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Ultrasonic Testing
Pundit PL-200
The Pundit PL-200 is a best-in-class Ultrasonic pulse velocity (UPV) test instrument to examine the quality of concrete and other materials such as rock, wood and ceramics.
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Test And Repair
If you are responsible for maintaining a system where faulty electronic modules are not readily replaceable. Innovasys can assist by providing cost effective repair services or by developing support tools to allow in-house repair.Our IPC J-STD-001 certified technicians provide test and repair of electronic modules and are backed by a team of electronics engineers. This gives us the capability to diagnose and repair complex circuitry.Innovasys provides test and repair services to the Defence Materiel Organisation. Our technicians are experienced in effecting repairs to meet strict quality requirements on complex multi-layered circuit card assemblies.
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XMC-PCIeStor High Speed PCIe Triple M.2 SSD Adapter
9302
The 9302 is a VITA 42.3 XMC adapter card with three M.2 SSD sites. Each M.2 site supports one lane of PCIe Gen 2 connectivity at 5 Gb/s per lane when a Gen 2 or 3 capable M.2 PCIe card is used.
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Test Automation
Test automation helps in reducing regression testing time and cutting down the time to market with significant cost savings on long term basis. However, a clear automation strategy and roadmap is key to ensuring the right return on investment on your automation initiatives. With disparate application architecture, multiple environments, third party integrations and multiple user devices, a standardized and consistent automation approach is needed to ensure high reusability, ease of maintenance and lower upfront cost.
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Pressure Testing
Types of Pressure Testing Performed at GTS:*Hydrostatic Pressure Testing*Leak Pressure Testing*Burst Pressure Testing*External Pressure Testing*Pressure Testing at Temperature Extremes*Vacuum Pressure Testing*Differential Pressure Testing*Cyclic Pressure Testing
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Test Fixtures-Assemblies
Qmax Test Technologies Pvt. Ltd.
Test Clips are available for various types of DIP ICs like 8, 14, 16, 20, 24, 28, 40, 48 & 64. These can be supplied with or without connectors and cables for interfacing to Qmax Testers. Test Pins in the clips are gold plated and engineered for good contact with the Device Under Test. It is designed for long life and trouble free operation. For easy handling the clips are provided with metal covers.
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High Speed Optical Power Meter
Shenzhen Golight Technology Co.,Ltd
High-speed optical power meter has fast sampling and data cache functions, and supports external trigger input and analog output. It is built-in 2mm or 5mm photosurface detector, and has wide dynamic range and high measurement accuracy, can be applied to various optical loop test solutions.
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Software TEsting Services & Test Automation Services
Our test automation services help application development and delivery teams. We can help you irrespective of how many or the types of applications you need to test: web applications, mobile applications and even desktop applications. Not only are we innovators in the software testing tools space with our Qsome testing platform, but we also continually enhance software testing best-practices in the software testing services and test automation services we provide to our customers. This dedication to challenge boundaries and deliver better outcomes helps us to help you "outperform your now".
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Thermal Testing
At E-Labs, Inc., we support thermal cycling and thermal bakeout vacuum testing requirements. During thermal cycling, the unit experiences repeated heating and cooling as it would when exposed to the harsh environment of space. During thermal bakeout, flight equipment is subjected to an outgassing reduction process so as to decrease the chance of molecular contamination of the spacecraft instrumentation.
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Test Labs
ART-MAN
ART-MAN uses 285 100% vector sensors per SAM phantom and 390 sensors in the flat body phantom to take accurate measurements based on state-of-the-art near-field theory.
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Test Contactors
OCwype
Johnstech International Corporation
The new OCwype™ contactors are the latest in a long line of Johnstech products that allow companies to reduce costs and time to market.
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Test & Test Development for Circuit Card Assembly
Teledyne Advanced Electronic Solutions performs comprehensive testing at the CCA and system level assembly. Teledyne AES can perform testing developed by the customer or develop a complete test strategy for the customer’s products.- Bed of Nails FixtureIn-Circuit Test (Bed of Nails) or Flying Probe Testing for rapid feedback on CCAs- Functional testing of CCAs or complete systems- Environmental testing to include vibration, thermal cycling, HASS, etc.- CCA and system level test development- High frequency testing – currently to 40 GHz- High power system testing – currently to 4kW
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Device Testing
The BTL Working Group (BTL-WG) has developed a test package which contains a set of testing procedures. These can be acquired and used by manufacturers to pre-test their products for BACnet compliance before they send their products to an RBTO (Recognized BACnet Testing Organization) for BTL Testing. The BTL Test Package is available on the test documentation page.
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Memory Testing
C.C.P. Contact Probes Co., LTD.
Standard and Custom test solutions for RAM, Flash and many other memory chips.
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AI-Based Analytics for Lower-Power Consumption & High Speed Data Processing
Extreme Search
Introducing Extreme Search, an integrated collection of powerful AI-based analytics functions engineered for speed and transportability. The suite provides fast, flexible and comprehensive statistical reasoning, predictive analytics and query capabilities in any computing environment.
