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ARINC 818 Tester
iWave 3U VPX High-Speed Video/Data Processing Card is a rugged standalone module in the 3U VPX form factor, aimed for the high-speed data, video processing, and display applications is ideal for military, defense, and aerospace applications requiring an optimal balance of performance and power efficiency. iWave 3U VPX High-Speed Video/Data Processing Card is implemented using Xilinx Kintex-7 device architecture and has I/O interfaces including High speed 16 channels of transceiver interfaces capable of operating up to 6 Gbps data rate, Gigabit Ethernet, RS232, RS422, PCIe interface, Built-in health monitoring circuits, HDMI input, and output interfaces
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IR Radiation Systems And Systems
Irradiation systems with infrared are used in test applications when a high heat input to the test object is required. In our portfolio you will find a wide range of different designs and areas of application for IR systems. From simple radiation modules to highly complex radiation systems.
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Test Automation System for Driveline Testing
STARS Driveline
STARS Driveline is an integrated automation, acquisition and control system that provides a broad range of application functionality in a single, powerful environment. It has been designed to fulfil the specialist requirements and applications for driveline testing from simple modal testing on two or four wheel drive systems, to RLS simulation or advanced applications such as service load replication (SLR).
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Circuit Breaker Simulation Device
PSS01
PSS01 is the circuit breaker simulator，which can conduct circuit breaker simulation to test the whole secondary relay scheme together with relay test set. It is very good accessory for protection relay test kit to avoid complicated software programming to finalize the same test.
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Brake Test Systems
GIANT Evo
The GIANT Evo is an extension of the well-proven GIANT product portfolio and has been developed to suit the growing demands and needs of the current and future brake markets. Covering the market segments from mini and compact cars to medium sized SUVs as well as large vehicles, this brake testing machine forms the base of HORIBA’s inertia brake dynamometers portfolio. All components are specifically tailored to the needs of the passenger car market segment.
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Testing System
OpTest™ MTF
The Optikos OpTest™ MTF Testing Equipment is the most flexible and complete system for characterizing the optical performance of optical elements, lens assemblies and optical imaging systems in Infinite Conjugate, Finite Conjugate and Afocal configurations spanning the UV, Visible, NIR, SWIR, MWIR and LWIR spectral regions . OpTest™ software drives Optikos hardware, is easy to use and controls all motion control, image acquisition, configuration set-up and data reporting.
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Optomechanical Devices
Optomechanical devices include an optical chopper, scanning galvo mirrors, adaptive optics, a motorized pinhole wheel, a piezo objective scanner, a motorized flip mount, motorized filter wheels, and optical beam shutters.
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Test System
ETS788
The 55/110 MHz ETS788 system boasts the same small footprint and cool quiet CMOS architecture as our ETS780 but with the new high-performance precision components of our Griffin series. This powerful member of the HiLevel family takes advantage of all of the tried and true features that have served users so successfully to date. Learn why the ETS788 is the perfect cost-effective solution for higher performance in Design Verification, Production and Failure Analysis.
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G7 Connected Safety Devices
Our G7 product line incorporates leading incident detection and advanced location technology with 3G and satellite communications to ensure seamless monitoring. From gas detection to lone worker monitoring and evacuation management, G7 has your teams covered.
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Phase Noise Test System
PN9000 System
Noise eXtended Technologies S.A.S.
The PN9000 is a simple and fast Automatic Phase Noise Test System covering a very wide frequency range. Its modular architecture allows optimum configuration, multiple measurement techniques and future growth in a NIST tested instrument.
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Integrated NDT Inspection Device
FlawHunter
The FlawHunter is an integrated NDT inspection device, equipped with an advanced, high-resolution Laser Shearography sensor with a vacuum (partial) excitation system. It is ergonomic & easy-to-use and is equipped with a workflow-oriented, GUI-display and left/right-hand button control. Regardless of the application, the FlawHunter provides reliable and resolute measurement results for in-field (service) NDT and quality control (post-production) operations.It can be used on any material & surface provided a stable vacuum can be generated within the vacuum seal (viewable inspection area).
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Mature & Discontinued Devices
The product families on this page have been classified as "Mature". In most cases there is a newer technology product family that will better meet the needs of today's system logic designers. Designers working on new designs are strongly encouraged to evaluate the alternative product families listed in the "Use for New Designs" column. Unless a Mature Family has been formally superseded via our Product Change Notification (PCN) procedure Lattice will continue to support existing business for these Mature products. Certain of the products for which the PCN process has been completed have been transferred, as indicated in the table, to Rochester Electronics or Arrow Electronics. Please contact those companies for availability of the products indicated.
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Single Event Effects Test System
SEE-RAD
The SEE-RAD test system brings together the proven features of our ETS780 tester (such as true APG memory test and powerful FA tools) with the newest technology of the Griffin III. With all new high-accuracy DC Parametrics, superior precision pin drivers, and capture memory of 64M, the Griffin SEE-RAD combines the newest innovations in the test industry with our years of experience in Radiation Test.
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Multi-Purpose RF Test System
SPA1241
The S - Series multi-purpose RF test system can be used in many applications such as R&D lab, ATE factory testing, EMC testing, field testing, and general purpose RF design. The S - Series is a flexible alternative to expensive and bulky RF test equipment. As shown in the setup in the upper right the S-Series system can be utilized to simultaneously provide all RF functions using its 7 inch front panel display or can be connected to a larger monitor for ease of viewing multiple windows at the same time
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Configurable Data-Logging System
NI CompactDAQ
This NI CompactDAQ configurable data-logging system includes an NI CompactDAQ controller or chassis, C Series I/O modules, and Chameleon software. It is designed for structural test and monitoring applications with the NI CompactDAQ controller, which includes built-in processing and nonvolatile storage for running Chameleon software and logging data locally. Alternatively, you can choose a USB or Ethernet chassis for a lower cost system that requires an external PC. This system accepts a variety of C Series I/O modules, so you can mix and match microphones, accelerometers, and temperature and bridge-based sensors.
