JTAG
Boundary Scan is a topic that contains the various types of testers designed to control and observe the behaviour within boundary scan devices and the circuitry around them.
See Also: JTAG Controllers, JTAG Debuggers, JTAG Emulators, iJTAG, P1687, Boundary Scan
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Semiconductor Authenticity Verification & Anti-Counterfeiting
JTAG Interrogator
Top manufacturers have used JTAG tests for years to ensure electronic systems are free from defects and assembled correctly. With growing uncertainty in supply chains and the proliferation of counterfeit components, that same technology can be used to verify the authenticity of system components.The Corelis JTAG Interrogator is an affordable solution for semiconductor verification. The software and hardware system provides the means to quickly identify components on an assembled electronic product by reading available information from the JTAG chain. Components can also be scanned to discover undocumented opcodes that may indicate hidden JTAG capabilities such as backdoors and harmful or malicious functions.Fast and nonintrusive JTAG component identification has never been so easy.
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Imbedded A5 Processor Test Interface
Advanced Microtechnology, Inc.
Advanced Microtechnology has extended the application of its Optimum product line with theintegration of ARC5 imbedded test functions. Up to 40 controllers may be independently powered and monitored for functionality using the process test interface of the Optimum WinAOS application. Each part may have 2 separate biases featuring both current and voltage monitoring. Independent test is implemented through a standard JTAG interface. A separate serial clock and command interface may be used if required to provide device initialization sequences. JTAG control is muxed to each part through the use of an independent clock for each part. All of the ARC processor registers and memory space may be tested through the JTAG I/O.
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JTAG Boundary-Scan Packaged Solutions
Corelis offers an extensive line of boundary-scan software packages that can also be custom tailored to create the right package for any user. For datasheet information, please click here.
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PCB Test Connectors
Tag-Connect
Tag-Connect is a simple and secure way of connecting debuggers, programmers and test equipment to your PCBs. Tag-Connect uses a specially designed and patented connector for making the connection to your PCB (Patent Pending for the -NL versions). Tag-Connect eliminates the need for a programming or JTAG connector on your PCB.
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ARM LPC3250 Board
MS 1509
- 32 Bit ARM LPC3250 Processor (256KB SRAM)- 133MHz External Bus Speed and 266 MHz internal CPU Speed- 32 Bit, 33MHz CPCI Bus, 6U Form Factor- External memory ( Flash – 2 MB, RAM - 512 KB, DPRAM – 128KB)- 10/100 MBPS Ethernet Interface- USB 2.0 Host/Device Interface- 2 RS232 Serial Ports, 4 RS422 Serial Ports- M Module Interface- 6U board compatible with CPCI & PXI backplanes- High Speed Logic Device- Hot Swap Feature- Front Panel and Rear IO Interface- External Bus through Rear IO- Reception of 3Kbytes within 2ms through Ethernet- Board Dimension is 160mm x 233.35mm- Power Requirements: +3.3V, +5V and +/-12V- Board Dimension is 160mm x 233.35mm- Board has Rear IO interface- Ethernet, JTAG, RS232, USB connectors at front side- BSPs and Driver software for Windows and Linux OS
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CPCI ARM LPC3250 Board
MS 1513
- 32 Bit ARM LPC3250 Processor (256KB SRAM)- 133MHz External Bus Speed and 266 MHz internal CPU Speed- 32 Bit, 33MHz CPCI Bus, 6U Form Factor- External memory ( Flash – 2 MB, RAM - 512 KB, DPRAM – 128KB)- 10/100 MBPS Ethernet Interface- USB 2.0 Host/Device Interface- 2 RS232 Serial Ports, 4 RS422 Serial Ports- M Module Interface- 6U board compatible with CPCI & PXI backplanes- High Speed Logic Device- Hot Swap Feature- Front Panel and Rear IO Interface- External Bus through Rear IO- Reception of 3Kbytes within 2ms through Ethernet- Board Dimension is 160mm x 233.35mm- Power Requirements: +3.3V, +5V and +/-12V- Board Dimension is 160mm x 233.35mm- Board has Rear IO interface- Ethernet, JTAG, RS232, USB connectors at front side- BSPs and Driver software for Windows and Linux OS
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Flex Socket Test Module
JT 2127/Flex Socket Test Module
The JT 2127/Flex STM memory socket tester is a family of hardware adapters specifically designed for the testing of of PCB-mounted DIMM & SODIMM sockets using a JTAG/boundary-scan controller and supporting software. The testing of memory sockets has always been troublesome for test and production engineers using JTAG/boundary-scan systems. Even when it is possible to create memory writes/reads from a boundary-scan compliant access device on the UUT (Unit Under Test), the initialization process may fail leaving you with little diagnostics information. What’s more it can still be uncertain whether fault lays with the DIMM module itself or the socket. Using the new JT 2127-Flex system from JTAG Technologies you get pin-point diagnostics from a known-good test interface so you can be certain that your socket is soldered correctly.
