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Instrument Transformer Test Systems
Our systems for testing voltage (VT) and current (CT) instrument transformers are conceived among other things for testing accuracy and insulation.
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Automatic Instrument Transformer Test Set
*ARM 9 processor controlled measurements*Measures total burden connected to test sample*Internal data storage facility upto 1 lakh readings*Digital display of test results on 800 x 480 TFT color display.*Latest IEC 61869 / ANSI C57.13-2008 / IS-2705 standards incorporated*VGA Port to interface with bigger display / monitor*Both Voltage & Current Transformer testing with one test set*5 and 1 Amp CT testing using either 5 or 1 Amp standard CT*Identifies ANSI, IEC, IS-P, IS-PR, BS, BS-S, IEC-S, IS, IS-S, AS, AS-M, AS-ME standards for CT & VT*USB memory storage*Available in three versions: AITTS Plus , ACTTS Plus & AVTTS Plus
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ANSI Metering Current Transformer Burden
The ANSI Current transformer burden is designed for loading the current transformer during accuracy Tests. The ANSI burden is designed as per ANSI burden C57.13.It can be used along with the Eltel Automatic Instrument Transformer Test Set to test CTs as per ANSI Standards.
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ANSI Relaying Current Transformer Burden
The ANSI Current transformer burden is designed for loading the current transformer during accuracy Tests. The ANSI burden is designed as per ANSI burden C57.13.It can be used along with the Eltel Automatic Instrument Transformer Test Set to test CTs as per ANSI Standards.
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GSM/EDGE Analysis Using NI PXI RF Test Instruments
NI-RFmx GSM/EDGE
The NI-RFmx GSM/EDGE personality is a highly optimized API for performing physical layer measurements on GSM/EDGE cellular standard signals. NI-RFmx GSM/EDGE is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development effort.
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TD-SCDMA Analysis Using NI PXI RF Test Instruments
NI-RFmx TD-SCDMA
The NI-RFmx TD-SCDMA personality is a highly optimized API for performing physical layer measurements on TD-SCDMA cellular standard signals. NI-RFmx TD-SCDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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3-Axis Non-Robotic Automated Testing System
AT3
The Instron AT3 is a space-efficient, highly adaptable 3-axis mechanical testing platform designed for automated execution of tensile, compression, flexural, and lap shear tests. Built to comply with a broad spectrum of ASTM and ISO standards, it’s well-suited for evaluating materials such as plastics, elastomers, thin films, foils, and metals. The system streamlines the entire testing workflow from specimen measurement and handling to strain measurement and specimen disposal—enabling users to load up to 160 samples and let the AT3 take care of the rest. Boost productivity, reduce manual intervention, and achieve consistent, dependable results with every test cycle.
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Semiconductor Testers
Our integrated team of semiconductor test innovators delivers a complete system tailored to achieve your specific objectives, incorporating:Test strategyHardware designSoftware development and integrationManufacturingInstallationProgram managementOngoing support
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Instrument Transformer & Switchgear Testing
Our stationary and mobile instrument transformer test systems are used to test current and voltage instrument transformers. Among other things, accuracy testing, demagnetization and insulation testing are possible.
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LTE/LTE-Advanced Analysis Using NI PXI RF Test Instruments
NI-RFmx LTE/LTE-Advanced
Highly optimized RF measurement experiencePerform physical layer analysis on LTE cellular signals including MODACC, ACPR, CHP, OBW, and SEMIncludes support for TDD, FDD, and LTE-Advanced signals specified in 3GPP standards release 12Simple access to advanced measurement parallelism
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Electronic AC Potential Standard
PMT25010
Power Measurement Technologies Inc.
Provides the electronic equivalent of a standard potential transformer as typically required for instrumentation potential transformer accuracy testing.
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Primary Testing Technique
Individual components for instrument transformer testing technologyStationary and portable instrument transformer testing technologyprimary testing technique
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EV-DO Analysis Using NI PXI RF Test Instruments
NI-RFmx EV-DO
Highly optimized RF measurement experiencePerform physical layer analysis on EV-DO cellular signals including MODACC, ACPR, CHP, OBW, and SEMSimple access to advanced measurement parallelism
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Noise Figure Analysis Using NI PXI RF Test Instruments
NI-RFmx Noise Figure
Measure noise figure, gain, Y-factor, effective temperatures, hot and cold power, and moreOptimized calibration and measurement routines for multi-DUT test using Y-factor and cold sourceSupports the PXIe-5668R 26.5 GHz VSA, the PXIe-5698 26.5 GHz preamplifier, and VSTsDesigned for use with industry-standard noise sources such as the Noisecom NC346 Series
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Power Transformer
Transformer turn ratio meter is special designed for power transformer (single phase & three phases) and instrument transformer testing, suitable for testing in substation, transformer manufacturer, meter manufacturer. It helps to detect faulty transformer winding and tap changer position. It’s fully automatic device, can recognizes winding connection and vector group number of transformer winding. The user only need connect measuring cable and press start button and come out the test result.
