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Product
1 MS/s, 12-Bit, 16-Ch Multifunction PCI Card
PCI-1712
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16 single-ended or 8 differential or a combination of analog inputs12-bit A/D converter, with up to 1 MHz sampling rateTwo 12-bit analog output channels with continuous waveform output function16-ch digital input and 16-ch digital outputThree 16-bit programmable multifunction counter/timers on 10 MHzProgrammable gainAutomatic channel/gain scanningOnboard FIFO memory (AI: 1,024 samples AO: 32,768 samples)Auto-calibration (AI/AO)PCI-Bus for data transferPre-, post-, about- and delay-trigger data acquisition modes for analog input channelsFlexible triggering and clocking capabilities
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Product
MXI-Express Cable, Gen 3 x8, Copper, 3m
785550-03
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MXI-Express Cable with Communication Levels up to Gen 3 x8 - The MXI-Express Cable connects a host interface to a PXI or PXI Express chassis. You can also use it for data communication between multichassis systems. NI offers it in different MXI communication levels and lengths.
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Product
MXI-Express Cable, Gen 3 x8, Copper, 1m
785550-01
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MXI-Express Cable with Communication Levels up to Gen 3 x8 - The MXI-Express Cable connects a host interface to a PXI or PXI Express chassis. You can also use it for data communication between multichassis systems. NI offers it in different MXI communication levels and lengths.
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Product
MXI-Express Cable, Gen 2 x8, Copper, 3m
782317-03
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MXI-Express Cable with Communication Levels up to Gen 3 x8 - The MXI-Express Cable connects a host interface to a PXI or PXI Express chassis. You can also use it for data communication between multichassis systems. NI offers it in different MXI communication levels and lengths.
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Product
MXI-Express Cable, Gen 1 x1, Copper, 7m
779500-07
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MXI-Express Cable with Communication Levels up to Gen 3 x8 - The MXI-Express Cable connects a host interface to a PXI or PXI Express chassis. You can also use it for data communication between multichassis systems. NI offers it in different MXI communication levels and lengths.
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Product
BSD (Test Diagnostics)
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BSD Test Diagnostics software can be added to either developer or factory run-time systems to further improve the location of faults such as net bridges (short-circuits), open pins, open nets and even ''twisted'' connections that can occur within cable assemblies. BSD Test diagnostics reports faults in a verbose English language statement with pin level information included and can easily interpret multiple fault conditions.
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Product
MXI-Express Cable, Gen 1 x1, Fiber Optic, 200m
778959-200
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MXI-Express Cable with Communication Levels up to Gen 3 x8 - The MXI-Express Cable connects a host interface to a PXI or PXI Express chassis. You can also use it for data communication between multichassis systems. NI offers it in different MXI communication levels and lengths.
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Product
MXI-Express Cable, Gen 3 x4, Copper, 3m
785549-03
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MXI-Express Cable with Communication Levels up to Gen 3 x8 - The MXI-Express Cable connects a host interface to a PXI or PXI Express chassis. You can also use it for data communication between multichassis systems. NI offers it in different MXI communication levels and lengths.
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Product
Prototyping & Test Consulting Services Solutions
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Don’t cut corners on the path to quality. We are experts in Design for Test (DFT), Design for Manufacturing (DFM), agile development, prototyping and standards/best practices in many industries. Speak to our prototyping and consulting services experts to ensure you make the right decisions and investments at the start of your project.
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Product
Imperial Test Executive
ITE
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The Imperial Test Executive (iTE) is a UI shell that sits on top of National Instruments TestStand. It provides a simple but elegant interface to execute your NI TestStand sequences. The iTE software was designed to allow general operators to execute ATE testing software without requiring any knowledge of NI TestStand. Training an operator to use this system typically takes less then 5-minutes.
