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Tire Rolling Resistance Test System
This system measures the rolling resistance of each tire accurately. In addition to the simultaneous measurement of tire loss resistance and rolling resistance coefficient for each drive by mode operation (JC08, WLTC), coasting test, constant acceleration/deceleration test and transient mode test are able to be performed. Furthermore, measurement of driving noise/ vibration of the tire, effect of the tire loss due to the temperature change can be verified by adding options.Conforming the JIS D 4234: 2009 and ISO 28580: 2009.
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Meter Test Systems
We offer a huge variety of products for meter testing. From the smallest device with the size of a single-phase meter up to customized semi-automatic systems with more than 40 test positions.
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Backplane Test System
402HV
Our model 402HV is the result of 25 years of high voltage / high pin count test systems experience. We produced our first high voltage system back in 1985. It was programmable up to 600 volts / 600 Mohms and had over 49,000 test points. It could test a 5k point board in less that 15 seconds. Since then we have built hundreds of high voltage test systems, with our highest voltage system capable of testing up to 2000 Volts DC / 1500 Volts AC. (One of our 600 volt systems, built in 1986 is still in operation testing boards for a defense contractor.)
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Physical Layer Test System
N19301B
The N19301B Physical Layer Test System (PLTS) 2022 software is a powerful signal integrity tool for today’s high-speed digital designers.
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Brake Test Systems
Worldwide, high-speed transport is getting more important. Only through continued improvement and expansion of braking systems, will suppliers all around the world provide a solid foundation for safe traffic. HORIBA has been successfully making brake test stands for more than 90 years.
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High Voltage Switching Test System
The advanced development of new technologies, such as SiC and GaN, have opened the opportunity for more efficient and higher voltage/power performance in switching and power management circuits. Their high cutoff frequencies, low on-state resistance, and very high breakdown voltages can increase power supply power handling densities approaching hundreds of watts/inch. Reliability of these new technologies and techniques is critical for realizing practical applications. While Silicon devices have a rich history of proven reliability, these newer compound semiconductor technologies are too new to have a reliability history and have not been well proven. Further, process variations, even in well-controlled lines, yield widely varying results. This has driven the need for additional testing and to burn-in devices prior to delivery.
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Bottom Electrode SMD Test Fixture
16198A
Designed for impedance evaluations of bottom electrode SMDs and supports 201 (mm) and 402 (mm) sizes
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UXA Signal Analyzer, Multi-touch, 3 Hz to 110 GHz
N9041B
Characterize challenging millimeter-wave signals: 5G, 802.11, satellite, radarMake continuous sweeps up to 110 GHzCapture lower-level spurious signals with DANL as low as -150 dBm/Hz (> 50 GHz)Simplify analysis of the latest wideband signals: 1 GHz fully-integrated instantaneous bandwidth; 5 GHz with external IF output
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Test Cell System
qCf FC50/125
qCf: Our revolutionary test cell system for the professional characterization of fuel cells.
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COMPUTERIZED AUTOMATIC RELAY TEST SYSTEM
CVRT-S16
CVRT-S8 & S16 are ideal for automatic testing of ELECTRO MECHANICAL AND READ RELAYS (only DC relays) both for static and dynamic characteristics. This system scans at one stroke, all the parameters of the relay as per definition of test procedure. The test sequence can be pre-programmed and stored in the disk. You can select the tests as per your requirement. Can include or exclude the test and you can have several options to match your test definitions. Semi skilled person can be engaged for actual testing, as he need not make any settings and need not interpret the readings. The system conducts the tests and gives PASS / FAIL indication on overall test results. If a printer is connected, each test result will be printed.Test Parameters : -> Coil Resistance.-> PickUp/Pull In /Operating Voltage or Current Linear Ramp Method or Step Method.-> Measure Pickup Contact Gap FBB-LBB V or mA-> DropAway/Drop Out/Release Voltage or Current Linear Ramp Method or Step Method.-> DropAway Contact Gap FFB-LFB V or mA-> % Release Dropaway/Pickup-> Contact Resistance of all contacts both Front and Back contacts.-> Operating Time @ Set Voltage or Current.-> Contact Bounce or Chattering Time while Operating @ above-> Release Time @ Set Voltage or Current.-> Contact Bounce or Chattering Time while release @ above-> Difference of Operate Time - Release Time.-> Bridging Test or Non Overlap Test.-> Transfer or Traverse Times while Operate and release.-> Operate Time @2nd Set Voltage or Current.-> Release Time @2nd Set Voltage or Current.-> Power Consumption @ Rated Voltage.-> Coil Current @ Rated Voltage at Room Temperature.-> Coil Resistance Corrected to 20deg C.-> Timing Waveform Graph for all active Contacts.
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ARTES Automatic Relay Test Systems
The purpose of power system protection is to use accurate and reliable protection devices to detect faults promptly and without fail and to minimize impairments to the power supply by selectively switching off faulted sections of the system.The use of suitable protection devices can significantly improve the safety and reliability of complex electrical power systems and installations. Regular testing is the only way to ensure that these protection devices function correctly throughout their operational life.More than 20 years of experience in developing and manufacturing automatic relay test systems have gone into creating the third generation of ARTES test instruments. Back in 1996, KoCoS was the first company to present Windowsbased testing software for controlling and operating test equipment and the company continues to play a pioneering role in the design of clearly structured and ergonomic user interfaces today.
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Source of Signals
CRS+
The CRS+ is a stable and calibrated source of signals which cover the 9KHz - 30MHz frequency range. The fundamental signal is a 15KHz comb and each harmonic is output as a narrowband peak of known amplitude. This signal is output on either the L and N lines, referenced to ground. A switch provides on/off and line selection.
