Gigabit Ethernet Test
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Product
Ethernet Digital Interface
Model 8063
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* Provides 48 high-power TTL I/O lines that can sink 48 mA or source 24 mA. * Easily interfaces to TTL or CMOS signals and contact closures. * User can configure the data bytes as inputs or outputs.* Transfer data as bits, bytes or data strings.* Transparent data transfer mode.* Fully VXI-11 Compliant plus Raw Socket for easy programming with Visual Basic or C, Agilent VEE and LabVIEW.* 1 U high rack mount kit mounts one or two 8063s.* Includes 100-230 VAC Power Adapter with universal plugs.
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Product
Customized Testing
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Independent Testing Laboratories
ITL specializes in providing custom testing. Let us help you with designing your next R&D project.
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Product
Semiconductor Test
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Smiths Interconnect’s test socket and probe card solutions utilize IDI contact technology to ensure superior quality and reliability in semiconductor test applications. Our best-in-class engineering, development and technical expertise ensure support of automated, system level and development test platforms.
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Product
25Gbps Ethernet Packet Generators
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Axtrinet (AXTRINET IS A TRADING NAME )
Full wire-speed 25Gbps/10Gbps/1Gbps ports.
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Product
NI-9149, 8-Slot, Zynq-7020 FPGA, Ethernet CompactRIO Chassis
783376-02
Chassis
8-Slot, Zynq-7020 FPGA, Ethernet CompactRIO Chassis - The NI‑9149 is a rugged Ethernet chassis that you can use to add C Series I/O modules to any standard Ethernet network. You can program the chassis using Scan Mode for fast expansion of your real-time system or using the onboard FPGA for inline processing and high-speed I/O and control. With the NI‑9149, you can add high-performance I/O to your PC-based application or expand your CompactRIO, PXI, or industrial controller application.
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Product
Semi-Rigid Cable, 3.5 Mm (Test Port) To 3.5 Mm
85131C
Test Port Cable
The Keysight 85131C is an 81 cm (32 in) long1 semi-rigid cable with a 3.5 mm female2-to-PSC-3.5 mm female connector. Cable frequency range is DC to 26.5 GHz with a return loss of 17 dB or better. Insertion loss is 0.43 * sqrt(f) + 0.3, where f is frequency in gigahertz, for the test port connector and 2.5 dB at maximum frequency for the device connector. Phase stability of the semi-rigid / flexible cables is specified with a 90-degree bend using a 4 to 3-inch radius. Stability1 of the 85131C is less than 0.06 dB, and phase is 0.16 * f + 0.5, where f is frequency in gigahertz.
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Product
Test Probes
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Petracarbon is a leading supplier and provider of spring contact probes and semiconductor test sockets.
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Product
Prototyping & Test Consulting Services Solutions
test
Don’t cut corners on the path to quality. We are experts in Design for Test (DFT), Design for Manufacturing (DFM), agile development, prototyping and standards/best practices in many industries. Speak to our prototyping and consulting services experts to ensure you make the right decisions and investments at the start of your project.
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Product
3U OpenVPX Ethernet Switch and Multifunction I/O Board
68G5E
Multifunction I/O
The 68G5E is a 3U OpenVPX board that is configured with an Ethernet Switch module (choose the ES1, 12-Port GbE Cu legacy unmanaged Ethernet Switch, or the ES2 16-Port Cu GbE managed Ethernet Switch with optional 4x 10GBASE-SR 850 nm multimode Fiber Optic interface) and provides additional support for one NAI smart I/O and Communications function module. Uniquely designed, the 68G5E provides ‘independent’ Ethernet Switch capabilities and can operate as a MFIO board end point with access via the 1 x1 PCIe and/or 1x 10/100 Ethernet motherboard Control Port which hosts the NAI Ethernet Protocol Server/Listener application for direct GbE MFIO control. Ideally suited for rugged Mil-Aero applications, the 68G5E delivers off-the-shelf solutions that accelerate deployment of SWaP-optimized systems in air, land and sea applications.
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Product
Corrosion Testing
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Corrosion testing helps you estimate component service life, compare candidate materials in your service environment, and help screen your materials and their condition.
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Product
Noise Test
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Noise testing is conducted to determine if materials can withstand external noises generated by various sources. It also includes air-borne and structure-borne noise measurements.
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Product
Magneto-electric Testing
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An exciting new area of scientific exploration examines the potential usefulness where magnetic field effects occur simultaneously with ferroelectric effects in materials and structures. Where these two properties, ferromagnetism and ferroelectricity, are coupled in the same material, the material is called a multiferroic. Radiant offers Magnetoelectric response bundle/software package to measure the magnetic coupling of multiferroic or magnetopiezoelectric devices.
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Product
LED Test
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Neosem developed and released the LX500 - LED Accelerated Aging Tester to provide our customers with the capability to deliver highly reliable automotive LED products to the market. By adopting Neosem’s patented temperature control algorithm, the customer can execute the LED device aging test at very stable temperatures.
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Product
Testing Technology
Testing technology for battery storage
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Specialized mobile diagnostic instruments—such as the METRACELL BT PRO—designed to evaluate, maintain, and inspect stationary battery systems and uninterruptible power supplies
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Product
Ethernet Media Converter
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A physical layer equipment which interconnects the Ethernet, Fast Ethernet, or Gigabit Ethernet on copper UTP and the related fiber optics network. Ethernet media converter meets corresponding IEEE 802.3 standards.
