Deep Ultraviolet
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Product
Deep Ultraviolet Observation System for Microscope
U-UVF248
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Model Capable of High-magnification/High-contrast Deep Ultraviolet (DUV) Observation. A Semiconductor / FPD Inspection Microscopes.
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Product
Deep Ultraviolet Spectrophotometer System
VUVAS-10X
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A new ultraviolet spectrophotometer system for optical metrology just arrived at NASA Goddard! The VUVAS-10X spectrophotometer works best in the 90 to 160 nanometer wavelength range, also known as deep or vacuum ultraviolet (VUV) region. It uses a windowless hydrogen plasma light source and differential pump section to reach many wavelengths beyond those of conventional deuterium lamps. The source also works with other gases, or gas mixtures, for atomic spectral line emission from about 30 nanometers (double ionized Helium gas) up to the Visible light range. The new spectrophotometer system, McPherson VUVAS-10X, uses a one-meter focal length high-resolution monochromator with the special light source, scintillated detector and Model 121 goniometric sample chamber. The system is ideal for optical transmission, absorbance and specular reflectance at incident angles up to 60 degrees. This McPherson spectrophotometer system will help develop, inspect and qualify optical materials and coatings used for very high altitude and extraterrestrial space flight missions.
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Product
DUV Lithography Systems
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ASML's deep ultraviolet (DUV) lithography systems dive deep into the UV spectrum to print the tiny features that form the basis of the microchip.
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Product
Ambient Pressure Photoemission Spectroscopy With Nitrogen Environment
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The APS04-N2-RH incorporates a tuneable deep ultra-violet (UV) source outputting 3.4 - 7.0 eV, for absolute work function and highest occupied molecular orbital (HOMO) measurements, a surface photovoltage spectroscopy (SPS) module outputting 400 - 1000 nm for Voc and Eg measurements, together with a 50 x 50 mm scanning area for planar relative work function measurements (Fermi level).
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Product
EUV Lithography
NXE systems
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NXE lithography systems are used in high-volume manufacturing of advanced Logic and Memory chips. The first systems to use ASML’s novel 13.5 nm EUV light source, they print microchip features with a resolution of 13 nm, which is unreachable with deep ultraviolet (DUV) lithography. Chipmakers use our NXE systems to print the highly complex foundation layers of their 7 nm, 5 nm and 3 nm nodes. Read about how EUV lithography went from imagination to reality.
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Product
Ultra-High Vacuum Ф4 Scanning Kelvin Probe
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The Ф4 Ultra-high Vacuum Scanning Kelvin Probe system gives the user full access to work function measurements under vacuum with the ability to alter the temperature from 77 K to 860 K. The Kelvin Probe measurement has resolution of 1 - 3 meV for a 2 mm tip on a conducting sample. The sample is mounted on a plate that is located on a motorized (x, y, z) translator attached to a stainless-steel vacuum chamber. Phi 4 also comes with a photoemission spectroscopy system with a tuneable source (3.4 - 7.0 eV). The deep ultra-violet (DUV) light spot measures approximately 3 x 4 mm. Absolute work function measurements can be obtained with this system in the range of 4.0 - 6.5 eV with an accuracy of 0.05 - 0.1 eV.
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Product
DXG Deep Ultraviolet
DXG Series
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Engineered for versatility and performance, the DXG Nd: YAG Laser Series powers a wide range of applications, from high-precision material processing to marking, scribing, and advanced manufacturing. With air-cooled, water-cooled, and long-pulse options, DXG lasers provide high energy, stability, and efficiency, ensuring superior results in industrial, scientific, and semiconductor applications.
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Product
Ultraviolet Microscope
UVM-1
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The UVM-1™ is a UV microscope that also can image in the visible and NIR. This UV-visible-NIR microscope embodies both advanced optics for cutting edge UV, color and NIR imaging and visualization. The system is a flexible design, very easy to use and very durable. It is designed with cutting edge CRAIC optics for the highest image quality and to give years of service.
