Standard Test Interface Language
IC digital vector test representation standard.
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Standard 1.71 (48.00) - 3.00 (85.00) General Purpose Probe
HPA-74T80
Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Test Center Remark: max. test center 187 mil / 4,74 mmFull Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 75Recommended Travel (mm): 1.91Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 598Overall Length (mm): 15.19Overall Length Remark: Tip “A-B”: 598 (mil), 15.19 (mil), Tip “C”: 586 (mil), 14.88 (mil), Tip “E, T135, T156, T65, T80”: 610 (mil), 15.49 (mil), Tip “T75”: 620 (mil), 15.75 (mil)
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Diagnostic Testing
Response Dynamics Vibration Engineering, Inc.
Response Dynamics has made diagnostic testing our core focus for over 30 years. We do this detective work well because we have particular expertise in structural dynamics and how it relates to vibration and acoustic noise issues on a myriad of levels. We enjoy this work because it stays interesting and draws on multiple disciplines in engineering and science.
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Test Cells (
LaplaCell
LaplaCells provide a facility for the rapid and efficient testing of the EMC compliance of products. These cells offer a calibrated and screened environment in which radiated emissions can be measured and immunity to RF radiation can be tested. They \re calibrated according to the methodology of IEC61000-4-20, thus affording compliant testing to IEC61000-4-3 and pre-compliance testing for radiated emission testing.
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Magnet Testing
m-axis
m-axis is a measurement system that can be used to characterize permanent magnets in terms of their magnetic specifications (magnetic moment and magnetization angle) with high precision. In addition to the four standard measuring ranges, the modular design allows the system to be adapted to customer-specific requirements. The measurement systems can be used for 100% in-line quality control via our m-axis I/O module.
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Standard 1.10 (31.00) - 2.50 (71.00) General Purpose Probe
HPA-1G
Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 67Recommended Travel (mm): 1.70Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 655Overall Length (mm): 16.64
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Test Stands
The cost of a test stand or test facility is usually directly proportional to the accuracy of the test simulation.
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Data Interfaces, Sensors And Actuators
Dewesoft also develops and manufactures data interfaces such as CAN USB devices, GNSS and INS positioning devices, and Inertial Measurement Units (IMU), and high-speed cameras. All devices are completely compatible and synchronized with all of our Data Acquisition (DAQ) systems and offer the same highest possible built quality. To complete the measurement chain we also provide high accuracy current and vibration sensors.
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Standard 1.10 (31.00) - 3.85 (109.00) General Purpose Probe
HPA-64-4
Current Rating (Amps): 3Average Probe Resistance (mOhm): 50Test Center (mil): 100Test Center (mm): 2.54Test Center Remark: max. test center 187 mil / 4,74 mmFull Travel (mil): 50Full Travel (mm): 1.27Recommended Travel (mil): 50Recommended Travel (mm): 1.27Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 375Overall Length (mm): 9.53Overall Length Remark: Exact length depends on selected tip: Tip 1,4, 7: 0,375″; Tip 2,3,9,10: 0,365″; Tip 8: 0,385″
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Virtual Interface Technology for 3D-IC Metrology
VIT
TSV profile (depth, top & bottom CD, tilt, SWA)-Residue Detection-RST-Copper Nail Height-Bump Height and Cu pillar height-Edge trim profile
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Testing Instruments
NDT testing instruments, other testing instruments, paper testing instruments, plastic testing instruments, rubber testing instruments, soil testing instruments
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NanoLattice Pitch Standard for Mask Handling Tools (NLSM)
The NanoLattice™ (NLSM) 100 nm pitch standard utilizes gratings with near perfect periodicity to calibrate magnification and scan linearity of CD-SEM and Atomic Force Microscopes (AFM). Make the grade, with the only pitch standard of its kind available below the 130 nm node.
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Test systems
MG Products can supply a variety of test systems. These include the Extended Boundary Scan Test from JTAG Technologies, the functional test equipment integrated into a table or high configuration from Unites systems or the Cabinet Modular Test solution (CMT). We offer the right solution for every test setup.