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Product
Battery Testing
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Electric vehicles (EVs) rely on batteries as their primary source of energy storage. As battery packs require battery management systems (BMS) to operate safely and reliably, it is vital to test control algorithms for state of charge (SoC) estimation or cell balancing at an early stage.
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Product
cDAQ-9184, 4‑Slot, Ethernet CompactDAQ Chassis
782069-01
Chassis
4‑Slot, Ethernet CompactDAQ Chassis - The cDAQ‑9184 is a CompactDAQ Ethernet chassis designed for small, remote, or distributed sensor measurement systems. The chassis controls the timing, synchronization, and data transfer between C Series I/O modules and an external host. You can use a combination of modules to create a mix of analog I/O, digital I/O, and counter/timer measurements. The chassis also has four 32‑bit general‑purpose counters/timers built in. You can access these counters through an installed, hardware‑timed digital C Series module for applications that involve quadrature encoders, PWM, event counting, pulse train generation, and period or frequency measurement. With multiple timing engines, you can run seven hardware‑timed operations simultaneously, with three independent rates for analog input.
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Product
Test Instruments
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Improve the way high voltage testing is performed with quality test and measuring instruments. We have a history of providing quality portable equipment for utilities and contractors to use onsite, including Hipot testers, resistance meters, cable fault locators, and more.
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Product
Test Contactor
cDragon
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cDragon™ Test Contactor pin’s thermal design supports fast temperature control response and stabilization for repeatable at temperature testing of devices in a handler environment.The homogenous MEMS elastomer-free multi-beam pin delivers long life and high wear resistance. By design the cDragon’s pin decouples insertion motion from the test-interface-board side of the pin. This eliminates test-interface-board pad wear.
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Product
HALT/HASS Testing
HALT HASS Chamber
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AST applies stresses (such as temperature and vibration) to products well beyond its normal use environment. This type of testing is done to determine product operating and destruct limits. These stresses are applied as the product is functionally tested and continuously monitored for failures.Highly Accelerated Stress Testing (HALT) and Highly Accelerated Stress Screening (HASS) are two types of accelerated stress testing. These types of tests are commonly used to eliminate design problems, helping to develop a robust, mature product prior to market introduction. It can also be used to screen out infant mortality issues prior to shipment.
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Product
A to Z Testing
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Elemental Analysis has the ability to analyze, and to test for all of the substances listed below, and many more. If you do not see the substance you need analyzed or tested for, please give us a call! We can test almost ANYTHING!
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Product
SONET / SDH, OTN, Ethernet and multiservice testers
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At the core of EXFO’s expertise are next-gen SONET / SDH, OTN, Ethernet and multiservice testers that are designed to take testing to the next level. These instruments address the needs of field technicians seeking ultimate portability and ease-of-use, as well as network managers and systems vendors who require flexible and scalable, future-proof solutions.
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Product
Test and Analysis
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ESDEMC Technology will calibrate; the Contact Mode ESD current waveform and tip voltage to 4 GHz and 30 kV, the frequency response of ESD Target & Adapter Line to 4 GHz, and the DC Resistance
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Product
Test Probes
E-Series
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Your product descriA full portfolio designed for general purpose test on bare boards, surface mount assemblies and other forms of test specially to meet any needs.ption goes here.
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Product
ATE Test Probes
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For contacting loaded PCBs in automatic test equipment (ATE) with vacuum, pneumatic or mechanically operated fixtures. Available in 2.54mm, 1.91mm & 1.27mm test centre spacings.
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Product
6-Port Hardened Industrial Gigabit Ultra PoE DIN-Rail Switch
TI-UPG62
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4 x Gigabit Ultra PoE ports2 x dedicated SFP slots240 watt power budget12 Gbps switching capacityHardened IP30 rated metal switchIncludes DIN-rail and wall mountsExtreme -40 to 75 ºC (-40 to 167 ºF) operating temperature rangeDual redundant power inputs with overload current protectionAlarm output triggered by power failurePower supply sold separately (TI-S24048)
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Product
Environmental Testing
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Environmental testing capabilities include: High and Low Temperature Testing including Thermal Shock. Humidity Testing to 100% Relative Humidity at High and Low Temperatures. Altitude Testing to 100,000 Feet. Combined Vibration, Temperature and Altitude Testing. Mass Spectrometer for Leak Testing. Vibration Testing to 50 G's and 3000 Hz including Resonance Scan, Cycling, and Endurance. Free Fall Half Sine Wave Mechanical Shock Testing to 100 G's
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Product
Detector Testing
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CI Systems' Optical Test benches are especially built to test many types of detector arrays used as the sensors of a camera, from visible to far infrared ranges. With CI Systems' expert know-how, these test benches can be tailored to a customer's design requirements. MTF, spectral response, crosstalk, NETD and sensitivity are some of the basic parameters that can be tested with CI's Optical Test benches during the design, manufacturing and integration of detector arrays.
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Product
Quad-Port 25G PCIe Ethernet NIC
P425G
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The P425G 4x25G PCIe NIC builds upon the success of the widely-deployed NetXtreme E-Series architecture by combining a high-bandwidth Ethernet controller with a unique set of highly-optimized hardware acceleration engines to enhance network performance and improve server efficiency.