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Product
Ultraviolet Analyzers
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Teledyne Analytical Instruments
Ultraviolet Analyzers by Teledyne Analytical Instruments
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Product
On-Camera Deep Learning
Firefly DL
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Deep learning is a powerful tool for system designers to quickly automate complex and subjective decision making and deliver higher quality products and improved productivity. Deploy your trained neural network to the FLIR Firefly DL with Neuro technology and reduce system cost and complexity by making decisions on-camera without host PC. With its very small size, low weight and power consumption, the Firefly DL camera is ideal for embedding into mobile, desktop, and handheld systems.
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Product
Deep Access RF Probes
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GigaTest Microwave Probes are perfect for device characterization and modeling. GigaTest Probes have a high tolerance allowing them to land repeatedly and take high-quality data.
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Product
Open eVision Deep Learning Studio
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Ease the evaluation of Open eVision’s Deep Learning toolsDataset creation and image annotation for classification, segmentation, and object localizationCreate and configure dataset splits to decide how your images are usedManage the data augmentation transformationsTrain your tools in succession thanks to the training queueValidation and analysis of the results of the trained toolsAvailable on Windows and LinuxFree of charge
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Product
Deep And Sloped Pan Fixtures
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Line of deep and sloped pan fixtures for general purpose/system non-specific pcb test applications. H+W Test Products manufactures test fixture products for in-circuit, functional and combinational testers for users of automated test systems (ATE) such as Aeroflex, Agilent (HP), Checksum, Factron, Teradyne (GenRad), Test Research (TRI) and Testronics.
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Product
Rack Extender Kit, G12, 1.5" Deep
310113406
Rack Extender
The Rack Mount Extender Block Kit is used for mounting to racks with recessed mounting rails recessed more than 1.” It is made of aluminum with a black anodized finish. NOTE: Used only with slide mounted G12 Receivers.
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Product
Ultraviolet Meter
UVR Series
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UVR series is suitable to manage lamp of ultraviolet curing equipment, Also suitable to measure intensity of ultraviolet ray for sun light and lamp.
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Product
Deep Cooled UV-VIS/NIR Scientific Cameras
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TE and cryogenically cooled CCD and EMCCD scientific cameras for ultra sensitivity from 200 nm to 1100 nmHORIBA Scientific offers a complete line of spectroscopic multi-channel detectors for scientific research. For spectral detection from UV to near-IR, two dimensional CCDs and indium gallium arsenide linear arrays offer a faster acquisition option over single point detectors with relatively high sensitivity. Coupled with HORIBA’s range of aberration corrected, flat field imaging spectrographs, custom spectroscopy packages can be assembled for a variety of applications.
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Product
Deep Target System
NX15®
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Geophysical Survey Systems, Inc.
NX15® Deep Target System is designed for inspecting thick concrete, slab-on-grade surfaces, and structural elements. Engineered for enhanced penetration, it offers a depth range of 0–150 cm (0–60 in) in ideal conditions.
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Product
Ultraviolet Light Distribution Measurement Film
UVSCALE
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UVSCALE is a film that responds to UV light, and changes color depending on the amount of light it is exposed. This makes it easy to see UV light distribution. There are a roll type and a sheet type, with three types for different amounts of light.
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Product
Solar Ultraviolet Pyranometers
UVR1-T, UVR1-A, &
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The Middleton Solar UVR1 series are precision filter radiometers for measuring solar global ultraviolet irradiance. The UVR1-T and UVR1-A are suitable for air pollution monitoring. The UVR1-B is suitable for biological and human erythema (sunburn) monitoring.
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Product
Deep Cooled NIR Scientific Cameras
Synapse InGaAs/Symphony II InGaAs
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HORIBA Scientific offers a complete line of spectroscopic multi-channel detectors for scientific research. For spectral detection from UV to near-IR, two dimensional CCDs and indium gallium arsenide linear arrays offer a faster acquisition option over single point detectors with relatively high sensitivity. Coupled with HORIBA’s range of aberration corrected, flat field imaging spectrographs, custom spectroscopy packages can be assembled for a variety of applications.
