Near-field Scanning Optical Microscope
Near-field Scanning Optical Microscope
-
Product
Metallurgical Microscope
-
Offering you a complete choice of products which include dg classic trinocular metallurgical microscope, dg victory trinocular metallurgical microscope, dmi classic trinocular metallurgical microscope, dmi excel binocular metallurgical microscope, dmi optima trinocular metallurgical microscope and dmi prime trinocular metallurgical microscope.
-
Product
Surgical Microscopes
-
The surgical microscopes of Leica Microsystems are exactly geared to the requirements of microsurgery. A compact optical unit delivers clear and sharply focused images and the modular system gives the surgeon optimum maneuverability.
-
Product
Scanning Probes
-
3D Laser Scanning Probes for your existing CMM are options for full-time or part-time use. Laser Design’s broad range of scanning probes ensures a perfect fit between the scanner and the size and detailed features of your parts.
-
Product
Microscope
-
An optical instrument used for viewing very small objects, such as mineral samples or animal or plant cells, typically magnified several hundred times.
-
Product
Scanning Instruments
-
X-Rite scanning solutions automate press-side color control and are ideal for printers and converters who want to benefit from fast, accurate color. These systems not only remove the possibility of human error, they speed up make-ready and generate predictable and repeatable color results.
-
Product
Laser Scanning Microscope
OLS4100
-
The LEXT OLS4100 is a Laser Scanning Microscope to perform non-contact 3D observations and measurements of surface features at 10 nanometer resolutions. It also features a fast image acquisition and a high-resolution image over a wider area.
-
Product
Optical Coherence Tomography Imaging Line Scan Cameras
OctoPlus Range
-
Teledyne e2v spent 2 years developing a CMOS sensor specifically for OCT. This resulted in the launch of OctoPlus, which has a specially designed pixel architecture that improves sensitivity and reduces signal roll-off to improve image quality by several dB vs state-of-the-art CMOS cameras, especially in deep structures.
-
Product
3D Microscope
BVM-5006
-
BVM-5006 Electric 3D Microscope features the quality optical system, high resolution, large field of view, high zoom ratio, novel design and one-up technology, easy and automatic operations. Includes: Motorized zooming, motorized observation angle for changing and optional motorized focusing. The speed can be adjusted while changing observation angle. With the angle attachment, the microscope can realize 3D image effects for observing the components and deep holes. The LED lights can generate high brightness. Theoretically the service life of LED lights can reach 20,000 hours. The LED lights with area control function can illuminate from different angles for convenient multi-angle inspections. The M-N3D Microscope can be widely used in micro-electronics, automated monitoring and testing industries. By selecting the appropriate objectives and video couplers, different magnification, field of view and depth of field can be acquired. Digital and Analog video systems can meet the different users' demands.
-
Product
Microscope
-
Instrument that produces enlarged images of small objects, allowing the observer an exceedingly close view of minute structures at a scale convenient for examination and analysis.
-
Product
Fluorescence Microscopes
-
PicoQuant offers different solutions for time-resolved confocal microscopy. The available systems include single molecule sensitive microscopes with picosecond temporal resolution and super-resolution imaging capabilities as well as upgrade kits for laser scanning microscopes of all major manufacturers that enable time-resolved applications.
-
-
Product
Scanning XPS Microprobe
PHI Quantera II
-
The core technology of the PHI Quantera II is PHI’s patented, monochromatic, micro-focused, scanning x-ray source which provides excellent large area and superior micro-area spectroscopy performance. Spectroscopy, depth profiling, and imaging can all be performed over the full range of x-ray beam sizes including the minimum x-ray beam size of less than 7.5 µm. In addition to superior XPS performance characteristics the PHI Quantera II provides two in situ sample parking stations which enables the automated analysis of all three sample platens in a single user defined analysis queue.
-
Product
Scanning XPS/HAXPES Microprobe
PHI Quantes
-
The PHI Quantes is the only commercially available automated, high-throughput lab-based HAXPES spectrometer. It is a unique scanning X-ray photoelectron microprobe that combines a high energy (HAXPES) monochromatic X-ray source (Chromium Kα) with a conventional monochromatic soft X-ray source (Aluminum Kα). Both sources are high flux focused X-ray beams that can be scanned across the sample surface and can be used to define analysis points, areas, lines, and maps with 100% confidence.
-
-
Product
Atomic Force Microscope
Flex-Mount
-
Flex-Mount is a unique AFM that can be configured to acquire high-resolution information on large, non-planar and demanding samples. The Flex-Mount solution combines the superior resolution and performance of the Nanosurf FlexAFM scan head with the integrability of the Nanosurf NaniteAFM.
