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ARINC 429 Test And Simulation PCIe Module
PCIe-C429
*4, 8, 16 or 32 software programmable TX / RX channels*X4 lane PCI Express host interface*Programmable high / low speed operation*Simultaneous operation of all TX / RX channels*Error entry and detection*128 MB RAM*Label selective triggering for recording / filtering*Sorting according to SDI field*IRIG-B timecode encoder / decoder for data correlation*Real-time recording and later analysis of multiple channels*Supports: C, C ++, C # and .net*Driver support: Windows, Linux, VxWorks and other systems
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ARINC 429 Test And Simulation USB Module
USB-429
*4, 8 or 16 software programmable TX / RX channels*Programmable high / low speed operation*Simultaneous operation of all TX / RX channels*Error entry and detection*128 MB RAM*Label selective triggering for recording / filtering*Sorting according to SDI field*IRIG-B timecode encoder / decoder for data correlation*Real-time recording and later analysis of multiple channels*Supports: C, C ++, C # and .net*Driver support: Windows, Linux, VxWorks and other systems
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ARINC 429 Test & Simulation Interface for PCI Express
PCIe-C429
Avionics Interface Technologies
4, 8, 16, or 32 Software Programmable Tx/Rx Channels - Programmable High/Low Speed Operation - Concurrent operation of all Tx/Rx Channels at high data rates - Full error injection and detection • Data capture filtering, 100% bus recording, and physical bus replay - Rate-oriented Label Transmission - Label Selective Trigger for Capture/Filtering - IRIG-B time code encoder/decoder with free-wheeling mode - Application Interface supporting C/C++, C# and VB.NET Development - Device driver support: Windows, Linux, LabVIEW Real-Time (others on request) - Compatible with AIT’s Flight Simulyzer GUI Bus Analyzer Software
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ARINC 429 Test & Simulation Interface for PCI
PCI-C429
Avionics Interface Technologies
4, 8, 16, or 32 Software Programmable Tx/Rx Channels - Programmable High/Low Speed Operation - Concurrent operation of all Tx/Rx Channels at high data rates - Full error injection and detection - Data capture filtering, 100% bus recording, and physical bus replay - Rate-oriented Label Transmission - Label Selective Trigger for Capture/FilteringIRIG-B time code encoder/decoder with free-wheeling modeApplication Interface supporting C/C++, C# and VB.NET Development - Device driver support: Windows, Linux (others on request) - Compatible with AIT’s Flight Simulyzer GUI Bus Analyzer Software
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ARINC 429 Test And Simulation PCI Module
PCI-C429
*4, 8, 16 or 32 software programmable TX / RX channels*Programmable high / low speed operation*Simultaneous operation of all TX / RX channels*Error entry and detection*128 MB RAM*Label selective triggering for recording / filtering*Sorting according to SDI field*IRIG-B timecode encoder / decoder for data correlation*Real-time recording and later analysis of multiple channels*Supports: C, C ++, C # and .net*Driver support: Windows, Linux, VxWorks and other systems
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ARINC 429 Test And Simulation PMC Module
PMC-429
*4, 8, 16 or 32 software programmable TX / RX channels*Programmable high / low speed operation*Simultaneous operation of all TX / RX channels*PXI interrupts, star trigger, and PXI clock*Error entry and detection*128 MB RAM*Label selective triggering for recording / filtering*IRIG-B timecode encoder / decoder for data correlation*Real-time recording and later analysis of multiple channels*Sorting according to SDI field*VXI Plug & Play driver including soft front panel*Supports: C, C ++, C # and .net*Driver support: Windows, Linux, VxWorks and other systems
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ARINC 429 Test & Simulation Instrument for VXI
VXI-429
Avionics Interface Technologies
Programmable High/Low Speed Operation Concurrent operation of all Tx/Rx Channels at high data rates
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ARINC 429 Test & Simulation Interface for PCI Express
PCIe-C429X
Avionics Interface Technologies
16, 32, or 64 ARINC 429 Channels (up to 32 Tx & 32 Rx) - Programmable Tx channel output amplitude - Programmable High/Low Speed Operation - Eight (8) Discrete I/O (Four (4) inputs, and four (4) outputs) - Concurrent operation of all Tx/Rx Channels at high data rates - Full error injection and detection - Data capture filtering, 100% bus recording, and physical bus replay - Rate-oriented Label Transmission - Label Selective Trigger for Capture/Filtering - IRIG-B time code encoder/decoder with free-wheeling mode - Application Interface supporting C/C++, C# and VB.NET Development - Device driver support: Windows, Linux, LabVIEW Real-Time (others on request) - Compatible with AIT’s Flight Simulyzer GUI Bus Analyzer Software
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ARINC 429 Test And Simulation PXI Module
PXI-C429