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AVL Battery Test Systems
In modern electrified powertrains (xEVs), huge demands are placed on batteries. These electrochemical energy storage and conversion devices must meet market requirements such as long-lasting high power and energy performance, and dynamic charge and discharge processes.
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Electricity Metering Device
Mk10D
Built on the advanced Atlas metering platform, the Mk10D adds three 100A UC3 compliant relays into the meter which allows for disconnection and reconnection of electrical services remotely.
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Pneumatic Horizontal Shock Response Spectrum Test System
KRD15 series
KRD15 series is the state-of-the-art shock response spectrum tester that adopts compressed gas energy to provide impact energy, push the shock hammer to impact the resonance plate, and generate high energy shock. Comparing to traditional pendulum shock response spectrum tester, this machine has the advantages of high energy, stable performance, high reliability, good repeatability, easy adjustment, safety and environmental protection. It is mainly applied in the industries of aerospace, aviation and ships.
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Circuit Breaker Endurance Test System
Endurance testing involves operating – closing and opening – the circuit breaker repeatedly for a set number of cycles. This test is necessary to stabilize the circuit breaker mechanism and to identify “Early Infant Mortality” failures in the switchgear assembly.
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Memory Test System
T5835
The new T5835 has full testing functionality, from package testing to high-speed wafer testing, for any memory ICs with operating speeds up to 5.4 Gbps, including all next-generation memories from NAND flash devices to DDR-DRAM and LPDDR-DRAM. It can handle 768 devices simultaneously for final package-level testing. It additionally features functions such as an enhanced programmable power supply (PPS) for advanced mobile memories, and a real-time DQS vs. DQ function to improve yield.
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Handheld Testing Device
GPON Tracer
GPON Tracer is the ideal tool for both telecom operators' field engineers and customer support teams of OLT and ONT/ONU manufacturers. Featuring a compact handheld device with a user-friendly touch screen interface, the GPON Tracer provides a rich variety of real-time indications in simple graphical and textual formats, giving accurate indications of network and service issues and their root causes. Moreover, GPON Tracer reduces repair charges by preventing unnecessary replacements of properly working equipment.
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Transmission Performance/Endurance Test System
This system is suitable for vehicle drive test with only the transmission unit in combination with the real-time model calculation by the measurement/control panel and low inertial motor. Simulation test of an actual vehicle running condition can be executed by modeling engines, tires or vehicles other than transmission. The engines, tires and vehicles are modeled by MATLAB® / Simulink®, so they can be evaluated under various conditions by changing parameters or replacing models.
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Goniophotometer Test System For Led Lamp
LCG-1680B
Shenzhen Chuangxin Instruments Co., Ltd.
Design according to IEC61341the test method of central luminous intensity and beam angle for reflecting light, this instrument can be used to test the cross section luminous intensity distribution curve, central luminous intensity and effective beam angle of LED assembled luminaries and LED lens system with diameter less than 180mm.
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Optics Test Systems
Front Window Scanner For Wedge Angle Measurement
Optik Elektronik Gerätetechnik GmbH
Scanning of complete automotive windshields to measure the wedge angle and thickness change, especially in the HUD area.
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Variable Frequency Series Resonant Test System
HTXZ(L) / 150
Wuhan Huatian Electric Power Automation Co., Ltd.
This system is designed and manufactured for the communication withstand voltage test of 11kV/30MW hydro-generator.
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Electro-Dynamic Vibration Test System (Air Cooled)
HIACC Engineering & Services Pvt. Ltd.
The air-cooled electro-dynamic vibration test system has a wide frequency range, high reliability, easy to operate and small foot-print area. The force ranges from 1kN to 70kN, and maximum load is from 70 kg to 1000 kg. This product can be integrated with HIACC’s environmental chambers.
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Mixed Signal Test Systems
MTS1020i
The MTS-1020i is a cost effective production ATE designed for testing high-volume linear and mixed signal semiconductor devices (Op Amps, high-voltage drivers, DAC, ADC, etc.), both at the wafer sort and final test stages of the manufacturing process
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Transducer Test System
TTS-030
For the generation of unique bond links the use of high-quality components is an essential precondition. Despite all care in the production of ultrasonic transducers again and again unexpected effects occur, which only manifest themselves in the use of those transducers and which also have the reason in the transducer itself.
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Battery (EV) Automatic Test System
Landrex Technologies Co., Ltd.
Battery (EV) Automatic Test System
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Thermal Conductivity Measuring Device
TCM1001
In recent years, there has been a demand for small and thin electronic products such as mobile devices, and printed circuit boards are shifting to thin, multi-layered, and even modularized printed circuit boards. effect of bonding materials, that is, the ability to easily conduct heat, is emphasized, and testing equipment that evaluates thermal conductivity is required .As a business of our company, we have mainly manufactured and sold test equipment for solder wettability tests and solder bonding strength, but there was a need to urgently develop next-generation bonding material test equipment to replace these. Under these circumstances, we received a request from an academic research facility to manufacture a device that can measure the thermal conductivity of conductive adhesives under research and development, and we were able to obtain an opportunity to develop the device. We proceeded with the development based on these requirements .
