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12 GSa/s Arbitrary Waveform Generator
M8190A
From low-observable systems to high-density comms, testing is more realistic with precision arbitrary waveform generation. Now you can take reality to the extreme: A Keysight AWG is the source of greater fidelity, delivering high resolution and wide bandwidth simultaneously. This unique combination lets you create signal scenarios that push your design to the limit and bring new insight to your analysis. Get bits and bandwidth and enhance your reality.
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Generates Test Cases on ICE
TrekSoC-Si
TrekSoC-Si automatically generates self-verifying C test cases to run on the embedded processors in SoCs in in-circuit emulation (ICE), FPGA prototyping, and production silicon. This verifies your chips more quickly and more thoroughly than hand-written diagnostics or running only production code on the processors. TrekSoC-Si's generated test cases target all aspects of full-SoC verification and work in a variety of different environments. TrekSoC-Si is a companion to TrekSoC, which generates test cases for simulation and acceleration. TrekSoC-Si extends the benefits of TrekSoC into hardware platforms.
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Memory Test System
T5833/T5833ES
T5833 system is a cost-efficient, high-volume test solution capable of performing both wafer sort and final test of DRAM and NAND flash memory devices. Amid surging sales of mobile electronics, DRAMs, NAND flash memories and multi-chip packages (MCPs) — the main device types used in smart phones and tablets — are quickly evolving toward higher speeds and greater device capacity. Internet and cloud servers also are driving demand for faster, higher-capacity ICs. Yet the cost of testing today's wide array of memory devices is an obstacle for chipmakers, which urgently require solutions that can deliver high functionality, high performance and low cost of test (COT). Advantest's new, multifunctional T5833 memory test system meets these needs, delivering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories and next-generation non-volatile memory ICs.
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ATE & Test Systems
Data Patterns' core business for over 20 years has been the development of Automated Test Equipment for critical aerospace requirements. Data Patterns developed a Multi Programmer with associated test automation software in 1994. Christened the DP-800 this product was adopted for the implementation of test rigs for Navigation Platform Test Benches, Engine Test Bed Automation, Cable Harness Test Systems, etc. This product was effectively utilized in the development of test benches required by Indian Space Research Organisation (ISRO) for the Polar Satellite Launch Vechicle (PSLV) and Geo Stationary Launch Vehicle (GSLV). Based on this foundation, the next generation test benches were developed in the cPCI architecture. Presently, Data Patterns develops cPCI based test systems for Laboratory applications as well as VME based test systems for challenging environmental conditions. Examples of test solutions built by Data Patterns are indicated below.
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Arbitrary Function Generator 14-bit, 100Msa/s
PXI-5412
The PXI-5412 is a 20MHz arbitrary waveform generator for generating custom arbitrary waveforms and other standard functions such as sine, square, triangle, and ramp. The arbitrary generator generates signals from -6 V to +6 V and uses direct digital synthesis (DDS) to generate precise waveforms.
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Standard 1.50 (42.00) - 3.30 (94.00) General Purpose Probe
P2663G-1C1S
Current Rating (Amps): 3Average DC Resistance lower than (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 90Full Travel (mm): 2.29Recommended Travel (mil): 67Recommended Travel (mm): 1.70Overall Length (mil): 810Overall Length (mm): 20.57
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Portable Test System
MT781
Actual value, vector, curve displayCurrent and voltage generationerror measurementMeasurement of harmonics up to the 40th
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Test Instruments
Test instrumentation from COTS to custom, including VXI, PXI and LXI-based platforms.
