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Test Probe Connector, High Voltage, Voltage, 3 %
72-6530
The 72-6530 is a high voltage Testy Probe with built-in meter measures voltages up to 40kVDC.
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Shock Test System
Labtone Test Equipment Co., LTD
Products are inevitably affected by impact, bump, free fall, tumbling etc. during production, transportation, loading and unloading as well as during the use of the products. All of these are transient excitation on the object, causing the object to produce mechanical characteristics of high speed, acceleration, strain rate instantly. These kind of characteristics are completely different from that in static load, and may cause problems to the object in terms of structural strength and stability...show more -
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Modular Hydrostatic Test System
Our modular hydrostatic test chambers are designed with open ends to accommodate the connection to similar units for the purpose of lengthening the enclosed test area. The modular test system starts with a base unit with complete pump system, gauges and controls mounted on the 60” x 24” x 18” test chamber. If longer test lengths are required, simply add another test chamber to double, triple or quadruple the test length area. Specify your particular requirements at our Customization Page.
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Meter Test Bench
Meter Test Banch is available with high-technology to ensure high testing accuracy as well as maximum functionality. It is designed to provide precise results in any simple to complex testing. It comes with modern systems to ensure to provide artificial load that cannot be changed in the power supply. It is provided with high durability and efficacy to ensure long lasting life with no maintenance. In addition to this, it ensures high accuracy in testing without any wear.
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Environmental Test Chambers
An enclosure used to test the effects of specified environmental conditions on biological items, industrial products, materials, and electronic devices and components.
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SSD Test Systems
MPT3000ES / MPT3000ES2
Using the same high-performance electronics and powerful software as all products in the MPT3000 family, the MPT3000ES and MPT3000ES2 engineering stations feature a small footprint configured to test up to eight SSDs in parallel. The system's small size and ability to plug into a standard AC outlet enable users to conduct program development and interactive device debugging in either office or lab settings.
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C-Mic Auto Test System
BK9010B
Based on the BK3010V2 C-Mic Tester, the BK9010B is our fastest C-mic test system. Fully automatic, the BK9010B loads the mics in place and after testing, it sorts passing microphones into 8 quality classes, and failing microphones according to the reason they failed. Each mic is put into its appropriate bin. As testing progresses, you can view the data graphically in real time or save it to be viewed or analyzed later.
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Test Switches
Series FT
An industry standard for CT & VT isolationfor instrument transformer and connected device testing.Up to 10 poles; Numerous configurations availableTypically mounted on switchgear and relay panels10 pole test plug available; UL and cUL recognized.
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RF Test Benches
FIME laboratory equipment qualified for RF testingValidate the analogue behaviour of RF devices with a single set of laboratory tools and services before seeking contactless Level 1 type approval or launching mass production. FIME RF test benches are built for RF testing of: EMV contactless cards and readers; ICAO e-passports and readers; ISO devices (PICC and PCD), HF and UHF RFID tags and readers.
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NI Vehicle Radar Test System
VRTS provides automated radar measurement and obstacle simulation capabilities for 76 to 81 GHz automotive radar systems. With VRTS, you can perform precision RF measurements and simulate a wide range of test scenarios for radar hardware and software subsystems, including sensors, advanced driver assistance systems (ADAS), and embedded software. Use VRTS for all phases, from design to manufacturing, of ADAS and radar system test.
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PC Based Comprehensive Test Setup for Luminaires
Our zest for innovation has resulted in continuous upgrades in the existing line of products. Till now we used to manufacture 3 different equipments for Driver, MCPCB and Luminaires Component testing. We at SCR Elektroniks have developed our comprehensive tester to incorporate all the 3 systems in a single bench. Here in this tester one can test all the three DUT in a single bench. Since all the 3 testing procedures have many tests in common, we have incorporated all the tests in a single bench such that testing of Luminaire driver, Luminaire PCB and Final Luminaire set is performed in single test bench. Only these tests are performed over the DUT else other are disabled for them.
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Mixed Signal Test Systems
MTS2010i
The MTS-2010i are a cost effective production ATE designed for testing high-volume linear and mixed signal semiconductor devices (Op Amps, high-voltage drivers, DAC, ADC, etc.), both at the wafer sort and final test stages of the manufacturing process.
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DG Test Panel for C-14/A/D Gyros
TA-14
C-14 Gyro Series DG panel. This special test panel does include a FV simulator for a more complete solution to stand alone gyro testing.
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Creepage Distances Test Card
CX-P27
Shenzhen Chuangxin Instruments Co., Ltd.
Creepage Distances Test Card Brief DescriptionCreepage Distances Test Card, Refer to GB4706.1-2005 the 29th Item Atc
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Component Test Systems
These products include test peripherals used with test systems, such as interfaces that connect semiconductor devices with test systems, and handlers that transport semiconductors to the test system. System-level test equipment and software are also included in this category.
