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Showing results: 106 - 120 of 262 items found.

  • Integrated I-V Test Systems

    OAI

    The OAI Integrated I-V Test System is perfect for R&D as well as production, the OAI Integrated I-V Test System delivers extremely accurate solar cell performance measurement. OAI’s advanced fully Integrated I-V Test System is designed to overcome the limitations of flash testing by providing a highly optimized pulse width and voltage sweep rate to match any type of solar cell’s high capacitance and slow dielectric response speed. As a result, the system produces extremely accurate measurements of solar cell I-V parameters and efficiency while leading to the most accurate test results.

  • AMIDA 5000 Tester

    Amida Technology, Inc.

    AMIDA 5000 is a high-end performance test system, combining analog, mixed-signal and logic with the latest test solutions. High pin count - as many as 512 smart multi-function pinframes and 128 sites. Ability to provide cost-optimized test solutions for a variety of consumer components in power management and mobile device components. This system has a higher number of parallel tests and a higher level of capability. This series of test systems provides a powerful test combination with high-speed hardware and software integration. The 5000 series test system is the best analog, mixed signal, digital IC, PA test system for engineering verification and mass production. It can be easily connected to all well-known wafer probing machines and sorters, and also supports parallel test functions. The 5000 series meets customers' needs for high-precision, high-resolution, high-reliability, user-friendly, and low-cost testing and measurement of test systems.

  • Flying Probe Tester

    Pilot 4D M4 - SEICA SpA

    The Pilot 4D M4 is a full-performance, double-sided, flying probe test system with an extremely high level of flexibility, making it the ideal solution for those with a wide variety of testing needs, from prototypes to small/medium production volume, through the repair of field returns and reverse engineering. The vertical, compact architecture and the excellent board clamping system ensure that there is no oscillation of the board under test, which in turn greatly facilitates the precise positioning of the probes on the test points.

  • Measurement & Test

    ET Power Systems Ltd.

    Electronic test engineers use a variety of precision instruments for R&D, vendor verification, and production testing. ETPS can supply a number of general test instruments that can be used in stand alone mode or automated for high throughput testing. Dedicated battery test systems with automatic charge and discharge modes with data logging are available. The standard 16 and 32 channel systems have range up to 5VDC ensuring their suitability for a wide variety of cells.

  • Build-to-Print for Test Systems

    Ball Systems, Inc.

    Built-to-print / test system replication addresses your internal capacity and capability constraints. Ball Systems has perfected quoting, procurement, planning, assembly, testing, quality, delivery and installation to ensure your testers are on-time and on-budget, and meet design and production standards while keeping open and transparent communication.

  • Test System

    LPDDR4 and LPDDR3 - Triad Spectrum, Inc.

    Testing LPDDR4, LPDDR3 devices is made fast and simple with the "Lower Power" LPDDR4/3 TCE-3200LP IC test system. It can be configured up to 32 sites in parallel and integrated with the customer's selected handler.The TCIII-3200LP system can be used as a production tool as well as an engineering tool. To assist manufacturers and integrators, TurboCATS has developed a heat chamber that can be integrated with the TCE-3200LP, LPDDR4 and LPDDR3 test system. This allows the devices to be tested while being exposed to heat conditions.

  • Medical System

    Sentinel I - Chroma Systems Solutions, Inc.

    The Sentinel I System provides fully automated Electrical Safety Testing to IEC/EN/UL/CSA 60601-1. This system is ideal for testing medical products with one or no patient connections or low volume production where operators can manually change leads between different patient connections. This is a 5 in one Hipot test system that can test Hipot, Ground Bond, Insulation Resistance, Patient Leakage, Earth Line Leakage, Enclosure Leakage and Patient Auxiliary Leakage.

  • Cable-End Test Fixtures

    Test Head Engineering, LLC

    Test Head Engineering's cable-end fixtures are used in the production of cable harnesses and in the testing of finished products. They are the long-lasting "connector" to the test system - taking the place of connectors that would quickly exceed their cycle life and produce erratic test results. Cable-end fixtures are used in the automotive and heavy equipment industries, but are also applicable wherever low cycle-life connectors are used - including RF cables.

