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Kelvin Test Contactor
cCruiser
cCruiser™ Kelvin contactor was designed with cost of test optimization in mind, boasting a cantilever design that allows the testing of challenging discrete ICs and small logic package types. Providing a best-in-class proven lifespan of up to 5 million touchdowns increasing handler uptime. cCruiser reduces the cost of test for customers significantly, lasting longer and testing longer than previous contact solutions.cCruiser is the versatile solution for testing small discrete ICs. Its side-by-s...show more -
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Cable/Harness Test System with Rack-Mounted Switching
CKT1175-20
The CKT1175-20 is a high-voltage wiring analysis system that features rack-mounted switching matrices. This system is expandable in 100 test point increments to 96,000 test points, and available with a wide variety of adapter cable interface connectors, with the standard interface being the CKT MAC interface system.
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Semiconductor Automatic Test
Qmax Test Technologies Pvt. Ltd.
Semiconductor Automatic Test by QMax
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Kelvin Contact Test
C.C.P. Contact Probes Co., LTD.
We offer different tip types for low resistance testing.
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Becker NAV/RMU/RMI/OBS Test Fixture
TA-3320
This NAV test fixture is specific to the requirements for testing Becker Avionics NAV, RMI and RMU products. The panel incorporates specific functionality required for testing these Becker products by the book including special requirements for the RMU 5000 and the IN 3300 series of nav indicators. This BAEE NAV test fixture also facilitates resolver alignment and discrete meter testing through the PG 3300 interface connector. The RM 3300 portion of the panel tests the Becker RMI indicators and ...show more -
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Test Fixture
16047E
Perform impedance evaluation of lead type devices of up to 120 MHz; includes a guard and a shorting plate
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Test Probes / Test Fixtures
INGUN has an unbeatable assortment of test probes and test fixtures for individual testing tasks.Thanks to many years of experience in the testing equipment field, INGUN offers the suitable test solution for every test requirement.
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PD Free Test Transformer
Wuhan Fanke Transformer Manufacture Co., LTD
PD Free Test Transformer
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Additional hardware for our test systems
REINHARDT System- und Messelectronic GmbH
Our test systems are made up of modules which can be added to the needs of our customers.
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Multimode LAN Test Kit
KI-TK052
Multimode LAN test kit for low to modest test volume & some SM capability.
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MCB Test Option, Monitor Voltage Adapter
PTE-FCB
The PTE-FCB / PTE-FCD can be used to effectively reduce the sensitivity of the monitor input. The monitor input detects the relay’s operation and stops (or starts) the chronometer when testing with the PTE-100-C, PTE-50-CE, PTE-50-CET, and all LETs excluding the LET-400 (which lacks a chronometer).
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Automated Laser Test System (ATE)
Lix is a class of instruments for automated laser beam profiling, power measurement and analysis with integrated machine vision.
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Altitude Test Chambers
Altitude chamber testing is important for manufacturers of products that might be shipped via air. It is especially important for defense and aerospace applications where pressure and vacuum conditions are even more intense. Our altitude test chambers simulate a variety of environmental conditions including temperature, altitude, humidity, and vibration for the rigorous testing standards of combined environment.
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Program Development for Multisite Test
IG-XL
Teradyne’s award winning IG-XL software transforms test program development for the FLEX, UltraFLEX and J750 family of testers. Its powerful, yet easy-to-use, graphical environment lets engineers rapidly develop fully functional test programs, cutting program development and debugging time. Designed to address multisite complexity, IG-XL can convert single site test programs to multisite automatically, speeding time to market and reducing cost of test. With IG-XL, test engineers focus on actual testing, not writing code for the tester.
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Comprehensive Fuel Injection Pressure Test Kit
38000
A complete, master fuel injection pressure tester for cars and trucks.Tests gasoline fuel injection pressure systems on virtual all domestic and imported cars and trucks.For multi-port, throttle body and C.I.S. K-Jetronic fuel Injection Systems.Supplied with complete instructions in a durable, plastic molded storage case.
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Acoustic Test Chambers
Small Device Test Chambers are used for >Basic sound level measurement of small products and equipment >Pre-compliance testing of small products and equipment >End of line manufacturing test on small products and equipment Small Device Test Chambers provide acoustic isolation from outside sounds and/or reduce the sounds from the device under test radiating into the host
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Armature Test Systems
Automation Technology's ATS-3800 is at the top of the class when it comes to Armature Test Systems. The ATS-3800 is packed with standard features and like all of ATI's 3800 Series Test Systems; it is backed by ATI's industry leading two-year limited warranty. The ATS-3800 offers the most comprehensive testing of armatures available.