*4, 8, 16 or 32 software programmable TX / RX channels*Programmable high / low speed operation*Simultaneous operation of all TX / RX channels*PXI interrupts, star trigger, and PXI clock*Error entry and detection*128 MB RAM*Label selective triggering for recording / filtering*IRIG-B timecode encoder / decoder for data correlation*Real-time recording and later analysis of multiple channels*Supports: C, C ++, C # and .net*Driver support: Windows, Linux, VxWorks and other systems
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ARINC 429 Test And Simulation VME Module
VME-429
*8, 16, 32 or 64 software programmable TX / RX channels*Programmable high / low speed operation*Simultaneous operation of all TX / RX channels*PXI interrupts, star trigger, and PXI clock*Error entry and detection*128 MB RAM*Label selective triggering for recording / filtering*IRIG-B timecode encoder / decoder for data correlation*Real-time recording and later analysis of multiple channels*VXI Plug & Play driver including soft front panel*Supports: C, C ++, C # and .net*Driver support: Windows, Linux, VxWorks and other systems
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ARINC 429 Bus Interfaces
AIM’s > ARINC 429 test, simulation, monitoring and analysis modules use our field proven Common Core hardware design giving you the best performance, best feature set and highest functional integration on the market. The use of SoC (System on Chip) based core designs with multiple processors for real time bus protocol and application support, massive memory and IRIG-B time code encoder/decoder functions are standard. The latest versions also support avionics discrete I/O.
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ARINC 429 Test & Simulation Interface for VME
VME-429
Avionics Interface Technologies
4, 8, 16, 32, or 64 Software Programmable Tx/Rx Channels - Programmable High/Low Speed Operation - Concurrent operation of all Tx/Rx Channels at high data rates - Full Error Injection & Detection - Rate-oriented Label Transmission - Label Selective Trigger for Capture/Filtering - IRIG-B Time Code Encoder/Decoder for Data Correlation - ANSI Application interface supporting C, C++, C#, and .net development - Device driver support: Windows, Linux, & VxWorks (others on request) - Designed for extended temperature operations - 64-bit VME - Interface (VME master & slave capability) - Front Panel and Rear I/O (P2) Available
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NI HIL and Real-Time Test Software Suite
Suites combine LabVIEW Professional Development System with NI's most popular application softwareIncludes LabVIEW Professional, VeriStand, and the LabVIEW Real-Time and LabVIEW FPGA modulesEach new suite includes a one-year NI Training and Certification membershipSoftware is shipped on USB 3.0 media with NI device drivers included to speed up your installationConfigure real-time test applications quickly and easily; add custom functionality
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Wireless Test Standards Software
Generate and analyze signals for cellular and connectivity standards with NI PXI RF instrumentationPerform advanced automated test with the easy-to-use NI-RFmx software APISave on all NI RF wireless test software under a single license
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Semiconductors Testing
Our Testers support the production lines of variety of products such as 40/100 GBps Mux/DeMux, LNA, WiMAX RF Transceivers, Microwave & Millimeter Wave components. This high reliability products are being used in (a) Networking & Communications (b) Consumer Electronics (c) Military & Space
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Test Management Software
ActivATE™
Easily create and run robust test programs in semiconductor automated test systems with ActivATE™ test management software. Designed by test engineers for test engineers, ActivATE™ tames automated test complexities with elegant simplicity.
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Explosive Test Site Range Instrumentation
Firesets, CDU’s EDU’s, Delay generators, firing panels, and custom instruments. Fiber-optic and computer-control options.
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Infotainment Test for Automotive Applications
Multimedia operating interfaces are complex control and display devices for functions such as entertainment, telephony, on-board computers and vehicle settings. The functional test of such complex control units and their networking within the vehicle architecture presents a particular challenge in every phase of the product design process.
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NI Automated Test Software Suite
The NI Automated Test Software Suite features all three NI IDEs and NI's most popular application software and add-ons specifically for building your automated test system with confidence. This package offers the power of LabVIEW, LabWindows/CVI, and Measurement Studio combined with the TestStand ready-to-run, test executive and the Switch Executive intelligent switch management application
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Imperial Test Executive
ITE
The Imperial Test Executive (iTE) is a UI shell that sits on top of National Instruments TestStand. It provides a simple but elegant interface to execute your NI TestStand sequences. The iTE software was designed to allow general operators to execute ATE testing software without requiring any knowledge of NI TestStand. Training an operator to use this system typically takes less then 5-minutes.
