Fiber Test Systems
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Product
Integrated Rotating Systems
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In a radar, for instance, the integrated Rotary Joint connects the moving part of the radar with the pedestal, enabling uninterrupted transfer of multiple media. This transmission can be a combination of RF signals in waveguides or coax channels, or multiple other needed transfers like cooling media, fiber optical signals, electrical signals and air. The design of this Integrated Rotating System is conducted in cooperation with the customer, resulting in a tailor-made product with low losses, high peak performance and compact physical dimensions. EVERAXIS’s extensive experience guarantees a product that has one of the longest lifespans in the market.
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Product
Speaker Test
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Determines speaker polarity by analyzing a proprietary signal. See our new demo video of this module. Measures woofers, midrange, and tweeter drivers.
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Product
Test Accelerometer Sensitivity And Noise Test
Accelerometer Test Unit
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*Quick and Accurate Accelerometer Test*Battery operation*All tests use 32-bit resolution A to D Converter*All data downloaded to PC via Ethernet link*Records all data to a flexible easy to use database*Records time and date of tests
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Cameras & Imaging Systems
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Cameras & Imaging Systems by TP - Thermal Imaging, Corona Cameras
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Product
EMC Testing
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Underwriters Laboratories Inc.
Leverage our EMC expertise to avoid costly errors and accelerate time to market. Our customized testing solutions can enhance process efficiency and reduce testing cycles to help you make the most of your time and budget.
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Product
Localisation Testing
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Localisation testing is paramount for ensuring a seamless experience for your international customers and users. Your website or app must reflect the prevailing culture and conform to specific local standards and usage.
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Product
Systems
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Walter Stauffenberg GmbH & Co. KG
Custom-design and ready-to-install hydraulic pipe, tube and hose assemblies from port to port
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Product
Semiconductor Switching Systems
Keithley 700 Series
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The high speeds and low currents of semiconductor devices demand high quality, high performance switching of I-V and C-V signals. We offer switching solutions for both semiconductor R&D and production test applications with mainframes that can support up to 2,880 channels and a family of matrix cards designed specifically for semiconductor applications.
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Product
Load Shedding System
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An advanced smart load preservation solution must dynamically determine the optimal system response to a variety of system changes and disturbances. Utilizing model-driven foundation with embedded predictive analytics, and optimization algorithms, ETAP's adaptive Intelligent Load Shedding (ILS) solution makes Faster than Real-Time decisions.
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Product
DDoS Testing
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DDoS testing missions enable enterprises, operators and governments to test their resilience against DDoS and evaluate their DDoS mitigation infrastructure.
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Product
NI Real-Time Test Cell Reference System
778820-35
test
DIAdem Advanced with DAC Bundle, Perpetual License, Include 1 Year SSP
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Product
In-Sight Vision System
D900
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The In-Sight D900 is a smart camera powered by In-Sight ViDi software designed specifically to run deep learning applications. This embedded solution helps factory automation customers easily solve challenging industrial OCR, assembly verification, and random defect detection applications anywhere on the line that have gone uninspected because they are often too difficult to program with traditional, rule-based machine vision tools.
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Product
Test Chambers
Anechoic
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Free Field Test Chamber for sound pressure level measurement, sound power level determination, acoustic research and audio measurement applications
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Product
Test Patterns
DisplayMate Multimedia Edition
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DisplayMate Technologies Corporation
DisplayMate Multimedia Edition is the most advanced and powerful version of DisplayMate ever, with lots of proprietary and highly innovative suites of test patterns for setting up, tuning-up, calibrating, testing, evaluating, diagnosing, and analyzing CRTs, analog and digital LCD, Plasma, DLP, LCoS, and SXRD monitors and projectors, microdisplays, video boards, color printers, TVs and HDTVs, NTSC/PAL Television encoders and decoders, and more.
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Product
Test Leads
AL-34WB 10A
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Standard Electric Works Co., Ltd
● Wire length: 1m approx. Silicone insulated wire (700mm) with wire connected to straight input plugs (150mm PVC wire), and wire for clamp (150mm PVC wire).● Outside diameter of silicone insulated wire: 6.4mm Outside diameter of PVC wire: 4mm● Input plug color: Red•Green•Black•Blue ● Current rating: 10A● Voltage rating: 300V● Designed for Milliohm meter, Micro-ohm meter, Low resistance measurement with high current injection. ● Conductor size: 40mm maximum● Safety standard: IEC/EN 61010-031 CAT IV 300V
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Product
LIFA FLIM System
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The Lambert Instruments LIFA FLIM system is the fastest and easiest way to perform Fluorescence Lifetime Imaging Microscopy (FLIM).Available in versatile configurations dependent on your specific applications, the LIFA system offers a turn-key solution for fluorescence lifetime imaging microscopy. Compatible with any fluorescence microscope with a camera output – including microscopes by Leica, Nikon, Olympus, TILL and Zeiss. Set up is quick and easy, with all hardware integrated seamlessly with our dedicated LIFA software, so you can focus on your experiment.The advanced software instantly analyses data and presents the calculated fluorescence lifetimes visually. Recorded images are compatible with ImageJ, FIJI, Matlab and MetaMorph, while detailed statisitcal data can be exported to an Excel worksheet.
