Functional Test
black box type testing via interface level inputs and resulting output analysis.
See Also: Functional ATE, Functional Test Systems, Interoperability Test, End of Line
-
Product
12 Channels 1.0 ~ 17.0 Gb/s (200Gbps) Pulse Pattern Generator and Error Detector
CA9806-12
-
The UC INSTRUEMNTS CA9806-12 is a highp erformance, flexible 12 channels Pulse Pattern Generator and Error Detector that can operate from 1.0 to 17.0 Gb/s (200 G). It is combined with three sets CA9806 4 CH 1.0 to 17.0 Gbps Pulse Pattern Generator and Error Detector that incorporates an external one by 4 rate clock synthesizer. Its small size allows it to be placed close to the device under test, it can also be placed further away using the TX driver pre and post emphasis controls features to compensate for cable and interconnect losses. It also has a non destructive, integrated eye outline capture feature along with a quick eye height and width measurement capability. Build-in 8.5 ~ 15 Gb/s eye diagram testing function.
-
Product
ICT/FCT-Fixtures (Small IF)
GenRad CK-1-228X-S
-
The series of In-Circuit testers that are Teradyne for the 228x and TestStation are dedicated tools that rely on the tester hardware for diagnostics and test pattern delivery. The integration of the stand-alone BTS with the Teradyne ICT can enhance the system’s capability. In other words, it can provide access to additional tools. It provides the user with a common platform and portability of test patterns from stand-alone to ICT and later on to functional test and depot test stations.
-
Product
PXI High Density Precision Resistor Module, 9-Channel, 2.5Ω to 1.81kΩ
40-298-022
Programmable Resistor Module
The 40-298-022 is a high density programmable resistor module with 9 channels which can be set between 2.5Ω and 1.81kΩ with 0.5Ω resolution The 40-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
-
Product
Resistor Simulation Card
SET-1210
-
The card has two ranges of values that meet the requirements of most functional test systems.The SET card is designed for applications in which resistive sensors provide information about parameters such as temperature (e.g. when testing motor controls)Each channel of the SET-1210 resistor simulation card is able to simulate the common short-circuit and no-load conditions, which can occur in a system due to faulty wiring or sensors.
-
Product
PXI 2.5W Programmable Resistor Module, 4-Channel, 1Ω to 239Ω
40-251-113
Programmable Resistor Module
The 40-251-113 is a programmable resistor module with 4 channels which can be set between 1Ω and 239Ω with 1Ω resolution The 40-251 range provides a simple solution for applications requiring up to 2.5W of power handling per channel. The 40-251 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
-
Product
Integration and Functional Testing
-
Exactest provide test analysts of the highest calibre only. Those who think "anyone can test software" are mistaken. Many key skills are required depending on the project and test phase being undertaken.
-
Product
USB 2.0 SmartCable For MIL-STD-1553 Test And Simulation
ASC1553
-
The ASC1553 (AIM SmartCable) USB module offers full function test, simulation, monitoring and recording for MIL-STD-1553B applications implemented in an ultra compact form factor.
-
Product
Universal Launcher Test Set
TS-217
-
The TS-217 is an I-level and Depot-level Universal Launcher test set supporting fighter aircraft launchers including the LAU-127, LAU-128, and LAU-129 (AMRAAM), LAU-117 and LAU-88 (Maverick), and LAU-7 (Sidewinder) missile launchers, launcher electronic assemblies, launcher power supplies, and circuit cards. The TS-217 is also used as a depot-level tester for F-18 armament including launchers (LAU-127, LAU-7, LAU-115, and LAU-116), bomb racks (BRU-32), and aircraft pylons (SUU-62 and SUU-63). Additionally, the TS-217 supports MAU-169 Paveway kits, subassemblies, and circuit cards. The TS-217 performs full parametric functional testing as well as troubleshooting to the faulty LRU (I-Level configuration) and SRU (Depot-Level configuration). The TS-217 can be used as an I-Level tester or as a Depot / Acceptance tester for launcher subassemblies.
