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Automated Testing Services
Automated tests are software products. So, one must refer to the process of automating tests as to any other software development process.
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Automated Testing
TestComplete
Got an aggressive testing schedule? No problem. With this automated testing tool, designed for advanced and novice testers alike, you can create, manage and run tests for any desktop, Web or rich client software. Revel in the easy-to-use interface and script-free testing combined with a powerful set of customization features.
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Ethernet Motion Controllers
DMC-21x3
Galil's DMC-21x3 Ethernet motion controllers are designed for extremely cost-sensitive and space-sensitive applications. These controllers are typically half-the-price and half-the-size of box-level Ethernet controllers. These intelligent, card-level controllers can be purchased with plug-in, multi-axis amplifier boards which eliminate wiring between the controller and drives.
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Cable, 3POS B2CF Omnimate To Pigtail, Automotive Ethernet, Unshielded, 1m
787108-01
3-Pin, Male B2CF Omnimate to Pigtail, Automotive Ethernet Cable - The B2CF3M-Pigtail Automotive Ethernet Cable helps you connect Automotive Ethernet interfaces with ECUs, devices, switches, and accessories. This cable is available in 1 m and 5 m lengths.
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Fungus Test
The fungus test assesses the extent to which material will support fungal growth and how any fungal growth may affect performance. The fungus test also identifies how rapidly fungus will grow on the material, and how fungus affects the material, its mission, and its safety for use following the growth of fungus on the material.
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Noise Source, 10 MHz to 26.5 GHz, nominal ENR 15 dB
346C
The Keysight 346C noise source is the ideal companion to Keysight's noise figure solutions. Since it is broadband (10 MHz to 26.5 GHz), it eliminates the necessity for several sources at different frequency bands. The low SWR of the noise source reduces a major source of measurement uncertainty; reflections of test signals. Option K01 is a coaxial noise source and features coverage from 1 to 50 GHz with a 2.4 mm coaxial connector.
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DC Hipot Testing
Weshine Electric Manufacturing Co., Ltd
Your product description goes here.
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Microwave Testing
220
The PICOPROBE® MODEL 220, a high performance microwave probe which incorporates a WR-5 waveguide with our patented coaxial design techniques, has inherent low loss and low dispersion characteristics.
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Test Sockets
Yamaichi Electronics Co., Ltd.
A test socket is the ideal point to test your home’s internal phone wiring for faults. You can also use it to identify any potential faults with the phone line outside. Your test socket is located in your master socket. It is the point between the internal phone wiring in your house and the phone line outside. That means by plugging into your test socket you can bypass all the internal wiring and test your device directly on the phone line.
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Grabber Test Clips
Grabber test clips are specially designed with tips that slide onto wire-wrap terminals. And with available do-it-yourself Grabber test clips, the user can assemble quickly and with ease.
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Test Adapter
Ramcheck 72 Pro
Our latest addition to the RAMCHECK memory tester provides needed support for testing 72-pin SO DIMM modules used in older laptop computers. The RAMCHECK memory tester automatically detects the presence of the RC 72 Pro adapter
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Electrical Measurements Test
The tests are performed to measure and collect data from electrical and electronic parts using various measurement methods including, but not limited, to the following: capacitance, resistance, winding resistance, insulation resistance, magnetic permeability, power input, and quality factor Q.
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DHCP Tests
The Dynamic Host Configuration Protocol (DHCP) provides configuration parameters to Internet hosts. DHCP consists of two components: a protocol for delivering host-specific configuration parameters from a DHCP server to a host and a mechanism for allocation of network addresses to hosts. DHCP is built on a client-server model, where designated DHCP server hosts allocate network addresses and deliver configuration parameters to dynamically configured hosts. (Source: RFC 2131)
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Companion for on-Site Testing
PTMate
The PTMate app is our mobile companion for the Primary Test Manager™ (PTM) software. It supports you on site by providing additional features on your smartphone, for example, sending images, displaying wiring diagrams, or sharing jobs and reports.
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LTE RRM Test System
T4010S
The T4020S LTE RRM tester is the Keysight platform for LTE RRM conformance testing of LTE UEs. T4020S belongs to the Keysight LTE product family and, as the other LTE T4000S test platforms, is based on the T2010A LTE Wireless Communications Test Set.
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DRAM Module Test
We provide our customers with Automated SLT (System Level Test) Solutions for DRAM Module HVM test. Our solution gives our customers the best possible combination of technologies for the best performances and manufacturing effiencies - increasing yield, reducing cost of ownership and accelerating time-to-market.
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Platforms For Offline Tests
The offline platforms are a perfect base for the conception of a real modular Automatic Test Equipment for low to mid manufacturing volumes.