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Product
Automated Metrology System
EVG®50
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High-throughput, high-resolution metrology for bonded stacks and single wafers. The EVG 50 (fully automated stand-alone tool) and the Inline Metrology Module (integrated in EVG''s high-volume manufacturing systems) offer highly accurate measurements at high speed, utilizing different measurement methods for a large number of applications. The tool''s application range covers multi-layer thickness measurements for determination of the total thickness variation (TTV) of an intermediate layer, the inspection of bond interfaces as well as resist thickness measurement, and meets the most demanding requirements of the yield-driven semiconductor industry.
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Product
NI LabVIEW Base Development System for Windows
System
NLabVIEW is system engineering software designed for applications that require test, measurement, and control with rapid access to hardware and data insights. The LabVIEW Base Development System is recommended to integrate NI hardware and third-party devices together to build automated desktop measurement applications with an intuitive graphical programming syntax.For applications that require advanced inline analysis or PID control, consider LabVIEW Full Development System.
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Product
GSP-2B Test System Interface Probe
GSP-2B
ICT/FCT Probe
Current Rating (Amps): 5Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 125Full Travel (mm): 3.18Recommended Travel (mil): 125Recommended Travel (mm): 3.18Overall Length (mil): 845Overall Length (mm): 21.46
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Product
Ready to Use Systems
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The ready-to-use systems offer a variety of solutions with smal learning time and just a few clicks of a button in industries such as food and beverages, electronics and in areas such as deep learning, thermography, 2D and 3D image processing. The systems include the EyeVision software solution for free adaptation, as well as the EmSys computer hardware and an industrial camera from one of the supported manufacturers such as Allied Vision Technologies, Basler, Baumer, Teledyne Dalsa, or thermography cameras from Optris or Flir. Both GigE and USB cameras are available for cameras.
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Environmental Testing
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Environmental testing typically involves hot or cold temperatures, humidity, altitude (vacuum) or thermal shock. This testing can even be combined with other test methods such as vibration or shock.
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Product
Etch System
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When it comes to clean etches, Veeco’s Ion Beam Etch (IBE) systems deliver with sharp control and minimal disruption. Using a focused argon ion beam, this subtractive technique etches nanoscale features with precision, making it a go-to for pattern transfer, layer removal, and surface refinement where edge definition matters most.
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Product
Camera Systems
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Delivering confident visibility. Our high-temperature and radiation-tolerant cameras deliver critical protection through confident visibility in the most extreme industrial environments.
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Permanent Bonding Systems
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The introduction of EVG's wafer-bonding approach, which separates the bond alignment from the bonding step, immediately revolutionized the market. Utilizing high-contact forces under elevated temperatures and a controlled atmosphere, this novel approach is today's process standard, with EVG holding the dominant market share for both semi- and fully automated wafer bonders and a growing installed base of more than 1500 chambers. EVG's wafer bonders offer optimal total cost of ownership (TCO), as well as multiple design features to optimize bonding yield. Multiple modules for bond alignment are optimized for different market requirements in MEMS, 3D integration or advanced packaging. Industry-leading alignment accuracies of less than 100 nm and a high-volume-proven modular platform enables the combination of EVG’s wafer bonding technologies in various applications.
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Complex System Solutions
К2М-100 Series
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*Operating Frequency Range: 100 MHz*Measurements per Connection*All S-Parameter Measurement (256 states)*SOLT Calibration*Measurement Profile Save*Full and Cross Measurement Result Analysis
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Product
Personal Dosemeter System
05NK003
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Measure personal noise levels with the Dosemeter System. Kits consist of either 1 or 5 non-logging dosemeters with calibrator and case. Ideal for checking worker's exposure to noise and adhering to Control Of Noise At Work Regulations.
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Scalable Test Solution for Mixed-Technology Test Applications
Spectrum RF Systems
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The Spectrum RF Systems are fully integrated, configurable test platforms combining several digital, analog, RF, and switching instruments to provide automated functional test solutions for a wide range of mixed-signal and microwave test applications including radars, Electronic Warfare, missile, and satellite communications.
