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Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196A
The 16196A surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results - reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement - now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196D
The 16196D surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results – reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement – now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Fixture Kit 600x455mm RCV 8-slot for 6TL34
AG588
Stopper kit includedYAVCANCON2 for fixture identification not included
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Functional Test Trainer System
QT65
Qmax Test Technologies Pvt. Ltd.
Functional Test Trainer system, is a test system which can perform various Power- On functional tests of digital devices(ssl/MSI/LSIs and analog devices in the out- circuit and in-E conditions. Unified Library of vast number of devices to effectively test devices in in-circuit as well as out of circuit conditions.
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Off-Line Seat Operation Base Test Platform
6TL23
The 6TL23 is a bare rack for creating Off-Line, modular, flexible, and reliable Base test platforms. The overall rack capacity is 18U (580mm depth). The rack is ideal for sit-down operation since there’s space for the operator’s legs under the fixture receiver.
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Functional Test
UTS
The UTS functional test system is perfect for electronics manufacturing operations that have a mix of products where operators load and unload devices under test (DUT) and routinely change out fixtures for each type of DUT.
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In-Circuit Test Systems For Sale
Forwessun offers a comprehensive range of global services for a variety of Test Systems. We provide refurbished systems that have undergone rigorous testing, giving you reliable performance at a fraction of the cost of new equipment. Whether you’re looking for a long-term solution to enhance your testing capabilities or a temporary setup to meet increased production demands, we have flexible options to suit your needs. - HP3070- Agilent - Keysight- GenRad- Teradyne Our bespoke rental agreements make it easy to scale up without permanent investment—simply return the system when it’s no longer required. For ongoing support, we offer calibration, repair, and maintenance services through convenient service contracts. If you’re looking to retire any outdated or non-functional In-Circuit Test (ICT) systems, we’ll offer fair market prices, helping you maximise value on any surplus equipment.
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VR/AR/MR Calibration Platform
AR, VR and MR device calibration is critical for product performance. Leverage Averna’s standardized alignment platform to efficiently calibrate cameras and Inertial Measurement Unit (IMU) modules with supreme accuracy. Easily customize or upgrade the base platform into the automated quality solution to best fit your manufacturing requirements.
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At-Speed Non-Intrusive Functional Testing
ScanExpress JET
Functional circuit board testing presents many challenges that are often costly and time consuming. Most functional tests need to be customized for each design, limiting reusability. This results in software engineers vying for time between development code and test code. Even when functional tests become available, the diagnostic details are often inadequate to give clear visibility on a given problem.ScanExpress JET is a tool designed to overcome these challenges by automating the functional test generation process on CPU–based IEEE-1149.1 compliant circuit boards. Coined JTAG Embedded Test, JET is the preferred method for at-speed, non-intrusive functional testing.
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Digital Test Instruments
Conduct pattern-based digital tests incorporating the latest parallel, digital, serial, and bus protocols with the PXIe-6943 digital test instrument.
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128 DIOs JTAG Boundary Scan Resources Unit
YAV9JTAG
Boundary-scan is a widely practiced test methodology that is reducing costs, speeding development, and improving product quality for electronics manufacturers around the world. By relying on an industry standard, IEEE 1149.1, it is relatively quick, easy, and inexpensive to deploy a highly effective test procedure. In addition, today’s PCBs have little alternative because of limited access to board-level circuitry.
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RF Test Sets
ETS-Lindgren's MF-9F Series of RF Leak Detector/Attenuation Meter Kits are designed to simplify the performance evaluation of shielding enclosures.
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6TL10 Table Top Test Base
H71001000
The 6TL-08 base platform was designed to cover the most common testing and in-system programming (ISP) needs with a reduced initial budget. The system includes a robust manual linear push mechanism allowing a low-cost fixture strategy thanks to the exchangeable cassettes.The platform enclosure features an 8-Slot fixture receiver, compatible with VPC 90 Series Mass Interconnect Module, as well as 6TL intelligent YAVModules (YAV90MMU &YAV90059), with room for fast ISP devices, optional PXI chassis and various power supplies. A removable back panel allows easy placement of custom connectors or test auxiliary circuitry.
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RAMP TEST SET
AN/USM-719
Tel-Instrument Electronics Corp.
Based on entirely new up-to-date technology and digital architecture; the AN/USM-719 large 4.75" x 3.5" in. color LCD screen and surrounding soft-keys and keyboard provides easy and quick access to a multiple of test screens menus, and display options affording single man operation, instant results, and a host of pre-programmed and manually variable parameters to meet the most demanding requirement's for testing of advabced airborne avionic and transponder/interrogator systems.