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High-Density Precision SMU (10 PA, 30 V)
PZ2131A
The Keysight PZ2131A is a high-channel density precision source / measure unit (SMU) having 5 channels per module and saving space for a wide range of applications requiring numerous precision power supplies. The narrow-pulse function and fast Digitizer Mode allow the PZ2131A to expand the conventional static DC measurements to emerging dynamic measurements. Its seamless current measurement ranging function eliminates the time it takes to change the range and expands the dynamic range to cover multiple measurement ranges, which reduces test duration. These capabilities make the PZ2131A suitable for applications that require numerous precision power supplies, such as semiconductor reliability tests and integrated circuit (IC) tests. The Keysight PX0107A low noise filter adapter lowers its voltage source noise level, which makes the PZ2131A suitable for noise-sensitive applications such as quantum computing as well.
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cDAQ-9181, 1‑Slot, Ethernet CompactDAQ Chassis
782052-01
1‑Slot, Ethernet CompactDAQ Chassis - The cDAQ‑9181 is a CompactDAQ Ethernet chassis designed for small, distributed sensor measurement systems. The chassis controls the timing, synchronization, and data transfer between C Series I/O modules and an external host. You can use this chassis with a combination of C Series I/O modules to create a mix of analog I/O, digital I/O, and counter/timer measurements. The chassis also has four 32‑bit general‑purpose counters/timers. You can access these counters through an installed, hardware‑timed digital C Series module for applications that involve quadrature encoders, PWM, event counting, pulse train generation, and period or frequency measurement.
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In-Circuit Test Systems
TestStation In-Circuit Test Systems provide full structural and functional coverage for a wide range of manufacturing, component, process, and performance for high-performance analog, digital, and mixed-signal devices used on modern PCBs.
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Phoronix Test Suite
Following the success of Phoronix in covering the Linux hardware scene, the Phoronix Test Suite was founded based upon the internal tools developed at Phoronix Media. The Phoronix Test Suite has a growing community and is used by numerous organizations and Fortune 500 companies. The Phoronix Test Suite continues to be developed and experiences major updates on a quarterly basis.
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Flying Probe Test
Producing the highest quality test programs since 2005, Test Coach is the proven specialist firm for flying probe test. Our in depth knowledge of SPEA systems and over 10 years of honed flying probe test techniques guarantees that our test programs offer the highest test coverage possible. As an In – Concert Partner with SPEA, we work closely with their team to keep at the forefront of new product innovations and technology, so that we can provide the latest advancements to our customers. In addition to test program development, we offer board test services, maintaining the systems and staff that allow for high throughput and the ability to consistently deliver the rapid turn times that customers can depend on. And, with 7,000 square feet of space, we feature a modern, clean, ESD safe and ITAR registered facility that surpasses expectations.
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Memory Test System
T5851/T5851ES
The T5851 system is designed to provide a cost-effective test solution for evaluating high-speed protocol NAND flash memories including UFS3.0 universal flash storage and PCIe Gen 4 NVMe solid-state drives (SSD), both of which are expected to be in high demand for the LTE 5G communications market.
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Railroad Test Sets
Triplett Test Equipment & Tools
Railroad Testers are designed to perform standard maintenance tasks (using Volts, Ohms, and Amps measurements) as well as specialized tasks requiring measurements on railroad coding equipment. The 2000 Series is compatible with older test technologies and offers test features not found on earlier test sets.
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Eggplant Test Automation
Keysight Eggplant Test 7.0: Test automation software designed to streamline testing and reduce associated risks with manual do-it-yourself testing on any platform.
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Test Solutions For Integrators
Beyond being your test equipment expert, Testek can also provide engineering design advice and guidance on building complete test solution facilities. We will work closely with your building contractor to advise on the most optimal layout configuration and to specify all facility resource requirements. For systems that may share resources, we can facilitate resource demand and management, including power management and fluid management. With a central control system, we can provide software logic to monitor these resources and route them appropriately based on demand and priority.
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Thermal Test Chip
Thermal Engineering Associates, Inc.
Thermal Test Chips (TTC) are used in many different Applications: Package Thermal Characterization, Heat Source Simulator, Temperature Reference Platform, Transient Analysis, System Thermal Management Design, Thermal Interface Material (TIM) Measurement & Characterization, Heat Sink Measurement & Characterization.
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LoRa Test Solution
To ensure optimal operation, LoRa devices must provide reliable and consistent performance. The IQfact+ LoRa offers an optimal solution to accelerate volume manufacturing testing while minimizing engineering effort.
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Exchangeable Test Fixture
MA 2112/D/H/S-7/GR228x-15/15
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 17,46 kg
