Showing results: 751 - 765 of 3178 items found.
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DVTest Inc.
Super speed “USB 3.1 type C modules” for RF Test Enclosures eliminate conducted and radiated interference while keeping data and power signals for USB 3.1 link untouched.
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YB4365l -
KILTER ELECTRONIC CO.,LTD
Set up OSD, Multi Para Char Display. Cursor measurement£¬¡÷V, ¡÷T, 1/¡÷T. Auto set sweep speed. SMT technolegy. Switch Power Supply , 90-260V
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burster präzisionsmeßtechnik gmbh
"Plug & measure" design, simple connection via PC USB port, resolution up to 24 bit, high speed measurement of up to 1200 meas./second, several interfaces can be networked
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Pontis EMC
High definition (HD) cameras require controllers that can handle the high speed digital signals needed to transfer the high resolution videos in an uncompressed format (HD-SDI), which is displayed on the local monitor.
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Macom Technology Solutions Holdings Inc.
MACOM offers photodetectors and photoreceivers for 32 Gb/s PAM-4 applications in both multimode and single-mode fiber-coupled packages. The product line covers wavelengths 800 – 1650nm with speeds up to 30 GHz.
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TACH2 -
UEi Test & Measurement Instruments
The TACH2 is a dual measurement mode, contact or non-contact, Tachometer that measures rotational speed using both modes. With measurements of RPMs up to 99,999 are possible, with resolution automatically changing throughout the range.
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Cobra Express 22G8 -
Wuntronic GmbH
The Cobra CompuScope family of high-speed 8-bit digitizers provide a powerful combination of speed, memory, and bandwidth as well as a wide portfolio of advanced acquisition features on a single PCI Express or PCI card.
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Cobra Express 21G8 -
Wuntronic GmbH
The Cobra CompuScope family of high-speed 8-bit digitizers provide a powerful combination of speed, memory, and bandwidth as well as a wide portfolio of advanced acquisition features on a single PCI Express or PCI card.
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Precio octo -
Tokyo Electron Ltd.
200mm wafer prober. The system adapts ultra-high speed indexing and high-speed wafer exchange functions to reduce test cost and improve overall equipment effectiveness (OEE) markedly enhancing productivity.
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FAST Trac -
CEM Corp.
Accurate determination of fat and moisture in low-moisture samples can be challenging, but CEM’s newFAST Trac Analyzer gives you speed and accuracy in an easy-to-use, cost-effective system specifically designed for low-moisture samples.
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PH-SE -
HenergySolar
The spectroscopic ellipsometer is used for thin film and material characterization in R & D. The spectroscopic ellipsometer is designed to meet the requirements in modern research with special emphasis on speed and accuracy for an unmatched variety of applications.
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M9161D -
Keysight Technologies
The Keysight M9161D PXI Dual SP4T solid state switch module provides an ultra-long cycle life, fast switching speed and high isolation, all within a single slot enclosure.
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Grass Valley
The LDX 86N Series is the latest addition to the LDX Series for when resolution matters most, delivering native HD, 3G and 4K UHD images for the highest possible resolution and image clarity. The LDX 86N Series lets you grow into the formats you need tomorrow while buying only what you need today. With a daily, weekly or perpetual GV-eLicense upgrade path, you can move from any single speed HD/3G format to 4K UHD — from 3X HD speed to 6X HD/3X 3G speed — and even a camera that can switch between higher resolution and higher frame rate. The LDX 86N Series offers XDR — Extended Dynamic Range — operation (HDR with up to 15 F-stops or >800% of regular cameras) is available for all 50/59.94 Hz formats offering a new level of viewer experience.
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CFA -
Hanatek Instruments
By measuring the stiffness of the substrate and crease bending resistance the user can optimise cartons for faster running and packaging speeds. The instrument allows individual creases to be analysed identifying problem areas in packaging design or manufacture. Industry research indicates that the packaging speeds of pre-glued skillets is governed by the energy required to open creases. The Hanatek CFA is the first instrument to isolate and accurately measure this key parameter The instrument measures: Bending resistance, bending moment, board stiffness, crease recovery stiffness, crease folding force, crease opening force.
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Symmetry -
Oxford Instruments plc
Electron backscatter diffraction – is a powerful microanalysis technique that enables rigorous characterisation of the micro structural properties of crystalline materials. A high performance EBSD detector is critical for the effectiveness of the technique, influencing both speed and data quality. Symetry is Over 3000 indexed patterns per second (pps). Up to 30x faster than existing CCD-based detectors. Extreme sensitivity for low current and low kV analyses. Megapixel resolution for HR-EBSD applications. High resolution patterns (at least 156 x 128 pixels) at all speeds.