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Phase Noise Measurement Application
N9068A
One-button measurements for analyzing phase noise in frequency domain (log plot) and time domain (spot frequency)Compatible with phase noise measurement personality in Keysight PSA and ESA spectrum analyzers Runs inside the PXA, MXA, EXA signal analyzers and MXE EMI receiver
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Off-Set Kelvin Test Sockets
This is an innovative and robust contact technology for making Kelvin contact to 0.5mm pitch QFNs. The contact uses a tip that is angled to one side, matched to an orientation that's flat on the tip. Two such contacts placed in opposition will touch the pad within 0.125mm. And because the tip is offset, the probe diameter is a robust 0.39mm and the load board pad pitch remains 0.5mm.
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Test bench for Infrared Focal Plane Array detectors
BIRD
The BIRD bench enables characterization of any types of Infrared Focal Plane Array (IRFPA) detectors.
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HV Test Transformer
GTU-800KVA/220KV
Wuhan Sangao Electrical Test Installations Limit Co.
SF6 gas -filled testing transformers are especially designed for GIS in the factory and on-site test,and for testing all GIS switchgears and GIS components such as insulators,insulating tension pole,GIS voltage transformer and so on,the PD test can be performed under the general environment because of the merits of encapsulation ,the PD level of our equipment can be lee than 3pC,and it can be added a HV bushing to perform the withstand voltage test at the same time.
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Simulator for Test Driving of Drones & Robots
Aerial Informatics & Robotics Platform
The Aerial Informatics and Robotics platform solves for these two problems: the large data needs for training, and the ability to debug in a simulator. It will provide realistic simulation tools for designers and developers to seamlessly generate the copious amounts of training data they need. In addition, the platform leverages recent advances in physics and perception computation to create accurate, real-world simulations. Together, this realism, based on efficiently generated ground truth dat...show more -
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Polarity & Burn in Test Systems
Our polarity and burn-in test systems are available for components such as multilayer, disc type or hollow ceramics.
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Extendible Test Leads
The Extendable Tip Probe permits testing in those hard to reach areas. The tips are fully insulated with durable Kynar. This prevents accidental shorting of adjacent components. The tip is stainless steel and is very sharp, allowing for penetration of conformal coatings. The rubber lead is 18 gauge, 48" long.
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HV AC Test Set
SERIES S400 TYPE RX I O/ I OACP
K&S Engineering and Scientific Ltd
The output is continuously variable from zero to 10 kV by means of the panel mounted regulator. An output trip is fitted which operates when the output exceeds 25 mA switches off the test set and operates a neon overload indicator. Primary protection is provided by two panel mounted fuses. The output is protected by the output trip and a magnetic/hydraulic circuit breaker.
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Battery Pack Test System
*Easy to see now test progress*Can cycle test*Provide Charge, Discharge, Suspend, FOR, LOOP Mode Select*When Charging, set the stop current to stop charging when fully charged so as to avoid overcharging that will damage the battery. When Discharge, set the stop voltage to stop discharge when discharging to lowest so as to avoid over-discharging that will damage the battery.
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Automotive Radar Test ∙ Evaluation
XRE
KEYCOM develops and manufactures various radar systems to measure and evaluate such functionalities of mass-produced millimeter and microwave radars including in-vehicle radars as transmission power, frequency, antenna beam alignment, distance accuracy, bearing accuracy and receiving accuracy. KEYCOM’s product line includes the Radar Test System (RTS) that measures radar distance accuracy and transmission power, and the Rader Alignment System (RAS) that assists you to adjust the mounting position of the in-vehicle radar.
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Test Automation Services
One of the effective approaches we are constantly using is keyword-driven testing (KDT). This approach covers hundreds of test cases in long-term projects with complex business logic.
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EMI and EMC Test System
EMI receiver system. It is a main test system for EMI (Electro Magnetic Interference) testing. The EMI-9KB is produced by the full closure structure and strong electro-conductibility material, which has high shielding effect. Due to the new technology for the EMI Test System, it solved the instrument self-EMI problem.
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High Voltage Test Set
Hi-Pot Series
SCOPE introduces a high voltage test set, these high voltage testing sets comes with Power frequency AC high voltage /DC high Voltage test /AC-DC high Voltage test set for testing transformers, motors, insulators, cables etc. Further, these testing sets are capable of giving continuously variable HIGH VOLTAGE from zero to maximum rated output voltage. Wide range of up to 100 kV is available in user selectable combinations.
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Flash Device Test System
MS7208
The MS7208 system can test a wide range of device families including – but not limited to – NAND flash, NOR flash, multi-level flash, multi-die flash, EEPROM, RAM, and mixed-technology memory devices.
