Automated Fiber Optical inspection Systems
See Also: Inspection Systems, X-ray Inspection Systems
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Product
LabVIEW Development Systems
System
Base--The instant productivity of graphical development for DAQ and instrument controlFull--A rich set of routines for mathematics, signal processing, and signal generationProfessional--The solution for professional developers who need code deployment or validationLabVIEW suites--LabVIEW Professional plus industry-specific add-on software
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Product
Memory Test System
T5851/T5851ES
Test System
The T5851 system is designed to provide a cost-effective test solution for evaluating high-speed protocol NAND flash memories including UFS3.0 universal flash storage and PCIe Gen 4 NVMe solid-state drives (SSD), both of which are expected to be in high demand for the LTE 5G communications market.
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Product
Validation System
FLEX BMS
System
The FLEX BMS™ Validation System is a quick-connecting, highly flexible test system for rapid evaluation of centralized, single-board and distributed battery management systems. Utilizing Bloomy’s industry-leading battery cell simulators, COTS instrumentation, industry-standard connectors, and models that run in real-time, the FLEX BMS™ Validation System can easily be reconfigured to test a wide variety of BMSs. The FLEX BMS™ Validation System is used by national and regional safety and standards labs for certifying the BMS for a wide array of e-mobility products and applications.
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Product
4U 8-Slot CompactPCI® System with Redundant Power Supplies
cPCIS-6418U
System
The cPCIS-6418U Series Subsystem is designed for maximum density and has 8 horizontal slots for 6U cPCI boards with 80mm RTMs. The chassis is 4U in height and standard 19" rack mount width.
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Product
NVIDIA® Jetson Xavier™ NX Edge AI Vision Inference System
EOS-JNX Series
System
The EOS-JNX series has a built-in Smart PoE feature to control PoE power remotely to reduce maintenance efforts in challenging environments and provides PoE power loss detection to alert of any unexpected PoE disconnection. The EOS-JNX-I is designed as an AI PoE switch for connecting to IP cameras to enable AI inferencing, and also provides an uplink port to connect to a network video recorder (NVR) for recording video streams, making upgrading existing surveillance systems easy. The EOS-JNX-G is designed for industrial AI machine vision applications, providing a dedicated bandwidth of 1Gb per channel with a GigE camera connection, which is crucial for production line and manufacturing applications.
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Product
65 GHz Dual Channel Optical Module
N1030B
Optical Module
The N1030B is a plug-in module for the DCA-X mainframe that includes two 65 GHz optical channels.
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Product
VLSI Test System
3380P
Test System
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (512 I/O pins to test 512 ICs in parallel) that can meet the upcoming higher IC testing demands.
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Product
Optical Switches
Optical Source
Fast and reliable optical switches to streamline your test procedures. Can be customized with a wide range of switch configurations, fiber types and connectors.
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Product
Communications System Analyzer
Freedom R8200
System
The Freedom R8200 from Astronics Test Systems represents a major step in the evolution of the Land Mobile Radio Test. The Freedom R8200 is the first and only test instrument that combines comprehensive digital and analog LMR testing with the ability to measure important RF network characteristics, such as Distance to Fault (DTF), Return Loss, and Voltage Standing Wave Ratio (VSWR). The Freedom R8200 is also the only service monitor with the abilityto display advanced RF Parameters in a Smith Chart for more complicated network analysis
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Product
Medalist i1000D
U9401B
In-Circuit Test System
The Keysight Medalist i1000D is now even better. Improving from its previous state of an analog-only ICT, the new digital release of the system now features per pin programmable digital cards and a whole new set of intuitive software graphical user interfaces (GUIs) that makes programming and development effortless.
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Product
Development System
PCIe490
System
The PCIe490 Expansion Chassis enables users to scale application workstations with up to eight additional PCIe boards per chassis and up to 63 total slots with chassis daisy chaining. It was designed to accommodate the Abaco Systems PC820 and PC821 with Xilinx Ultrascale technology and multiple FMC+ interfaces.
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Product
SoC/Analog Test System
3650-S2
Test System
The Chroma 3650-S2 is specifically designed for high-throughput and high-parallel testing to provide the most cost-effective solution for fabless, IDM and testing houses.
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Product
Other Test Systems
Test System
Your business challenges do not fit the typical mold. Your test requirements are different. Ball Systems has more than 50 years of experience in multiple industries that has exposed our team to a wide variety of testing applications. As a result, we’ve likely created a solution for a challenge similar to yours.
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Product
Mini In-Circuit Test System
U9403A
In-Circuit Test System
The Keysight Mini ICT is a true in-circuit test unit in the rack that can be used standalone or integrated. It comes with a full set of Keysight ICT test features, from VTEP vectorless test, Cover-Extend Technology, to digital library tests and boundary scan. The unmuxed per-pin programmable digital engine makes test development really flexible and easy, especially in a situation when device conditioning is needed in functional test.
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Product
Optical to Electrical Converters
Optical / Electrical Converter
High bandwidth, broadband optical to electrical converters available in a range of configurations. Choose from 1 or 2 channels, AC or DC coupling and various conversion gain and operating wavelength ranges.
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Product
Massively Parallel Parametric Test System
P9001A
In-Circuit Test System
The highest throughput parallel parametric test solution. 100-pin parallel measurement capability and faster single parameter measurement than Keysight 4080. Good data correlation with Keysight 4080. New per-pin parametric test unit module with all basic measurement function (voltage, current, capacitance, pulse, frequency). Easy development of parallel test plan. Easy migration from 4080 environment. Proven in 1st-tier logic foundries and memory companies.
