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Stand-Alone Test Fixture
MA 2013/D/H/Pylon
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: NoInterface signals max.: 1700Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 24,00 kg
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Internally Ruggedized Phase Stable Test & Measurement Test Lead Assemblies
Storm-Test®
- Engineered to provide precise measurements with stable electrical performance- Excellent loss, VSWR, & phase/amplitude stability with flexure. - Internally ruggedized cable construction delivers longer life, repetitive mating and prevents crushing, bending & twisting- Accurate & repeatable measurements - Performance tested prior to shipment
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Memory Test System
T5851/T5851ES
The T5851 system is designed to provide a cost-effective test solution for evaluating high-speed protocol NAND flash memories including UFS3.0 universal flash storage and PCIe Gen 4 NVMe solid-state drives (SSD), both of which are expected to be in high demand for the LTE 5G communications market.
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Longbow Launcher / LEA Test Set
TS-201B
The TS-201 is a state-of-the-art I-Level and Depot level test set for MIL-STD-1760 and legacy armament systems including launchers and bomb racks.
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Audio Test Tone Generator
Tone Plug
The TONE PLUG offers five user selectable sine wave test tones at frequencies of 100, 250, 400, 1K and 10KHz. An additional 5 special function test signals are also provided.
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AC Dielectric Test Systems
700-DI
The HIPOTRONICS standard line of AC Dielectric Test Systems are designed to perform high voltage AC tests on electrical apparatus in accordance with IEC60, IEEE 4 and IEC 270 and other national test standards. A variety of mechanical configurations are available to suit different installation conditions. Some models can be supplied in mobile versions when it is difficult to move the test object to the test area. AC Dielectric Test Sets are available in a wide range of voltage and power ratings with exceptional reliability, durability and functionality. No matter what your requirement is, HIPOTRONICS has an affordably priced, highly reliable test solution to meet your needs.
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RF Test Probes
With over 50 Tip-Styles, you can be certain we can help you find the right solution for your testing demands. And if we don’t offer a probe solution already in production, we will work together with you to develop a custom solution.
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Test Fixturing
There are no good measurements without good test fixtures. Ideally the test fixture needs to make the electrical connection between the test instrument and the device-under-test (DUT) and be electrically transparent. ATE has developed fixtures for SMT components, leadless packages, and miniature coaxial interfaces, in such a way that the fixture effects can be removed, and the measurement reference plane can be brought right down to the DUT.
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Portable Converged Networks Test Set
TX Series
The VeEX TX product series offers a complete test solution for Next Generation of Transport, Metro and Carrier Ethernet Testing. Color graphical display assisted with touch panel enables users tapping through the test configuration and accessing complex overhead bits and bytes. Features include APS, TDM, pointer adjustment, pulse mask analysis, G.821/G.826/M.2100, histogram, and overhead access.
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NI Vehicle Radar Test System
VRTS provides automated radar measurement and obstacle simulation capabilities for 76 to 81 GHz automotive radar systems. With VRTS, you can perform precision RF measurements and simulate a wide range of test scenarios for radar hardware and software subsystems, including sensors, advanced driver assistance systems (ADAS), and embedded software. Use VRTS for all phases, from design to manufacturing, of ADAS and radar system test.
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Functional Test
Functional test systems offer users the ability to test boards in a real world environment, checking that they function as designed by stimulating inputs and monitoring outputs. Often whole suites of boards have similar functions and this is where a generic functional tester offers large benefits over more bespoke solutions.
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Electrodynamic Vibration Test Systems
i-series
Vibration tests have become diversified and specifications have become increasingly strict.i-series offer a user-friendly lineup with enhanced performance and durability.
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Test Port Adapter Set, 2.4 Mm To 3.5 Mm
85130F
The Keysight 85130F test port adapter protects the test set port from connecting directly with the device under test. It has a special rugged female connector designed for connecting to the network analyzer test port. This special connector does not mate with a standard male connector but converts the rugged test set port to a connection that will mate with the device under test. The set contains a 2.4 mm to PSC-3.5 mm male adapter and a 2.4 mm to PSC-3.5 mm female adapter. The frequency range for these adapters is dc to 26.5 GHz with a return loss of 26 dB or better.