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Game Testing
Here at UpDoerTech, we strive to improve the gaming industry by providing the most comprehensive, accurate, and efficient testing mechanism. We've built an A/B testing framework so that you don't have to guess or speculate what gamers think of all your features. Our team of QA experts will help you find bugs early in the development process so that your product ships with fewer issues.
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PCIe 14 Bit High Speed Digitizer - 400 MS/s on 4 Channels
M4I.4481-X8
The 6 models of the M4i.44xx-x8 Express series are designed for the fast and high quality data acquisition. Each of the input channels has its own A/D converter and its own programmable input amplifier. This allows the recording of signals simultaneously on all channels with 14 bit or 16 bit resolution without any phase delay between them. The card uses only one A/D converter even when running with 500 MS/s, guaranteeing best signal quality without any interleaving technology. The extremely large on-board memory allows long time recording even with the highest sampling rates.
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HIRF Testing
High Intensity Radiated Fields (HIRF) testing simulates high RF peak pulsed and average fields typical of radar environments and is integral to the certification of flight essential avionics systems. L3 Cincinnati Electronics (L3 CE) can perform HIRF testing from 400 MHz to 18 GHz (with traditional average field testing from 10 kHz to 40 GHz).
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Test Solutions
AT/CX/CM Series
The VeEX AT/CX/CM series are next generation test solutions designed for analog and digital cable TV networks supporting VoIP, WiFi, and Internet service. Analog and Digital SLM, ingress noise sweep, deep interleave support, and QAM constellation analysis are among many standard features. Enhanced optional features include QAM16/64/128 Upstream Generation (USG), Reverse Path QAM Analysis, and DOCSIS 2.0/DOCSIS 3.0 Cable Modem emulation. A high capacity LiIon battery pack provides extended autonomy for a full day use with only a single charge.
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Test System
Tessy
TESSY automates the whole unit test cycle including regression testing for your embedded software in C/C++ on different target systems. As an easy-to-install and easy to operate testing tool TESSY guides you through the unit test workflow from the project setup through the test design and execution to the result analysis and reporting. TESSY takes additionally care of the complete test organization as well as the test management, including requirements, coverage measurement, and traceability.
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Performance Testing
Often times, great apps fall victim to their own success. If 20,000 concurrent users suddenly start accessing an app, it can bring even the best apps to its knees. Performance testing helps to find out the bottlenecks impacting the quality and the caliber of an IT system to perform under heavy loads.
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Test System
ETS788XL
The 50/100 MHz ETS788XL system is the compact protable version of our ETS788. Made with the new high-performance precision components of our Griffin series, this portable powerhouse offers an optional tough road case and ready to go to any test site needed. Just pop off the covers and get started. Whether it's research, Failure Analysis, or single-event effects testing, his powerful member of the HiLevel family takes advantage of all of the tried and true features that have served users so successfully to date.
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Cloud Testing
Cloud-based platforms are increasing enterprises’ ability to reduce time-to-market drastically along with eliminating upfront costs. This has led to increased interest in the adoption of cloud-based solutions. However, it brings unique challenges related to data security, privacy, integration, and application performance. These require comprehensive cloud-based testing to ensure your cloud implementations are successful and you realize complete benefits from the cloud solution.
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LED Test
Universal LightProbe Penta sensors are Optomistic Products' most popular LED test sensor, relied upon for their versatility in accommodating most LED test applications for color and intensity. The Penta Sensor provides analog voltage outputs, and features built-in color binning, eliminating the need to convert LED wavelength to visual color in the ATE software, and saving valuable processing time. For use with any of the Universal LightProbe Fiber-Optic Probes.
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Test Kit
Metriso B530
Wolfgang Warmbier GmbH & Co. KG
Test voltage / Test current: 1 mA < I < 1,3 mAHigh ohmic range: DC 10 volts,100 volts and 500 voltsTest range:low ohmic range: 1 to 10 kOhmhigh ohmic range: 1 kOhm to 199 GOhmOperation: Battery operatedProbes:2x Model 870 (weight: 2,27 kg / ø 63,5 mm) with conductive rubber (grey) and extension,1x hand-held probe Model 45
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Wafer Test
Silicon Turnkey Solution, Inc.
Most foundries provide wafers already probed to a set of DC parameters at room temperature to ensure they meet a basic subset of the package-part specification. Beyond this basic set of tests, more rigorous testing is often needed to meet specifications requiring die to be 100 percent probed, identify and segregate devices with higher performance levels and guarantee that parts will perform to a certain specification level.
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PXIe, 28.2 Gbps, 48-Channel PXI High-Speed Serial Instrument
PXIe-7903 / 788917-01
The PXIe-7903 is designed for engineers who need high-performance FPGA coprocessing capabilities or who need to validate, interface through, and test serial protocols. It includes a Xilinx Virtex UltraScale+ FPGA to implement various high-speed serial protocols, and it is programmable with the LabVIEW FPGA Module for maximum application-specific customization and reuse. The PXIe-7903 takes advantage of FPGA multigigabit transceivers to deliver 48 TX and RX serial lanes.