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Standard 1.00 (28.00) - 1.80 (51.00) General Purpose Probe
P2662BG-1R1S
Current Rating (Amps): 3Average DC Resistance lower than (mOhm): 30Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 68Full Travel (mm): 1.73Recommended Travel (mil): 50Recommended Travel (mm): 1.27Overall Length (mil): 575Overall Length (mm): 14.60
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Microwave Testing
50A
The GGB Industries, Inc., MODEL 50A probe sets new standards in microwave probing performance. Using low loss coaxial techniques, the Model 50A achieves an insertion loss of less than 1.0 db and a return loss of greater than 18 db through 50 GHz.
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Unit Testing
Hitex offers a unit testing service for C/C++ application source code using the well-known test tool TESSY. For this service, the customer provides their source code of the C/C++ functions to be tested, ideally along with the specifications of the functionality and comprehensive comments in the source code.
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Connector Testing
If your product uses a connector or terminal, it can be susceptible to a unique set of failures that warrant specific connector testing conditions to determine the robustness of your design.
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HMI Operator Interface Panels
- Robust and powerful HMI for operation and monitoring- Programmable and parameterizable to IEC 61131-3 with CODESYS- Vibration and shock resistant housings with high protection rating- Units for surface or panel mounting- Powerful interfaces for various communication tasks
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Test SIP
VoIP, Video, and IPTV products must withstand and continue to function when facing all the conditions that occur on the Internet. These include attacks from hackers exploiting vulnerabilities in security and protocols as well as the common phenomenon of congestion, delay, jitter, drops, and so on. VoIP, Video, and IPTV products must demonstrate robustness and resiliency in the face of unusual and/or illegal conditions.
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Shock Testing
Shock testing typically involves calibrated, repeatable, violent events. The resulting energy is then absorbed transferred through the test specimen or Device Under Test (DUT)
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Test Adapters
In our specially developed MG range of linear test adapters (test fixtures), we use solid aluminium components in our mechanical construction. This is to ensure the reliability and contact accuracy of the test adapter.
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Test Systems
6TL’s speciality is simplifying the architecture of test systems, so that our customer’s Total Cost Of Ownership is drastically minimized. The technology that conveys our mission is called FastATE.FastATE technology is based on using intelligent modules to build test systems.
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EMC/EMI Testing
MET Laboratories boasts proven, superior capabilities in Electromagnetic Compatibility (EMC) compliance testing, including wireless & RF testing. Our EMC labs are among the most respected in the U.S. Our EMC testing covers FCC Part 15, as well as Parts 18, 22, 24-27, 74, 90 & 95, and 101
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Test Sockets
Smiths Interconnect offers a wide range of spring contacts and design standards for high quality test sockets providing flexibility and fast delivery for optimal cost/performance ratio.
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Standard 0.79 (23.40) - 1.75 (49.60) High Frequency Probe
CSP-40A-024
Bandwidth @ -1dB (GHz): 6.00Return Loss @ -20dB (GHz): 2.30Nominal Impedance (Ohms): 50Dielectric VTE Rating (k VAC): 1Test Center (mil): 250Test Center (mm): 6.35Full Travel (mil): 200Recommended Travel (mil): 133Recommended Travel Remark: Shield: 211 (5.36) including travel of probesOverall Length (mil): 1,231Overall Length (mm): 31.28Full Travel Remark: Shield: 225 (5.72) including travel of probes
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Test System
LB302
Computer Gesteuerte Systeme GmbH
The LB302 test system is the most used midsize range version of the LB-300 series. It is designed for development as well as for production. The ‘device under test’ (DUT) is connected with a G12 receiver (Virginia Panel Company), which has a high number of possible contacting and a low transition resistance.
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RS-232 to RS-485 Optically Isolated Interface Converter
Model 8322
FEATURES: 4 Wire-Master/Slave Operation; Active Mode Control Via RTS or Data; Opto Isolation; Built-in Power Supply; Internal Microcontroller; 38.4 KBPS Data Rate; DIN Rail Mountable; Programmable Terminations. The Model 8322 RS-232 to RS-485 Interface Converter allows information exchange in half duplex mode over two twisted pairs.
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Test Facility
Emprise has extensive experience designing test facilities for the aerospace, automotive, industrial and power generation marketplaces. The cost of a test facility is usually directly proportional to the accuracy of the test simulation.
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Test Handler
M6242
Optimal Test Handler for Mass-Production DRAM, with Double the Throughput.
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Test Probes
Our innovative Test Probes are the upgrade version of Auto Multi Meter. It can perform multiple circuit system test such as power supply feed, voltage and resistance measurement, continuity test, ground test, polarity check and components activation.