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Product
SAE AS5643 Mil-FireWire PXI Express Test & Simulation Instrument
HSSUB-6120
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Avionics Interface Technologies
Highest density capability available in an AS5643 3U PXI Express, single slot instrument - Four (4) FireWire nodes, each with three (3) ports - Apps provide high-level (AS5643) and low-level (1394) access, while accommodating end-user customization - S100, S200, S400, S800 transfer rates - Support all Nodes operating concurrently at 800 Mbps - Independent transformer coupling for each port - Eight (8) standard PXI backplane triggers - Industry standard Texas Instruments IEEE 1394b Chipset - ANSI C (typical), C++/C#/LabVIEW
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Product
Fast and Flexible WLAN Measurements up to 802.11ax
WLAN Test Toolkit
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The WLAN Test Toolkit gives you direct and fine control over the generation and analysis of IEEE 802.11a/b/g/n/ac and ax signals, as well as 802.11j/p/ah/af waveforms, with industry-leading speed and accuracy. It empowers you to characterize, validate, and test a variety of WLAN connectivity products, such as RF front end components, wireless modules, and user devices.The toolkit includes extensive support for the latest features of the 802.11ax standard, including extended single-user packets, multiuser OFDMA, and multiuser multiple input, multiple output (MIMO) functionality with per-user configuration and measurement results. The WLAN Test Toolkit helps you solve demanding new access point test cases by generating signals that simulate multiuser environments, including per-user impairments. You can also use the new software to generate trigger frames to test the real-time response of client devices and make power precorrection and relative center frequency measurements.
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Product
Compact PCI-Express/PXI-Express Module
ACE1553-3U-x
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The ACE1553-3U-x is a member of AIM’s new family of compact PCI-Express/PXI-Express modules for analyzing, simulating, monitoring and testing
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Product
Full DSP-Based 8-Axis Motion Control Universal PCI Card
PCI-1285
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Encoder input is 10 MHz for 4xAB mode, 2.5 MHz for CW/CCW modePulse output up to 5 MppsMemory buffer (10K points) for trajectory planning which is designed in DSPSupports E-Gear, and helical interpolationSupports E-CAM providing 256 points to describe the CAM profiles which buffers located in DSPHardware emergency inputWatchdog timerPosition latchPosition compare triggering up to 100 KHz, and memory buffer is up to 100 K points in DSPProgrammable interruptSupports gantry mode by semi-closed loop pulse train controlRDY/LTC-dedicated input channels & SVON/CMP/CAM-DO/ERC-dedicated output channels are switchable for general input and output purposes
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Product
NI Real-Time Test Cell Reference System
780590-35
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VeriStand Full Development License with NI Standard Service , Include 1 Year SSP
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Product
Full DSP-Based 4-Axis Motion Control Universal PCI Card
PCI-1245
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Encoder input is 10 MHz for 4xAB mode, 2.5 MHz for CW/CCW modePulse output up to 5 MppsMemory buffer (10K points) for trajectory planning which is designed in DSPSupports E-Gear, and helical interpolationSupports E-CAM providing 256 points to describe the CAM profiles which buffers located in DSPHardware emergency inputWatchdog timerPosition latch via ORG & index signalPosition compare triggering up to 100 KHz, and memory buffer is up to 100K points in DSPProgrammable interruptSupports gantry mode by semi-closed loop pulse train controlRDY/LTC-dedicated input channels & SVON/CMP/CAM-DO/ERC-dedicated output channels are switchable for general input and output purposes
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Product
Flexible Cable, 3.5 Mm (Test Port) To 3.5 Mm
85131E
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Achieve phase stability with this 96.5-cm cable when a DUT is connected, with adapter, directly to the test set port
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Product
ARINC429 PCI Express Mini Card
AMEE429-x
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The AMEE429-x is AIM’s new PCI Express Mini Card module targeted for embedded ARINC429 applications in an ultra-compact form factor.
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Product
PXIe High Performance System Module: Dual Port (x16), Gen 3
M9023A
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The M9023A is a PXIe System Module and is installed in the system slot of a PXIe chassis. When combined with an appropriate host adapter, it will provide a high data BW connection between the host PC and the chassis. The M9023A has a flexible configuration capability. Each card has two Gen 3 x8 PCIe cable links capable of achieving speeds up to 8 GB/s on each port. These two ports can be combined into a single x16 cable link providing a speed of up to 16 GB/s. This means a data-intensive system can be built using high-performance desktop or rack-mounted computers.
