Showing recent results 2956 - 2970 of 3242 products found.
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Pasternack Enterprises, Inc.
Pasternack's high-performance, flexible VNA test cables operate at up to 110 GHz and deliver precise results for testing using a coaxial cable and 1.0 mm stainless steel connector interface. The coaxial cable is covered by a non-conductive Nomex outer sleeve. In addition to the Nomex, a light-duty armoring protects the cable, while maintaining a 0.27-inch diameter and improving stability during flexure. These cables feature 50 Ohm impedance, a maximum VSWR of 1.5:1 and excellent phase/amplitude stability under flexure. Our flexible 1.0 mm VNA test cables operate over a wide range of temperatures from -65C to +125C. They are RoHS and REACH compliant. Each cable assembly is fully tested and comes with serialized test data. These cables are available in standard 6-inch and 12-inch lengths with male-to-male or male-to-female configurations. These VNA test cables are designed to deliver precision testing results for Vector Network Analyzer (VNA) testing, semiconductor probe testing, automotive radar testing and military radar testing.
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B1510A/B1511B/B1517A - Keysight Technologies
The Source/Measure Units (SMUs) are the key measurement modules of Keysight B1500A Semiconductor Device Parameter Analyzer. The SMUs integrate voltage/current source and measurement capabilities into a module, and it enables accurate DC current-voltage (IV) measurement with down to fA / V resolution. The low current measurement performance can be expanded down to sub-fA level by the optional ASU (Atto sense switch unit) if you need more measurement performance.The SMU can also perform the Quasi-Static Capacitance-Voltage (QS-CV) measurement. It is a measurement method to obtain low frequency CV characteristics, and it is important to characterize the surface state of the gate of transistor as well as high frequency CV. Keysight B1500A enables accurate QS-CV measurement with the leak current compensation.Along with analysis and data management capability of EasyEXPERT software, it is very powerful and useful to perform characterization for semiconductor, nano devices such as carbon nanotube (CNT) and carbon nanowire (CNW), active/passive component, material and any electric devices that require accurate and precise voltage/current measurement.
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Keysight Technologies
Conducting all the parametric measurements necessary for the numerous test structures on a semiconductor wafer can be a time-consuming and expensive process. With the cost of end-user devices continuing to drop, even laboratory characterization environments must reduce the cost of test. Until now engineers and scientists working on current and future semiconductor process technologies were faced with a difficult choice: either use a semiconductor parameter analyzer with positioners on a wafer prober, which limits the ability to perform automated test, or use a switching matrix and probe card, which reduced the analyzer's measurement resolution. Utilizing a switching matrix with a semi-automatic or fully-automatic wafer prober enables characterization tests to be automated, eliminating the need to have an operator manually reposition the probes each time a new module needs to be tested. This reduces both test time and cost. Due to the many price/performance points available, Keysight's switching matrix solutions provide the flexibility to choose exactly what your testing needs require, without overspending.
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Model VXI 65VP1 - North Atlantic Industries
NAI’s 65VP1 is a Video Processor System (VPS) on a VXI board. Capable of highly accurate video stimulus and measurements, this state-of-the-art instrument is the culmination of over three generations of Automatic Test Equipment (ATE) development programs. It provides increased functional density, and it reduces power consumption, size, and cost of the overall system. The 65VP1 is ideally suited for defense and commercial ATE programs, including television applications.With this multi-format video display generator and video signal acquisition system, videos can be composed with any possible sync format, rectilinear and polar raster, multi-image interactive stroke, and mixed video (stroke over composite, or stroke over raster). Video image acquisition and sync processor / analyzer functions are also supported. Either 6 output channels or 3 input channels are provided, along with extensive diagnostics. NAI’s Background Built-in-Test (BIT) continually checks on the health of each function and channel, and an initiated BIT function is also available through simple programming commands.
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Maintenance Reliability Group, LLC
Root Cause Analysis of Grease Lubricated Components: Root cause analysis includes a complete root-cause failure report and recommendations for further monitoring and corrective actions. MRG will test for grease consistency, oxidation, product contamination and wear metals utilizing Grease Thief® Analyzer die extrusion test, FTIR, RULER and RDE Spectroscopy. Testing includes Analytical Ferrography and Rheometer testing. Testing can include the submission of a failed component for extraction of grease from failed component and visual inspection for Root Cause Analysis.Root Cause Analysis of Grease Lubricated Components: Root cause analysis includes a complete root-cause failure report and recommendations for further monitoring and corrective actions. MRG will test for grease consistency, oxidation, product contamination and wear metals utilizing Grease Thief® Analyzer die extrusion test, FTIR, RULER and RDE Spectroscopy. Testing includes Analytical Ferrography and Rheometer testing. Testing can include the submission of a failed component for extraction of grease from failed component and visual inspection for Root Cause Analysis.
