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Product
Scienlab Combined Battery Test Solution
SL1133A
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Solution for testing battery cells with an output power up to ±3 kW and a voltage range up to 6 V.
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Product
Flight Control System Test Platform
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The Flight Control System Test Platform provides a hardware in-the-loop (HIL) closed-loop test environment for dynamic and maintenance testing of Flight Control Systems (FCS) of both commercial and military aircraft. The system simulates control surface activities from multiple combinations of rudder, flaps, elevator, aileron, and engine controls to the FCS. The system delivers repeatable, cost-effective testing in a fraction of the time needed with typical in-house simulation test systems.
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Product
PCIe 5.0 Test Platform
PXP-500A
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The Teledyne LeCroy PXP-500A Test Platform provides a convenient means for testing PCIe 5.0 cards with a self-contained portable and powered passive backplane. The PXP-500A provides power required for both cards under test.
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Product
Diode Lasers
Spot Creator
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Advanced Photonic Sciences LLC
Spot Creator is an innovative accessory developed for enhancing the performance of blue laser diode based engraving and cutting machines. Spot Creator solves a major problem with using asymmetric blue laser diodes: the production of engraving features that are different in the X-Y directions, resulting in unequal or blurred lines. Using Spot Creator, line widths are equal in the X-Y directions, with a minimum spot of 50 μm. The intensity on the engraved part is thus maximized.
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Product
PIN Diodes
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PIN photodiodes convert light to current – without a bias voltage having to be applied. Silicon is commonly used as an inexpensive detector material in the Vis range. For higher demands, InGaAs is used; it covers the widest spectral range from the Vis to the NIR. We offer silicon carbide as a “solar-blind” detector specifically for the UV range.
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Product
Test System Optimized for High-Performance Digital and SoC
ULTRAWAVEMX44 and ULTRAWAVEMX20-D16
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Teradyne is the leader in RF/wireless device testing and has a large installed base of UltraFLEX test systems with the UltraWave24 RF instrument. As new devices for handset and base station applications are introduced using mmWave technology, Teradyne’s mmWave instrumentation has expanded in anticipation of new testing demands.
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Product
Tunable Diode Laser Absorption Spectroscopy
5100P TDLAS Transportable
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Using tunable diode laser absorption spectroscopy, the 5100P is a transportable, easy-to-use analyzer optimized to measure either water vapor (H2O) or carbon dioxide (CO2) in select gas streams.
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Product
Radio Frequency, Communications, & Navigation Test Systems
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Reduce testing time and costs with the Astronics radio test sets for use in military, avionics, and civil security industries.Available in commercial and military grades, these integrated test systems make it easy to develop test program sets and leverage them securely and instantly across all deployed testers at the factory, depot, and operational levels.
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Product
Laser Diode
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Is a Polarization Maintaining CWDM Coaxial DFB-LD for CWDM analog communication, CATV return-path, laboratory instrument, and R&D applications. This cost-effective, high reliability DFB laser chip has a selectable wavelength with range between 1270 nm to 1610 nm. The versatile DFB-CWDM also features a built-in InGaAsP monitor photodiode, built-in optical isolator and 4-pin coaxial- pigtailed package, single mode coupling, and an FC/APC connector. Contact Optilab for more information.
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Product
SMD Test Fixture
16034G
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Perform impedance evaluation on a minimum SMD size of 0.6(L) x 0.3(W) [mm]
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Product
Scienlab Battery Test System – Module Level
SL1001A Series
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The SL1001A and SL1006A Battery Test Systems – Module Level Series help you emulate sink and source for battery modules for automotive and industrial applications.
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Product
Functional Test
cUTS
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Get the essentials of measurement automation to power tests of simpler PCBAs and subassemblies. compactUTS (cUTS) is a cost-effective platform for automating manual tests of devices with fewer than fifty cable-accessible test points in manufacturing environments with moderate production volume. DUT-specific electrically keyed cables make changeover quick and easy.
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Product
LIV – High-power Laser Diode Testing
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An important aspect of the development and manufacture of laser diodes is the so-called laser diode characterization, or laser IV curve. By applying increasing current to the laser diode so it that emits light, the optical output is measured together with the voltage drop across the diode element. The resulting LIV curve reveals important clues about the quality of manufacture and the performance of the laser diode, enabling a pass/fail decision to be met.
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Product
Optimize Throughput And Cost For MmWave 5G Device Functional Test
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Test engineers always have faced tough new test-coverage challenges. Those introduced by 5G measurements at mmWave are no exception, as they require over-the-air (OTA) radiated test solutions. But never have these pressures seen today’s intense time-to-market, manufacturing volume, and operational expectations! A solution that meets these demands must:
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Product
Diode Laser Driver
D200
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The D200 is a compact, DC-coupled fast laser driver, providing up to 4 amps of regulated constant current. A built-in edge-triggered pulse generator produces up to 1 microsecond pulse widths and 2 nanosecond transition times, capable of driving lasers with forward voltages up to 9 volts. A pulse-follower mode is also provided, accommodating externally-defined trigger widths up to 100% duty continuous-wave (CW). Power, pulse width, drive current and differential triggering functions are accessible through a ribbon cable header for embedded OEM applications. A low-inductance laser drive interface permits direct laser connection or custom interposer and flex-cable attachment.
