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2D

two dimensions.


Showing results: 181 - 195 of 213 items found.

  • Machine Vision Platform

    NeuralVision - Cyth Systems, Inc

    NeuralVision is a machine vision platform designed to allow an operator or supervisor with no previous experience to develop an inspection and measurement routine for their products. The operator need only provide as many examples of each type as possible for the system to scan. NeuralVision is the first such processing system to work with any type of camera or image including 2D gray-scale or color, plus 3D and infrared images.

  • Analytical Services

    Inolytix

    IGC: Inverse Gas Chromatography; Understand surface energies, polarities, acid/base properties and nanomorphology on powders and fibers. ToF-SIMS: Time-of-Flight Secondary Ion Mass Spectrometry. Localize your molecules at the first nanos! 2D imaging with resolution up to 200 nm. Highest sensitivity up to 10 ppm. CM: Quarz Crystal Microbalance In-situ observation of thickness and stiffness of any films in liquid environmentSEM: Scanning Electron Microscopy Images say more than words, especially with an artistic eye XPS/ESCA: X-ray Photoelectron Spectroscopy/Electron Spectroscopy for Chemical Analysis.

  • Non-contact Ultra-High Range Sheet Resistance Measurement System

    CRN-100 - NAPSON Corp.

    *Ultra-High range sheet resistance measurement for 10E+9 ~ 10E+15 ohm/sq without contacting*Mapping program software;*1. Arranged in a multipoint pattern measurement is programmed*2. 2-D & 3-D mapping software*Easy operation by Windows 7 system software*Measurement data base link with Excel via CSV format file*Unaffected by contact resistance

  • 3D Inline Solder Paste Inspection System

    TROI 7700 SERIES - Pemtron Co., Ltd

    Using Moire' pattern, Pemtron's three-dimensional lead applicationdosage tester combines 2D color images with 3D measurement data toprovide more detailed, near-real PCB images, unlike traditionalcolor maps. We will also provide you with the best solution forhigh-quality and high-precision PCB production with a varietyof statistical programs, along with information you need toquickly and accurately judge positive/failure.

  • Software

    FDCS - Mesuro Ltd

    Beyond traditional Noise and Harmonic Load/Source Pull, FDCS also supports Tuner and Fixture (TRL) calibrations, Time Domain Load Line acquisition, Pulsed IV and Load Pull and Active feedback Power Injection operations (for Γ ≥ 1).The measured data are processed graphically into 2D and 3D plots and are converted into popular simulator formats (ADS, AWR etc.).The FDCS user unterface includes many many improvements and optimizations to make load pull and noise measurement easier.The software has ActiveX control for controlling MPT tuners in any ActiveX compatible platform.

  • Software

    Focus Microwaves

    Beyond traditional Noise and Harmonic Load/Source Pull, FDCS also supports Tuner and Fixture (TRL) calibrations, Time Domain Load Line acquisition, Pulsed IV and Load Pull and Active feedback Power Injection operations (for Γ ≥ 1).The measured data are processed graphically into 2D and 3D plots and are converted into popular simulator formats (ADS, AWR etc.).The FDCS user unterface includes many many improvements and optimizations to make load pull and noise measurement easier.The software has ActiveX control for controlling MPT tuners in any ActiveX compatible platform.

  • Mini Array+

    DORC's ZX-1 - Direct Optical Research Company

    Used primarily to measure multi fiber (MT/MPO and MT-RJ) connectors, DORC's fourth generation "ZX-1 mini Array+" is the result of 18 years of hardware and software product development. Although optimized for mutifiber connectors, the ZX-1 mini Array plus also does an excellent job of measuring single fiber PC and APC connectors. DORC's patented design is based on a variant of the Michelson configuration, and provides BOTH 2D and 3D high resolution images of the sample under test in approximately 45 seconds for multi fiber connectors and just 3-4 seconds for single fiber connectors - from the time the connector is inserted.

  • Digital Laser Beam Analyzer

    ScienceGL, Inc.

