DDR
Double Data Rate memory achieved by reading both the rising and falling edge of clock.
See Also: Memory, Memory Test, NAND, DRAM, Memory Device, DDR4
-
Product
PXI Digital Waveform Instrument
Digital Waveform
PXI Digital Waveform Instruments feature up to 32 channels, can sample and generate digital waveforms at up to 200 MHz, and interface with various standard TTL and low-voltage differential signals (LVDS), as well as settable voltage levels. These devices offer per clock cycle, per channel bidirectional control, and phase shifting. They include deep onboard memory with triggering and pattern sequencing. Some models also support doubledatarate (DDR) technology and real-time hardware data comparison. You can use Digital Waveform Devices to create device simulation and complex stimulusresponse tests.
-
Product
3.5" Embedded SBC With AMD LX800, Dual LANs, 4 COM, 4 USB 2.0 And VGA/TTL (-40°C To +85°C)
SBC84620
-
The SBC84620 supports AMD LX800 500MHz processor and full feature I/Os. It is an ideal entry level PC-based embedded platform and be able to be fanless operation for industrial applications. The new integrated graphic controller, 4 COM, 4 USB 2.0 ports and 1GB DDR memory features empower the system value without extra development cost. In the meanwhile, for the expansion interface, the SBC84620 provides PCI with Mini PCI socket and ISA bus through PC/104 interfaces. Also, SBC84620 gives the best TCO (Total-Cost-of-Ownership) for system design due to DDR memory supported.
-
Product
4-Channel DAC FMC Module
SMT-FMC211 – LPC
-
Sundance Multiprocessor Technology Ltd.
The main component of the SMT-FMC211 is the Texas Instruments 4 channel DAC – TI’s Quad 1.25GHz DAC3484. This device offers excellent SFDR performance better than 70dBc, with an output sample rate of over 312MSPS. It interfaces to an Artix-7 XC7A15T-2C FPGA using a 16 bit differential DDR bus.
-
Product
DDR Validation License Suite
SW00DDRV
-
The DDR Validation License Suite is part of the subscription based Oscilloscope Compliance Test Software Suites. This suite covers Tx Validation licenses for DDR with coverage across the DDR technology starting from DDR3. Together with the subscription model, this enables the support and coverage continuity as the DDR technology progresses through generations.
-
Product
DH Series High-Sensitivity Solder-In Tip, 30 GHz BW, 2.0 Vpp Range
DH-SI-HS
-
Teledyne LeCroy’s DH series 8 to 30 GHz differential probes offer the combination of bandwidth, input range and offset capability to address any high-speed probing requirement from debugging serial data interfaces to validating DDR memory systems. DH series probes provide superior loading characteristics and are calibrated with a custom “fine-tuned” frequency response. The ultra-low loading and flat frequency response ensure accurate measurements.
-
Product
Memory Analysis Software for Logic Analyzers
B4661A
-
DDR3, DDR4, DDR5, LPDDR2, LPDDR3, LPDDR4, and LPDDR5 Analysis . The Keysight B4661A memory analysis software offers a suite of options that include the industry’s first protocol compliance violation testing capability across speed changes, a condensed traffic overview for rapid navigation to areas of interest in the logic analyzer trace, powerful performance analysis graphics, and DDR and LPDDR decoders. With the B4661A memory analysis software and a Keysight logic analyzer*, users can monitor DDR/2/3/4/5 or LPDDR2/3/4/5 systems to debug, improve performance, and validate protocol compliance. Powerful traffic overviews, multiple viewing choices, and real-time compliance violation triggering help identify elusive DDR/LPDDR system violations.
-
Product
DH Series High-Temperature Solder-In Tip, 16 GHz BW, 3.5 Vpp Range
DH-HITEMP
-
Teledyne LeCroy’s DH series 8 to 30 GHz differential probes offer the combination of bandwidth, input range and offset capability to address any high-speed probing requirement from debugging serial data interfaces to validating DDR memory systems. DH series probes provide superior loading characteristics and are calibrated with a custom “fine-tuned” frequency response. The ultra-low loading and flat frequency response ensure accurate measurements.