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Standard 3.00 (85.00) - 6.00 (170.00) Non Replaceable General Purpose Probe
G-S-F
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 30Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 67Recommended Travel (mm): 1.70Overall Length (mil): 780Overall Length (mm): 19.81Rec. Mounting Hole Size (mil): 86Rec. Mounting Hole Size (mm): 2.18Recommended Drill Size: #44
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9GS/s 16Bit 8GS Mem 4CH 8 Markers RF AWG Benchtop
P9484B
The benchtop version of the Proteus arbitrary waveform generator series offers up to 12 channels in a 4U, 19” benchtop box. With a 9” touch display and on-board PC the benchtop platform enables users to program the instrument without the need of an external PC. Users can program the instrument from the onboard PC using various programming environments such as MATLAB, LabView, Python, and more. So for synchronized, phase coherent, multi-channel applications such as quantum physics and radar applications the Proteus arbitrary waveform transceiver is an ideal, high performance, and cost effective solution
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PXIe-5413, 20 MHz Bandwidth, 2-Channel, 16-Bit PXI Waveform Generator
785114-01
PXIe, 20 MHz Bandwidth, 2-Channel, 16-Bit PXI Waveform Generator - The PXIe-5413 is a 20 MHz arbitrary waveform generator capable of generating user-defined, arbitrary waveforms and standard functions including sine, square, triangle, and ramp. This arbitrary waveform generator can generate signals from -12 V to +12 V and uses a fractional resampling method to precisely generate waveforms. The PXIe-5413 also features advanced synchronization.
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Vibration Test Systems
L.A.B.’s Vibration Test Systems help you design high quality, cost-effective products and shipping containers by accurately measuring sensitivity to vibration.
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In-Circuit Test System
TestStation LX
TestStation LX is a cost-effective in-circuit test solution providing high-volume electronics manufacturers with reliable, high-quality test for the latest printed circuit board assembly technologies.
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16 Bit / 400 MS/s Arbitrary Waveform Generator
AWG16
The AWG16 is a 16 bit Arbitrary Waveform Generator for high-speed / high resolution waveform generation. The fully differential signal path from the DAC all the way to the outputs ensures an exceptional high signal quality. Despite the emphasis on signal quality the AWG16 also has a very good DC accuracy.
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Test Automation System for Durability Testing
STARS MATS
STARS MATS is a Mileage Accumulation Test System application available with the STARS Automation platform for chassis dynamometer. The application provides test execution, equipment control, refueling, and vehicle state monitoring to perform long endurance test without the necessity of continuous staff presence. Its flexible design offers a wide range a customization, and it addresses the different testing requirements from manual to fully-automated operation.
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Automated Test Equipment
These systems test semiconductor performance and quality with industry-leading precision and cost efficiency. Robust support for semiconductor design evaluation, volume production ramps, and yield improvement.
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Alternate 1.30 (37.00) - 4.50 (128.00) General Purpose Probe
HPA-1L-1
Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 67Recommended Travel (mm): 1.70Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 655Overall Length (mm): 16.64
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Alternate 2.52 (71.00) - 6.50 (184.00) General Purpose Probe
EPA-3T-1
Current Rating (Amps): 6Average Probe Resistance (mOhm): 35Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Mezzanine System
5676
The Abaco SystemsP/N 5676 ECM module provides eight channels of 16 bit voltage measurement in the 0 to 2.5V volt range. For each channel the common mode voltage range is -100 volts to +100 volts.
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Automated Test Systems
Chroma Systems Solutions, Inc.
From power conversion to battery to electrical safety, our test systems will maximize your time, improve your validation process, and increase your throughput.
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PXIe 16 Bit Arbitrary Waveform Generator - up to 1.25 GS/s on 1 Channel
M4X.6630-X4
The M4x.66xx-x4 series arbitrary waveform generators (AWG) deliver the highest performance in both speed and resolution. The series includes PXI Express (PXIe) cards with either one, two or four synchronous channels. The large onboard memory can be segmented to replay different waveform sequences. The AWG features a PCI Express x4 Gen 2 interface that offers outstanding data streaming performance. The interface and Spectrum’s optimized drivers enable data transfer rates in excess of 2.8 GB/s so that signals can continuously replayed at a high output rate. While the cards have been designed using the latest technology they are still software compatible with the drivers from earlier Spectrum waveform generators. So, existing customers can use the same software they developed for a 10 year old 20 MS/s AWG card and for an M4x series 625 MS/s AWG.
