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Paint Inspection Gauge
141
The Paint Inspection Gauge is ideal for use on metallic & non-metallic substrates such as wood, glass and plastics.Large easy grip handle - makes cutting thick or hard coatings easyInternal cutter storage compartmentx50 magnification microscope
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Semiconductor & Flat Panel Display Inspection Microscopes
MX63 / MX63L
The MX63 and MX63L microscope systems are optimized for high-quality inspections of wafers as large as 300 mm, flat panel displays, circuit boards, and other large samples. Their modular design enables you to choose the components you need to tailor the system to your application. These ergonomic and user-friendly microscopes help increase throughput while keeping inspectors comfortable while they do their work. Combined with OLYMPUS Stream image analysis software, your entire workflow, from observation to report creation, can be simplified.
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On-site EL/PL Inspection Machine
“EPTiF”
"EPTiF (EL/PL Test in Field)" enables you to check invisible conditions of installed solar panels during daytime by EL and PL inspections, which are adopted by a number of solar panel manufacturers, without detaching solar panels. Irradiance-independent and steady results can be obtained. This is the first in the industry.
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X-Ray Components
Photonis designed the Micro Pore Optics detector to be used in X-Ray imaging applications. Its perfectly square, flat channels are optimized to allow X-Ray and UV photons to be focused or collimated due to the total external reflection at a grazing angle (<2°). Micro Pore Optics are installed on a number of international space missions.
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Dual Projection 3D In-Line Solder Inspection System
KY8030-2
The new KY8030-2 delivers 2x fasterinspection without compromising performanceand accuracy.Using patented dual projection, the systemeliminates the critical Shadow problem thatall 3D SPI systems can be vulnerable to.Easy UI and SPC Plus are included in the systempackage in order to help users achieve faster& easier printer process optimization
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X-ray Inspection System
TruView Prime
The TruView Prime is a fully motorized radiography system developed to meet the stringent requirements of electronics assembly and component inspection. The TruView Prime is professionaly built - something hard to find in entry level systems in the TruView Prime's price range.
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X-ray Fluorescence Measuring Instrument
FISCHERSCOPE® X-RAY XDLM®
Universal instrument for inspection of small parts and small structures, measuring of light metals, hard coatings and thin electroplated parts.
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Conformal Coating Inspection (CI AOI)
They cover the components, the area around the components and identify most coating issues including cracks, bubbles, insufficient / excess coating, loss of adhesion and other common contaminations. Full coverage inspection for conformal coating.
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Automated Inspection Systems
Our systems utilize phased array and eddy current array to inspect the full volume and surface of various products and profiles in many manufacturing industries, such as metal, aerospace, transportation, power generation, and oil & gas.
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Silicon Inspection System
NIR-01
The NIR-01 imaging system is made of CNC engineered Aluminium alloy. The suruface protection is powder painting and electrolitic oxidation on pure aluminium surfaces. The frame of the system is a high quality industrial design. All components are designed for long term heavy usage with minimal maintenance needs. Electrical components are also selected for stability and durability. The block like electronics gives the advantage of easy and quick repair.
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Waterproof Inspection Cameras
waterproof inspection cameras have waterproof probes, General's DCS6XX wet/dry cameras, the DCS600A, DCS605, DCS660A, DCS665 & the DCS665-ART, go one step further because their grips and monitors are also waterproof. This feature, unique in the industry, allows users to inspect toilets and water and sewer lines carrying running water without worrying about dropping and "dunking" the instrument.
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Sensor for Filament Inspection
EyeFI
EVT presents the EyeFI - the sensor for the inspection of filaments. The sensor contains two cameras with an Aptina sensor and S-Mount lenses. The cameras are perpendicular to each other. It is therefore possible to inspect two sides of the filament, which means that the EyeFI can detect if the filament is out-of-roundness. Additionally the errors and defects can be detected. For example the occurring flaws are point-shaped or partly flaked, or point-shaped and transverse, or also looking like a longitudial rib, or only spots in different shapes. The defects can be detected with the EyeFI sensor. The EyeFI contains board cameras with sensors from Aptina, the IoCap and an evaluation processor. The housing is about 14x10x4 cm in size. The IoCap is the image-capture-IO-board, which is designed and developped by EVT.
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Inspection Tools
Deca XG1040
SATA 3.0 Gbps interface supportedSATA 3.0 Gbps supported. Up to 144PB HDD is supported.Register and edit inspection details (operation modes)Operation modes can be registered and edited using script files in text format.More accurate inspections can be performed using various types of inspections.Provides high speed data transfer at 8GB/minute.(* Varies according to performance of connected HDD.)Deletion and quick diagnostics functionEquipped with overwrite deletion using specified values and DoD (Department of Defense) conforming deletion method.Quick inspections such as SMART status, random seek inspection, entire area read/write inspection can be performed.HDDs connected to each port can be executed, terminated, attached or removed individually.Multiple channels supportedUp to 16 HDDs can be operated by attaching 4 devices.