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Standardize Production Test Software For PCBAs And Electronic Devices
The vast majority of test project man-hours are spent on software development, so the choices that teams make in software tools and architecture have significant impact on deployment schedules. Standardizing software across a team or organization increases both efficiency and proficiency, lowering the risk of missed deadlines and improving test quality and reliability. Test software must:
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Automated Test Systems
WinSoft designs, develops and integrates automated functional test systems for use in aerospace, military, high tech and commercial applications
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Radio Test Set
CTS-6000 Series
Bring your radio test function into the modern age with the new CTS-6000 Series radio test set. Combining nineinstruments into one, this tester offers fault detection and operational verification of your radio communicationssystem whether in the factory, at the depot, or deployed in the field.
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Wireless Device Functional Test Reference Solution
The Keysight S8890A Wireless Device Functional Test Reference Solution provides an automation environment which is both simple to use, yet comprehensive and powerful. Based on the Test Automation Platform www.keysight.com/find/TAP, S8890A provides optional instrument driver/plug-ins offering simplified logically grouped control steps. These steps can be sequenced, looped and swept to provide powerful individual test cases or comprehensive sequences. Each driver/plug-in is provided with extensive starter sample test cases which can be modified by Keysight or the end user the UE to be tested. Plug-in options:
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Off-Line Base Test Platform
6TL19
The 6TL19 is a bare half-rack with castors for creating Off-Line, modular, flexible, and reliable Base test platforms. The overall rack capacity is 11U (580mm depth).
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Loss Test Set, Return Loss Test Set
LTS1315, LTS1315R
The KD Optics LTS1315 is a combined mains / battery powered laser source and power meter designed to make attenuation testing in the field easy, reliable and most importantly, consistent. The LTS1315R incorporates return loss measurement (RLM) capability with the ability to switch very easily between dBrel and return loss.
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NI Real-Time Test Cell Reference System
778820-35
DIAdem Advanced with DAC Bundle, Perpetual License, Include 1 Year SSP
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HV Test Set
Beijing GFUVE Electronics Co.,Ltd.
Used for testing transformer, circuit breaker & switch etc by engineer, for example TTR tester can test transformer turns ratio.
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Ionization Test Set
PFK-105
- Ionization Test Kit for Measuring Offset Voltage and Discharge Times- Includes a Field Meter, Charge Plate Monitor, ±1000 Volt Charger and Decay Timer- Balance Ionizers per ANSI/ESD SP3.3 Periodic Verification- Measure Ionizer Decay time as per ANSI/ESD S3.1 and ANSI/ESD SP3.3.- Measure Body Voltage Generation and Decay- Evaluate Ionizers and Packaging Materials- Includes a fixture to hold the PFM-711B, CPM-720B and PDT-740B as one- Molded Carrying Case with Foam Insert Included
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Sealed Beam Bulb Testing System
H710019SSL
EOL test for manufacturing of bulbs with LED for applications requiring to ensure watertightness: vehicles, marine, swimming pools, operating rooms, classified areas (Ex Zone), etc. The test system checks in a short time all the light and electrical characteristics of the bulb. A high precision Micro Leakage Meter also checks that there are no leaks between the environment and the inside of the bulb. The test results are recorded on the PC and can be printed on a quality control label attached to each unit.
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Functional Test
cUTS
Get the essentials of measurement automation to power tests of simpler PCBAs and subassemblies. compactUTS (cUTS) is a cost-effective platform for automating manual tests of devices with fewer than fifty cable-accessible test points in manufacturing environments with moderate production volume. DUT-specific electrically keyed cables make changeover quick and easy.
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PRO Test Set
TS® 52
Fluke Networks’ new TS52 PRO Test Set features the latest in test set technology. Designed with a superior, radiant liquid crystal display (LCD) user interface, it allows you to see what cannot be heard in any outside plant environment.
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Test Program Sets
Each grouping may consist of 15 levels of development ranging from Complexity 0 to Complexity 14, with level 14 the most complex. Within each complexity, nine additional subcomplexity levels exist.
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Test Sets For Switchgear Industries
These durable and modern Test Sets For Switchgear Industries are developed for determining the tripping of circuit in emergency or random current fluctuation. These testing systems save the outage and break-down of any electrical systems. They are designed to be used on multiple types of circuits. From voltage, current to vacuum, every factor is precisely tested to provide accurate results. They are easy to use and install sets available with user-friendly features.
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CT/PT Test Set
PCT200Ai
PCT200Ai is the CT/PT test set (current transformer analyzer) that can finish various current transformer test of different CT and plus reference testing functions of PT. Compared with PCT200i, its accuracy is higher.
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Four-module test set
F8200
Use the F8200 Power System Simulator for testing single-phase conventional schemes, digital protection systems, and more. This four-module F8000-series instrument is available in four standard configurations of HVA Current, HVA Voltage, and Low-Density Logic I/O modules.