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Test Leader / Other
PL-50Pro
*IMPEDANCE：50Ω*Z-TOL：±１％*FREQUENCE B.W.：DC TO 1 GHz*WORKING POWER：１ WATT*Best VSWR Model. ＜1.1 DC~1GHz
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Test Solutions For Integrators
Beyond being your test equipment expert, Testek can also provide engineering design advice and guidance on building complete test solution facilities. We will work closely with your building contractor to advise on the most optimal layout configuration and to specify all facility resource requirements. For systems that may share resources, we can facilitate resource demand and management, including power management and fluid management. With a central control system, we can provide software logic to monitor these resources and route them appropriately based on demand and priority.
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Test System
USB Explorer 280
The Ellisys USB Explorer 280 is a sophisticated protocol test and analysis system for USB SuperSpeed traffic monitoring, driver and software stack debugging, and performance analysis.
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Wireless In-Circuit Test Fixtures
Higher density more complex circuit boards complicate testing requirements while smaller more tightly spaced test pads create a wiring challenge for the fixture fabricators, test engineers and maintenance personnel. Wireless fixtures solve the challenges associated with the nest of wires found in standard long wire fixtures. Wireless fixtures replace the “nest” of wires with copper traces on a multilayered printed circuit board called a Translator Board or T-Board®. Circuit Check’s wireless f...show more -
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4, 8, 16 Or 32 Channel ARINC429 Test And Simulation Modules For PMC
AMCX429-x
ARINC429 Test and Simulation module for PMC with 4, 8, 16 and 32 programmable Tx/Rx channels plus up to 8 Discrete Inputs/8 Discrete Outputs.
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AC/DC Hipot Test Set (Dry Type)
GTB / 555
Wuhan Huatian Electric Power Automation Co., Ltd.
Power supply equipment、All kinds of electrical products and insulation tools materials electrical strength test equipment necessary.
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Modular In-Circuit & Functional Test System
Our testing systems are based on established industry standards and can be individually configured to meet your requirements. In addition, our systems can be easily and efficiently adapted to changing and new challenges.
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Functional Test Systems
With extensive experience in functional test equipment, a world-wide service and support organization, and a broad range of software/hardware options, we will supply cost-effective production-ready test solutions to meet your test challenges. Proposals developed by our functional test engineering team include a detailed description of system requirements, test instrumentation, estimated test cycle times (as applicable), footprint, and other key specifications.
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Test Management App
Test Management goes mobile with the new Kualitee App. Now, simply use your Kualitee mobile app to manage your testing activities by viewing multiple projects, creating defects, approve or reject test cases and view your Kualitee Dashboard to get the latest status reports on the defects being reported.
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Secondary Current Injection Test Sets
Our range of units covers applications up to 200A and includes single phase and three phase units with applications for testing and timing of IDMT relays, thermal overloads, MCB’s and auto-reclosers.
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Test Finger Probe
Shenzhen Bonad Instrument Co., Ltd.
BONAD’s test fingers, test probes and test needles comply with IEC 60065, IEC 60238, IEC 60335, IEC 60529 and IEC 61032 standards and are essential instruments for the protection against electric shock of household and similar electrical appliances. For more information, please contact us and BONAD will provide you with professional technical advice and high-quality testing equipment.
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Optical Materials & LiDAR Test Equipment
Is a remote sensing method which is used to estimate the range between two objects.
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Test & Measurement
High-quality connection solutions for precise measuring, testing and examination. Whether low or medium voltage range, whether precise test runs or preventive measuring and testing: With an extensive portfolio of specific components and cables, Stäubli always ensures perfect and reliable contact between the measuring instrument and the points, objects and systems to be tested. In addition, we are a proven partner of leading manufacturers of measuring instruments in this field, for example for equipping them with high-quality sockets. Every product meets all quality and safety standards.
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ARINC825 (CAN Bus) Test & Simulation Module for PCI With 2 Or 4 CAN Bus Nodes
ACP825-x
ARINC825 (CAN bus) Test & Simulation module for PCI with 2 or 4 electrically isolated CAN bus nodes operating concurrently at CAN bus high speed bit rate of up to 1Mbit/s. The ACP825-x PCI card can work either with full functionality as an active CAN node for testing and simulating or in Listening Only mode for monitoring and recording purposes.
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Component Test Stands
As your specialist for measurement and testing technology, imc designs and manufactures test stands perfectly matching requirements for a complete range of components: whether for servomotors, pumps, brakes or valves – according to your wishes, imc component test stands can quickly and precisely test for perfect operation, verify lifetime, determine energy efficiency, and much more. Thanks to the modern software imc STUDIO, test objects can be tested for complex and wide-ranging scenarios.Test s...show more -
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High Parallel Test Handlers
High parallelism test in strip or singulated device batch handling on carriers, WLCSP post singulation test.
