Mil
Abreviation standing for military standard or grade.
See Also: MIL-SPEC, MIL-STD, Conformal Coating, Standards
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BIP-3 Battery Probes
Current Rating (Amps): 5Average Probe Resistance (mOhm): 35Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 60Recommended Travel (mm): 1.52Mechanical Life (no of cyles): 250,000Overall Length (mil): 511Overall Length (mm): 12.98
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Alternate 2.82 (80.00) - 5.00 (141.00) General Purpose Probe
HPA-74T65-1
Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Test Center Remark: max. test center 187 mil / 4,74 mmFull Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 75Recommended Travel (mm): 1.91Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 598Overall Length (mm): 15.19Overall Length Remark: Tip “A-B”: 598 (mil), 15.19 (mil), Tip “C”: 586 (mil), 14.88 (mil), Tip “E, T135, T156, T65, T80”: 610 (mil), 15.49 (mil), Tip “T75”: 620 (mil), 15.75 (mil)
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Elevated 1.68 (48.00) - 7.00 (198.00) High Performance Bias Ball Probe
POGO-1Z1-7
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Light 0.60 (17.00) - 2.00 (57.00) High Performance Lead Free Probe
LFRE-72I15-2
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,700Overall Length (mm): 43.18
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Wire Crimp Pull Tester (Motorized)
WT3-201M
The WT3-201M motorized wire crimp pull tester is designed to measure pull-off forces of up to 200 lbF [1 kN] for wire and tube terminations. The tester conforms to numerous UL, ISO, ASTM, SAE, MIL, and other requirements for destructive testing. Non-destructive testing is also possible, such as pulling to a load or maintaining a load for a specified period of time, as per the requirements of UL 486A/B. Programmable pass/fail limits with red and green indicators and audio alerts help identify non-conforming samples.
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Ultra High 4.09 (116.00) - 10.00 (283.00) General Purpose Probe
EPA-2C40-2
Current Rating (Amps): 5Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 160Full Travel (mm): 4.06Recommended Travel (mil): 107Recommended Travel (mm): 2.72Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 970Overall Length (mm): 24.64
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Standard 0.39 (11.00) - 1.39 (39.00) Non Replaceable General Purpose Probe
MEP-20U
Current Rating (Amps): 2Average Probe Resistance (mOhm): 50Test Center (mil): 25Test Center (mm): 0.635Full Travel (mil): 75Full Travel (mm): 1.91Recommended Travel (mil): 50Recommended Travel (mm): 1.27Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 750Overall Length (mm): 19.05Rec. Mounting Hole Size (mil): 20.5Rec. Mounting Hole Size (mm): 0.52Rec. Mounting Hole Remark: 20.5 to 21.5 mil / 0.52 to 0.55 mmRecommended Drill Size: #75 or 0.52 mm
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FPGA UDP Packet Interface Connnecting 3-4 Channels of MIL-STD-1553 to Ethernet in Real-Time
ENETX-1553
ENETX-1553™ is an innovative product that provides “remoting” of 1553 operations on 10/100/1000 Ethernet IP/UDP local area networks (LAN). ENETX-1553 is a small, low-power, rugged device that provides real-time Ethernet connectivity to for three or four dual redundant 1553 (A/B) buses (channels). Ideal for remoting 1553 connections for in-field applications or point-point lab usage. AltaAPI provides and highly portable BSD SDK and National Instruments LabVIEW and LabWindows. ENET products are unique in the market as they have a hardware, FPGA real-time UDP engine – no OS or IP stacks – provides maximum throughput and ultimate virus protection.
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Standard 0.39 (11.00) - 1.39 (39.00) Non Replaceable General Purpose Probe
MEP-20G
Current Rating (Amps): 2Average Probe Resistance (mOhm): 50Test Center (mil): 25Test Center (mm): 0.635Full Travel (mil): 75Full Travel (mm): 1.91Recommended Travel (mil): 50Recommended Travel (mm): 1.27Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 750Overall Length (mm): 19.05Rec. Mounting Hole Size (mil): 20.5Rec. Mounting Hole Size (mm): 0.52Rec. Mounting Hole Remark: 20.5 to 21.5 mil / 0.52 to 0.55 mmRecommended Drill Size: #75 or 0.52 mm
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High 1.50 (43.00) - 9.60 (272.00) Long Travel Bead Probe
BPLT-1HF-9.6
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 350Full Travel (mm): 8.89Recommended Travel (mil): 317Recommended Travel (mm): 8.05Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,450Overall Length (mm): 36.83Full Travel Remark: Standard Spring: 400 mil / 10,16 mm, High Spring: 350 mil / 8,89 mm
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Standard 1.71 (48.00) - 3.00 (85.00) General Purpose Probe
HPA-74T65
Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Test Center Remark: max. test center 187 mil / 4,74 mmFull Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 75Recommended Travel (mm): 1.91Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 598Overall Length (mm): 15.19Overall Length Remark: Tip “A-B”: 598 (mil), 15.19 (mil), Tip “C”: 586 (mil), 14.88 (mil), Tip “E, T135, T156, T65, T80”: 610 (mil), 15.49 (mil), Tip “T75”: 620 (mil), 15.75 (mil)
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Single, Dual Or Quad Stream MIL-STD-1553A/BTest And Simulation Modules For XMC
AXC1553-x
MIL-STD-1553 Test and Simulation modules for XMC with 1, 2 or 4 dual redundant streams plus 8 Discrete I/O’s (on Rear-I/O).*Concurrent BC, MRT (31) & Chronological/Mailbox Bus Monitor*Full Error Injection/Detection (AS4112)*Complex Triggering, Data Capture/Filtering and 100% Bus Recording*Physical Bus Replay*IRIG-B Time Encoder/Decoder*Full Function, Single Function and Simulator Only versions available*Drivers for Linux and Windows*Drivers for other embedded applications are available on request*Optional Databus Test and Analysis Software and RT Production Test Plan
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Standard 2.20 (62.00) - 4.80 (136.00) General Purpose Probe
EPA-4J
Current Rating (Amps): 7Average Probe Resistance (mOhm): 35Test Center (mil): 187Test Center (mm): 4.75Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,320Overall Length (mm): 33.53
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Elevated 1.68 (48.00) - 7.00 (198.00) High Performance Bias Ball Probe
POGO-1P-7
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Type 12R2, 8U, 19" Rackmount, MIL-Rugged, Vertical
12R2-8U-V
The 8U, 12R2 is designed to meet the harsh environment of shipboard, airborne, and ground mobile applications per MIL-STDs. Shock isolated versions are designed to attenuate 25G shock inputs to the chassis to less than 10Gs at the card cage.