-
Product
PXI 2.5W Programmable Resistor Module, 1-Channel, 3Ω to 11.4MΩ
40-251-153
Programmable Resistor Module
The 40-251-153 is a programmable resistor module with 1 channel which can be set between 3Ω and 11.4MΩ with 1Ω resolution The 40-251 range provides a simple solution for applications requiring up to 2.5W of power handling per channel. The 40-251 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
-
Product
Common Armament Test Set
MTS-209
-
The MTS-209 is a state-of-the-art portable test set for various armament systems used on the F-16, F-15, F-18, TA-50, FA-50 and additional aircraft. The MTS-209 supports a wide range of Alternate Mission Equipment (AME) including launchers, pylons, and racks. It combines the test capabilities of an I-Level test set in a compact, rugged, flight-line qualified enclosure. The MTS-209 performs parametric functional tests on AME components including Launchers (LAU-117, 16S210, LAU-127,, LAU-128, LAU-129, LAU-7,etc.), bomb racks (MAU-12, MAU-50, SUU-20, TER-9, etc.), Remote Interface Units (RIUs) and Pylons. The MTS-209 can also test MIL-STD-1760 aircraft stations and weapon systems.
-
Product
Digital Bit Pattern Generator
FAB-3226
Function Generator
The FAB-3226 Digital Bit Pattern Generator connects digital ports to an user-defined FPGA logic. As the FPGA is user-programmable all kind of operation can be implemented: input, output, and closed loop operation where input and output are processed in real-time. All this can be controlled by an user-defined application program running on a computer system (PC or embedded).
-
Product
PXI 2.5W Programmable Resistor Module, 2-Channel, 2Ω to 26.7kΩ
40-251-132
Programmable Resistor Module
The 40-251-132 is a programmable resistor module with 2 channels which can be set between 2Ω and 26.7kΩ with 0.5Ω resolution The 40-251 range provides a simple solution for applications requiring up to 2.5W of power handling per channel. The 40-251 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
-
Product
PXI 2.5W Programmable Resistor Module, 4-Channel, 2Ω to 102kΩ
40-251-034
Programmable Resistor Module
The 40-251-034 is a programmable resistor module with 4 channels which can be set between 2Ω and 102kΩ with 2Ω resolution The 40-251 range provides a simple solution for applications requiring up to 2.5W of power handling per channel. The 40-251 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
-
Product
Qualification Testing
-
Qualification, functional, and operational testing are important steps in evaluating how well spacecraft, launch vehicles, and other mechanical/electrical systems perform under severe loading conditions that occur during launch and operation.
-
Product
PXI Function Generator
Function Generator
Our PXI Function Generator is capable of generating sine, square and triangle waveforms to 10MHz with 48-bit frequency resolution referenced to the 10MHz PXI clock or to an external standard. It can generate fast swept frequency signals, permitting the output to emulate the operation of variable speed devices. The module can also generate arbitrary waveforms loaded into its internal 256k memory, allowing the emulation of many waveform types including the typical waveforms of automotive and aerospace sensors.
-
Product
PXI Three Channel Function Generator
41-620-003
Function Generator
The 41-620 is a compact 3 channel function generator provided in a PXI 3U single slot module. It is capable of generating sine waves to 10MHz with 48-bit frequency resolution referenced to the 10MHz PXI clock or to an external standard. The 41-620 can generate arbitrary waveforms loaded into the internal 256k memory, allowing the function generator to emulate many waveform types, including the typical waveforms of automotive and aerospace sensors.
-
Product
Flight Instruments & Gyro Department
-
Aero Instruments & Avionics, Inc.
The Flight Instruments & Gyro Department offers complete functional testing, repair and overhaul of most instruments & gauges located within the aircraft cockpit, and the associated computers that control them.
-
Product
Research & Electronic Test Products
test
he CAL-AV Research & Electronic Test Product line includes Explosive Test Site Range Instrumentation, Illuminated Laser Warning Signs and Special Projects.. Firesets, CDU’s EDU’s, Delay generators, firing panels, and custom instruments. Fiber-optic and computer-control options.
