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eBIRST™ – Switching System Test Tools
The eBIRST toolset consists of four different tools that support 200-pin LFH, 104-pin, 78-pin and 50-pin D-type connectors and a set of adaptors that allow connection to other connector types. A supplied application program controls the eBIRST tools via a USB2 port that also provides the tool power and controls the switching system using a Test Definition File to define the test sequence.
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Custom Motor Test Systems
Magtrol's Customized Motor Test Systems (CMTS) are PC-based, turnkey systems custom designed and built to meet your specific motor testing requirements. By integrating Magtrol's motor test equipment with power supplies, adaptable fixtures, custom tables/cabinets, printers, etc., Magtrol's engineering team can customize PC-based, turnkey systems and modular test benches for almost any motor test application.
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Test System
NFC Xplorer
The CISC NFC is a compact, high-quality test system, developed for HF RFID and NFC devices measurements and performance and conformance tests.
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Solenoid Test Systems
The production solenoid test systems are designed to check a high volume of parts each shift, verifying all important parameters of the solenoid.
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Instrumented Pendulum Impact Testing System
JB(INSTRUMENTED)
Jinan Testing Equipment IE Corporation
JB-450I/750I Instrumented Pendulum Impact Testing Machine is equipped with high precision instrumented strain-gauged striking edge & high-speed data acquisition system. This instrumented test system can measure the force of a test specimen during an impact event. Then, the instrumented test data can be used to calculate the energy absorbed by the test specimen. In addition, the crack initiation and arrest loads can be used in fracture mechanical models.
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Vibration Test System
Guangdong Bell Experiment Equipment Co.,Ltd
DGBell's Vibration Test System is a simulation of the various environments encountered in the manufacturing, assembly, transportation and use phases of execution. It is primarily used to identify the ability of a product to withstand environmental vibrations.
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DWV/IR Test Systems
When used in conjunction with ART's own parametric relay test systems such as the RT290, the RT900 offers high speed AC and DC Hipot (dielectric withstand voltage) and Leakage testing of relays or other multi-pin passive devices.
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High Voltage Cable/Harness Test System
CKT1175-50
The CKT1175-50 is a high-voltage wiring analysis system that features a switching matrix that can be distributed around the workshop or in and around the assembly to be tested. This system is expandable in 100 or 150 test point increments to 96,000 test points, and is available with a variety of adapter cable interface connectors, with the standard being the CKT MAC interface system
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Thermal Stability Test System
Premier Electrosystems' Thermal Stability Test Setup is used to test thermoplastics and PVC (Plasticized Polyvinyl Chloride) materials. When exposed to continuous heat, these materials degenerate and emit harmful acidic gases. The instrument is manufactured for testing PVC materials for their thermal stability at higher temperature.
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Incircuit and Functional Test Systems
REINHARDT System- und Messelectronic GmbH
We offer test systems which vary in their expansion and can be used for different ranges of automatic testing.
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RF Conducted Immunity Test System
RFCI61000-4-6
RFCI61000-4-6 RF Conducted Immunity Test System is an automatic test system which is for the conduction sensitivity testing, it is fully meets IEC61000-4-6.2006, ISO11452-4, GB/T17626.6-2008 and GTB152B-CS114 etc standards. RFCI61000-4-6 internal source and broadband power amplifier can be generated 3 voltage test levels: 1v, 3v and 10v, and has the function of the real detect output level. It has two operation software which is calibration software and test software. When measuring, the signal is in 1 KHZ sine wave amplitude modulation system (80%) to simulate the actual harassment, and can through the coupling/decoupling network (CDN or electromagnetic clamp) to make the harassment signal coupled to the device.
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Test Fixture
16047E
Perform impedance evaluation of lead type devices of up to 120 MHz; includes a guard and a shorting plate
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ECM Noise Under RF Test System
BK8020
The BaKo Type BK8020 ECM Noise Under RF Test System tests microphones under RF noise, using a ‘Direct Injection Test’ in the frequency range of 5MHz~2.5GHz with an amplitude modulated (AM) disturbance signal of 1kHz. You run the system using the controlling PC, which allows automatic configuration and which runs the test sequence automatically. When you finish testing, you can print data as an MS Excel report or save it for comparison and analysis.
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Rail Traction Inverter Test System
The rail inverter test system uses a pulse test methodology to verify proper operation of the IGBT switching elements in a subway car motor control. The system is designed to verify proper commutation of the switching elements. A large capacitor bank allows testing at DC voltages up to 1kV and peak currents of up to 3kA into reactive loads.The system also integrates self test capabilities and safe-to-turn-on (STTO) diagnostics to ensure no gross faults are present prior to the application of high voltages. Further the system includes dielectric withstand (hi-pot) test capability to ensure electrical safety.
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PXI System for LRU Test
ARINC 629
PXI System for LRU Test Support. The system shown here was developed in support of Boeing 777 LRU Production Test.
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Vehicle Tracking System
Information System Technologies Inc.
ISTI has built a vehicle tracking system that overcomes the challenges with acoustic tracking and localization of small ground and airborne vehicles using low-cost wireless sensor nodes. The sensor-level sub-band feature extraction and streaming of the encoded data enables real-time direction of arrival (DoA) estimation and tracking even for large wireless sensor networks with limited bandwidth. Benefits include: accurate tracking of single or multiple closely spaced electric or gas driven small planes and UAVs, collaborative decision-making, target localization and classification, robustness to sensor node loss, flexibility and deployment ease. The interface gives users complete control over the entire sensor network, including the ability to monitor the azimuth and elevation angles to the targets in real-time.
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SSD Test System
The Neosem’s SSD test system combines advanced SSDtest hardware, software and environmental chamber into a single platform and supports all popular storage interfaces including PCIe, SAS & SATA and fast emerging protocols such as NVMe and AHCI.