-
Product
Long Range Scanning
-
Our contract measurement services include a variety of short-range (< 20 feet) and long-range (20 to 900 feet) high definition technologies, which use both contact and non-contact processes. With over a decade of experience in long range scanner technologies, we have the experience to determine the most affordable approach to your project and the expertise to do the job right. Our tools for long range scanner services include portable CMMs (PCMM) – both touch probes and laser trackers – and 3D laser mapping scanners.
-
Product
Scanning Droplet Cell
VS-SDC
-
Scanning Droplet System (SDC) uses a compact peristaltic pump to force electrolyte through a small diameter tube and into a specifically designed head. This PTFE-based SDC head is machined to allow electrolyte to flow past an installed Reference Electrode and then to a port at the base of the head.
-
Product
Inverted Raman Microscope
XploRA INV
-
The XploRA INV inverted Raman microscope combines the automation features and small footprint of the standard XploRA™ Raman microscope with the unique sampling capabilities of an inverted microscope, especially important for demanding biological applications.
-
Product
Inverted Light Microscopes
-
Inverted microscopes from Leica Microsystems are designed to meet the rigorous demands of life science as well as material science and industrial applications.
-
Product
Light Sheet Microscopes
-
Discover advanced light sheet microscopy solutions from Leica Microsystems. Our portfolio combines cutting-edge technology with exceptional imaging capabilities to enhance your research.
-
Product
Scanning Probes
-
Scanning probes can acquire several hundred surface points each second, enabling measurement of form as well as size and position.
-
Product
Near-Field Detection Module for Imaging
Reflection
-
Reflective AFM-tip illuminationDetection optimized for high-performance near-field imagingEnables optical amplitude and phase resolved near field measurementsNear-field spectroscopy possible via sequential imaging (Requires tunable illumination unit)Patented background-free detection technologySuited for visible & infrared wavelength range (0.5 20 m)Version for infrared & THz wavelength range (5 300 m) availableSupported AFM scan-speed: up to 20 m/s @ highest spatial resolution
-
Product
3D Scanning Software
-
Software is a comprehensive component to any advanced metrology system. Combined with laptops and portable equipment, 3D scanning and measurement is now possible virtually anywhere. 3D scanner software plays a critical role in every stage from the creation of a concept design to the manufacturing and inspection of prototypes. Below is a look at some of the Laser Scanner Software and 3D Scanner Software providers and platforms we represent and handle.
-
Product
Thermal Microscope Stage
TS-4MP
-
With our TS-4MP Thermal Stage, a specimen on a microscope slide or culture dish can be maintained at any temperature between -20°C and +60°C. Setup is easy, takes little time, and the controller will regulate the stage temperature to within +/-0.1°C
-
Product
Microscopes
-
Probing Solutions offers Microscopes made by Azoom, Excelitas, Meiji, Leica, Mitutoyo, and Motic. To order Microscopes, please call PSI at (775) 246-0999, or email sales@probingsolutions.com for a quote.
-
Product
Scanning Kelvin Probe Microscope
VS-SKP
-
The Kelvin Probe experiment uses a nondestructive method to determine the relative work function difference between the probe and the sample. Work function describes the energy required to liberate an electron from the surface of a conductor; electrochemists often interpret this as the difference from an electrode’s Fermi Level, average energy of electrons, and that of vacuum.
-
Product
Scanning Electron Microscope w/ EDX Laboratory
-
Trialon has the equipment and experienced staff to operate this highly technical piece of laboratory equipment. Our state-of-the-art materials analysis lab located in Auburn Hills, MI is managed by a Ph.D with over 20 years of hands-on experience in root cause failure analysis of design, material and process for current and future products.
-
Product
Scanning XPS Microprobe
PHI VersaProbe III
-
The PHI VersaProbe III is a highly versatile, multi-technique instrument with PHI’s patented, monochromatic, micro-focused, scanning X-ray source. The instrument offers a true SEM-like ease of operation with superior micro area spectroscopy and excellent large area capabilities. The fully integrated multi-technique platform of the PHI VersaProbe III offers an array of optional excitation sources, sputter ion sources, and sample treatment and transfer capabilities. These features are essential in studying today’s advanced materials and in supporting your material characterization and problem-solving needs.
-
Product
Modular Optical Modulation Analyzer
M8292A
Optical Receiver
Optimized for the 400G speed class, the M8292A optical modulation analyzer provides a compact, faceless and rack-mountable test instrument that connects to the optical output of coherent transmitters. It leverages the full feature set of Keysight's vector signal analyzer and optical modulation analyzer software ensuring a known-good customer experience for analyzing complex modulated data signals.
-
Product
Fiber Microscope
WL-C400S
-
The WL-C series fiber microscopes use coaxial illumination to provide users with maximum detail. It easily can detect the finest scratches and contamination, making it ideal for critically inspecting polish quality.