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Product
Modular Functional Test Platform
LX-OTP2
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The OTP² system platform has recently been available in both the PXI and LXI versions. The OTP2 system platform enables the cost-effective and fast implementation of function test systems based on defined modules and function blocks. Thanks to the open system interfaces, customer-specific adjustments can be made at any time without any problems. When considering options for your next generation functional test system, it is important to assess the entire life cycle of the system and the associated costs and efforts. Use OTP² to accelerate development cycles and reduce the development effort for new functional test systems.
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Product
Die Test Handler
3112
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Chroma 3112 is a productive pick & place handler for high volume single- or multi-site bare die testing.
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Product
Digital Test Instrumentation
EDigital-Series™
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Teradyne’s eDigital IVI driver controls all parallel digital functional test parameters, including per-pin timing, data formats, pattern data, and timing alignment on 64 channels (32 static + 32 dynamic or 32 differential)—each with an 8M pattern depth and results memory.
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Product
Planar-Doped Barrier Diode Detector, 0.01 to 33 GHz
8474C
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The Keysight 8474C is a high-performance detector using a gallium arsenide, planar-doped barrier detecting element. It features extremely flat frequency response over its entire band of operation and very good frequency response stability versus temperature. The Keysight 8474C is also very rugged with high resistance to ESD damage. The Keysight 8474C detector is available with a 3.5-mm (mates with SMA, 0.01 to 33 GHz) connector. This detector offers the options for optimal sqaure-law loads (Option 102) and for positive polarity output (option 103). Because the unit-to-unit frequency response tracking of this device is typically better than 0.3 dB, no matched response option is offered.
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Product
Diode Lasers
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The large spectral coverage of our diode lasers combined with the compact form factor, direct modulation capability (up to 150 MHz), true off during modulation (>70 dB aspect ratio), and integrated spectral clean-up filters make them ideal for applications in high resolution bioimaging, flow cytometry, optogenetics and quantum technologies.
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Product
KATANA & PILAS Pulsed Diode Lasers
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With external trigger functionality, nano- to picosecond pulse duration, and a wide range of wavelengths, the KATANA & PILAS series are our most versatile offering.
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Product
EV Power Components End of Line Test Platform
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Test and Validate all EV Power Electronics with One Flexible and Scalable Solution
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Product
External Cavity Diode Lasers
ECDLs
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High-performance ECDLs and injection-locked optical amplifier.
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Product
Varactor Tuning Diodes
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Macom Technology Solutions Holdings Inc.
MACOM’s GaAs and Silicon varactor tuning diodes provide broadband performance ranging from 10 MHz to 70 GHz. They are ideal for high Q filter and VCO electronic tuning circuits and are available in die form, flip chip, plastic and ceramic packaging. These GaAs diodes boast a constant gamma series for higher frequency and high Q applications and silicon abrupt and hyper abrupt series in plastic packaging are suitable for high volume surface mount applications.
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Product
EBIRST 200-pin LFH Coaxial Adapter - 56 SMBs
93-002-202
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eBIRST adapters allow extension to other switching system connectors, including SMB
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Product
Prototyping & Test Consulting Services Solutions
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Don’t cut corners on the path to quality. We are experts in Design for Test (DFT), Design for Manufacturing (DFM), agile development, prototyping and standards/best practices in many industries. Speak to our prototyping and consulting services experts to ensure you make the right decisions and investments at the start of your project.
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Product
Diodes
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Development target specification*PD=5W class*Capability for load dump surge：ISO7637-2, JASO A-1*Reliability standard：AEC-Q101*Package size：[W×L×H] 12.0×9.6×4.3(mm)
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Product
Asynchronous System Level Test Platform
Titan
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The Titan System Level Test (SLT) platform delivers maximum flexibility, scalability and density in semiconductor test environments that require the highest levels of system performance testing. Titan is Teradyne’s solution for high-volume mobile application processor SLT requirements.
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Product
Semiconductor Test Software
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Easily create and run robust test programs in semiconductor automated test systems with ActivATE™ test management software. Designed by test engineers for test engineers, ActivATE™ tames automated test complexities with elegant simplicity.
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Product
PIN Limiter Diodes
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Macom Technology Solutions Holdings Inc.
MACOM’s PIN limiter diodes provide excellent broadband performance from 1 MHz to 20 GHz and higher for receiver protector circuits. Our PIN limiter diodes are available in die form, plastic and ceramic packaging. Our ceramic packaged diode series is ideal for waveguide, coaxial, and surface mount applications, while our die diode series is well suited for chip and wire high frequency microwave applications.