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LED Power Driver Test System
Chroma C8000
Chroma Systems Solutions, Inc.
The Chroma 8491 ATS is equipped with optimized standard test items for LED driver testing (lighting & TV backlight). The user is only required to define the test conditions and specifications for the standard test items to perform the test.
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CDM Test System
1100-CDM series
Tokyo Electronics Trading Co., Ltd.
Model 1100-CDM is the latest model developed as a successor to the conventional CDM-550, and supports testing methods (Field-Induced CDM) that conform to international standards. In addition, a camera and a high-accuracy robot can apply CDM stress to a precise position.
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Stationary Meter Test Systems AC
Today Meter Test Technology is much more than only testing accuracy and functionality of a conventional electricity meters. With implementation of SmartMeters a complex test and data management system is required. – It’s a good thing to have experts by your side.
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Automated Test Systems
Chroma Systems Solutions, Inc.
From power conversion to battery to electrical safety, our test systems will maximize your time, improve your validation process, and increase your throughput.
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Camera Test System
FS 8681 / SR
FS8681/SR is software for evaluating images* and making pass/fail judgments in camera mass production inspections. It consists of the "Editor FS8681" application that sets the inspection content and the "Sequence Runner FS8681SR" application that executes the set inspection.
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Vehicle Multiprotocol Interface Module
C Series
C Series Vehicle Multiprotocol Interface Modules use hardware-selectable NI-XNET Transceiver Cables (TRC) to communicate High-Speed/Flexible Data‑Rate CAN, Low-Speed/Fault Tolerant CAN, and/or LIN. Using the NI-XNET driver, you can create applications that require real-time, high-speed manipulation of hundreds of CAN and/or LIN frames and signals. The NI-XNET device-driven DMA engine enables the onboard processor to move frames and signals between the interface and the user program without CPU interrupts, minimizing message latency and freeing host processor time. C Series Vehicle Multiprotocol Interface Modules work well in applications such as hardware-in-the-loop (HIL) simulation, rapid control prototyping, bus monitoring, and automation control.
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Universal Testing Systems (Up to 600 kN)
5980 Series
Instron 5980 Series floor model testing systems are universal, static testing systems that perform tensile and compression testing; and also perform shear, flexure, peel, tear, cyclic, and bend tests. The 5900 Series are engineered for precision, built for durability, and offer the flexibility for changing requirements. They are designed with standard and optional features that increase testing efficiency and improve the testing experience for the operator. 5980 Series floor models are robust, heavy-duty frames commonly used for testing high-strength metals and alloys, advanced composites, aerospace and automotive structures, bolts, fasteners, and plate steels. Frames are available in load capacities of 400 and 600 kN.
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Phase Noise Test System
PN9000 System
Noise eXtended Technologies S.A.S.
The PN9000 is a simple and fast Automatic Phase Noise Test System covering a very wide frequency range. Its modular architecture allows optimum configuration, multiple measurement techniques and future growth in a NIST tested instrument.
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Six-Cell Diffusion Testing System
Phoenix DB-6
The Phoenix DB-6 (six-cell diffusion block) provides an ideal platform compliant with 21 CFR Part 11 for release-rate testing of six vertical diffusion cells at once using manual sampling methods. Controlled by an advanced computerized display, the DB-6 provides uniform and precise heating and stirring of six cells. The compact footprint of the DB-6 economizes on lab bench space.
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Conformance Test Systems
With an established market leadership position in GCF and PTCRB approvals for LTE-Advanced and all leading-edge technologies, Anritsu continues expanding its number of test case validations in GCF and PTCRB for Protocol, RF and RRM conformance testing. With increasing complexity of wireless technologies, Anritsu Conformance Test systems provide easy-to-use control software to maximize testing efficiency.
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COMPUTERIZED AUTOMATIC RELAY TEST SYSTEM
CVRT-S16
CVRT-S8 & S16 are ideal for automatic testing of ELECTRO MECHANICAL AND READ RELAYS (only DC relays) both for static and dynamic characteristics. This system scans at one stroke, all the parameters of the relay as per definition of test procedure. The test sequence can be pre-programmed and stored in the disk. You can select the tests as per your requirement. Can include or exclude the test and you can have several options to match your test definitions. Semi skilled person can be engaged for actual testing, as he need not make any settings and need not interpret the readings. The system conducts the tests and gives PASS / FAIL indication on overall test results. If a printer is connected, each test result will be printed.Test Parameters : -> Coil Resistance.-> PickUp/Pull In /Operating Voltage or Current Linear Ramp Method or Step Method.-> Measure Pickup Contact Gap FBB-LBB V or mA-> DropAway/Drop Out/Release Voltage or Current Linear Ramp Method or Step Method.-> DropAway Contact Gap FFB-LFB V or mA-> % Release Dropaway/Pickup-> Contact Resistance of all contacts both Front and Back contacts.-> Operating Time @ Set Voltage or Current.-> Contact Bounce or Chattering Time while Operating @ above-> Release Time @ Set Voltage or Current.-> Contact Bounce or Chattering Time while release @ above-> Difference of Operate Time - Release Time.-> Bridging Test or Non Overlap Test.-> Transfer or Traverse Times while Operate and release.-> Operate Time @2nd Set Voltage or Current.-> Release Time @2nd Set Voltage or Current.-> Power Consumption @ Rated Voltage.-> Coil Current @ Rated Voltage at Room Temperature.-> Coil Resistance Corrected to 20deg C.-> Timing Waveform Graph for all active Contacts.
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Memory Test System
T5801
Capable of Testing Ultra-High-Speed DRAM Devices, Supporting Next-Generation GDDR7, LPDDR6, and DDR6 Technologies
