I-V-Curve
See Also: Photoluminescence
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Product
IND CAT IV TRMS Clamp Meter with Temperature
ACD-3300
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This CAT IV rated ACD-3300 IND Clamp On Tester is ideal for industrial applications and utilities that require an extra level of safety. Including True-rms sensing for accuracy, this clamp on meter’s extra large jaws can clamp on to those wide diameter wires making taking measurements in industrial environments simple.
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Product
Power Device Analyzer / Curve Tracer For Circuit Design
B1506A
DC Power Analyzer
The Keysight B1506A Power Device Analyzer / Curve Tracer for Circuit Design is a complete solution that can help power electronic circuit designers maximize the value of their power electronics products by enabling them to select the correct power devices for their applications. It can evaluate all relevant device parameters under a wide range of operating conditions, including IV parameters such as breakdown voltage and on-resistance, as well as three terminal FET capacitances, gate charge, and power loss. The B1506A Power Device Analyzer/Curve Tracer for Circuit Design meets and exceeds all curve tracer capabilities.
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Product
Quick I/V Measurement Software For PXIe SMU
PX0109A
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The PX0109A is an essential and powerful software tool to control the PXIe Precision SMU which makes it easy to quickly setup and perform current-voltage (IV) measurements and to display the measurement data in tables and graphs without the need to program.
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Product
Semiconductor Curve Tracer
CS-5000 Series
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*Max. Peak Voltage : 5,000V（HV mode）*Max. Peak Current : 1,500A（HC mode）*Equipped all models with LEAKAGE mode (Cursor resolution 1pA）*USB port for display hardcopy, waveform data (CSV format) and measurement setup SAVE/RECALL*LAN interface for Remote Control
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Product
Automated DC Parametric Curve Tracer
MultiTrace
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MultiTrace curve tracer is a mid-sized benchtop model supporting pin counts from 216-625 pins and includes the PGA-625 fixture as a standard interface. MultiTrace supports a wide range of test applications: Failure analysis, Reliability testing, Counterfeit device analysis, Nondestructive electrical counterfeit test, Opens, shorts leakage testing (OSL), Post decap electrical inspection, Optical fault localization, ESD testing, Latch-up testing, Supply current measurements, and more!
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Product
Curved Needle Test Systems
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Instron’s Curved Needle Testing System is designed for evaluating surgical and wound closure needles through two specialized testing methods: curved needle puncture testing (per ASTM F3014) and cantilever bend testing. These fixtures assess key performance attributes such as sharpness, coating integrity, and flexural strength. Compact and efficient, the tabletop system conserves bench space while delivering robust functionality. Powered by Bluehill® Universal software, it offers comprehensive control over test execution, data collection, and reporting, along with access to a wide range of built-in calculations.
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Product
Solar Array IV Curve Simulation Softpanel
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Chroma Systems Solutions, Inc.
Easily program the I-V curve of the Solar Array Simulator with this test software as well as the I-V and P-V curves for real-time testing. See both dynamic and static MPPT efficiency and even simulate the IV Curve with shadows. The real world weather simulation function allows the user to simulate the irradiation intensity and temperature level from early morning to nightfall.
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Product
Goniophotometer For Luminaries Intensity Distribution Curve
LCG-1800
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Shenzhen Chuangxin Instruments Co., Ltd.
Mainly used to measure FL etc. When installing luminaires, the lighting center of luminare and the rotating center of rotating table shall be at the same position. In B- coordinates, luminaire axis is superposed with the horizontal axis of rotating table. In A- coordinates, luminaire axis is vertical with the horizontal axis of rotating table.
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Product
Parametric Curve Tracer Configurations
Keithley PCT
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Developing and using MOSFETS, IGBTs, diodes and other high power devices requires comprehensive device-level characterization such as breakdown voltage, on-state current and capacitance measurements. Keithley's line of high power Parametric Curve Tracer configurations supports the full spectrum of device types and test parameters. Keithley's Parametric Curve Tracer configurations include everything necessary for the characterization engineer to develop a complete test system quickly.
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Product
Solar Cell PL/EL/IV 3-in-1 Testing System
VS6841
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Industrial Vision Technology Pte Ltd.
This luminescence Analyzer integrates a Photoluminescence (PL), Electroluminescence (EL) , and I-V Measurement Technology, has a Device’s PL image, EL image, as well Device’s I-V characteristics in One system. It is being using to quantitatively map Minority-Carrier Lifetime, and to characterize the defect of silicon wafer & solar wafer, and measure the key parameters from solar cell I-V Curve. It is also a useful tool for scientist to develop other methodology & parameters that can be used as a promising technique for online material monitoring and process control.