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Semiconductor Wafer Microscope Inspection System
MicroINSPECT
MicroINSPECT Semiconductor Wafer Defect Microscope Inspection System combines state-of-the-art robotics, intelligent microscopes and SITEview software to provide a flexible, easy-to-operate defect inspection platform for either micro or macro defect wafer inspection.
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Abrasive & Blast Inspection
Blasting parameters: A number of important parameters need to be monitored during the blasting or water jetting process, these include: air pressure (at the nozzle), nozzle diameter, blast media contamination & pH values in order to avoid recontamination of the substrate during blasting.
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Non-Destructive Resonant Inspection Drop Test Fixture
RAM-DROP
The Drop Test Fixture, Model RAM-DROP, Resonant Inspection System, allows automated sorting and quality testing of small metal injection molded (MIM), powder injection molded (PIM), additively manufactured, and other small parts by using the Resonant Acoustic Method (NDT-RAM).
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Benchtop Small Angle X-ray Scattering (SAXS) Instrument
NANOPIX mini
Non-destructive measurement of particle size and size distribution.Rigaku NANOPIX mini is the world’s first benchtop small angle X-ray scattering (SAXS) system that is engineered to deliver automatic nanoparticle size distribution analysis for both quality control (QC) and research and development (R&D) applications. Nanoparticle size, size distribution, and particle shape are the key pieces of information obtained from SAXS. Samples may range from solutions, suspensions or slurries to solid plastics, rubbers or polymers.
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X-ray Analytical Microscope Super Large Chamber Model
XGT-9000SL
- Large chamber capacity (W x D x H) : 1030 mm x 950 mm x 500 mm- X-ray shield complying with JAIMAS0101-2001/ IEC1010-1 to protect you from X-ray exposure- Mapping area size up to 350 x 350 mm2- <15 µm spot size with ultra-high intensity without compromising sensitivity and spatial resolution- Dual types of detectors for transmission and fluorescent X-rays- Detectable element range down to C with a light element detector and He purge module
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Automated LED Inspection and Testing
Landrex Technologies Co., Ltd.
Automated LED Inspection and Testing
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Fiber Inspection Probe
FIP-920
FIP-920 Fiber Optic Inspection Probe combines a 3.5” high definition TFT LCD display, provides a detailed image of fiber end-face, zoom in/out feature make it easy to identify the smallest particles, scratches. With the attached SD card memory, you can capture/record the live end-face image, the image file can be reviewed/transferred via SD card reader or USB cable. Up to 8hrs battery working make it possible to inspect the fiber end-face at any time and any place.
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DC Safety Inspection Device For Solar Panels
“DC Fault Tester”
Identifies defect position instantly- contributes to saving inspection time
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Non-Destructive Test Resonant Inspection System
RAM-AUTO
Resonant Acoustic Method is designed to help deliver fully inspected parts, economically and on time. Every component has a unique resonant signature or pattern that reflects its composition.
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Vison Inspection System
High Speed stroboscopic 2D vision inspection system for die attached and wirebond quality in back-end semiconductor processes. User friendly HMI for easy recipe creation and management. Able to configure with various defect identification module. (Strip Mapping, Inker, Scriber, Pucher, Bristle, Laser wire cutter and Laser clip bonding cutter.)
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Benchtop X-ray Diffractometer
Aeris
Meet Aeris – our brand-new benchtop X-ray diffractometer. Aeris will impress you with data quality and speed of data acquisition so far only seen on full-power systems. The instrument is accessible for everyone with its built-in touch screen and intuitive software. Being a Malvern Panalytical product guarantees delivery of the best benchtop data and full automatability for industrial applications. Aeris is designed for low cost of ownership and is available in 4 editions tailored to the needs of specific markets: the Cement, Minerals, Metals and Research editions.
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Solar Power Plant Inspection Service
We provide various performance/safety tests including insulation resistance measurement, ground resistance measurement as well as string I-V inspection, EL inspection, and IR inspection using thermography. We provide services of pre-operation voluntary test and pre-operation self check, mandated by revision of FIT scheme in 2017 for solar plants of 500kW – 2,000kW.
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STEEL PLATE INSPECTION MACHINE
Yubain Steel Plate Inspection Machine can effectively detect steel plate problems, including pinholes, hole breaks, hole deviations, leaks, multiple holes or few holes... and other shortcomings, which can help customers efficiently inspect incoming materials and inspections in the manufacturing process. , To avoid product damage due to steel plate problems, reduce financial losses and customer complaints.
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NEX CG II Energy Dispersive X-ray Fluorescence Spectrometer
NEX CG II
Applied Rigaku Technologies, Inc
NEX CG II, a powerful second-generation energy dispersive X-ray fluorescence (EDXRF) spectrometer, delivers rapid qualitative and quantitative determination of major and minor atomic elements in a wide variety of sample types — from oils and liquids to solids, metals, polymers, powders, pastes, coatings, and thin films.
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Automatic Flight Inspection Systems
AT-940
The AT-940 is a mobile and deployable flight inspection system providing high performance in the smallest possible package.
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DIP Vision Inspection Machine
Optima III
Landrex Technologies Co., Ltd.
DIP Vision Inspection Machine
