Production Test Systems
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Product
Thermal Testing
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A view of multiple testing stations for use in conducting Thermal Analysis on various materials. This is one of several areas assigned to various thermal tests. Differential Scanning Calorimetry (DSC), Thermogravimetric Analysis (TGA), Thermomechanical Analysis (TMA), and Dynamic Mechanical Analysis (DMA)
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Transformer Testing
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The ART-3D series of Automatic Ratio Testers are precision instruments, designed to measure the turn ratios, phase displacements, excitation currents of single phase and three phase power, distribution and instrument transformers in conformity to the IEEE C57.12.90 & IEC 60076. Now featuring an enhanced test lead design, the ART-3D is the perfect instrument for real-life field usage. ART-3D series also has Anti Induction circuit which makes it suitable for system voltages upto 765KV.
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EMC Tests
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Electromagnetic compatibility (EMC) must be demonstrated for all devices with integrated radio components for approval in almost every country in the world. EMC tests examine whether the electromagnetic emissions from your product are within the specified limits and whether your product and its functionalities themselves are not negatively influenced by electromagnetic emissions. We offer EMC tests for modules and end products with integrated radio technology as well as IT and IoT products. Our accredited EMC test laboratories are equipped to test almost all modern radio technologies, and our EMC experts have many years of experience in this area. With us, your modern radio products are on the safe path to the global market.
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Display Measurement Systems
DTS Series
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Instrument Systems Optische Messtechnik GmbH
Characterization of emissive, transmissive, reflective, and transflective displaysViewing-angle-dependent analysis of illuminance, contrast, color, and derived parametersDetermination of the electro-optical transfer function: analysis of luminance, contrast, and color depending on electrical driving conditionsMeasurement of transient properties, such as switching times, flicker, and modulation
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Microwave Testing
170
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The PICOPROBE® MODEL 170, a high performance microwave probe which incorporates a WR-6 waveguide with our patented coaxial design techniques, has inherent low loss and low dispersion characteristics.
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System Modeling
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Mentor Graphics SystemVision is a mixed-signal modeling and simulation environment using the power of VHDL-AMS and SPICE to verify your control and mechatronic systems. SystemVision includes graphical design entry, VHDL-AMS modeling and library tools, leading-edge simulation technology and powerful waveform viewing and analysis tools
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Basic Digital Systems
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The Medical Imaging System can be configured simply by installing the FCR Reader, the CR Console, and the Imager to your existing X-ray equipment. The Imager uses the dry film for output and therefore does not require a dark room as in conventional systems thus saving space. Also, the scanned image can be digitally saved to media and not on films, thus not much storage space is required.
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EMI/EMC Testing
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EMI/EMC testing can reliably predict product performance in any electromagnetic environment. Testing can also determine the possibility of interference with other equipment, possibly degrading performance. Testing may be required in order to comply with regulations or for informational and product improvement purposes.
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Product
Solar Cell PL/EL/IV 3-in-1 Testing System
VS6841
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Industrial Vision Technology Pte Ltd.
This luminescence Analyzer integrates a Photoluminescence (PL), Electroluminescence (EL) , and I-V Measurement Technology, has a Device’s PL image, EL image, as well Device’s I-V characteristics in One system. It is being using to quantitatively map Minority-Carrier Lifetime, and to characterize the defect of silicon wafer & solar wafer, and measure the key parameters from solar cell I-V Curve. It is also a useful tool for scientist to develop other methodology & parameters that can be used as a promising technique for online material monitoring and process control.
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Product
Test Module
MTC
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The measuring channels can be connected depending on the application to the pins on the system interface or to the six internal bus lines.Four measuring channels per module on 8:1 multiplexer = 32 InputsUp to 4 parallel measurements per MTC (4 parallel counters)Intelligent algorithms for fast measurements even at low frequenciesFrequency, period, pulse width, rise- and falling time as well as event counting on each channelTime measuring range: 10 ns - 42 s, resolution 10 nsFrequency measuring range: 0.015 - 100 MHzEvent counting: 0 - 232, maximum 100 MHzMax. input level/trigger voltage: +/-100 VSynchronization with external trigger possible
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Product
Three-phase Fully Automatic Test System
TS41
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Calmet Smart Calibration Devices
The Calmet TS41 test system consists of a three-phase reference meter of accuracy class 0.02% (or 0.04%) and an integrated three-phase current and voltage source up to 3x120A/600V. It makes possible automatic testing of electricity meters in meter test stations
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Product
Additional Products: 26 Pin D-Type Cables - Connector to Unterminated
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The connector to unterminated cable assemblies below are not compatible with Pickering products, however, are offered for developing a connection solution for use with other products.
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Magnetic Research System
MagRS
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The MagRS base system comes with a 4 or 7 in magnet, with additional options to customize the system for your experimental needs. Choose to add VSM capability, temperature option accessories, or optical access. MagRS comes standard with ExactGAP magnet pole gap indexing and GlideLOCK precision sample positioning.
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Test a Service
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Enabling the automation of regression testing, verification, and validation within a functional safety environment
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Product
Connector Test
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A connector test system which provides expansion of up to 160 Kelvin pair connections. The system incorporates high voltage AC and DC power supplies with a maximum output of +/- 2100 Volts peak for Hi Pot, Insulation resistance measurement. LCR bridge control is provided with 4 terminal multiplexing in order to add precision capacitance, inductance and resistance measurement capability. An integral H.V. capacitor bias option permits capacitance measurement to be made at up to 2.1kV.