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PCI Express 3.0 Test Platform with SMBus Support
The Summit Z3-16 Test Platform with SMBus Support allows the Summit Z3-16 to act as a host emulator, and provides a general purpose test backplane and interposer for testing Gen3, Gen2 or Gen1 hosts and devices. In addition, it supports the Summit Z3-16 with SMBus Support by providing SMBus tapping connectivity.
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ARINC 818 Tester
iWave 3U VPX High-Speed Video/Data Processing Card is a rugged standalone module in the 3U VPX form factor, aimed for the high-speed data, video processing, and display applications is ideal for military, defense, and aerospace applications requiring an optimal balance of performance and power efficiency. iWave 3U VPX High-Speed Video/Data Processing Card is implemented using Xilinx Kintex-7 device architecture and has I/O interfaces including High speed 16 channels of transceiver interfaces capable of operating up to 6 Gbps data rate, Gigabit Ethernet, RS232, RS422, PCIe interface, Built-in health monitoring circuits, HDMI input, and output interfaces
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EFT Module for Teststand
The Electronics Functional Test (EFT) Module for TestStand provides out-of-the-box tools to speed up development of automated tests for electronic assemblies including PCBAs, subassemblies and final assemblies. Test engineers can develop, deploy and execute test sequences quickly and efficiently with minimal custom code development for a shorter time-to-solution.
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Scienlab Battery Test System — Cell Level
SL1002A
Test System with up to 36 Channels.The Keysight SL1002A provides sink and source with 0 to 6 V, 100 to 600 A, 0.6 to 3.6 kW and 36 channels for battery cells.
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In-Circuit Test System Repairs
Forwessun provides expert repair services for a wide range of Test Systems, helping you maintain optimal performance and extend the life of your equipment. Our team of skilled technicians quickly identifies and addresses issues, ensuring that your system is back in operation with minimal downtime. We handle both routine and complex repairs, offering comprehensive solutions to keep your systems running efficiently and reliably.
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EVSE Test Platform
To manage both the challenging high-power requirements of electric vehicle supply equipment and the market demand, it is crucial to rely on a test system that performs to your specs. The right system needs to combine the tools for reliable asset communication, microgrid management, effective protocol simulation and high-power testing. This EVSE platform combines the right energy regeneration equipment with 25+ years of test experience to deliver the results you need to meet conformance in the time you need it.
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Test System Optimized for High Throughput, Low Cost of Test for Single Site, Multi-site and Index Parallel Applications
ETS-88RF
Targeting the needs of power amplifier (PA) and front-end-module (FEM) semiconductor manufacturers, the ETS-88RF test system is aligned with the test challenges associated with these direct RF radio wave interface components. The precision with which the ETS-88RF can measure high-gain, wideband frequency performance, adjacent channel leakage and power supply efficiency makes this test system the most cost-effective alternative to bench set-ups. Teradyne routinely provides timely updates to a substantial library of RF Standards (such as 802.11xx and 3GPP) targeted for PA and FEM test.
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ESD Test System
58154 Series
ESD (Electrostatic Discharge) Test Systems are PXI/PCI controlled module to simulate electrostatic discharge pulse during electronic device testing. The 58154 series offer both ESD STM5.1-2001-Human Body Model and ESD STM5.2-1999-Machine Model. The user friendly software offers programmable and flexible features, such as sampling test on a wafer, ESD model, ESD pulse polarity, ESD pulse interval in a sequence, and automatic testing function.
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Automated Multi-Functional Tester
QTouch 1408 C
Qmax Test Technologies Pvt. Ltd.
QTouch 1408 C – Automated Multi-Functional Tester with in-built camera is designed to make automatic image capturing and probing of electrical signals with ease and speed especially in PCBs with high density/high pin count device that are mounted on the PCB. It is designed to move on X, Y, Z directions making it possible to probe every component as close as 20 mils. Easy tagging feature allows the user to get the real time XY coordinates using the library information with minimal intervention. CAD import feature is available for Auto Test Generation/to extract the XY coordinates from the CAD data. Qmax Automated Multi Functional Tester can perform Board level functional test of a PCB and guided probe / Back tracking diagnostics utility to reliably test Digital, Analog and Mixed Signal PCBs and fault isolation to the PCB level or component level.
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Functional Test Trainer System
QT65
Qmax Test Technologies Pvt. Ltd.
Functional Test Trainer system, is a test system which can perform various Power- On functional tests of digital devices(ssl/MSI/LSIs and analog devices in the out- circuit and in-E conditions. Unified Library of vast number of devices to effectively test devices in in-circuit as well as out of circuit conditions.