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Product
Deep Cooled UV/Vis/NIR and VUV Scientific Cameras
Syncerity Scientific Cameras
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HORIBA Scientific offers a complete line of spectroscopic multi-channel detectors for scientific research. For spectral detection from UV to near-IR, two dimensional CCDs offering a faster acquisition option over single point detectors with relatively high sensitivity. Coupled with HORIBA’s range of aberration corrected flat field imaging spectrographs, OEM packages can be assembled for a variety of applications.
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Product
Deep Learning Accelerators
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ADLINK’s Deep Learning Accelerators provide GPU- and VPU-accelerated inferencing with embedded, small, and standard form factors. ADLINK’s Deep Learning Accelerators offer high performance, power efficiency and longevity support required of AI applications at the edge, delivering actionable insights at the right place at the right time for industrial automation, transportation, smart city, military and aerospace applications and more.
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Product
Enclosure, 50 Module, Hinged Cover Plate, 4" Deep
410112199
Enclosure
The Enclosure for the 50 module ITA is made of aluminum, painted black and secured to the ITA by eight socket head cap screws (included). The top of the enclosure is a hinged cover plate with quarter turn hardware that provides easy access to the ITA’s wiring when required.
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Product
Image Processing and Analysis Software Deep Learning Module
ENVI® Deep Learning
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L3Harris Geospatial Solutions, Inc
L3Harris Geospatial has developed commercial off-the-shelf deep learning technology that is specifically designed to work with remotely sensed imagery to solve geospatial problems. The ENVI Deep Learning module removes the barriers to performing deep learning with geospatial data and is currently being used to solve problems in agriculture, utilities, transportation, defense and other industries.
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Product
Deep Submersible Particle Size Analyzer
LISST-Deep
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The LISST-DEEP instrument obtains in-situ measurements of particle size distribution, optical transmission, and the optical volume scattering function (VSF). Using a red 670nm diode laser and a custom silicon detector, small-angle scattering from suspended particles is sensed at 32 specific log-spaced angle ranges. This measurement is post-processed to obtain sediment size distribution, volume concentration, optical transmission, and VSF. The electronics and optical configuration in the LISST-DEEP are very similar to Sequoia’s workhorse, the LISST- 100X. However, because of the extreme difficulty associated with keepingalignment under high pressure, the LISSTDEEP hardware design is radically different from the LISST-100X. This allows the LISST-DEEP to be deployed down to 3000 m and obtain reliable measurements of the in situ particle size distribution and volume concentration in waters with optical transmission up to 98.5%.
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Product
Logger Version 2-D Electro-Magnetic Current Meter for Deep Ocean
INFINITY-Deep AEMD-USB
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INFINITY-Deep is an autonomously deployable data logger for current speed measurements in the deep oceans. The currents in the deep oceans are very weak. It is too hard to accurately measure the deep water currents by some ADVs (Acoustic Doppler Velocimeters) that detect the Doppler-effect by scatter with the suspended particles in the water, because the concentration is very low.
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Product
PCE-2000UV_1.5 Ultraviolet Light Radiation Measurement System
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Hangzhou Everfine Photo-E-Info Co., LTD
PCE-2000UV UV light source radiation Measurement system can realize the measurement of the relative spectral power distribution of ultraviolet LED, UV fluorescent lamp, UV light source, peak wavelength, half-peak wavelength, spectral radiation flux of UV-A/B/C, and the total radiation flux in specific wavelength.
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Product
Multibeam Echosounder - Deep Water
HydroSweep MD/50
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The HydroSweep MD/50 is a high resolution multibeam echosounder ideally suited for seabed mapping in mid and shallow water based on a sonar frequency range between 52 kHz to 62 kHz. Beside bathymetric depth information from 5 m to more than 2000 m, sidescan data and backscatter data for seabed classification can be acquired.