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Product
Test System for Detecting Exact PCB Short Circuit Locations
QT25
Test System
Qmax Test Technologies Pvt. Ltd.
QT25 employs a unique method to detect exact PCB shorts circuit locations and pin down the shorted components and tracks. It is designed in such a manner that it precisely detects exact short circuit locations across VCC - GND or a shorted component connected across a Bus or hair-line shorts between PCB tracks, Which is highly impossible to detect using conventional tools especially when they are connected parallel in circuit. It can also be used in measuring the contact resistance of switches and relays in its milli-ohm mode as a value add.
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Product
Onboard Systems
System
Collect and store critical data securely to facilitate train operation monitoring, driver performance evaluation, and post-event investigation; reliable data management can yield improved operational efficiency and safety
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Product
Mini Fiber Optic, Contact, Receiver, Polymer Optic Fiber
610113170
Fiber Optic Contact (Receiver)
This contact available for purchase as a patchcord only. Choose link below to configure as a patchcord. Primary mating contact 610113171. (May mate with other ITA contacts, as well.)
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Product
Functional Test System Optimized For Real-Time Digital Bus Test
Spectrum HS
Test System
Spectrum HS is Teradyne’s fully integrated functional test system. Optimized for real-time test of low latency buses, it’s a high-performance system delivering excellent test coverage of current and future products.
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Product
Test Requirements Document (TRD) System
TRD Software
System
The Test Requirements Document (TRD) System helps users develop and document the strategy and structure of test programs.
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Product
Advanced SoC Test System
3680
Test System
The Chroma 3680 is an advanced SoC test system with data rate up to 1Gbps. The Chroma 3680 is capable of conducting parallel tests on multiple chips to meet the digital and analog IC testing requirements, with applications including MCU, digital audio, digital TV, set-top box, DSP, network processor, field programmable gate array (FPGA) and consumer electronics.
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Product
19” Rackmount Data Collection System
DCS-211
Data Acquisition System
- Intel Atom® x5-E3930 processor- Up to 8x DI and 6x DO with two 2A relays- 3x M12 GbE, 1x RJ-45 GbE, 2x isolated RS232/422/485, 2x USB and one lockable HDMI port- Up to 3x PCI Express mini slots with one USIM card slot each- Storage: up to 64GB eMMC 5.0, 1x 2.5” SATA drive bay
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Product
Mini Fiber Optic, Patchcord, ITA, 36", Polymer Optic Fiber, to SMA Plug
7-413845516-036
Fiber Optic Patchcord
Mini Fiber Optic, Patchcord, ITA, 36", Polymer Optic Fiber, to SMA Plug.
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Product
Scienlab Battery Test System - Cell Level
SL1007A
Test System
The SL1007A Scienlab Battery Test System – Cell Level enables you to accurately and productively test battery cells for automotive and industrial applications. The bidirectional power supply charges and discharges your cells under test with very high efficiency.
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Product
Systems
System
In addition to our ISO 9001:2008 certification, we are proud to have the highest possible score for delivery-on-time and QA rating - 100% - from all the major aerospace companies.
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Product
Battery Cell Formation System
17000 series
System
Chroma 17000 series is specifically designed for the formation of Lithium Ion and Lithium Polymer secondary batteries. The 17000 series is a complete turn-key system, including carrier trays, robust battery probe contacts, high quality charge/discharge modules and intuitive software all under computer control. Patented Battery Voltage Tracking (BVT) DC-DC conversion power modules minimize power consumption in battery charging, and Energy Recycle Modules (ERM) recycle the discharged energy directly back to the DC power system for increased power efficiency. These power saving designs provide a planet friendly solution along with cost savings by reducing energy consumption. The intuitive software provides a flexible selection in the charge/ discharge channel, current rating, and modules under test. These features allow the Series 17000 to be used for final cell development, pilot line production, high volume production and ongoing reliability monitoring/quality control.
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Product
Variable Optical Attenuator Module with Angled Interface
81571A
Optical Attenuator
The Keysight 81571A variable optical attenuator features lowest insertion loss and excellent wavelength flatness over a complete attenuation range of 60 dB, for characterizing optical network components for telecommunication and data communication in systems.
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Product
Single Optical Head Interface Module
81618A
Optical Module
The single-channel interface module is used to connect optical heads ( Keysight 8162x ) to the mainframes 8163A/B, 8164A/B or 8166A/B.
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Product
OLED Lifetime Test System
58131
Test System
The 58131 Lifetime Test System is designed specifically for the OLED industry. Model 58131 provides twoquadrant constant current (CC) and constant voltage (CV) stimulus to each OLED panel and acquires electrical and optical characteristics automatically. Two independent and isolated precision source-and-measure units (PMU) are incorporated in one modular card, which is capable of testing two OLED panels. Additional instrument cards are added to expand test capacity. Hot plug and play is a key feature of 58131. When a UUT fails or an instrument card needs to be replaced, 58131 does not have to be shutdown and testing continues for other UUTs. Hot plug and play obviates life test cycle restarts due to isolated faults and significantly improves life test efficiency. We firmly believe that hot plug and play capability should be mandatory for all lifetime test systems.