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StellarNet Inc
UV-VIS & NIR systems for chemical absorbance measurements 190-2300nmSpectrochemistry Systems include a miniature spectrometer, light source, and sampling accessory such as cuvette holders, dip probes, & flow cellsSpectraWiz Software has built in features for ChemWiz Concentration Analyzer with multivariate chemometric optionsEpisodic capture for kinetics, time series analysis, & batch monitoringEasily convert to fluorescence or reflectance for multi applicationsGreat for Teaching Labs, Research, Process Control & much more!Also see details about our Fluorescence and Raman Systems
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KH23101 - Beijing KeHuan Century EMC Technology Co,.LTD
The KH23101 current caliper is a toroidal transformer used to measure EMI current. When measuring, the caliper does not directly touch the electrical conductor or the cable under test. The conductor passing through the caliper window is used as the single-turn primary wire of the transformer, and the secondary is designed to be multi-turn. Use with 50 Ω receiving system (such as EMI electromagnetic interference field strength meter or spectrum analyzer). In order to facilitate installation and rapid measurement of EMI current, it is designed as a caliper that can be opened.
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PXIe-2746 / 780587-46 - NI
PXIe, 2.7 GHz, Quad 4x1 PXI RF Multiplexer Switch Module—The PXIe‑2746 is a PXI RF multiplexer switch module that is ideal for switching RF signals up to 2.7 GHz in production test applications. The high channel count of the PXIe‑2746 makes it well-suited for test systems that require switching a large number of RF signals, such as switching several devices under test to a single channel on the RF analyzer. It also features onboard relay counting for relay monitoring.
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PXIe-6548 / 781012-03 - NI
PXIe, 200 MHz, 32-Channel PXI Digital Waveform Instrument—The PXIe‑6548 is a digital waveform generator and analyzer for interfacing and basic characterization test with 32 single-ended digital pins. The device is capable of sampling digital waveforms at up to 200 MHz and interfacing with user-programmable voltage levels that have a 100 mV resolution. The PXI‑6548 also features advanced synchronization capabilities for building integrated mixed-signal test systems, hardware comparison for bit-error test, and per-bank digital timing features.
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PXIe-6548 / 781012-02 - NI
PXIe, 200 MHz, 32-Channel PXI Digital Waveform Instrument—The PXIe‑6548 is a digital waveform generator and analyzer for interfacing and basic characterization test with 32 single-ended digital pins. The device is capable of sampling digital waveforms at up to 200 MHz and interfacing with user-programmable voltage levels that have a 100 mV resolution. The PXI‑6548 also features advanced synchronization capabilities for building integrated mixed-signal test systems, hardware comparison for bit-error test, and per-bank digital timing features.
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PXIe-2747 / 780587-47 - NI
PXIe, 2.7 GHz, Dual 8x1 PXI RF Multiplexer Switch Module—The PXIe‑2747 is a PXI RF multiplexer switch module that is ideal for switching RF signals up to 2.7 GHz in production test applications. The high channel count of the PXIe‑2747 makes it well-suited for test systems that require switching a large number of RF signals, such as switching several devices under test to a single channel on the RF analyzer. It also features onboard relay counting for relay monitoring.
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PXIe-2748 / 780587-48 - NI
PXIe, 3 GHz, 16x1 PXI RF Multiplexer Switch Module—The PXIe‑2748 is a PXI RF multiplexer switch module that is ideal for switching RF signals up to 3 GHz in production test applications. The high channel count of the PXIe‑2748 makes it well-suited for test systems that require switching a large number of RF signals, such as switching several devices under test to a single channel on the RF analyzer. It also features onboard relay counting for relay monitoring.
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AS7261 - ams AG
Calibrated XYZ color sensor provides complete, integrated platform for handheld color analyzers, color calibration and mobile analysis devices. Tri-stimulus XYZ realized by silicon interference filters. UART or I²C slave digital Interface. 16-bit ADC with digital access. Programmable LED drivers. 20-pin LGA package 4.5mm x 4.7mm x 2.5mm, with built-in aperture. Compact true-color sensing. Applications; Color/CCT sensing, Fluid or reagent analysis, Color point comparison, Display calibration.
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Aaronia AG
EMF & RF close field sniffer-set for use with any Spectrum Analyzer or Measurement Receiver. The EMC Near Field probe set allows for straightforward pinpointing and measurement of interference sources in electronic component groups as well as execution and monitoring of generic EMC measurement. Our RF near field probe set is especially suitable for: - Pinpointing interference sources - Estimation of interference field strength - Verification of shielding and filtering measures - Identifying faulty components - Detecting circuitry overly sensitive to interference.
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M+P International
The Rotate software package is part of the m+p Analyzer Software for noise & vibration measurements and analysis. It provides a wide range of data acquisition and analysis tools for capturing and understanding noise and vibration induced in rotating and reciprocating machines by their motion. Fixed and variable speed machines are accommodated as are both structural vibration and condition monitoring diagnostics. Multiple tacho inputs can be processed for accurate speed tracking during analysis. Spectral mapping, order tracking, time history and orbit data analysis are all available.