    ScienceGL offers economic laser beam profiling solutions for laser beam measurement, diagnostics and analysis. The Digital Laser Beam Profiler allows you to analyze laser output quickly and accurately at fraction of the market price. The profiler utilizes our advanced computer graphics engine for best visual perception of the beam in 3D realistic representation. Traditional 2D plot colored by the look up table (LUT) is also available.

  • Barcode Conformance Calibration Standards

    Applied Image, Inc.

    Barcode symbol quality has been at the forefront of discussion among practitioners in the automatic identification and data capture (AIDC) industry since they were invented in 1951. Barcodes became commercially successful when they were used to automate checkout systems at grocery stores, with the very first scanning of the Universal Product Code (UPC) on a pack of Wrigley Company chewing gum in June 1974. The Uniform Code Council (UCC) published barcode quality guidelines, and ANSI X3.182-1990 became the first published standard for barcode quality. Since then, ISO/IEC 15416 for 1D symbols and ISO/IEC 15415 for 2D symbols have become the global standards for grading printed barcodes.

  • Multibeam Profiling Software

    MB-DataLogger - Teledyne Marine BlueView

    Teledyne BlueView's MB-DataLogger software provides a powerful tool for multibeam profiling applications. From mission setup to data playback, review, and export, MB-DataLogger gives users full end-to-end mission support. Set up data collection parameters (sonar head range, ping rate, filename identifiers, etc.) for a SmartCore-enabled system prior to deployment, then review bathymetric profiles in a 2D or 3D waterfall display with or without navigation correction post mission. When regions of interest are identified, export batches of data files to georeferenced point clouds to be imported by third-party applications. MB-DataLogger is the software Swiss army knife for your BlueView multibeam profiling system.

  • Computer Vision and Visualization

    Fraunhofer Institute for Telecommunications

    The Computer Vision and Visualization Department consists of three research and development groups working on innovative technologies in the field of monocular, stereoscopic and multichannel video processing. It covers the entire processing chain from original capture to rendering, with a focus on advanced 2D and 3D analysis, post-production synthesis, computer vision, image understanding, human-machine interaction, and immersive media , The department also has expertise in processing complex systems consisting of multiple cameras, sensors, displays, projectors or screens.

  • Automated X-ray Inspection (AXI)

    TR7600 SII - Test Research, Inc.

    Featuring advanced automated 3D X-ray inspection of PCBAs, the TR7600 SII high speed scanning with multiple resolutions in a single program. Automatic Pass/Fail determination uses 2D + 3D images provided using 6-axis control and ultra-high-speed multiple angle cameras with automatic board warp compensation. TR7600 SII is ideal for inspection of fine pitch 01005 components, BGAs, PoPs, LGAs and other bottom termination components on both sides of the PCBA, including complex Pressfit connectors.

  • Imaging Photometers

    Westboro Photonics

    Westboro Photonics offers an intelligent selection of imaging photometers. With a wide range of resolutions, an assortment of lenses, flexible software, and cooled systems, our products are unmatched in the marketplace. We provide three series of photometers to satisfy almost any 2D luminance-based measurement need. Applications including Graphics Testing, Beam Pattern Distribution, Flat Panel Displays and Avionics Panel Balancing are handled with ease, thanks to our robust design, extensive calibrations, and flexible, intuitive analysis software.

  • Stylus Profilometry

    Dektak® - Bruker Nano Surfaces

    Bruker's Dektak stylus profilers are the product of over four decades of proprietary technology advances. They provide repeatable, accurate measurements on varied surfaces, from traditional 2D roughness surface characterization and step height measurements to advanced 3D mapping and film stress analyses. Dektak surface profilers have been widely accepted as a superior solution for measuring thin film thickness, stress, and surface roughness and form in applications ranging from educational research verification to semiconductor process control.

  • Antenna Measurement Software

    Raymond RF Measurements Corp.

    Raymond RF's Antenna Measurement Software performs 2-D (polar/rectangular) and 3-D (spherical) antenna pattern measurements for passive antennas and active wireless mobile stations (cell phones). Insertion loss of passive devices is included as part of the calibration component. Data management and reporting of antenna properties such as half power beam-width, directivity, gain, radiation efficiency, total radiated power, and total isotropic sensitivity. AMS performs and reports all measurements required by the CTIA Over-the-Air Performance Test Plan.

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