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Annual testing of Automatic Identification System
AIS
The purpose of an annual testing is to determine that AIS is operational as defined in appropriate performance standards - the International Maritime Organization (IMO) Performance Standard (MSC 74(69)) and IEC standard, IEC 61993-2: Maritime Navigation and Radio Communications Equipment and Standards Automatic Identification Systems (AIS).
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Signal Analyzer
bsw TestSystems & Consulting AG
The simplest way to measure the phase noise is to compare the Device-Under-Test (DUT) to the source of a spectrum analyzer. With the SA set at the same frequency as the OUT, you see the sum of the SA's and DUT's sideband-power spectrum on the SA display. It is a simple and straight forward method well suited for free running VCO's where the SA is easily an order better.You can improve on this method by establishing a Phase Lock (PLL) between the DUT and the Local Oscillator and create a zero-IF or base-band spectrum analyzer system.
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At-Speed Non-Intrusive Functional Testing
ScanExpress JET
Functional circuit board testing presents many challenges that are often costly and time consuming. Most functional tests need to be customized for each design, limiting reusability. This results in software engineers vying for time between development code and test code. Even when functional tests become available, the diagnostic details are often inadequate to give clear visibility on a given problem.ScanExpress JET is a tool designed to overcome these challenges by automating the functional test generation process on CPU–based IEEE-1149.1 compliant circuit boards. Coined JTAG Embedded Test, JET is the preferred method for at-speed, non-intrusive functional testing.
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Signal Generators
NF‘s function generators have been used in many applications, since NF produced the first Japan-built function generator in 1959.A function generator is general-purpose test equipment used to generate various waveforms and to execute trigger, sweep and gate oscillation.
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Signal Converters & Load Cell Signal Converter
Mantracourt provide a range of signal converter modules which take load cell or strain bridge inputs and provide a data output in a variety of bus and protocol formats. Hardware formats include RS232, RS422 RS485, CAN and USB. Signal converter protocols include Industry Standards such as MODBUS, or Mantracourt’s own proprietary protocols which have been optimised for either ease of use (MantraASCII2) or higher speed communications (MantraBus2).
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5G Carrier Acceptance Test System
NetOp
R&S®NetOp is the leading platform for network operator device acceptance test, covering all leading tier 1 operators.As one-stop shop for Protocol, IMS, Data Performance, E911 GNSS the supported carriers include:North America: AT&T, Verizon Wireless, T-Mobile USLatin America: America MovilChina: China Mobile, China Unicom, China TelecomJapan: NTT DoCoMo, Softbank, KDDI
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TriPaddle Signal
TriPaddle signal contacts achieve superior performance using VPC's patented TriPaddle design. Rated up to 20,000 cycles Carries up to 7 amps (22 AWG ) or 10 amps (14 AWG) continuous Resistance is 4 mOhms max
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Functional Test Systems
With extensive experience in functional test equipment, a world-wide service and support organization, and a broad range of software/hardware options, we will supply cost-effective production-ready test solutions to meet your test challenges. Proposals developed by our functional test engineering team include a detailed description of system requirements, test instrumentation, estimated test cycle times (as applicable), footprint, and other key specifications.
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Signal Transformers
Signal transformers are used as a step-up / step-down, isolating, or impedance matching component in electronic devices.
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Signal Generator
SGA4
The C.Scope SGA4 is an affordable Signal Generator designed for use alongside a CXL4 or DXL4 Cable Avoidance Tool. It enables significantly more underground utilities to be detected including street lighting cables.
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Electrodynamic Vibration Test Systems
i-series
Vibration tests have become diversified and specifications have become increasingly strict.i-series offer a user-friendly lineup with enhanced performance and durability.
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D-Mic Testing System
BK3012V2
Easy to use and faster than human testers can load, the new BK3012V2 is the upgrade of our popular BK3012 D-Mic tester. Setup is even easier than for the BK3012 and you can enter specifications and be ready for testing in a few minutes. As well as testing, the BK3012V2 can be connected to a computer, so you can keep your results and analyze them for current quality and trends over time.
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LED Test Production System
Lumere-LC
Evolusys Technologies Sdn. Bhd.
Lumere LC is a LED test and measurement system for various parameters of LED light. It is economical, its geometry conforms with CIE-Publication 127, and the test program is easy to configure and adjust. Main application is in the production of LEDs.
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Signal Conditioner
INELTA Sensorsysteme GmbH & Co. KG
Signal Conditioning of LVDT Displacement Sensors and Force Sensors
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(2500kN+) Fatigue Testing Systems
8806
The precision mechanical systems, combined with the advanced features of the 8800 digital controller and Dynacell™ load cells, enable Instron to supply fully-integrated turnkey solutions to meet the most demanding applications. The system can be used to cover a broad range of static and dynamic test applications, covering metals, rebar, high-force fracture mechanics, aerospace panels, civil engineering components, wire ropes, or concrete.
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Signal conditioning
Simple parameterization of the sensors and visualization of the measured values via the on-site display.
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Electrodynamic Vibration Test Systems
PET-series
Vibration controller: Enables complicated vibration tests being coupled with the vibration controller.
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640 Gb/s Digital Signal Processor
M8132A
The M8132A is a powerful digital signal processing module featuring two customers accessible Xilinx Ultrascale+ FPGAs, four optical data interfaces (ODI) running at up to 160 Gb/s in+out each, and a PCIe Gen3 x8 link to the AXIe backplane. In addition, the module provides a trigger input and output, synchronization input and outputs for deterministic latency between compatible digitizers and AWG modules as well as a 10-general purpose I/O pins. The M8132A is part of Keysight’s Wideband Solution Platform that consists of a portfolio of compatible instruments, including digitizer, arbitrary waveform generator, digital signal processor and storage modules.
