2D
two dimensions.
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Product
Sensors
2D Fiber Probe
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Smallest and most accurate probe for 2D evaluations world-wideMechanical fiber sensor with optical evaluation from image processorTransmitted light and self illumination modeLowest contact force of 1 µNSphere diameters down to 25 µmControl and evaluation software for fully automatic measurements
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Product
Surface Analysis
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Bruker Nano Surfaces provides industry-leading surface analysis instruments for the research and production environment. Our broad range of 2D and 3D surface profiler solutions supply the specific information needed to answer R&D, QA/QC, and surface measurement questions with speed, accuracy, and ease. Bruker’s AFMs are enabling scientists around the world to make discoveries and advance their understanding of materials and biological systems. Our tribometers and mechanical testers deliver practical data used to help improve development of materials and tribological systems.
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Product
Image-Based Code Readers
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Versatile, high-performance, straightforwardImage-based code readers provide flexibility, high performance, convenience and simplicity. Even at fast conveyor speeds, SICK image code readers can reliably detect and evaluate 1D, 2D, DPM (direct part marking), and partially damaged codes. These readers identify markings on nearly any surface, including metal, glass, plastic or paper. Plus, different models, interfaces, and networking capabilities provide application flexibility.
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Product
Non Destructive Analysis
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The submicron resolution of a submicron focus X-ray tube and digital image detection offers in 2D and Oblique View with High Magnification imaging mode high resolution X-ray images. A 3D image of the sample can be reconstructed from multiple image recordings during a 360° rotation of the sample. Virtual any cross section can be viewed at an offline workstation. This mode is a strong tool for multi-material components.
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Product
2D Automated Optical Inspection Systems (2D-AOI)
BF1 Series
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Saki’s unique line scanning technology and coaxial overhead lighting enables high-speed accurate inspection.
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Product
Electrical Tomography Software
Res2dinv
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This very popular software, developped by M.H.Loke, uses the method involving the Sasaki minimum squares inversion (1992) to produce a 2D sub-soil model starting from the data of apparent resistivity (up to 2000 electrodes). It is completely automatic and does not require that the user formulates a starting model. When using a state-of-art computer, the inversion of a single pseudosection will require only a few minutes.RES2DINV supports spreading types like Wenner, Schlumberger, Pole-Pole, Pole-Dipole, line Dipole, equatorial Dipole and other non-conventional spreading types.
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Product
Code Verification Systems for Quality Inspection
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Matrix codes enable the comprehensive and seamless traceability of goods, which turns out as significant advantage considering everyday product recalls across all industries. Whether salmonella in food, contaminated cosmetics or poor components: defective products can harm consumers, cause losses of image as well as massive economic losses. Using the 2D code, each individual article can be localized globally. Based on the specific serial number, producers and consumers can clearly identify articles if required. That represents a perfect tool for determining whether the article is subject to be withdrawn from circulation. The proper application and specification of 2D code contents allows for serious and sustainable companies to limit recalls, save costs, and to take responsibility for consumer protection.
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Product
WAFERMAP
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WAFERMAP is an award winning software package used to collect, edit, analyze and visualize measured physical parameters on semiconductor wafers. WAFERMAP can import data files from various metrology tools such as ellipsometers, thickness gauges and four point probes. The imported data can then be visualized or printed as line scans, contour plots, 2D or 3D plots or as a histogram.
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Product
Display Processors For Automotive
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Designed for OEM Automotive applications, Renesas' highly integrated AEC-Q100 qualified automotive display processor ICs include an analog video decoder, high quality H/V scaler, 2D de-interlacer, and embedded timing controllers.
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Product
Laboratory EM current meter / water level and wave height meter
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ACM2-RS and ACM3-RS are 2-D and 3-D electro-magnetic current meters for laboratory experiments. The models provide digital output, a high-speed sampling rate and insusceptibility to electro-magnetic noise. ACH-600RS is a highly sensitive capacitance water level meters. With the new system, a maximum of four different sensors can be connected to the compact interface unit, enabling simultaneous recording on a personal computer. Additionally, the system can provide analog output as well as necessary. While conventional water level and wave height meters cannot be used near velocity sensors, our instrument can be as near as 5 cm without increasing noise, due to its special isolated circuit. The result is an innovative system that is capable of achieving highly accurate data.
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Product
High-speed Dual-channel 2D GPR
CrossOver
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First dual-channel RTS (Real-Time Sampling technology) antenna. The dual-channel configuration provides you with both low and high frequency bands in one package, making it possible to cover a broad range of applications with only one instrument. RTS-based GPR antenna designs have already proven their effectiveness against conventional designs in relation to performance improvements (increased dynamic range, sensitivity, and depth penetration).
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Product
Optical microscopy (OM)
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Materials Analysis Technology Inc.
Optical microscopy is used to display the surface morphology of samples by 2D intensity contrast due to deflection and reflection of visible light shined on areas of interest. Its resolution is about half of the incident wavelength, which is ~0.2 μm for visible light (wavelength of 400-700 nm). Such resolution limits the maximum magnification to X1000, and thus optical microscopy provides preliminary inspection of sample surface structure.
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Product
Coordinate Measuring Machines
FlatScope
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Perfect for the measurement of larger 2D profiles (e.g.),films, circuit boards, laser cut and stamped parts large and smallMachine design with the image processing sensor under the glass plate, eliminates time-consuming focusing as the workpiece is always in the correct distance to the opticsIn raster scanning mode the machine also quickly captures the selected measurement range completelyAll geometric features are then evaluated automatically in the imageQuick dimensional measurements in the scanned image and automatic gaging with ToleranceFit® comparisons
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Product
2D Multibeam Imaging Sonar in Compact Form Factor
BlueView M900 Mk2
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BlueView M-series - when you can’t compromise on imagery. Compact full featured 2D multibeam imaging sonar in a compact form factor with low power requirements. Delivers high quality sonar imagery over a wide field of view with leading data quality.