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Test Contactor/WLCSP Probe Head
ACE
ACE™ test sockets offer optimal RF performance for fine pitch FBGA, QFN and wafer-level packages for Power Amplifiers, RF switches and mobile communications. Supporting pitches down to 0.4 mm, ACE features an innovative design that provides superior performance, improved yields and power efficiency.ACE probe heads deliver exceptional electrical performance, both DC and RF. Manufactured from HyperCore™ base material, a proprietary material of Cohu’s Everett Charles Technologies, ACE probes have t...show more -
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Electromagnetic Interference Test
Electromagnetic interference (also known as radio frequency interference) tests are used to determine the electromagnetic characteristics of electrical, electronic, and electro-mechanical equipment. Electromagnetic interference, both radiated or conducted, can affect the performance of equipment. Electromagnetic interference tests are specified as follows: conducted emission, radiated emission, conducted susceptibility, and radiated susceptibility.
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In-Circuit Test Application Development & Fixture Fab
Arxtron Technologies has been in the Agilent3070/HP 3070 (Medalist i3070) In-circuit test application development and fixture fabrication business since 2004 when it took over the Agilent Canadian application centre. Our engineers count more than 35 years of experience and have been serving a variety of customers focusing on high end/ high node count complex products (Telecom, Medical, Industrial computers etc.) as well as Automotive and consumer electronics customers. We are also an Agilent channel partner.
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Tan Delta Test Set
TD 5000
The high-voltage generator TD 5000 is a complementary module of STS serie. TD 5000 designed to perform Tan Delta measurements, dissipation factor and capacitance of transformer and bushing at the frequency of the mains or in a wide frequency range.
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High Voltage Test System
CKT1175-15
12.5 mV – 2000 VDCIR measurements to 5000 megohmsHipot testingDwell time prog. from 1 ms to 1000s in 1 ms steps
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Instrument Transformer Test Systems
Our systems for testing voltage (VT) and current (CT) instrument transformers are conceived among other things for testing accuracy and insulation.
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Ball Pressure Test Apparatus
CX-Q03
Shenzhen Chuangxin Instruments Co., Ltd.
The Ball Pressure Apparatus is used to check the integrity of dielectric materials by exerting 20N force. The BPA10 is called out in IEC 60335, 60950, 61010, UL, CSA and European Norms. It is used to check the integrity of dielectric materials by exerting 20N force. The Ball Pressure Apparatus is made of stainless steel for long life. Since accelerated life procedures are used for this oven test, more than one apparatus may be useful for parallel testing.
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Integrated I-V Test Systems
The OAI Integrated I-V Test System is perfect for R&D as well as production, the OAI Integrated I-V Test System delivers extremely accurate solar cell performance measurement. OAI’s advanced fully Integrated I-V Test System is designed to overcome the limitations of flash testing by providing a highly optimized pulse width and voltage sweep rate to match any type of solar cell’s high capacitance and slow dielectric response speed. As a result, the system produces extremely accurate measurements of solar cell I-V parameters and efficiency while leading to the most accurate test results.
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Count Down Test System
The Second Launch Pad Count Down system is implemented using VXI hardware designed by Data Patterns specific to the application requirements, featuring a redundant system handling upto 14000 I/O points.
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DDR5 Receiver Conformance and Characterization Test Application
M80885RCA
DDR5 Receiver Conformance and Characterization Test Application.
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Mobil Cable Test and Fault Location System
SWG-12 (SWG-32)
• testing cable insulation with DC (rectified) voltage up to 32 kV;• conditioning faults by burning faulty cable insulation with current up to 100 mA;• pre-locating cable faults with the reflectometer RIF-9 based on the pulse reflection method (TDR), voltage wave oscillation method (DECAY), impulse current envelope (ICE) method and arc reflection method (ARC / ARC multi-shot);• pinpointing cable faults with the acoustic method with up to 2000 J surge wave generator and a suitable signal receiver.
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Fiber Acceptance Test Kit
23005
The unique design of the splice accommodates either 125um or 140um fiber and any size buffer up to 900um. The precision made splice holder firmly holds the pigtail in position without causing stress on the fiber. The low viscosity index matching liquid has an indefinite shelf life and allows for an easy glide of the bare fiber into the splice. Within seconds, a fiber acceptance reading can be made with an OTDR or test set. Low loss with minimum back reflection can easily be achieved for more accurate signatures. Other applications for this kit: splice training aids, bare fiber adapters, and temporary splicing.