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Showing results: 106 - 120 of 135 items found.

  • Strain Gage Testing

    Response Dynamics Vibration Engineering, Inc.

    Although strain measurement is often a key part of a root cause diagnosis, our analyses often also involve measurements of other parameters such as acceleration, relative displacement, pressure, temperature, flow, speed, load, dynamic stiffness, etc, to explore multiple parameters that may have a cause/effect relationship with the problem at hand. These measurements form part of a fact based hypothesis for the cause of the problem at hand. We use stain gauge testing and/or stain modeling and analysis, in conjunction with our structural dynamics expertise to characterize all the important pieces of the puzzle that come into play with dynamic strain issues (See Diagnostic Testing).

  • 3D Motion and Deformation Sensor

    ARAMIS - GOM GmbH

    ARAMIS is a non-contact and material-independent measuring system based on digital image correlation (DIC). It offers a stable solution for full-field and point-based analyses of test objects of just a few millimeters up to structural components of several meters in size. The system performs high-precision measurements with a 3D image resolution in the submicrometer range, regardless of the specimen’s geometry and temperature. There is no need for a time-consuming and expensive preparation. For statically or dynamically loaded specimens and components, ARAMIS provides accurate

  • N/Protein Analysis

    Elementar Analysensysteme GmbH

    The determination of the total protein content is an essential tool for quality control and protein declaration according to international labeling laws in the food & feed industry and research facilities. Since the protein content can directly correspond to product properties, highly precise, matrix-independent protein analyses are required in all application areas.Our N/protein analyzers use the high-temperature combustion method according to Dumas, which has clear advantages over Kjeldahl regarding laboratory safety, sample throughput, labor time, amount of chemical waste and thus cost-per-analysis. Our analyzers for the determination of nitrogen and protein are dedicated instruments serving today’s customer needs in regards to price-per-sample, throughput and sensitivity.

  • Femto / Picoammeter, 0.01fA, Battery

    B2983B - Keysight Technologies

    The B2983B Femto/Picoammeter is the world’s only graphical picoammeter that allows you to confidently measure small currents with 0.01 fA (0.01 x 10-15 A) resolution. In addition, battery operation eliminates AC line noise from your critical measurements. It possesses a 4.3” color LCD with a graphical user interface that provides trend chart and histogram data in addition to numeric information. These front-panel capabilities enable you to capture transient behavior and to perform quick statistical analyses without a PC. The available Setup Integrity Checker software option allows you to compare the noise levels of different cabling and fixturing arrangements to help isolate external noise sources.

  • Signal Analyzer

    Anritsu Corporation

    Choose from an extensive selection of signal analyzer products from DC to 44.5 GHz and extendable to 325 GHz.With excellent total level accuracy, dynamic range and performance, Anritsu spectrum/signal analyzers not only can capture wideband signals but FFT technology supports multifunction signal analyses in both the time and frequency domains. Moreover, the built-in signal generators on some models outputs both continuous wave (CW) and modulated signals for use as a reference signal source.

  • Windows-Based Software Suite for Rigaku's X-Ray Diffractometers

    SmartLab Studio II - Rigaku Corp.

    SmartLab Studio II is a new Windows®-based software suite developed for the flagship Rigaku SmartLab X-ray diffractometer that integrates user privileges, measurements, analyses, data visualization and reporting. Newly available for the MiniFlex, the modular (plugin) architecture of this software delivers state-of-the-art interoperability between the functional components. Just one click switches from measurement to analysis. Watch real-time scans from one experiment while simultaneously analyzing other data on the same desktop by selecting an appropriate layout. The software provides various analysis tools such as automatic phase identification, quantitative analysis, crystallite-size analysis, lattice constants refinement, Rietveld analysis, ab initio structure determination, etc.

  • Raman Imaging & High Resolution Spectrometer

    LabRAM Odyssey - HORIBA, Ltd.

    Special 50 years anniversary series: true confocal Raman microscope enabling the most detailed images and analyses to be obtained with speed and confidence. Ideally suited for both micro and macro measurements, it offers advanced confocal imaging capabilities in 2D and 3D. With guaranteed high performance and intuitive simplicity, the LabRAM Odyssey™ is the ultimate instrument for Raman spectroscopy, widely used for standard Raman analysis, PhotoLuminescence (PL), Tip Enhanced Raman Spectroscopy (TERS) and other hybrid methods.

  • Stylus Profilometry

    Dektak® - Bruker Nano Surfaces

    Bruker's Dektak stylus profilers are the product of over four decades of proprietary technology advances. They provide repeatable, accurate measurements on varied surfaces, from traditional 2D roughness surface characterization and step height measurements to advanced 3D mapping and film stress analyses. Dektak surface profilers have been widely accepted as a superior solution for measuring thin film thickness, stress, and surface roughness and form in applications ranging from educational research verification to semiconductor process control.