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Product
2D Image Sensor
Lince11M
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Lince 11M has been specifically designed as a high-speed CMOS image sensor that also allows customers to decrease the cost of ownership. The digital circuits of the sensor output images at 715fps in 4K resolution, or 1400fps when windowing in full HD resolution. To facilitate access to affordable optics, Lince11M is compatible with APS-C format in 4K resolution.
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Product
3D Contact Profilometer
NanoMap-LS
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NanoMap-LS with large scanning range allows to generate high resolution 3D and 2D images with a press of a button.
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Product
Semi-auto 4 Point Probe System for Solar Cell Substrate
RG-100PV
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*Measurement system for thin film on substrate samples for multi-points measurement*Even pitch and random pitch for Max.1,000 points*2-D/3-D square mapping software for even pitch
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Product
Fixed-Mount Barcode Readers
DataMan 280 Series
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DataMan 280 series fixed-mount barcode readers offer fast decoding, easy setup, and valuable Industry 4.0 features, like web browser connectivity and performance monitoring, in a small form factor. DataMan 280 was engineered to better track and trace items throughout manufacturing and logistics supply chains solving a broad range of tough 1D, 2D, and direct part mark (DPM) code applications.
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Product
Pre-reflow AOI
Zenith LiTE
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Minimizes Shadow Problems with 4way projectionEasy Programming with parametric approachReal time defect diagnosis and root cause removalrortified 2D features using 9 channel RGB lights100% 3D measurement inspection.
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Product
Analytical Services
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IGC: Inverse Gas Chromatography; Understand surface energies, polarities, acid/base properties and nanomorphology on powders and fibers. ToF-SIMS: Time-of-Flight Secondary Ion Mass Spectrometry. Localize your molecules at the first nanos! 2D imaging with resolution up to 200 nm. Highest sensitivity up to 10 ppm. CM: Quarz Crystal Microbalance In-situ observation of thickness and stiffness of any films in liquid environmentSEM: Scanning Electron Microscopy Images say more than words, especially with an artistic eye XPS/ESCA: X-ray Photoelectron Spectroscopy/Electron Spectroscopy for Chemical Analysis.
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Product
Trap-Free 2D LC/MS System For Quadrupole LCMS
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Question:When impurities are detected by UV under non-volatile mobile phase conditions, does one need to adapt the method to use volatile mobile phase additives for LCMS confirmation?
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Product
Laser Doppler Anemometry
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Laser Doppler Anemometry (LDA), also known as Laser Doppler Velocimetry (LDV), is an optical technique ideal for non-intrusive 1D, 2D and 3D point measurement of velocity and turbulence distribution in both free flows and internal flows. Science and industry apply our LDA systems to gain a clearer understanding of fluid mechanics. The measurement results are important steps in fine-tuning product designs to improve aerodynamic efficiency, quality and safety.
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Product
Geophysics
ELETOM
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ELETOM is a software that performs complete 2D inversion (and not the simple iterative deconvolution of the pseudo-sections) of surface electrical surveys with any measurement array (Wenner, dipole-dipole, pole-dipole, pole-pole, user defined arrays, mixed arrays) with a maximum of 64 electrode positions that can be added by the user as required.
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Product
EMI Tester
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The EMI tester automatically measures the noise distribution of the electric field and the magnetic field radiated from electronic equipment with high accuracy.・ Even if PCB and IC parts have complicated bumpy shape and surface. The movable assembly can automatically trace them.・ EMI noise distribution is expressed as a variety of maps, such as 4D/3D/2D graphics and cross section view.
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Product
Inline Barcode Verifiers
DataMan 475V Series
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Cognex barcode verification technology ensures the readability and compliance of 1D and 2D barcodes to industry standardization guidelines. Today most companies spot check codes one at a time using an offline, operator-based verifier which can be slow and cumbersome.
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Product
Manual Vision Measuring System
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Manual Vision Measuring MachineQS-LAF/B QS-LZB QS-EB Series. 2-D Manual Type Vision Measuring MachineQuick Image
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Product
3D Solder Paste Inspection (SPI)
TR7007 SII
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Offering inspection speeds of up to 200 cm2/sec, the TR7007 SII is the fastest solder paste inspection system in the industry. This highly accurate inline shadow-free solder paste inspection solution offers full 3D inspection at resolutions of 15 µm or 10 µm. Built on a high precision linear motor platform, the system's hallmark features include closed loop function, enhanced 2D imaging, auto-warp compensation and fringe pattern technology. Increase capacity without sacrificing additional space with an available dual-lane configuration.
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Product
Fast Electromagnetic Analysis Suite
FEMAS
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FEMAS was created to provide tools for engineers to assist in PCB and system design. Our tools are based on full wave solutions to Maxwell's equations but operate much faster than traditional CEM tools. Multi-Functional! End-to-End Link Path Analysis. S-parameter file concatenation. Time Domain analysis. Frequency Domain analysis. Transmit/Receive Equalization. Causality/Passivity Checking/enforcement. 2D Cross Section Analysis for multi-conductors. S-parameter and waveform plotting. Network parameter conversion. De-Embedding. Signal Analysis.
