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Meter Test System
MTS-100
Kongter Test & Measurement Co., Limited
This Meter Test System features state-of-art designing with high accuracy. It is composed of high accurate (class 0.05% or 0.1%) standard reference meter and power source (up to 120A). This system is particularly designed with modular structure for calibration and test of different single phase/3 phase electronic/inductive active and reactive energy meters.
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Swept Test System For Optical Components
measurement platform for optical components with a fastscan speed, high resolution and accuracy. The systemcombinesour tunable lasers, polarization controller, power meter and software.
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PXI/PXIe High-Accuracy Multi-Measurement Device
PXM(e)7822
The PXM Multi-Measurement Devices combine the functionalities of a 16 Bit digitizer, a 24 Bit multimeter, a timer/counter and a highly flexible trigger matrix in a PXI or PXIe device.
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AC Resonance Test System
KV Hipot Power Test Equipment Co.,Ltd
KVXZ-270kVA/270kV Variable Frequency AC Resonance Test System is applied for AC dielectric test for electric equipment.
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Horizontal Vibration Test Systems
G-3 Series
This series was used for the special structure of airbearing guide of inspection for Seismic Detectors andcharacterized is large displacement and high-accuracywaveform. In addition, the use of the Windows seismicdetector controller is easy to operate it.
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Analog DAQ Devices
Family of ruggedized products that provide an isolated analog, digital or temperature interface to a PC via the PC’s USB port.
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Clock Generation Devices
Analog Devices offers ultralow jitter clock generation products for wireless infrastructure, instrumentation, broadband, automatic test equipment, and other applications demanding subpicosecond performance. Our clock products are ideal for generating the high speed, low noise clock signals required to clock high performance analog-to-digital converters (ADCs) and digital-to-analog converters (DACs). ADI clock ICs integrate PLL cores, dividers, phase offset, skew adjust, and clock drivers in small chip scale packages.
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Power Electronic Devices
REINHARDT System- und Messelectronic GmbH
We also produce the power electronics devices listed below. They can be integrated into all our Test Systems.
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Camera Test System
FS 8681 / SR
FS8681/SR is software for evaluating images* and making pass/fail judgments in camera mass production inspections. It consists of the "Editor FS8681" application that sets the inspection content and the "Sequence Runner FS8681SR" application that executes the set inspection.
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Passive Devices
Passive Devices by Senko - attenuators, fused products, optical switches, plc splitter series, routing, WDM series, and more
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Test Automation System for Brake Testing
STARS Brake
STARS Brake is an integrated automation, data acquisition and control system platform that provides a comprehensive application functionality in a single, powerful environment. STARS Brake is designed to address the needs of a wide range of brake testing applications from component development to final component and system validation. It offers users a level of flexibility and openness that enables thorough investigations of brake systems.
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Automatic Transformer Test System
TH2829CX
Changzhou Tonghui Electronic Co., Ltd.
Number of Test PIN: 20 ■ Frequency: 20Hz-1MHz, Resolution: 0.5mHz ■ Signal Level: 5mV-2Vrms(Option:2mV-10Vrms) ■ Test Speed: max. 13ms ■ 7-inch TFT LCD display with a resolution of 800×RGB×480
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System
SYS-36
Systems with 36" chambers tend to be a customer favorite for their flexibility. They are easily used for many different types of coatings. Often times they are best utilized in a prototype or multi part production facility where a specialized system such as a dual chamber box coater is not required. They are, however, still configurable for specialized processes.
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L2-3 Testing of Virtual Network Infrastructure and Devices
IxNetwork VE
Keysight Network Applications and Security
IxNetwork VE makes it easy to perform wide-scale functional testing of Layer 2 and 3 devices. Using scaled protocol emulation, IxNetwork VE tests network infrastructure, capacity, scalability, and convergence to ensure peak performance of data center and cloud computing environments. You can perform wide-scale testing thanks to IxNetwork VE’s flexible deployment of an Ixia traffic generator and protocol emulation, enabling you to achieve seamless infrastructure performance across virtual networks.
