Exhaust Test
See Also: Exhaust
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PIM Test Systems
AWT's Portable PIM testers are powerful yet compact tools for testing and analyzing telecommunications network infrastructure. These testers are ruggedized and can withstand harsh environmental conditions. they are accurate, reliable and easy to operate and they provide a wealth of features ideal for work in the field. Built-in Distance-to-PIM option.
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Pressure testing solutions
Pressure testing involves applying stored energy to an assembly of parts, in order to verify its strength, its integrity and/or its functionality. Pressure Testing generally uses the application of a test fluid (liquid or gas) into a volume and the fluid is then pressurised to exert pressure forces onto the test object that can be measured.
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Test System
2000/DATS
WesTest Engineering Corporation
The WesTest-2000/DATS features Teradyne's high performance Digital Test Instrument and state-of-the-art intrsuments from Agilent, Elgar and North Atlantic.
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Benchtop Test System
300 Series Benchtop ATE
The Circuit Check 300 Series benchtop ATE Test Platform with built-in professional fixturing solves the uncertainty of repeatable results that are common with bench testing. With the 300 Series Benchtop ATE, test procedures can become automatic, with test steps and go/ no-go limits easily programmable in common tabular form. Hand-probing is eliminated, replaced with accurate, repeatable tooling and reliable spring-loaded test probe fixturing.
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Stand-Alone Test Fixture
MA 2012/D/H/VPC-G12x-18
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: NoInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 17,50 kg
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Continuous Testing Platform
BlazeMeter
BlazeMeter was designed and built by engineers who are passionate about open source. From mobile to mainframe, IDE or UI, bring teams together in a single platform with shared visibility, tests, and reports.
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Cloud Security Testing
RedWolf is the premium cloud-DDoS testing provider globally. We offer an easy-to-use testing system that is either self-serve or guided by RedWolf experts with years of experience helping secure the worlds largest and most complex enterprise networks.
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RF/Wireless Test Fixtures
Test‐Head Engineering develops and manufactures RF Test Fixtures which allow the testing of RF and Wireless modules and components.
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IC Test Clips
Low-profile fine-pitch chips, desnely populated boards, or vertical boards, Pomona test clips connect you with confidence.
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Meter Test Switches
Meter Test
TESCO introduced the original Meter Test Switch in the early 1920's. TESCO's current line of Test Switches have been designed with the intention to combine the best features of tried and proven switching methods with improvements in materials and construction.
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Climatic Testing
Environmental Test Chamber. Environment Associates' complete Climatic test facilities offer precise simulation of Temperature, Humidity, Altitude, Thermal Vacuum, Salt Fog, Sand and Dust, and Rain as well as many other specialized environments. Microprocessor Control along with calibrated recorded measurements and outstanding attention to detail by our technical staff make for a perfect test everytime.
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Design & Test Software
Industry-Leading Design, Emulation, and Test Software.Harness the power of digital twins, artificial intelligence, and automation to streamline workflows, break down silos, and accelerate test cycles.Find out why so many innovators trust Keysight to build their next breakthrough. With software spanning electronic design automation (EDA), instrument control, emulators, IT operations, and application delivery, your next project's only limitation is what you dare to dream.
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Test Automation Framework
Gauge
Gauge is an open source test automation tool that is completely hackable. Written in golang, Gauge lets you write tests in plain-speak and refactor fearlessly. Its pluggable architecture allows you to customize your environment so you can write tests in the language and IDE of your choice.
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Semiconductor Test Equipment
Wewon Environmental Chambers Co, Ltd.
Probe card manufacturing need the semiconductor test equipment. When we designed the thermal testing equipment, Only some commonly used test items are packaged into the IC tester, and the logic function of the verification chip is implemented in a fixed test mode. But as chip products diversify, Some thermal inducing system can no longer do it alonehttps://www.wewontech.com/semiconductor-test-equipment/
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Surge Arrester Testing
SCAR 10
This MOV- Metal Oxide Varistor test system is the perfect device to perform analysis and diagnostics on metal oxide arrestors. It is supplied with a special current clip-on transformer designed for the measurement of current leakage.
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Test Leads
8000 Series
The "SOFTIE" by Probe Master lets you say "goodbye" to hand fatigue and finger calluses. A soft probe that bends 90 degrees or more. A probe that conforms to the shape of your hand. This soft flexible probe bends gently to reduce wear and breakage of the lead. Many combinations are possible with the "screw on" accessories shown above. The 48" long, 18GA. test leads, are made of top quality silicone.
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Field Testing
When Laserline delivers a customer-specific solution, it makes sure that it fulfills every demand in the practical field. And that is because every newly designed customer solution is extensively tested in our own application laboratory and has passed comprehensive stress tests. These tests are made in close consultation with our customer as well. In this way, it is guaranteed that the demands are correctly identified and addressed with respect to practice.
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Web Application Testing
We provide manual, semi-automated and automated functional testing services to ensure that both front-end and back-end components of the application work properly and as initially designed.