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Product
Generator/Analyzer for NFC/EMVCo Manufacturing Test
Micropross MP500 PT1-NFC
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Support for ISO 14443 A/B, ISO 15693, MIFARE™, FeliCa™. Measurement correlation with NFC Forum and EMVCo certification test bench. Automated test executive with ready-to-run test sequences. Reader/Writer and Card Emulation modes, resonance frequency measurements supported on same antenna. Embedded analog measurements - LMA, field strength, S11, Q factor, waveform characteristics. Physical parameter/waveshape characteristic definition
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Product
Cable Free ATE
CABLEFREEATE
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Digalog Systems customizes resources to provide requirements or more cost-effective requirements that are not currently on the market.The CableFreeATE™ technology also affords lower cost and easier integration of some common offerings:- VPC 64 SPST Reed Relay- 0.1" Discrete Header 64 SPST Reed Relay- DL1-156R 72 SPST Reed Relay
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Product
Test Workflow Standard
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Test Workflow equips engineers with application-specific tools so that they can choose the right one for the job—from graphical programing environments to no-code and interactive software applications. Engineers can use Test Workflow software to perform quick ad-hoc tests, build an automated test system, automate data analysis and reporting, develop test sequences, and more.
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Product
NI Automated Test Software Suite
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The NI Automated Test Software Suite features all three NI IDEs and NI's most popular application software and add-ons specifically for building your automated test system with confidence. This package offers the power of LabVIEW, LabWindows/CVI, and Measurement Studio combined with the TestStand ready-to-run, test executive and the Switch Executive intelligent switch management application
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Product
SSD Test Systems
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Enables Rapid SSD Development and Production Ramp with Flexible Test Solution In the high-growth and highly competitive SSD market, a test system that supports multiple protocols can eliminate the need for retooling and achieve faster transitions from one product version — or one product generation — to the next. Advantest SSD Test System allows manufacturers to rapidly grow their product portfolios while remaining adaptable to the many changing needs of the evolving SSD market. This tester improves users’ engineering efficiency with powerful, easy-to-use software tools and a revolutionary multi-protocol hardware architecture, enabling accelerated SSD product development and a faster time-to-manufacturing ramp.
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Product
H(3)TRB & HTGB Test Systems
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SET offers two H(3)TRB and HTGB product lines which differ in the number of test object channels and the range of technical possibilities. The innovative systems are scalable, modular and standardized.
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Product
Test System Replication/Build-to-Print
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Need to manufacture test stations? For more than 15 years we have sourced, assembled, tested and shipped fleets of robust, cost-effective solutions. We produce them at our high-volume facilities and deploy them around the world.
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Product
Fastest In-Circuit Test Platform
TestStation
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Teradyne’s TestStation in-circuit test systems provide electronics manufacturers with reliable high-quality, high-volume testing for the latest printed circuit board assembly (PCBA) technologies that are used in automotive, industrial, computing, consumer, communications, and defense end-products.
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Product
PXI Semiconductor/IC Test System
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A high-density 100MHz PXIe digital IO card designed for characterizing, validating, and testing a variety of digital and mixed-signal ICs. Each IO card consists of a Sequencer Pattern Generator (SQPG) and 32 channels of full ATE-like features. The 33010 IO card is expandable up to 256 channels. Some unique features of the 33010 include an on-board SQPG, per pin timing/levels/ PMU/TFMU, multiple time domains, and multithreaded testing for complex IC testing. Each channel is also equipped with 64M vector memory, 16 timing sets with on-the-fly timing change, and per pin timing and frequency measurements up to 400 MHz.
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Product
Fixturing Kit
10744A
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The Keysight 10744A fixturing kit includes mounting hardware for a variety of Keysight measurement optics devices. A large base, multiple posts, and other accessories let you build structures -- such as tall, rigid towers -- that place optics in the center of a machine's work zone or wherever needed. The fixturing kit helps meet the physical requirements of a range of measurement applications.
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Product
Advanced SoC Test System
3680
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The Chroma 3680 is an advanced SoC test system with data rate up to 1Gbps. The Chroma 3680 is capable of conducting parallel tests on multiple chips to meet the digital and analog IC testing requirements, with applications including MCU, digital audio, digital TV, set-top box, DSP, network processor, field programmable gate array (FPGA) and consumer electronics.