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Optics Test Systems
WAS 160: Wedge Angle Sensor
Optik Elektronik Gerätetechnik GmbH
Portable measuring head for wedge errors and radius of curvature, eg of car windshields, airplanes and helicopters. It can be used for any other glass panes.
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Surge Voltage and Surge Current Testing Systems
HIGHVOLT Prüftechnik Dresden GmbH
Pulse Voltage Test Systems are used for surge testing on transformers, cables, gas insulated switchgear (GIS), arresters, and other high voltage equipment.
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HEV / EV / Grid Emulators and Test Systems
With Scienlab test systems and test software, Keysight offers customized test environments for the development and testing of electronic components according to hybrid and electric vehicle testing standards. Our solutions help you to accelerate your e-mobility applications from the battery, Battery Management System (BMS), inverter, the charging interfaces of Electric Vehicle (EV), and Electric Vehicle Supply Equipment (EVSE).
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Integration of Inline Test Systems
The test system and adapter can also be integrated in inline test systems. Additional communication can take place via interfaces (e.g. RS232, DLL). We have already created numerous integrations for different manufacturers.
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Automated Test Systems
Chroma Systems Solutions, Inc.
From power conversion to battery to electrical safety, our test systems will maximize your time, improve your validation process, and increase your throughput.
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AC Resonance Test System
Shanghai Guantu Technology Co., Ltd.
AC withstand voltage test is an effective and direct method to identify the insulation strength of electrical equipment. During the operation of power equipment, the insulation will gradually deteriorate under the action of electric field, temperature and mechanical vibration for a long time, including overall deterioration and partial deterioration, forming problems. question.
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Mixed signal LSI test system
Multi-pin type model is now launched in WL27 Logic/Power mixed LSI test system.This system is suitable for multi-site test in A/D mixed device such as automotive・motor driver IC. It’s a high throughput and cost performance mixed signal LSI test system.
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Series Resonance Test Devices
Wuhan Huatian Electric Power Automation Co., Ltd.
Voltage capacitance testers by HVTEST
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System
SYS-24
The system shown here was built for a customer to be used in metallization, a common use for many smaller systems. It is also fully capable of performing optical coatings when equipped to do so. This particular system came equipped with a 16" APD ISO Flange mounted cyropump, and a Varian tri-scroll for roughing. The cooling tubes for the crystals as well as the drive motor for the parts holder can be seen on the top of the chamber.
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Mobile Measuring & Testing Systems
Individual testing tasks for technical plants and large machines often require the use of a large number of measuring instruments on site, which are difficult to network with each other and which, in the case of complex measurements, require a lot of experience and time in operating the measuring equipment and analysing the recorded measured values. The applications and possible uses can be quite different:
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Automated Multi-Edge Measurement Device
EdgeMasterX
The EdgeMasterX is a fully automated cutting edge measurement device for production integrated quality assurance of inserts, drills, mills and other round tools. Specifically, the EdgeMasterX enables automated multi-edge measurement of tools. In a single measurement run, a complete series of user defined measurements at multiple edge positions can be achieved. All results are traceable, repeatable, and in a high vertical resolution.
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Partial Discharge Simulation Devices
Hangzhou Xihu Electronic Institute
Simulation device of cable PD faults, simulation device of switchgear PD faults, simulation device of GIS PD faults, simulation device of transformer PD faults.
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Discrete Devices Test
FTI 1000
The FTI 1000 tester consists of independent test channels that allow all DC and AC MOSFET parameters to be tested either separately, or in one handler insertion or prober touch-down.
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Circuit Breaker Test System
TDR9100
The Doble TDR9100 Circuit Breaker Analyzer is a state-of-the-art circuit breaker test set for testing all types of circuit breakers with efficient and accurate performance measurements.
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Training & Simulation Devices
Designed to minimize instructor input and provide realistic, automated response.