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Non-Destructive Testing (NDT)
Marposs complements its geometric measurement solutions with solutions for non-destructive testing using eddy current technology.The testing options can be divided in three large groups:Material integrity test, to check for the presence of defects (cracks, porosity, blow holes, inclusions) on the surface and in the layer just below the surface.Material properties test, to check if the thermal cycles (hardening, hardening and tempering, annealing, stress relieving, etc.) have been performed correctly. Material identification checks are done to sort parts with the same geometry but made with different materials.Thread inspection to check if the treading has been carried out and its quality.In addition to the non-destructive checks performed with the eddy currents, we have developed a durometer for the conventional measurement of surface hardness, according to the Rockwell scale (HRC or HRA); which uses a diamond penetrator to measure the hardness of the sample being tested.
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Unit Testing
Hitex offers a unit testing service for C/C++ application source code using the well-known test tool TESSY. For this service, the customer provides their source code of the C/C++ functions to be tested, ideally along with the specifications of the functionality and comprehensive comments in the source code.
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Protocol Test System
USB Explorer 260
The Ellisys USB Explorer 260 is a sophisticated protocol test system for USB traffic monitoring, driver and software stack debugging, protocol compliance verification and performance analysis. Analyze USB 1.1 and USB 2.0 links at any speed, including OTG and the new InterChip-USB at all speeds and all voltages; emulate USB hosts and devices; inject pre-defined error patterns for stress and error recovery testing.
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Power Networks Test
TX6000
The TX6000 is a hand held Time Domain Reflectometer with 11 range scales covering the range 0-6000 meters, with a 7 mater first range scale and a 0.5 meter dead zone near and far end faults are clearly displayed on its 128×64 pixel back light Liquid Crystal Display.
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Photoelectrochemical Test System
ModuLab XM
The system, based upon Solartron Analytical's world-leading experience in transfer function measurements, offers a high-quality measurement platform for characterizing a range of photoelectrochemical devices such as DSSC's, Perovskite cells, and Photoanodes," noted Professor Laurie Peter, world leading expert, University of Bath, UK. Professor Peter acted as scientific advisor during the development of the ModuLab PhotoEchem system and helped ensure the system met the requirements of the most demanding photovoltaic researchers in the market today.
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VCORE Power Test
To support the heavy computing loads required by AI technologies, system servers must rely on high performance CPUs and GPUs capable of complex, real-time processing. These processors are powered by VCORE power supplies, embedded DC/DC converters, or voltage regulator modules (VRMs).
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CT/PT Test Set
PCT200Ai
PCT200Ai is the CT/PT test set (current transformer analyzer) that can finish various current transformer test of different CT and plus reference testing functions of PT. Compared with PCT200i, its accuracy is higher.
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AC Test Transformer
Shanghai Guantu Technology Co., Ltd.
How the AC test transformer prevents the overvoltage generated by the frequency conversion series resonance test device is a relatively simple problem, but the overvoltage caused by voltage fluctuation is difficult to appear when the overvoltage protection is set. Generally, the overvoltage of the frequency conversion series resonance test device will appear in the frequency sweep stage of the instrument, that is, in the process of finding the resonance point. Those who have used it know that in the process of finding the resonance point of the frequency conversion series resonance test device, the voltage and frequency have a parabola-like linear relationship. By default, the system finds the high voltage, that is, the apex of the parabola as the resonance point.
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Microwave Testing
325B
The Model 325B Picoprobe sets new® standards in microwave probing performance. Benefiting from coaxial techniques, which have inherent low loss and low dispersion characteristics, the Model 325B Picoprobe achieves an insertion loss of less than 3.0 db and a return loss of greater than 15 db over its frequency range (see accompanying data).
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Test Contactor/Probe HEad
cRacer
The cRacer™ test contactor and probe head portfolio offer solutions for 5G mmWave FR2 up to 54+ GHz.cRacer utilizes robust spring probe technology for testing singulated packages or probe heads for wafer probe (bumped/pad) applications with fine pitch and WLCSP compatibility – ranging from 100 µm to 650 µm, covering the majority of 5G devices.cRacer features a stainless-steel spring for tri-temp testing and performance in operating temperatures -55°C to +155°C.
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Flying Prober Test
QTOUCH1202C
Qmax Test Technologies Pvt. Ltd.
he Prober Test System is capable of movement in XYZ directions with fixed angle (θ) and dual probe heads (further expandable up to 4 ) . The system has in-built Vision Camera for easy monitoring of probe needle contact.The prober supports automatic fiduciary recognition. The system has built –in linear encoders to achieve higher precision. It also comes with in-built image processing unit with minimum 5 Mega pixel Camera ,tele-centric lens with image processing software, illuminated with LED bar light with controls.The V-I signature test shall be in-built in the Prober system with “ Best fit Curve “ algorithm .Provision for adding various external Test & Measurement instruments like GPIB / USB / PXI Instruments is available.
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Test System
LPDDR4 and LPDDR3
Testing LPDDR4, LPDDR3 devices is made fast and simple with the "Lower Power" LPDDR4/3 TCE-3200LP IC test system. It can be configured up to 32 sites in parallel and integrated with the customer's selected handler.The TCIII-3200LP system can be used as a production tool as well as an engineering tool. To assist manufacturers and integrators, TurboCATS has developed a heat chamber that can be integrated with the TCE-3200LP, LPDDR4 and LPDDR3 test system. This allows the devices to be tested while being exposed to heat conditions.
