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Instrumentation Amplifier
AAF-3G
Programmable, 2-Channel Instrumentation Amplifier for the AAF-3, AAF-3PCI, PGA-16 and OEM Data Acquisition Systems.
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PXI Semi-Dynamic Digital I/O Module, 64-Channel
40-419-001
The 40-419-001 is a 64-channel digital I/O module suitable for operating external devices, such as power, RF and high voltage relays, solenoids and lamps. It can also be used for interfacing with external logic such as a programmable instrument with a BCD interface depending upon the module’s driving capabilities.
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ATE / Bench Calibrators & Multimeters
Time Electronics offer a range of precision calibrators and digital multimeters that can be used in the lab or in automated testing applications. These programmable instruments are designed for precision, performance, and functionality, making them ideal for automatic testing and fault diagnosis. Each designated ATE calibrator is rack mountable for straightforward integration into user systems.
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Linear Power Supplies Precision, GPIB or Local Control, Ultra Low Ripple/Noise
Series ATE-DMG
Kepco's 1000 watt instrument-grade digital power supplies, Series ATE-DMG, are linear low-noise power supplies designed to respond very quickly and precisely to voltage and current setting instructions delivered interactively by the GPIB (IEEE 488.2) or from a front panel keypad. When programmed from the bus, the ATE-DMG power supplies respond to the SCPI (Standard Commands for Programmable Instruments) common language for instruments used in an automatic test system.
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Programmable S/R Standard & Simulator
5300
NAI’s 5300 Synchro/Resolver Standard & Simulator is a laboratory-grade, programmable instrument. This model can be used as a true Synchro/Resolver standard for calibrating and testing Automatic Test Equipment (ATE) for Calibration/Metrology Labs, and for Engineering Design and Production Test environments. It can also be used to measure Angle Position Indicators (API) and Synchro-to-Digital converters for static or dynamic characteristics. This model also may use an external reference waveform.
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PXI Semi-Dynamic Digital I/O Module, 32-Channel
40-419-003
The 40-419-003 is a 32-channel digital I/O module suitable for operating external devices, such as power, RF and high voltage relays, solenoids and lamps. It can also be used for interfacing with external logic such as a programmable instrument with a BCD interface depending upon the module’s driving capabilities.
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Programmable Delay Line Instruments
The XT Series
Our most precise programmable delay line instruments featuring Colby's patented trombone technology
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GSM/EDGE Analysis Using NI PXI RF Test Instruments
NI-RFmx GSM/EDGE
The NI-RFmx GSM/EDGE personality is a highly optimized API for performing physical layer measurements on GSM/EDGE cellular standard signals. NI-RFmx GSM/EDGE is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development effort.
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6 GHz, 4 Channel Programmable Delay Line
QPADL6
The QPADL6 is a programmable delay line instrument with 4 independent channels designed for adjusting the time delay or phase of radio, microwave or even digital signals with bandwidths from DC to 6 GHz.
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Instrumentation Amplifiers (In-Amps)
Renesas instrumentation amplifiers (in-amps) and programmable gain instrumentation amplifiers (PGIAs) provide the precision and high performance needed in many industrial, test and measurement, data acquisition, and medical applications.
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TD-SCDMA Analysis Using NI PXI RF Test Instruments
NI-RFmx TD-SCDMA
The NI-RFmx TD-SCDMA personality is a highly optimized API for performing physical layer measurements on TD-SCDMA cellular standard signals. NI-RFmx TD-SCDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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3-Axis Non-Robotic Automated Testing System
AT3
The Instron AT3 is a space-efficient, highly adaptable 3-axis mechanical testing platform designed for automated execution of tensile, compression, flexural, and lap shear tests. Built to comply with a broad spectrum of ASTM and ISO standards, it’s well-suited for evaluating materials such as plastics, elastomers, thin films, foils, and metals. The system streamlines the entire testing workflow from specimen measurement and handling to strain measurement and specimen disposal—enabling users to load up to 160 samples and let the AT3 take care of the rest. Boost productivity, reduce manual intervention, and achieve consistent, dependable results with every test cycle.
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Semiconductor Testers
Our integrated team of semiconductor test innovators delivers a complete system tailored to achieve your specific objectives, incorporating:Test strategyHardware designSoftware development and integrationManufacturingInstallationProgram managementOngoing support
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Instrument Bracket Kit, w/ Strain Relief, Slide Configuration, for 28"+ Slide Kits
310113002
Instrument Bracket Kit, w/ Strain Relief, Slide Configuration, for 28"+ Slide Kits Similar to instrument bracket p/n 310113453, but includes cutout to accommodate air intake on NI PXIe-1088 chassis. Only compatible with slide configurations 28" and longer. Not compatible with cable tray. Not recommended for use with 2+ tier 90 Series systems (905, 9075, etc.).Used to mount testing instrument to slides and also allows test instrument to slide out for maintenance access. Provides strain relief in front area of bracket. Compatible with chassis (see drawing for more information)
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Productivity Software
From simple connection to programmatic control, Keysight provides all the software tools necessary to accelerate the process. Compatible with the most common interfaces (GPIB, RS-232, LAN, PXI, and USB), Keysight's IO Libraries will quickly discover and configure instruments. Once the connection is established, Command Expert can control instruments using IVI-COM drivers and Standard Commands for Programmable Instruments (SCPI) Command Sets. Instrument drivers provide a higher-level and more abstract view of the instrument. IntuiLink software links an instrument to some PC applications. BenchVue software offers multiple instrument measurement visibility and data capture from a PC or mobile device with no programming.
