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Semiconductor Test System
TS-960e
The GENASYS Semi TS-960e PXI Express Semiconductor Test System is an integrated test platform that offers comparable system features and capabilities found in proprietary ATE systems. Available as a bench top system or with an integrated manipulator, the TS-960e takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.
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Regenerative Battery Pack Test System
17040E
High-power testing equipment up to 1,700V/ 4800A/ 1.2MW Multiple safety protections for personnel safety risk management and control of battery testing Flexible Integration for automated battery verification solutions
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Device Programming Systems
Algocraft develops and markets a wide range of professional systems dedicated to the manufacturing and testing of electronic boards. Our main series of products is the WriteNow! Series of In-System Programmers, which are completely designed and produced by us.
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Clock and Trigger Distribution Card
The clock and trigger distribution card is a simple and passive component that allows to synchronize several systems externally. No programming is necessary. A clock can be fed in from an external device or as an option an internal clock oscillator can be equipped by the factory. This clock is then also used to synchronize an external trigger signal into the clock domain. Both, clock and synchronized trigger, are then fed into a maximum of 17 different systems. Each system can be a single card or a synchronized set of cards that run with an internal star-hub.
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Scienlab Battery Test System — Cell Level
SL1002A
Test System with up to 36 Channels.The Keysight SL1002A provides sink and source with 0 to 6 V, 100 to 600 A, 0.6 to 3.6 kW and 36 channels for battery cells.
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Mezzanine System Carrier
MMS6245
The MMS6245 gives you the ultimate flexibility in rugged embedded I/O by allowing you to customize the 64 user-configurable front panel signals with our patented Electrical Conversion Module (ECM) technology. This configurable XMC carrier can host up to four ECMs giving you the ability to customize I/O to your specific needs.
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Software Program
Process Engineer 4.0
To benefit from the full potential of industry 4.0, process and asset experts must be empowered with analytics to answer their own day-to-day questions. With use of our self-service advanced analytics solution, process engineers will move from analytics aware to analytics enabled up to analytics expert. The new Process Analytics Engineer will be better equipped to improve overall equipment effectiveness, improve product quality and reduce costs.
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Test System Replication/Build-to-Print
Need to manufacture test stations? For more than 15 years we have sourced, assembled, tested and shipped fleets of robust, cost-effective solutions. We produce them at our high-volume facilities and deploy them around the world.
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SAS Protocol Test System
Sierra M124A
The SAS Sierra M124A Protocol Test System is Teledyne LeCroy's 7th generation protocol analyzer system that provides 100% accurate protocol capture of both SAS (SAS 3.0) and SATA (SATA 3.0). The industry's most widely used test platform for SAS and SATA features unmatched analysis and debug capabilities to help pinpoint problems at every layer of the protocol.
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Flight Test Instrumentation Software
TTCWare
Curtiss-Wright Defense Solutions
TTCWare is a data acquisition system configuration and programming application. Using TTCWare, you can customize the behavior of your hardware and create parameters to sample data. Parameters can be inserted into the PCM format at user specified locations in order to achieve desired sampling rates. After creating a PCM format, you can program your hardware with your customized configuration.
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Wire Harness Tester
NX Pro
The Dynalab NX Pro Wire Harness Tester is a low-cost, feature-packed, stand-alone continuity tester with a maximum capability of 512 test points. The flexibility of the NX System allows each program to perform multiple tests, display custom messages or sounds, and analyze the results of a test or an input to "decide" which operation to perform next. The NX Pro Tester has 1.3Mb memory capacity for program storage and is compatible with Printers, Scanners, and all other Dynalab NX System accessories.
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System Integration
G Systems develops fully integrated systems and we know that both software and hardware are equally important to system design. Our focus on code quality and optimization ensures customers receive efficient and maintainable code. We specialize in LabVIEW development and all of our LabVIEW developers are certified developers or architects. We’re also highly skilled in mechanical and electrical hardware design and builds on a wide variety of data acquisition, signal conditioning, RF, and distributed communication platforms.
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Iridium Physical Layer Test Systems
PLTS
Averna has worked with Iridium to ensure you have the right equipment to support their test coverage. The Iridium PLTS verifies product performance to Iridium’s standards. Find out more!
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Conformance Test System
TS8980
The R&S®TS8980 is the most compact full range conformance testing solution on the market for testing in line with requirements from GCF, PTCRB and regulatory bodies. It supports the entire device certification process for RF and RRM, covering the widest range of technologies including 5G NR based on 3GPP and carrier acceptance specifications. The test system is available in various configurations to cover the required scope of testing.
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VLSI Test System
3380
The 3380 VSLI test system equipped with a maximum of 1280 I/O channels, 256 VI sources, flexable architecture and comprehensive optional function boards (ADDA/Hi-voltage DPS) can meet the high parallel multi-test tendency.
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Flash Programming for Functional Test Systems
Flash programming stations allow you to offload flash programming from functional test systems, increasing test throughput while improving capital utilization. Circuit Check flash programmer fixtures support multiple programmer types and multiple I/O configurations.