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Alternate 0.50 (14.00) - 2.50 (71.00) General Purpose Probe
P2662BG-1R2S
Current Rating (Amps): 3Average DC Resistance lower than (mOhm): 30Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 68Full Travel (mm): 1.73Recommended Travel (mil): 50Recommended Travel (mm): 1.27Overall Length (mil): 575Overall Length (mm): 14.60
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Standard 1.50 (43.00) - 4.00 (113.00) High Performance Lead Free Probe
LFRE-25T79-4
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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DER-100 Double-Ended Receptacle
DER-100
Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 160Full Travel (mm): 4.06Recommended Travel (mil): 130Recommended Travel (mm): 3.30Overall Length (mil): 1,710Overall Length (mm): 43.43Rec. Mounting Hole Size (mil): 67Rec. Mounting Hole Size (mm): 1.71Rec. Mounting Hole Remark: 67 to 69 mil / 1.70 to 1.75 mmRecommended Drill Size: #51 or 1.75 mm
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P2665 General Purpose Probes
Current Rating (Amps): 15Average DC Resistance lower than (mOhm): 10Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 230Full Travel (mm): 5.84Recommended Travel (mil): 167Recommended Travel (mm): 4.24Overall Length (mil): 1,290Overall Length (mm): 32.77Overall Length Remark: Tip 2W: 1270 mil (32.26 mm)
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Light 0.75 (21.00) - 2.00 (57.00) High Performance Lead Free Probe
LFRE-25Z1-2
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Standard 1.00 (28.00) - 3.20 (91.00) General Purpose Probe
P2550-8
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 30Test Center (mil): 187Test Center (mm): 4.75Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Overall Length (mil): 1,453Overall Length (mm): 36.91Rec. Mounting Hole Size (mil): 126Rec. Mounting Hole Size (mm): 3.20Recommended Drill Size: #30 or 3.20 mm
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High 1.73 (49.00) - 8.00 (227.00) Bead Probe
BTP-1C-8
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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1, 2, 4 Or 8 Stream MIL-STD-1553Test And Simulation Module For VME (6U)
AVC1553-x
MIL-STD-1553 Test and Simulation module for VME (6U) with 1, 2, 4 or 8 dual redundant channels.Integrated modular solution by using the AMCX1553-x PMC cards installed on AIM’s AVC-2 Generic VME64x (6U) Carrier card.
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Ultra High 2.84 (81.00) - 10.00 (283.00) High Performance Bias Ball Probe
POGO-1L24-10
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Elevated 1.68 (48.00) - 7.00 (198.00) High Performance Lead Free Probe
LFRE-1J-7
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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Ultra High 2.84 (81.00) - 10.00 (283.00) High Performance Bias Ball Probe
POGO-1V-10-S
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Standard 1.50 (43.00) - 4.00 (113.00) High Performance Lead Free Probe
LFRE-25L36-4
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Extreme Rugged Cold Plate Mount System with Intel® Xeon® Processor and MIL-DTL-38999 Connectors
HPERC-KBL-MC
Inside the tiny footprint of ADLINK’s HPERC lives the power of Intel® Xeon® processor and optional GPGPU parallel processing engine based on a NVIDIA Quadro MXM module. Dual removable secure erase RAID-0 SSDs provide 12Gb/s throughput and security for deployment in hostile environments.
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Vibration Test Systems
G-5 Series
Both Shock tests at from relatively high acceleration(max. 4900m/s2 -500G) to low acceleration with wide pulse width, difficult to achieve with conventional Shock Test Systems and Vibration tests for not only IEC, MIL and JIS but also requiring higher acceleration, velocity and displacement than ordinary VTSs can be carried out with one system.
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ESD & Latch-Up Test Service
MASER Engineering has automatic test equipment for the most common ESD test pulse models. MIL - JEDEC - ESDA - IEC standards. IC level Human Body Model. IC level Machine Model. IC level Charged Device Model. System level IEC 61000 HBM. AEC-Q100 Field Induced Gate Leakage test. Static Latch-Up test. Dynamic Latch-Up test.