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Bi-Directional Differential-TTL I/O PXI Card
GX5642
The GX5642 is a 3U PXI instrument card that can be used for general data acquisition, process control, Automatic Test Equipment (ATE), Functional Test, and factory automation applications. The GX5642 consists of 64 bi-directional TTL-to-differential LVDS I/O channels. Each channel has two ports (TTL and LVDS) and can be individually set to operate in either conversion or static I/O modes.
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PXI Semi-Dynamic Digital I/O Module, 48-Channel
40-419-002
The 40-419-002 is a 48-channel digital I/O module suitable for operating external devices, such as power, RF and high voltage relays, solenoids and lamps. It can also be used for interfacing with external logic such as a programmable instrument with a BCD interface depending upon the module’s driving capabilities.
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LTE/LTE-Advanced Analysis Using NI PXI RF Test Instruments
NI-RFmx LTE/LTE-Advanced
Highly optimized RF measurement experiencePerform physical layer analysis on LTE cellular signals including MODACC, ACPR, CHP, OBW, and SEMIncludes support for TDD, FDD, and LTE-Advanced signals specified in 3GPP standards release 12Simple access to advanced measurement parallelism
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Programmable Digital Panel Meters
RS485
Kusam Electrical Industries Limited
• Manages sending and receiving signal of multiple Modbus RTU instruments.• Programmable address for reading data• Data form: Unsigned Int / Signed Int• Max.Baud rate: 38400• Programmable address:1 ~ 255• With alarm setting and analog output
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EV-DO Analysis Using NI PXI RF Test Instruments
NI-RFmx EV-DO
Highly optimized RF measurement experiencePerform physical layer analysis on EV-DO cellular signals including MODACC, ACPR, CHP, OBW, and SEMSimple access to advanced measurement parallelism
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Noise Figure Analysis Using NI PXI RF Test Instruments
NI-RFmx Noise Figure
Measure noise figure, gain, Y-factor, effective temperatures, hot and cold power, and moreOptimized calibration and measurement routines for multi-DUT test using Y-factor and cold sourceSupports the PXIe-5668R 26.5 GHz VSA, the PXIe-5698 26.5 GHz preamplifier, and VSTsDesigned for use with industry-standard noise sources such as the Noisecom NC346 Series
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VXI Digital Test Instrument
T940 Series
The T940 Series for the VXIbus provides the basis for a complete state-of-the-art digital solution at the subsystem level. The T940 is the solution for both legacy digital replacement and new test stations to be built for digital test including aircraft/ avionics, weapons systems, spacecraft, semiconductors and medical devices.
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PXIe Semi-Dynamic Digital I/O Module, 64-Channel
42-419-001
The 40-419-001 (PXI) and 42-419-001 (PXIe) are a 64-channel digital I/O modules suitable for operating external devices, such as power, RF and high voltage relays, solenoids and lamps. They can also be used for interfacing with external logic such as a programmable instrument with a BCD interface depending upon the module’s driving capabilities.
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PXI High Density Digital I/O Module, 32-bit TTL
40-410-001
The 40-410 range of Digital I/O Modules are suitable for operating external devices, such as heavy duty relays (power, RF and high voltage types), solenoids, lamps, or for interfacing with external logic such as a programmable instrument with a BCD interface.
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VXI 12-Channel Digital-to-Analog
65DA2-55
NAI’s 65DA2-55 is a 12-channel Digital-to-Analog Instrument on a VXI board. This single-slot, message-based board provides twelve independent, single-ended, 16-bit, Digital-to-Analog (D/A) channels.
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PXI Resistor Module 2-Channel 2R to 65.5k with SPDT
40-293-133
The 40-293 is a Programmable Resistor module with two channels of 16-bit, two channels of 12-bit or four channels of 8-bit resistor chains in a single 3U PXI module. The module is ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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PXI/PXIe 15W Programmable Resistor Module
40-254-015
The 40-254-015 (PXI) and 42-254-015 (PXIe) are programmable resistor modules with 2 channels which can be set between 1Ω and 920Ω with 4Ω resolution The 40-254 range provides a simple solution for applications requiring up to 15W of power handling per channel.
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PXI/PXIe High Density Precision Resistor Module, 6-Channel
40-297A-051
The 40-297A-051 (PXI) and the 42-297A-051 (PXIe) are 6-channel programmable resistors with a range of 3 Ω to 2.97 MΩ. They are part of the 40/42-297A series of high density precision resistor modules and provide a simple solution for applications requiring accurate simulation of resistive sensors.
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PXI Resistor Module 2-Channel 2R to 16.3k with SPDT
40-293-131
The 40-293 is a Programmable Resistor module with two channels of 16-bit, two channels of 12-bit or four channels of 8-bit resistor chains in a single 3U PXI module. The module is ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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PXI/PXIe High Density Precision Resistor Module, 3-Channel
40-297A-156
The 40-297A-156 (PXI) and the 42-297A-156 (PXIe) are 3-channel programmable resistors with a range of 3 Ω to 85.3 MΩ. They are part of the 40/42-297A series of high density precision resistor modules and provide a simple solution for applications requiring accurate simulation of resistive sensors.