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VLSI Test Systems
50/100 MHz clock rate50/100 Mbps data rate1024 I/O pins (Max :1280 I/O pins)Up to 1024 sites Parallel testing32/64 M pattern memoryVarious VI sourceFlexible HW-architecture (Interchangeable I/O, VI, ADDA,)Real parallel trim/match functionTime & frequency measurement unit (TFMU)High-speed time measurement unit (HSTMU)AD/DA test optionSCAN test option (max 1G M/chain)ALPG test option for embedded memorySTDF tools supportTest program/pattern converter(J750, D10, V50, E320, SC312, V7, TRI-6020, ITS9K)User friendly windows 7 environmentCRAFT C/C++ programming languageSW (Software) same as 3380P & 3360P
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Medalist i1000D Small Foot Print Inline and Offline In-Circuit Systems
U9405A
Unlike traditional bridge type board handlers that add a 3rd party equipment on your offline ICT systems, we provide a one-stop shopping experience when you are automating your in-circuit test.
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Information Technology Services
Under the IT contract, Radiance Technologies, Inc. may provide federal agencies and approved federal contractors with a wide variety of information technology services including: facility operation and maintenance; systems development; systems analysis; programming services, backup and security; data conversion; Computer Assisted Design/Computer Assisted Manufacturing (CAD/CAM); Automated Information Systems Design & Integration; network management and other information technology services.
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Lighting Systems for Aviation
Flying on every major platform, Astronics offers decades of proven experience in delivering standard and custom lighting solutions that illuminate the world’s aircraft. From commercial to business to military, chances are we offer experience with your type of fixed-wing or rotorcraft program.
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Mezzanine System
5147
ECM P/N 5147 provides two channels of 12 bit A/D conversion using the Analog Devices AD9235, and is suitable for medium resolution high speed applications. The two differential inputs are terminated in 120 ohms and buffered with a gain of 1 differential amplifier. Differential Input range is +/-3.0V. Sample rates are 20MHz per channel with a 5MHz 4 pole elliptical analog input filter.
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Multi-Functional Optical Profiling system
7505-01
Chroma 7505-01 is the newest multi-function optical inspection system that equips with the capability of measuring 1D, 2D and 3D at the same time. Penetrating reflection measurement is used for 1D film thickness measurement to measure the non-destructive film thickness on transparent and translucent material.
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Modular Breakout System 78-Pin D-type Plugin Module for 40-525A
95-525A-001
The 95-525A-001 Plugin Breakout Module is designed to be fitted to a PXI 40-525A Signal Insertion & Monitor Matrix Module as part of the Pickering MBoS. The Modular Breakout System is designed to Simplify HILS (Hardware In the Loop Simulation) Applications.
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Digital Battery & Electrical System Analyzer w/Printer
726
*Accurate Battery & Electrical System Tester *Features programmed test for new Start/Stop Batteries 3 Testers in ONE! 1) 6 & 12 Volt Battery Tester + 12V Start/Stop Battery Test 2) 12 & 24 Volt Charging System Tester 3) Alternator-Starting-Charging System Tester *Wide Testing Range from 40 to 2,000 CCA *Built-in Printer - print the results for permanent service records *Removable/Replaceable Cable Set *Patented Dynamic Resistance Technology
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Laser Diode Burn-in Reliability Test System
58604
The Chroma 58604 is a high density, multi-function, and temperature controlled module for laser diode burn-in and lifetime tests. Each module has up to 256 SMU channels which can source current and measure voltage in various control modes as described below.
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Bluetooth RF Test System
FRVS
FRVS is recognized by the Bluetooth SIG as a validated test system for qualification testing of products to Bluetooth BR/EDR and low energy RF test specifications.
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Circuit Breaker Testing
HAOMAI Electric Test Equipment Co., Ltd.
Circuit Breaker Testing is utilised to test the operation of each switching systems and the programming of the entire tripping structure.
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DIP Program Header
Series 675
DIP Program Headers. Aries DIP programmable headers offer unusual versatility for programming within the header itself. They can be individually programmed using cutters or Aries programming tool, Part No. T-675, available separately, to remove the interconnecting sections. Consult Data Sheet No. 22002 for Aries programming tool.
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Programable Power Supply & Programable Electronic Load
PW-8033P
*DC 0~32V / 0~3A X 2 + Fix 5V/3A*Triple Output 207 VA High Power*4 Digits, 4 Display*Programable Control, 9 Memory*Built In USB Interface*Series 0~64V / 0~3A Operation
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OTP-Based Test System
Power electronics assemblies often cannot be tested using conventional technology for their electrical performance. Due to the adaptability of the instrumentation, the OTP concept offers an ideal platform even beyond the space requirements of several control cabinets. In order to achieve high test flexibility with different assemblies, the system was equipped with three-phase AC sources and AC loads as well as a precise three-phase power meter. DC sources and loads with different current and voltage ranges cover the test of frequent DUT operating parameters. Time-dependent voltage or current signals can be stimulated by an arbitrary generator with power amplifier. General measurements such as current, voltage, frequency, resistance can be carried out flexibly at various test points using the matrix concept. An oscilloscope with RF multiplexer is available for high-frequency measurements such as residual ripple, switching processes, etc.