  • Automatic Transformer Tester

    SS3250 / SS3252 / SS3302 - Sanshine Electronis Co., Ltd.

    Automatic transformer test instrument is a precision test system, designed for transformer production line or incoming/outgoing inspection in quality control process, with high stability and high reliability. With the enhanced capability in turn ratio measurement, they can solve the measuring problems of low coupling coefficient, transformer's turn ratio and turn number with more precise measurement.

  • Semiconductor Memory Tester

    T5851 - Advantest Corp.

    Advantest Corporation has introduced the T5851 system, designed to provide a cost-effective test solution for high-performance universal flash storage (UFS) devices and PCIe BGA solid-state drives (SSDs) memory ICs in high demand by makers of low-power, mobile applications such as smart phones, tablets and ultra-portable laptops. The flexible T5851 tester is available in both production and engineering models. This allows the system to be used for reliability and qualification testing as well as test-program development or, when equipped with an automated component handler such as Advantest''''s M6242, high-volume production. As a fully integrated, system-level test solution, the T5851 provides multi-protocol support in one tool while its tester-per-DUT architecture and proprietary hardware accelerator allow it to achieve industry-leading test times.

  • Analog Bus Extension for PXI

    ABex - Konrad Technologies GmbH

    The ABex (Analog Bus Extension for PXI) is an exceptional test platform that extends to accelerate productivity, development throughput and time to market. Applicable in various industries and technological fields, this platform covers complex test challenges anywhere on the production line.Due to its flexible system architecture with an analog bus backplane and terminal modules, the platform allows the integration of technology specific extensions and extremely short system set up times which result in a reduction of total system costs.

  • Automotive Radar Testers

    Rohde & Schwarz GmbH & Co. KG

    Rohde & Schwarz provides automotive manufacturers, components suppliers and test houses with innovative, cutting-edge solutions which bring realistic test scenarios from the road to the lab and production line.Our range of solutions include a signal generator-based target simulator, a radome & bumper tester and an anechoic automotive radar test chamber allowing for over-the-air (OTA) testing. These solutions are at the heart of the development of advanced driver assistance systems (ADAS) with its safety-critical features such as emergency braking. Using T&M solutions by Rohde & Schwarz enables a thorough testing of chipsets, sensors and modules at each phase from development and conformance to production.

  • Vacuum Inspection

    INDEC - KoCoS Messtechnik AG

    INDEC vacuum test systems monitor a wide range of containers during the production process, including bottles, jars and cans, by measuring the cap panel concavity of their closures which is dependent on the vacuum inside. This non-contact inspection reliably identifies defective containers for automatic rejection.

  • Wide Range High Voltage Programmable DC Power Supply

    N3600 Series - Next Generation Instrumental (Shanghai) T&C Tech. Co., Ltd.

    N3600 series is developed based on NGI's years of experience in testing for battery fluctuation simulation test, battery charger, high voltage diode, electrolytic capacitor, electromechanical control, ATE test system, etc. It is a high-voltage wide-range programmable DC power supply. According to different test environments in the fields of lab test, system integration test, and mass production line, NGI has made a number of optimization designs based on the international advanced technology. N3600 series is a market leader in similar products in terms of reliability, maintainability and safety.

  • Drop-In Functional Test Fixtures

    Circuit Check, Inc.

    Circuit Check’s drop-in base fixture and replaceable personalized plates are the ideal solution where production volumes are lower and the need to change from one fixture and test program to another occurs quickly. Interchangeable test fixture drop-ins enable the same test system to be quickly reconfigured with different tooling and probe patterns for different products. This maximizes equipment re-use, while minimizing the cost for each new test. With Circuit Check’s base fixture and drop-ins, the wiring and test electronics are not disturbed, thus ensuring configuration consistency each time the system is re-tooled.

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