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Graphical Circuit Interaction
XJAnalyser
XJAnalyser is a powerful tool for circuit visualisation and debugging. It provides a graphical view of JTAG chains, giving you complete control, on a pin-by-pin basis, of both pin state (either driven as an output or tristated as an input) and pin value (either high or low when driven), and it has the facility to run SVF and STAPL / JAM files.
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Test systems
MG Products can supply a variety of test systems. These include the Extended Boundary Scan Test from JTAG Technologies, the functional test equipment integrated into a table or high configuration from Unites systems or the Cabinet Modular Test solution (CMT). We offer the right solution for every test setup.
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high-speed JTAG debugger
Bus Blaster v4
Bus Blaster is an experimental, high-speed JTAG debugger for ARM processors, FPGAs, CPLDs, flash, and more. Thanks to a reprogrammable buffer, a simple USB update makes Bus Blaster v2 compatible with many different JTAG debugger types in the most popular open source software.
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JTAG based Test & Flash Programming Services
We offer EMS companies and design houses services and solutions in manufacturing testing with bias towards JTAG (IEEE 1149.x Boundary Scan) and functional test: System-level DFT rule checking for production testing and inspection. Test strategy development and optimization for test cost reduction. JTAG, functional, and emulation-based test development and deployment. Product testing and troubleshooting services. Ultra fast in-system programming solutions (Flash, EEPROM).
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Boundary-Scan Interactive Analyzer & Toolkit
ScanExpress JTAG Debugger
Test probe access is a luxury—modern electronic system design techniques such as blind and buried vias or ball-grid-array (BGA) devices guarantee limited signal access. Test points quickly reduce precious board real-estate and can even degrade performance. ScanExpress JTAG Debugger overcomes these limitations to provide the control and visibility necessary to quickly debug and test hardware, using a simple JTAG port to interface with IEEE-1149.1 compliant devices.Whether debugging prototype hardware, enhancing production tests with boundary-scan control, or diagnosing a faulty board in the field, ScanExpress Debugger’s easy-to-use and versatile interface helps engineers test and debug systems faster and more efficiently.
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Plug & Play JTAG/SWD Microcontroller Debugger with Built In GDB Server & UART
Black Magic Probe V2.3
In most cases Black Magic Debug takes the form of a firmware for the Black Magic Probe hardware, and implements a GNU DeBugger (GDB) server.The Black Magic GDB server features: - Automatic target detection- No need for target specific configuration scripts- All protocol and target specific control is done through GDB monitor commands- No “software in the middle” like OpenOCD required- Easily scriptable thanks to the GDB scripting capabilities- Interface to the host computer is a standard USB CDC ACM device (virtual serial port), which does not require special drivers on Linux or OS X.- Targets ARM Cortex-M and Cortex-A based microcontrollers- Provides full debugging functionality, including: watchpoints, flash memory breakpoints, memory and register examination, flash memory programming, etc.- [Semihosting / Host IO support] as well as [Serial Wire Debug TRACESWO support].- Implements USB DFU class for easy firmware upgrade as updates become available.- Works with Windows, Linux and Mac environments.
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Boundary Scan Tester and Programmer
JTAGMaster
The JTAGMaster Tester and Programmer is designed to work with ABI's bespoke software - a multiple purpose platform which enables users to freely configure test procedures and instruments. Integrated functions are also available to the user to automatically learn the device status, provide pin-to-pin comparison and information as well as use some reporting facilities.
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PLD For Bridging, Infinitely Reconfigurable I/O Expansion.
MachXO
*Up to 27.6 Kbits sysMEM™ embedded block RAM and up to 7.7Kbits distributed RAM*SRAM based logic can be reconfigured in milliseconds using JTAG port*IOs support LVCMOS, LVTTL, PCI, LVDS, Bus-LVDS, LVPECL, RSDS*Up to two analog PLLs per device that enable clock multiplication, division, and phase shifting*Available in TQFP, csBGA, caBGA and ftBGA packages