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Product
Program Specific Systems
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Curtiss-Wright Defense Solutions
Our experienced system design and integration teams analyze your system requirements, conduct trade studies to identify appropriate products, analyze data paths, select suitable cooling approaches, and create a rugged system solution tailored and optimized for your platform or program.
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Massively Parallel Board Test System
I7090
In-Circuit Test System
The Keysight i7090 is a massively parallel board test system designed to help PCBA test engineers improve manufacturing efficiency while reducing costs. Unlike traditional in-circuit testers, the i7090 supports up to 20 In-Circuit Test cores in parallel, which means engineers can test multiple Units Under Test (UUTs) simultaneously without the need for multiple systems. This reduces scaling and infrastructure costs and frees up valuable testing space.
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Aircraft Escape Systems
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The Emergency Interseat Sequencing System (EISS) was designed an qualified for the F-15K Fighter and has since been installed in the F-15SG and F-15SA configurations of the F-15. The system consists of Thermal Batteries with Initiators, a Digital Interseat Sequencer, Mode Selector, and customer provided cabling Electro-Explosive Devices (EEDs). The system is operated from either thermal battery and aircraft 28Vdc for redundancy. A separate field Test Set (EESSTS) performs both complete system continuity tests and an operational test of the total system installed in the aircraft. The sequencer is programmable and could be used in any escape system.Based on the initiation point, Forward or Aft Seat Handle, Internal or External Canopy Jettison Handles, and the Mode Selector setting, the Sequencer provides firing pulses to the EEDs to support canopy removal, ejection seat inertial reel activation(s) and ejection seat catapult firing(s). Sensing capabilities are provided to determine system state, canopy gone, seat gone, so as to provide the optimum escape timing.
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Product
Etch System
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When it comes to clean etches, Veeco’s Ion Beam Etch (IBE) systems deliver with sharp control and minimal disruption. Using a focused argon ion beam, this subtractive technique etches nanoscale features with precision, making it a go-to for pattern transfer, layer removal, and surface refinement where edge definition matters most.
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UV Aging System
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King Design Industrial Co., Ltd.
*Comply with IEC 61215, IEC 61646 UV Preconditioning Test Specification *Radiation intensity is linear adjustable; the intensity deviation is guaranteed within ±15% on the testing surface *Test cabinet is equipped with timer controller in a time range of 0～9999 hr, as well as time accumulating and power-shutdown data-saving ability * Using the standard PT-100 membrane thermo-transmitter to accurately control temperature in testing process
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Monitoring System
Sensaphone WSG30
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The Sensaphone WSG30 Monitoring System offers a flexible monitoring solution when hard-wiring sensors is not a cost-effective or viable option. It also functions as a data logger to demonstrate compliance. The WSG30 is encased in a stylish, wall-mountable enclosure with an easy-to-read, 80-character LCD display.
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High Performance PXI Functional Test System with Mac Panel Interface
TS-5400
Functional Test
The Keysight TS-5400 PXI Series Functional Test System provides automotive, aerospace and defense and industrial control manufacturers with an off-the-shelf PXI hardware and software platform with support for single or multiple DUT test. Designed for testing electronics control modules such as, power train control, complex body electronics and industrial controllers, the TS-5400 PXI Series helps manufacturers achieve higher throughput for their design validation and manufacturing functional test needs with the capacity to empower them to anticipate future functional test needs.
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QE Systems
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Abet Technologies offers a range of standard EQE and IQE measurement systems. Model QE-1100 is configured with the most useful components for single junction devices. It has a 350 – 1100 nm range. The QE-1800 is configured with components most useful for components for triple junction cells. Beyond the standard systems offered systems can be custom configured to meet a customer’s metrology needs.
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Product
V4 Marine Communications System - V4 NAVTEX Test System
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The ICS Electronics Limited V4 NAVTEX Test system may be used for type approval, general performance testing and production testing of NAVTEX receivers.
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Memory Test System
T5221
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The T5521 is a memory test system that supports wafer test and wafer burn-in test of non-volatile memory devices such as NAND flash, housed within a multi-wafer prober to reduce test floor footprint.
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PHIL System (Power Hardware In-Loop System) Case Study
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In the PHIL (Power Hardware In-Loop) Case Study, the PHIL system consists of a PONOVO 4-Q amplifier, RTDS simulator, DC electronic load unit and PV inverter.
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Functional Testing of Printed Circuit Boards, Sub Assemblies and Finished Products
Testpoint
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Yelo Testpoint is an extremely modular and flexible system, allowing you to scale to any size operation, and to add almost any new test requirements. Ideally suited to cellular manufacturing, the system can be used to complement an existing ATE, as a functional test add-on, or as a diagnostic work station. Its compact, space-saving construction has multiple interface positions to accommodate both horizontal and vertical connections.
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Automated ICT System
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With world-famous in-circuit test technologies and innovations around automated inline handlers, Keysight automated inline ICT solutions are versatile and flexible and provide you:
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Cartridge Testing
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Print Quality Text and Graphics. Seal Evaluation. Toner Hopper Seal Performance. Remanufactured and Recharged Cartridges. Machines and Multifunctional Products
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Product
System Components
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For demanding computational tasks, Rohde & Schwarz offers the versatile, flexible equipment you need for everyday use – from the system controller and switch unit to the test chamber. All feature excellent EMC shielding, reliable test results and modular solutions.
