1833C
Qingdao Hantek Electronic Co., Ltd.
Hantek1832C/Hantek1833C handheld LCR Meter is a portable handheld measuring instrument to measure the parameters of the component such as inductance, capacitance, resistance and so on.small volume, powered by 5V lithium battery, it can meet the requirements of desktop LCR application, and can also be applied to flow measurement and handheld measurement.
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Diagnostic Cores
Diagnostic VersaCore™
The diagnostic cores are uniquely designed in the VC20™ with Advanced Cantilever™ technology format. Using the customizable PCB, components can be added to create a “golden core” to quickly troubleshoot your system*Test SMUs*Test Motherboard*Test Pogo pins*Test Relay matrix
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Standard VXI Module Shield Kits With Address Switch Opening
* Single-slot kit fits all VXI-1 Revision 1.0 to Revision 3.0 chassis.* Clamshell design fits C-size modules with 96-pin connectors.* Side shields include connector shrouds for maximum shielding.* RFI limiting, air vent slots along top and bottom edges for good air circulation thru the module.* Extruded front panel is bend resistant.* Address switch opening on component side shield.* Complimentary layout support includes PCB design template and CAD layout files.
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Small Test Boxes
In today’s environment a small specific test box may be needed to test a component, perform R&D or simply tweak your product. Cuming Lehman Chambers has the ability to custom design and construct a precise test box to meet your specific needs.
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AMIDA 3001XP Tester
AMIDA has introduced two new analog/mixed-signal and logic options in the AMIDA-3000 series in recent years—the AMIDA-3001XP and AMIDA-3KS test systems. Both reinforce the AMIDA-3000 series' ability to provide cost-optimized test solutions for a variety of consumer components in power management and mobile device components. The AMIDA-3000 series provides more than twice the number of analog channels of its modules per test system, thus greatly reducing the acquisition cost of each channel and m...show more -
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Failure Analysis
Failure Analysis (FA) plays a crucial role in the production of semiconductors. It provides process and design feedback to determine the root cause of any failures. Time-to-data for the FA Engineer is a critical measurement and SemiProbe’s Probe System for Life ® (PS4L) is ideally suited to excel in this application. All key components are interchangeable, making it easy to switch between individual die, wafers, and packaged parts.
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SPM Monitor
CS-150
The CS-150 is a high-precision chemical concentration monitor designed for use with the SPM solutions used in semiconductor-manufacturing cleaning processes. Featuring fast response and a compact size, the CS-150 continually monitors the concentrations of the various components of the SPM solutions (H2SO4/H2O2/H2O) used to remove metal ions and organic substances. Feedback control based on the monitor output is used to keep the concentrations of the SPM solutions within the allowable ranges and ...show more -
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Brushless Resolvers
Computer Conversions Corporation
Computer Conversions GT transducers are brushless, Electromagnetic, Rotary Sensors used to provide Precise Absolute or Incremental Position, and Velocity feedback in harsh environments. All Computer Conversions Transducers are continuous rotation, bi-directional, and electronically passive devices (no electronic components to degrade or fail), that require zero maintenance, and may be installed in virtually inaccessible locations.
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LCR Component Meter with Component Impedance Measurement
LCR45
The new LCR45 does everything that the popular LCR40 does, but we've added some significant enhancements. The LCR45 features a new high capacity micro and high resolution ADCs.*Fluid measurements of L, C and R (continuous readings with selectable hold function).*Fine resolution for improved performance at low inductance/capacitance/resistance.*Auto and Manual component type.*Auto and Manual test frequency.*Frequencies: DC, 1kHz, 15kHz and 200kHz.*Display of component values, complex impedance, complex admittance and magnitude/phase.