  • Frequency Response Analyzer

    CAPture FRA - Captronic Systems Pvt Ltd

    A Frequency Response Analyzer (FRA) is a high precision measurement instrument used to analyse dynamic behavior of circuits & components of control systems in the frequency domain. An FRA generates a sinusoidal signal and inserted it into a unit under test. This signal is measured at the point of insertion using one of the input channels on the FRA The inserted signal travels through the UUT and the same signal is measured simultaneously by the FRA at other input channel. The technique measures the magnitude and phase relationship between output and input waveform as a function of frequency.

  • Portable Metal Analyzer

    SPECTROPORT - SPECTRO Analytical Instruments GmbH

    When handhelds aren't enough, the amazing new SPECTROPORT portable metal analyzer applies more advanced OES technology in a unit as easy to use as a handheld analyzer. SPECTROPORT delivers many advantages of SPECTRO's portable OES flagship, SPECTROTEST, in a smaller, lighter package. It accurately analyzes elements such as carbon, sulfur, phosphorus, and boron. It's as fast as an XRF, with many analyses taking only a few seconds. And it enables effortless point-and-shoot performance, to minimize operator intervention and decision-making. It adds the convenience and simplicity of the best handheld analyzers to the accuracy and wide analytical range of SPECTRO's renowned OES technology. You get fast, ready response; flexible portability; intuitive ease of use; and minimal standardization efforts.

  • Partial Discharge Testing Equipment

    3i - Scope T&M Pvt, Ltd.

    The portable multipurpose 3i device (Intellectual Insulation Indicator) is for eff ective high-voltage equipment insulation monitoring on-line. The 3i device measures and analyses partial discharges (PD). For eff ective PD measurement and noise rejection, there are two types of sensors used in the device: the acoustic sensor and the TEV sensor. Both the sensors are built into the device case, and so do not need any connection cables. The device is supplied in a strong metal case; at the faceplate there are the colored screen and two buttons: power button and function button.

  • Multi Channel Optical Fibre Verification

    LXinstruments GmbH

    The multi-channel optical fibre test system is used in the development and qualification of single mode optical fibres. The fibres are exposed to environmental influences in a climatic chamber in order to analyse the data on insertion loss and reflection. In addition, the current temperature in the climatic chamber is documented. Insertion loss measurement is performed with the help of an optical power meter, laser sources and optical switches. An Optical Time Domain Reflectometer (OTDR) from Exfo is used for the reflection measurements. The system was designed for the simultaneous characterization of 15 sample fibres and one reference fibre.

  • Detailed Hydrocarbon Analysis

    Shimadzu Corp.

    The purpose of detailed hydrocarbon analysis (DHA) is to determine the bulk hydrocarbon group type composition (PONA: Paraffins, Olefins, Naphthenes and Aromatics) of gasoline and other spark-ignition engine fuels that contain oxygenate blends (Methanol, ethanol, MTBE, ETBE, and TAME) according to ASTM-D6730. PONA analyte identification is conducted by matching retention indices with normal hydrocarbon paraffins. However, chromatograms obtained in PONA analyses have an extremely large number of peaks and their analytes may be mislabeled. Without accurate and reproducible retention indices, this may result in erroneous PONA ratios. The GC-2030 incorporates an Advanced Flow Controller that enables highly precise flow control, and makes it easy to analyze and identify detailed hydrocarbons. Shimadzu offers DHA analysis conforming to the following methods: ASTM-D5134, ASTM-D6729, ASTM-D6730, and ASTM-D6733.

  • LED Driver Online Tester

    LEDLS-60/LEDLS-12 - Lisun Electronics Inc.

    • The tester includes A Group Measuring Module and B Group Measuring Module. The A Group measuring module can test 6pcs LED Driver AC Parameters. The B Group measuring module can test 6pcs LED Driver AC, DC and AC/DC Parameters. • There are 12 windows to display the input and output parameters, it is good for comparing and analyses. • Quick test for all of the parameters in 0.1 seconds. • It can set up the testing parameters PASS/FAIL range, it will have Noise/Light warning if it is Fail. We also supply handle port (Extra cost) • Software communicate with PC (Extra cost)

  • Process EDXRF Spectrometer

    NEX LS - Applied Rigaku Technologies, Inc

    Featuring advanced third generation EDXRF technology, the Rigaku NEX LS represents the next evolution of scanning multi-element process coatings analyzers for web or coil applications. To deliver superior analytical performance and reliability, the EDXRF measuring head assembly was derived from the established Rigaku NEX Series high-resolution benchtop instrumentation. With this proven technology, the Rigaku NEX LS delivers rapid, non-destructive, multi-element analyses — for coat weight, coating thickness and/or composition — for elements from aluminum (Al) through uranium (U). The measuring head is mounted on a rigid beam and is equipped with a linear traversing mechanism positioned over a roller so that the head-to-surface distance is constant. Common applications include silicone release coaters, converters, denesting Si for vacuum-formed plastics, RoHS compliance, conversion coatings, metalized plastic, top coatings on metal coil and fire retardants on fabric.

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