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9GS/s 8Bit, 4GS Mem 4CH 16 Markers AWG
P9084D
The Proteus P9084D, is a 9GS/s, four channel arbitrary waveform generator packaged in a 4U, half 19” dedicated chassis, offering technologically advanced options and configurations that integrate the ability to transmit, receive and perform digital signal processing all in a single instrument. The P9084D offers industry leading performance Including an innovative task oriented programming, real time data streaming, fast feedback loop for environment dependent waveform generation and user customizable FPGA for application specific solutions.
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Alternate 3.20 (90.00) - 6.90 (196.00) General Purpose Probe
EPA-4J-1
Current Rating (Amps): 7Average Probe Resistance (mOhm): 35Test Center (mil): 187Test Center (mm): 4.75Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,320Overall Length (mm): 33.53
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Speaker/Receiver Unit Test Generator
BK2019
The BK2019 Generator is easy to operate, simple to set up, and you can fit it just about anywhere. This portable generator produces tones or sweeps and is technology you can whip out of your briefcase, plunk down on a table and start using. It's equally useful for either spot checking or for quality control. The setup is so easy that you can change DUT's in minutes.
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Automatic Welding Control System
The system is designed to move the tractor and position the welding head of the machine, which implements the industrial technology of one-sided automatic welding using the "cross-slide" method with obtaining guaranteed high-quality formation of the top and root of the seam.
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Ethernet/LXI generatorNETBOX 16 Bit Arbitrary Waveform Generator - up to 125 MS/s on 8 Channels
DN2.657-08
The generatorNETBOX DN2.65x arbitrary waveform generators (AWG) is a general purpose multi-channel AWG with outstanding dynamic performance. The series includes LXI units with either four, eight or 16 synchronous channels. The large onboard memory can be segmented to replay different waveform sequences.
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Automatic Oil Insulation Test Kit
The test kit is fully automatic and has the facility forAuto/Manual selections. The operator simply needs thesample in the test vessel & selects the required test. Testingcan be done as per many international ( IEC & Europeanstandards ) which are programmed into the instrumentmemory . Stand time, Stir times & Rate of rise of appliedvoltage can be selected in Custom Mode also , one setof such selected mode can also be stored in the memory. In addition to the above set can also perform withstand test(proof) tests. In this test the set allows the set voltage to pre-set value & hold for one minute to see if breakdown occurs. The backlit LCD is used for user friendly operationsduring the test process. It also display fault condition messages such as open ground and cover open . All the user selected programmes are chosen through(4x3) key pad.The test results can be printed along with with test type, date, time, breakdown test voltage, averages and deviations. Voltage value can be measured & printed with a resolution of 0.1kV. In reprint option it is possible to have number of printouts for the last test. For each test the readings are recorded and stored in memory.
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Standard 1.08 (31.00) - 3.50 (99.00) General Purpose Probe
EPA-2C30
Current Rating (Amps): 5Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 160Full Travel (mm): 4.06Recommended Travel (mil): 107Recommended Travel (mm): 2.72Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 970Overall Length (mm): 24.64
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Mezzanine System
5174
The 5174 provides two major functions, serving as a precision Voltage Controlled oscillator board and a variable frequency source board. These features can be use together or independently. As a variable frequency source, the 5174 provides a high-resolution variable clock source that is based upon a reference clock supplied by the ECM carrier.
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PXI-5652, 6.6 GHz RF Analog Signal Generator
779670-02
6.6 GHz PXI RF Analog Signal Generator—The PXI‑5652 features continuous-wave generation capabilities with FM, 2‑FSK, or OOK modulation. It uses direct digital synthesis (DDS) for high-resolution frequency hopping or phase-continuous sweeping for fixture and device characterization applications. The PXI‑5652 is ideal for clocking nonstandard sample rates, such as WCDMA signals at baseband or intermediate frequency (IF). With these versatile signal generators, you can perform analog and digital modulation through the onboard DDS circuit, which gives you frequency modulation and frequency-shift keying for applications such as bit error rate test, antenna testing, or even keyless entry. You can also perform amplitude modulation using on-off keying.