-
Product
Component Testers
-
After a wafer is tested through front-end test and back-end test, the component tester tests this final component or package assuring its quality for the semiconductor makers. DDR, DDR2, DDR3 memory component testers.
-
Product
DH Series Tip - CrossSync PHY PCIe5 CEM x16
DH-CSPHY-PCIE5-CEMX16
-
Teledyne LeCroy’s DH series 8 to 30 GHz differential probes offer the combination of bandwidth, input range and offset capability to address any high-speed probing requirement from debugging serial data interfaces to validating DDR memory systems. DH series probes provide superior loading characteristics and are calibrated with a custom “fine-tuned” frequency response. The ultra-low loading and flat frequency response ensure accurate measurements.
-
Product
S.O. DIMM Converter
DDR 200-pin
-
The RAMCHECK DDR 200-Pin Converter is a perfect low-cost solution for testing modern laptop DDR memory. The converter plugs directly into the 184-pin RAMCHECK DDR main adapter, providing you with fast, convenient testing capabilities
-
Product
Recording System
Surveyor DFR DDR
-
The Surveyor Recording System is a DFR/DDR with local Input Modules connected to a Controller. The Input Modules are connected to the Controller by multiconductor cables. The Controller contains a single board computer running 64-bit Microsoft Windows 10® and the E-MAX Director program, for recording, storing and transferring data.
-
Product
Resistivity Meters
DDR3
-
Integrated Geo Instruments & Services Private Limited
The DDR 3 Resistivity Meter is a specialized version of IGIS Resistivity meters designed for use in Resistivity surveys up to about 200m depth. It utilizes rechargeable batteries as power source to energize the ground thus eliminating the necessity of using the relatively expensive dry cells.
-
Product
Detective Logic Analyzer
DDR3
-
Provides logic analyzer like deep transaction Listing and Waveform captureCan store up to 1G of captured StatesContinuous, real time analysis, not post-processingEye Detector guarantees valid data acquisitionExtensive Triggering and Storage Qualification allows precise insightProtocol Violation Detector provides hundreds of simultaneous, real time tests to JEDEC specificationsRow Hammer Analysis for potential data corruptionInteractions among up to 8 ranks, over two slots are analyzed.Mode Register Listing providedSupports Auto-Clock rate detect and clock stoppage Connects to the target under test with DIMM, SO-DIMM, and BGA interposers or a midbus probeIntegrated Microsoft Charts gives quick insight into large trace capturesTrigger In & Out allows the Detective to integrate with other test tools
-
Product
Infrared Microscope
DDR200/300 NIR
-
The McBain DDR200 NIR (for 200mm) and DDR300 NIR (for 300mm) provide high-speed defect detection and precision measurement on wafers and other parts. These cost-efficient systems offer unique advantages for both production and process development use, providing an optimum near-infrared (900-1700nm) solution when both subsurface defect detection and dimensional metrology are required.
-
Product
Functional/Protocol Debug and Analysis Reference Solution
DDR4
-
Highest confidence in measurement accuracy! Industry’s fastest triggering and data capture for DDR4 analysis, test, and debug.
-
Product
Training Board
JT 2156
-
The JT 2156 training board has been devised to demonstrate all the latest features and test techniques available to users of JTAG Technologies’ ProVision & JTAG Live application development systems. As well as a modern ARM Core processor, the design also includes an Altera Cyclone FPGA, DDR Memory, Ethernet PHY, and several SPI and I2C peripheral parts. The JT2156 is shipped with a comprehensive self-study manual for getting to know the in-depth features of ProVision and/or JTAGLive Studio. For Altium users the design also serves as an example of how to adapt the Nano board into a realistic custom design.
-
Product
Infrared Microscope
DDR200 & DDR300
-
The McBain DDR200 and DDR300 for 200mm and 300mm wafer defect detection and review are unmatched in value and features in this special application and price category. The systems offer significant and unique advantages for both production and engineering use, and provide an ideal solution when both defect detection and dimensional metrology are required.
-
Product
Data Recording System
Director DII - DFR DDR
-
Using the Microsoft Windows 10® operating system, DII features complete Transient and Long-Term Phasor Data Recording, Analysis, and Transmission. E-MAX DII has a maximum capacity of 128 Analog and 256 Digital directly connected channels.