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Partial Discharge Test Set
We are an unparalleled name in the industry, engaged in manufacturing and exporting Partial Discharge Test Set that is broadly used for instrument transformers to test the discharge of voltage. This test set is manufactured in compliance with set international quality standards using optimum quality components under the observations of our experienced professionals. Further, it is made available in several specifications to meet the exact requirements of the clients. Our offered Partial Discharge Test Set can be owned from us at nominal prices.
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VXI Digital Test Instrument
T940 Series
The T940 Series for the VXIbus provides the basis for a complete state-of-the-art digital solution at the subsystem level. The T940 is the solution for both legacy digital replacement and new test stations to be built for digital test including aircraft/ avionics, weapons systems, spacecraft, semiconductors and medical devices.
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Automated Test Equipment
These systems test semiconductor performance and quality with industry-leading precision and cost efficiency. Robust support for semiconductor design evaluation, volume production ramps, and yield improvement.
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Instrument Bracket Kit, w/ Strain Relief, Slide Configuration, for 28"+ Slide Kits
310113002
Instrument Bracket Kit, w/ Strain Relief, Slide Configuration, for 28"+ Slide Kits Similar to instrument bracket p/n 310113453, but includes cutout to accommodate air intake on NI PXIe-1088 chassis. Only compatible with slide configurations 28" and longer. Not compatible with cable tray. Not recommended for use with 2+ tier 90 Series systems (905, 9075, etc.).Used to mount testing instrument to slides and also allows test instrument to slide out for maintenance access. Provides strain relief in front area of bracket. Compatible with chassis (see drawing for more information)
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NI HIL and Real-Time Test Software Suite
Suites combine LabVIEW Professional Development System with NI's most popular application softwareIncludes LabVIEW Professional, VeriStand, and the LabVIEW Real-Time and LabVIEW FPGA modulesEach new suite includes a one-year NI Training and Certification membershipSoftware is shipped on USB 3.0 media with NI device drivers included to speed up your installationConfigure real-time test applications quickly and easily; add custom functionality
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NI Real-Time Test Cell Reference System
778820-35
DIAdem Advanced with DAC Bundle, Perpetual License, Include 1 Year SSP
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CT/VT Test System
Fully pre-wired comprehensive turn test system. *Suitable for CTs up to 6000A & VTs up to 132kV. * Precision to (0.005 class) internal multi-ratio standard CT. * Internal 4KA current source. * State-of-the-art Instrument Transformer Test Set AITTS-98 with computer & printer interfaces. * Electronic potential divider facilitates testing any VT ratio upto 132kV. * Current & potential burdens.
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Bi-Directional Differential-TTL I/O PXI Card
GX5642
The GX5642 is a 3U PXI instrument card that can be used for general data acquisition, process control, Automatic Test Equipment (ATE), Functional Test, and factory automation applications. The GX5642 consists of 64 bi-directional TTL-to-differential LVDS I/O channels. Each channel has two ports (TTL and LVDS) and can be individually set to operate in either conversion or static I/O modes.
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NI Real-Time Test Cell Reference System
780590-35
VeriStand Full Development License with NI Standard Service , Include 1 Year SSP
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Test Workflow Standard
Test Workflow equips engineers with application-specific tools so that they can choose the right one for the job—from graphical programing environments to no-code and interactive software applications. Engineers can use Test Workflow software to perform quick ad-hoc tests, build an automated test system, automate data analysis and reporting, develop test sequences, and more.
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Generator/Analyzer for NFC/EMVCo Manufacturing Test
Micropross MP500 PT1-NFC
Support for ISO 14443 A/B, ISO 15693, MIFARE™, FeliCa™. Measurement correlation with NFC Forum and EMVCo certification test bench. Automated test executive with ready-to-run test sequences. Reader/Writer and Card Emulation modes, resonance frequency measurements supported on same antenna. Embedded analog measurements - LMA, field strength, S11, Q factor, waveform characteristics. Physical parameter/waveshape characteristic definition
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Design for Testability (DFT Test)
Corelis can provide you with design consultation and an analysis of your design for boundary-scan testability. We will review your design and make specific recommendations that if implemented will improve the testability. We can also suggest improvements that will increase test coverage and allow boundary-scan to be implemented in a more cost-effective manner.This service also includes a DFT test coverage analysis that we recommend to do after schematic capture and before PCB layout. At this stage of product development, Corelis provides you with a comprehensive test coverage reports that identifies all of the boundary-scan nets and pins and classifies them as completely tested, partially tested, or not tested. The report also recommends where to add test points (pads) for physical “nails” access if additional test coverage is required.
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Primary Current Injection Set
It is widely used in industries for instrument transformer and switchgear testing.
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Test Management Software
ActivATE™
Easily create and run robust test programs in semiconductor automated test systems with ActivATE™ test management software. Designed by test engineers for test engineers, ActivATE™ tames automated test complexities with elegant simplicity.
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Parametric Test Fixture
U2941A
The Keysight U2941A is a parametric test fixture that is designed to complement the usage of U2722A USB source measure unit in the testing of semiconductor components, including SMT and DIP ICs.