-
Product
10Gbit Ethernet Test Engine
XGT-200
-
The Ethernet test engine XGT 200 provide a comprehensive test for next generation Ethernet solution. There are many different test modules, it can help clients to verify the performance of their Ethernet. XGT-200 have two 10/100/1000Mb/s RJ45 , two 100/1000M SFP and two 10Gbps SFP+ it can generate test profession streams that you need and analyze them ,then provide the test result. XGT-200 provide install and maintain services and activate new profession service. XGT-200 can provide many kinds of test functions, it can help you to control and know the quality of your Ethernet.
-
Product
PCI Precision Resistor Card 18-Channel, 1Ω To 62.1Ω
50-297-011
Programmable Resistor Module
The 50-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
-
Product
Automated Test Equipment
test
These systems test semiconductor performance and quality with industry-leading precision and cost efficiency. Robust support for semiconductor design evaluation, volume production ramps, and yield improvement.
-
Product
Interactive Benchtop Test
test
Strict time-to-market deadlines make it vital to efficiently debug and validate product designs. Virtual instrumentation provides a unified interface that gives engineers an advantage over traditional box instruments.
-
Product
Design for Testability (DFT Test)
test
Corelis can provide you with design consultation and an analysis of your design for boundary-scan testability. We will review your design and make specific recommendations that if implemented will improve the testability. We can also suggest improvements that will increase test coverage and allow boundary-scan to be implemented in a more cost-effective manner.This service also includes a DFT test coverage analysis that we recommend to do after schematic capture and before PCB layout. At this stage of product development, Corelis provides you with a comprehensive test coverage reports that identifies all of the boundary-scan nets and pins and classifies them as completely tested, partially tested, or not tested. The report also recommends where to add test points (pads) for physical “nails” access if additional test coverage is required.
-
Product
Wireless Device Test
test
New wireless standards, in addition to rising wireless usage, are increasing wireless device complexity while lowering price expectations. To counter rising costs, manufacturers require test systems optimized for efficiency.
-
Product
PXI Three Channel Function Generator
Function Generator
Our PXI Function Generator is capable of generating sine, square and triangle waveforms to 10MHz with 48-bit frequency resolution referenced to the 10MHz PXI clock or to an external standard. It can generate fast swept frequency signals, permitting the output to emulate the operation of variable speed devices. The module can also generate arbitrary waveforms loaded into its internal 256k memory, allowing the emulation of many waveform types including the typical waveforms of automotive and aerospace sensors.
-
Product
PXI Precision Resistor Module 9-Channel, 1.5 to 3.55k
40-297-023
Programmable Resistor Module
This 9-channel PXI Precision Resistor Module provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-297 series is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
-
Product
NI-9351, 4-Channel C Series Functional Safety Module
784446-01
Functional Safety Module
4-Channel C Series Functional Safety Module - The NI-9351 works with 24 V industrial logic levels to directly connect to various sensor types, including light curtains, emergency e-stop buttons, and final elements such as relays, contactors, and motor drives. The NI-9351 is an analog input and digital I/O Functional Safety Module capable of SIL 3 certification according to IEC 61508. You can use the Functional Safety Editor to program the safety logic solver, which resides in the module. The module features diagnostics for monitoring the status of hardware and the integrity of the connections.
-
Product
Photodiode Burn-in Reliability Test System
58606
Test System
The Chroma 58606 PD/APD Burn-in system is a high density, multifunction and temperature controlled module based system for photo diode burn-in and lifetime test. Each module has up to 256 Source Measurement Unit channels which can source current and measure voltage in various scenarios such as one described below. The system can accommodate 7 modules for a total of 1,792 device channels.
-
Product
Conformance Test System
TS-RRM
Test System
The R&S®TS-RRM 5G and LTE test system is a test solution for running 5G NR and LTE inter-RAT RRM test cases for certification of wireless devices.It is a fully automated conformance test system for running validated RRM conformance test cases. In addition to the RRM test cases required by GCF/PTCRB, the R&S®TS-RRM also supports carrier acceptance specific RRM tests.





























